74ABT373CMTCX [FAIRCHILD]

8-Bit D-Type Latch ; 8位D类锁存器\n
74ABT373CMTCX
型号: 74ABT373CMTCX
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

8-Bit D-Type Latch
8位D类锁存器\n

总线驱动器 总线收发器 锁存器 逻辑集成电路 光电二极管 信息通信管理
文件: 总11页 (文件大小:122K)
中文:  中文翻译
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January 1993  
Revised November 1999  
74ABT373  
Octal Transparent Latch with 3-STATE Outputs  
General Description  
Features  
The ABT373 consists of eight latches with 3-STATE out-  
puts for bus organized system applications. The flip-flops  
appear transparent to the data when Latch Enable (LE) is  
HIGH. When LE is LOW, the data that meets the setup  
times is latched. Data appears on the bus when the Output  
Enable (OE) is LOW. When OE is HIGH the bus output is in  
the high impedance state.  
3-STATE outputs for bus interfacing  
Output sink capability of 64 mA, source capability of  
32 mA  
Guaranteed output skew  
Guaranteed multiple output switching specifications  
Output switching specified for both 50 pF and 250 pF  
loads  
Guaranteed simultaneous switching, noise level and  
dynamic threshold performance  
Guaranteed latchup protection  
High impedance glitch free bus loading during entire  
power up and power down  
Nondestructive hot insertion capability  
Ordering Code:  
Order Number Package Number  
Package Description  
74ABT373CSC  
74ABT373CSJ  
74ABT373CMSA  
74ABT373CMTC  
74ABT373CPC  
M20B  
M20D  
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300Wide Body  
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
MSA20  
MTC20  
N20A  
20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide  
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide  
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300Wide  
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.  
Connection Diagram  
Pin Descriptions  
Pin Names  
D0D7  
LE  
Description  
Data Inputs  
Latch Enable Input (Active HIGH)  
Output Enable Input (Active LOW)  
3-STATE Latch Outputs  
OE  
O0O7  
© 1999 Fairchild Semiconductor Corporation  
DS011547  
www.fairchildsemi.com  
Functional Description  
Truth Table  
The ABT373 contains eight D-type latches with 3-STATE  
output buffers. When the Latch Enable (LE) input is HIGH,  
data on the Dn inputs enters the latches. In this condition  
Inputs  
OE  
Output  
On  
LE  
Dn  
the latches are transparent, i.e., a latch output will change  
state each time its D input changes. When LE is LOW, the  
latches store the information that was present on the D  
inputs at setup time preceding the HIGH-to-LOW transition  
of LE. The 3-STATE buffers are controlled by the Output  
Enable (OE) input. When OE is LOW, the buffers are in the  
bi-state mode. When OE is HIGH the buffers are in the high  
impedance mode but this does not interfere with entering  
new data into the latches.  
H
H
L
L
L
H
L
H
L
L
X
X
O
n (no change)  
X
H
Z
H = HIGH Voltage Level  
L = LOW Voltage Level  
X = Immaterial  
Z = HIGH Impedance State  
Logic Diagram  
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 1)  
Recommended Operating  
Conditions  
65°C to +150°C  
Storage Temperature  
Ambient Temperature under Bias  
Junction Temperature under Bias  
55°C to +125°C  
55°C to +150°C  
0.5V to +7.0V  
Free Air Ambient Temperature  
Supply Voltage  
40°C to +85°C  
+4.5V to +5.5  
V
CC Pin Potential to Ground Pin  
Minimum Input Edge Rate (V/t)  
Data Input  
Input Voltage (Note 2)  
Input Current (Note 2)  
Voltage Applied to Any Output  
in the Disabled or  
0.5V to +7.0V  
50 mV/ns  
20 mV/ns  
30 mA to +5.0 mA  
Enable Input  
Power-Off State  
0.5V to +5.5V  
0.5V to VCC  
in the HIGH State  
Current Applied to Output  
in LOW State (Max)  
twice the rated IOL (mA)  
Note 1: Absolute maximum ratings are values beyond which the device  
may be damaged or have its useful life impaired. Functional operation  
under these conditions is not implied.  
DC Latchup Source Current:  
OE Pin 150 mA  
(Across Comm Operating Range) Other Pins 500 mA  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
Over Voltage Latchup (I/O)  
10V  
DC Electrical Characteristics  
VCC  
Symbol  
VIH  
Parameter  
Input HIGH Voltage  
Min  
Typ  
Max  
Units  
Conditions  
2.0  
V
V
V
Recognized HIGH Signal  
Recognized LOW Signal  
VIL  
Input LOW Voltage  
0.8  
VCD  
VOH  
Input Clamp Diode Voltage  
Output HIGH Voltage  
1.2  
Min  
Min  
Min  
Max  
Max  
Max  
0.0  
I
I
I
I
IN = −18 mA  
OH = −3 mA  
OH = −32 mA  
OL = 64 mA  
2.5  
2.0  
V
V
VOL  
IIH  
Output LOW Voltage  
Input HIGH Current  
0.55  
1
V
V
V
V
V
IN = 2.7V (Note 4)  
IN = VCC  
µA  
µA  
µA  
V
1
IBVI  
IIL  
Input HIGH Current Breakdown Test  
Input LOW Current  
7
IN = 7.0V  
1  
1  
IN = 0.5V (Note 4)  
IN = 0.0V  
VID  
Input Leakage Test  
4.75  
I
ID = 1.9 µA  
All Other Pins Grounded  
IOZH  
IOZL  
Output Leakage Current  
Output Leakage Current  
10  
µA  
µA  
0 5.5V  
0 5.5V  
V
OUT = 2.7V; OE = 2.0V  
10  
V
V
V
V
OUT = 0.5V; OE = 2.0V  
OUT = 0.0V  
IOS  
Output Short-Circuit Current  
Output High Leakage Current  
Bus Drainage Test  
100  
275  
50  
mA  
µA  
µA  
µA  
mA  
Max  
Max  
0.0  
ICEX  
IZZ  
ICCH  
ICCL  
ICCZ  
OUT = VCC  
100  
50  
OUT = 5.5V; All Others GND  
Power Supply Current  
Power Supply Current  
Max  
Max  
All Outputs HIGH  
All Outputs LOW  
30  
Power Supply Current  
50  
µA  
Max  
OE = VCC  
All Others at VCC or GND  
VI = VCC 2.1V  
ICCT  
Additional ICC/Input  
Outputs Enabled  
2.5  
2.5  
2.5  
mA  
mA  
mA  
Outputs 3-STATE  
Outputs 3-STATE  
Max  
Enable Input VI = VCC 2.1V  
Data Input VI = VCC 2.1V  
All Others at VCC or GND  
Outputs Open, LE = VCC  
ICCD  
Dynamic ICC  
(Note 4)  
No Load  
mA/  
Max  
0.12  
MHz  
OE = GND, (Note 3)  
One Bit Toggling, 50% Duty Cycle  
Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz.  
Note 4: Guaranteed, but not tested.  
3
www.fairchildsemi.com  
DC Electrical Characteristics  
(SOIC Package)  
Conditions  
VCC  
Symbol  
Parameter  
Min  
Typ  
Max  
Units  
C
L = 50 pF, RL = 500Ω  
VOLP  
Quiet Output Maximum Dynamic VOL  
0.4  
0.8  
3.0  
0.8  
V
V
V
V
V
5.0  
5.0  
5.0  
5.0  
5.0  
T
T
T
T
T
A = 25°C (Note 5)  
A = 25°C (Note 5)  
A = 25°C (Note 6)  
A = 25°C (Note 7)  
A = 25°C (Note 7)  
VOLV  
VOHV  
VIHD  
VILD  
Quiet Output Minimum Dynamic VOL  
1.2  
2.5  
Minimum HIGH Level Dynamic Output Voltage  
Minimum HIGH Level Dynamic Input Voltage  
Maximum LOW Level Dynamic Input Voltage  
2.0  
1.7  
0.9  
0.6  
Note 5: Max number of outputs defined as (n). n 1 data inputs are driven 0V to 3V. One output at Low. Guaranteed, but not tested.  
Note 6: Max number of outputs defined as (n). n 1 data inputs are driven 0V to 3V. One output HIGH. Guaranteed, but not tested.  
Note 7: Max number of data inputs (n) switching. n 1 inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD).  
Guaranteed, but not tested.  
AC Electrical Characteristics  
(SOIC and SSOP Packages)  
TA = +25°C  
TA = −55°C to +125°C  
TA = −40°C to +85°C  
V
CC = +5.0V  
V
CC = 4.5V to 5.5V  
VCC = 4.5V to 5.5V  
Symbol  
Parameter  
Units  
C
L = 50 pF  
CL = 50 pF  
CL = 50 pF  
Min  
1.9  
1.9  
2.0  
2.0  
1.5  
1.5  
2.0  
2.0  
Typ  
2.7  
2.8  
3.1  
3.0  
3.1  
3.1  
3.6  
3.4  
Max  
4.5  
4.5  
5.0  
5.0  
5.3  
5.3  
5.4  
5.4  
Min  
1.0  
1.0  
1.0  
1.5  
1.0  
1.5  
1.7  
1.0  
Max  
Min  
1.9  
1.9  
2.0  
2.0  
1.5  
1.5  
2.0  
2.0  
Max  
tPLH  
Propagation Delay  
6.8  
7.0  
7.7  
7.7  
6.7  
7.2  
8.0  
7.0  
4.5  
4.5  
5.0  
5.0  
5.3  
5.3  
5.4  
5.4  
ns  
ns  
ns  
ns  
tPHL  
tPLH  
tPHL  
tPZH  
tPZL  
tPHZ  
tPLZ  
Dn to On  
Propagation Delay  
LE to On  
Output Enable Time  
Output Disable Time  
AC Operating Requirements  
(SOIC and SSOP Packages)  
T
A = +25°C  
T
A = −55°C to +125°C  
CC = 4.5V to 5.5V  
T
A = −40°C to +85°C  
VCC = +5.0V  
V
VCC = 4.5V to 5.5V  
Symbol  
Parameter  
Units  
C
L = 50 pF  
C
L = 50 pF  
Max  
C
L = 50 pF  
Min  
Typ  
Max  
Min  
100  
2.5  
2.5  
2.5  
2.5  
Min  
Max  
fTOGGLE  
Max Toggle Frequency  
Setup Time, HIGH  
or LOW Dn to LE  
Hold Time, HIGH  
or LOW Dn to LE  
Pulse Width,  
100  
MHz  
ns  
tS(H)  
tS(L)  
tH(H)  
tH(L)  
tW(H)  
1.5  
1.5  
1.0  
1.0  
1.5  
1.5  
1.0  
1.0  
ns  
ns  
3.0  
3.3  
3.0  
LE HIGH  
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4
Extended AC Electrical Characteristics  
(SOIC Package)  
T
A = −40°C to +85°C  
CC = 4.5V to 5.5V  
L = 50 pF  
T
A = −40°C to +85°C  
CC = 4.5V to 5.5V  
T
A = −40°C to +85°C  
CC = 4.5V to 5.5V  
L = 250 pF  
V
V
V
C
C
L = 250 pF  
C
Symbol  
Parameter  
Units  
8 Outputs Switching  
(Note 8)  
8 Outputs Switching  
(Note 10)  
(Note 9)  
Min  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.0  
1.0  
Max  
5.2  
5.2  
5.5  
5.5  
6.2  
6.2  
5.5  
5.5  
Min  
2.0  
2.0  
2.0  
2.0  
2.0  
2.0  
Max  
Min  
2.0  
2.0  
2.0  
2.0  
2.0  
2.0  
Max  
9.0  
tPLH  
Propagation Delay  
6.8  
6.8  
7.5  
7.5  
8.0  
8.0  
ns  
ns  
ns  
ns  
tPHL  
tPLH  
tPHL  
tPZH  
tPZL  
tPHZ  
tPZL  
Dn to On  
9.0  
Propagation Delay  
LE to On  
9.5  
9.5  
Output Enable Time  
10.5  
10.5  
Output Disable Time  
(Note 11)  
(Note 11)  
Note 8: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase  
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.).  
Note 9: This specification is guaranteed but not tested. The limits represent propagation delay with 250 pF load capacitors in place of the 50 pF load capac-  
itors in the standard AC load. This specification pertains to single output switching only.  
Note 10: This specification is guaranteed but not tested. The limits represent propagation delays for all paths described switching in phase  
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.) with 250 pF load capacitors in place of the 50 pF load capacitors in the standard AC load.  
Note 11: The 3-STATE delay times are dominated by the RC network (500, 250 pF) on the output and has been excluded from the datasheet.  
Skew  
(SOIC Package)  
T
A = −40°C to +85°C  
CC = 4.5V–5.5V  
L = 50 pF  
T
A = −40°C to +85°C  
CC = 4.5V–5.5V  
L = 250 pF  
V
V
C
C
Symbol  
Parameter  
Units  
8 Outputs Switching  
8 Outputs Switching  
(Note 12)  
Max  
1.0  
(Note 13)  
Max  
1.5  
tOSHL (Note 14) Pin to Pin Skew, HL Transitions  
OSLH (Note 14) Pin to Pin Skew, LH Transitions  
ns  
ns  
ns  
ns  
ns  
t
1.0  
1.5  
t
PS (Note 16)  
tOST (Note 14)  
PV (Note 15)  
Duty Cycle, LHHL Skew  
1.4  
3.5  
Pin to Pin Skew, LH/HL Transitions  
Device to Device Skew, LH/HL Transitions  
1.5  
3.9  
t
2.0  
4.0  
Note 12: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load  
capacitors in the standard AC load.  
Note 13: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase  
(i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.).  
Note 14: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device.  
The specification applies to any outputs switching HIGH-to-LOW (tOSHL), LOW-to-HIGH (tOSLH), or any combination switching LOW-to-HIGH and/or  
HIGH-to-LOW (tOST). This specification is guaranteed but not tested.  
Note 15: Propagation delay variation is for a given set of conditions (i.e., temperature and VCC) from device to device. This specification is guaranteed but  
not tested.  
Note 16: This describes the difference between the delay of the LOW-to-HIGH and the HIGH-to-LOW transition on the same pin. It is measured across all  
the outputs (drivers) on the same chip, the worst (largest delta) number is the guaranteed specification. This specification is guaranteed but not tested.  
Capacitance  
Conditions  
Symbol  
Parameter  
Typ  
Units  
(TA = 25°C)  
CIN  
COUT (Note 17)  
Input Capacitance  
Output Capacitance  
5
9
pF  
pF  
V
V
CC = 0V  
CC = 5.0V  
Note 17: COUT is measured at frequency f = 1 MHz, per MIL-STD-883, Method 3012.  
5
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AC Loading  
*Includes jig and probe capacitance  
FIGURE 1. Standard AC Test Load  
FIGURE 2. Test Input Signal Levels  
Amplitude Rep. Rate  
3.0V 1 MHz  
tw  
tr  
tf  
500 ns  
2.5 ns  
2.5 ns  
FIGURE 3. Test Input Signal Requirements  
AC Waveforms  
FIGURE 4. Propagation Delay Waveforms for  
Inverting and Non-Inverting Functions  
FIGURE 6. 3-STATE Output HIGH  
and LOW Enable and Disable Times  
FIGURE 5. Propagation Delay,  
Pulse Width Waveforms  
FIGURE 7. Setup Time, Hold Time  
and Recovery Time Waveforms  
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6
Physical Dimensions inches (millimeters) unless otherwise noted  
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300Wide Body  
Package Number M20B  
7
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
Package Number M20D  
www.fairchildsemi.com  
8
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
20-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide  
Package Number MSA20  
9
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide  
Package Number MTC20  
www.fairchildsemi.com  
10  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300Wide  
Package Number N20A  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
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11  
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