XCR3320-10TQ144C [ETC]
;型号: | XCR3320-10TQ144C |
厂家: | ETC |
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文件: | 总43页 (文件大小:383K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
APPLICATION NOTE
0
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XCR3320: 320 Macrocell SRAM
CPLD
0
14*
DS033 (v1.1) February 10, 2000
Product Specification
nique is also what allows Xilinx to offer a true CPLD archi-
tecture in a high density device.
Features
•
•
•
320 macrocell SRAM based CPLD
Configuration times of under 1.0 second
IEEE 1149.1 compliant JTAG testing capability
The Xilinx XCR3320 devices use the patented XPLA2
(eXtended Programmable Logic Array) architecture. This
architecture combines the best features of both PAL- and
PLA-type logic structures to deliver high speed and flexible
logic allocation that results in superior ability to make
design changes with fixed pinouts. The XPLA2 architecture
is constructed from 80 macrocell Fast Modules that are
connected together by an interconnect array. Within each
Fast Module are four Logic Blocks of 20 macrocells each.
Each Logic Block contains a PAL structure with four dedi-
cated product terms for each macrocell. In addition, each
Logic Block has 32 additional product terms in a PLA struc-
ture that can be shared through a fully programmable OR
array to any of the 20 macrocells. This combination effi-
ciently allocates logic throughout the Logic Block, which
increases device density and allows for design changes
without re-defining the pinout or changing the system tim-
ing. The XCR3320 offers pin-to-pin propagation delays of
7.5 ns through the PAL array of a Fast Module; and if the
PLA array is used, an additional 1.5 ns is added to the
delay, no matter how many PLA product terms are used. If
the interconnect array between Fast Modules is used, there
is a second fixed delay of 2.0 ns. This means that the worst
case pin-to-pin propagation delay within a fast module is
7.5 + 1.5 = 9.0 ns, and the delay from any pin to any other
pin across the entire chip is 7.5 + 2.0 = 9.5 ns if only the
PAL array is used, and 7.5 + 1.5 + 2.0 = 11.0 ns if the PLA
array is used.
-
-
Five pin JTAG interface
IEEE 1149.1 TAP controller
•
•
•
In system configurable
3.3V device with 5V tolerant I/O
Innovative XPLA2 Architecture combines extreme
flexibility and high speeds
•
•
•
•
Eight synchronous clock networks with programmable
polarity at every macrocell
Up to 32 asynchronous clocks support complex
clocking needs
Innovative XOR structure at every macrocell provides
excellent logic reduction capability
Logic expandable to 36 product terms on a single
macrocell
•
•
Advanced 0.35µ SRAM process
Design entry and verification using industry standard
and Xilinx CAE tools
•
Control Term structure provides either sum terms or
product terms in each logic block for:
-
-
3-state buffer control
Asynchronous macrocell register reset/preset
•
Global 3-state pin facilitates "bed of nails" testing
without sacrificing logic resources
Programmable slew rate control
Small form factor packages with high I/O counts
Available in commercial and industrial temperature
ranges
•
•
•
Each macrocell also has a two input XOR gate with the
dedicated PAL product terms on one input and the PLA
product terms on the other input. This patent-pending Ver-
satile XOR structure allows for very efficient logic optimiza-
tion compared to competing XOR structures that have only
one product term as the second input to the XOR gate. The
Versatile XOR allows an 8-bit XOR function to be imple-
mented in only 20 product terms, compared to 65 product
terms for the traditional XOR approach.
Description
The XCR3320 device is a member of the CoolRunner™
family of high-density SRAM-based CPLDs (Complex Pro-
grammable Logic Device) from Xilinx. This device com-
bines high speed and deterministic pin-to-pin timing with
high density. The XCR3320 uses the patented Fast Zero
Power (FZP™) design technique that combines high speed
and low power for the first time ever in a CPLD. FZP allows
the XCR3320 to have true pin-to-pin timing delays of 7.5 ns,
and standby currents of 100 µA without the need for `turbo
bits' or other power down schemes. By replacing conven-
tional sense amplifier methods for implementing product
terms (a technique that has been used since the bipolar
era) with a cascaded chain of pure CMOS gates, both
standby and dynamic power are dramatically reduced
when compared to other CPLDs. The FZP design tech-
The XCR3320 is SRAM-based, which means that it is con-
figured from an external source at power up. See the con-
figuration section of this data sheet for more information.
The device supports the full JTAG specification (IEEE
1149.1) through an industry standard JTAG interface. It can
also be configured through the JTAG port, which is very
useful for prototyping. See section titled “Device Configura-
tion Through JTAG” on page 29 for more information.
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XCR3320: 320 Macrocell SRAM CPLD
The XCR3320 CPLDs are supported by industry standard
CAE tools (Cadence/OrCAD, Exemplar Logic, Mentor, Syn-
opsys, Synario, Viewlogic, and Synplicity), using text
(ABEL, VHDL, Verilog) and/or schematic entry. Design ver-
ification uses industry standard simulators for functional
and timing simulation. Development is supported on per-
sonal computer, Sparc, and HP platforms. Device fitting
uses a Xilinx developed tool including WebFITTER.
called the Global Zero Power Interconnect Array (GZIA).
Each Fast Module accepts 64 bits from the GZIA and out-
puts 64 bits to the GZIA. Each Fast Module is essentially an
80 macrocell CPLD with four logic blocks of 20 macrocells
each inside. There are eight dedicated, low-skew, global
clocks for the device; and each Fast Module has access to
any two of these clocks (there are additional asynchronous
clocks available in the Fast Modules, see Figure 3. There
are also Global 3-state (gts) and Global Reset (rstn) pins
that are common to all Fast Modules. When gts is pulled
high, all output buffers in the device will be disabled, caus-
ing all I/O pins to be tri-stated. When rstn is pulled low, all
flip-flops of the device will be reset.
XPLA2 Architecture
Figure 1 shows a high level block diagram of the XCR3320
implementing the XPLA2 architecture. The XPLA2 archi-
tecture is a multi-level, modular hierarchy that consists of
Fast Modules interconnected by a virtual crosspoint switch
V
CC
cclk
din
cclk
din
cclk
din
cclk
dout
dout
dout
dout
V
CC
V
CC
MASTER SERIAL
LEAD
SLAVE #1
SLAVE #2
EEPROM
pgrmn
resetn
pgrmn
resetn
pgrmn
resetn
done
done
done
reset/OE
CE
V
V
V
CC
CC
CC
crcerrn
hdc
crcerrn
hdc
crcerrn
hdc
M3
M2
M1
M0
M3
M2
M1
M0
M3
M2
M1
M0
SP00665
Figure 1: Xilinx XPLA2 CPLD Architecture
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XCR3320: 320 Macrocell SRAM CPLD
XPLA2 Fast Module
is a virtual crosspoint switch that connects the Logic Blocks
to each other and to the GZIA. The feedback from all 80
macrocells, input from the I/O pins, and the 64 bit input bus
from the GZIA are input into the LZIA. The LZIA outputs 36
signals into each Logic Block and 64 signals into the GZIA
(Figure 2).
Each Fast Module consists of four Logic Blocks of 20 mac-
rocells each. Depending on the package, either seven or 12
of the 20 macrocells in each Logic Block are connected to
I/O pins, and the remaining macrocells are used as buried
nodes. These four Logic Blocks are connected together by
the Local Zero Power Interconnect Array (LZIA). The LZIA
MC0
MC0
MC1
MC1
36
20
36
20
LOGIC
BLOCK
LOGIC
BLOCK
I/O
I/O
MC19
MC19
LZIA
MC0
MC1
MC0
MC1
36
20
36
20
LOGIC
BLOCK
LOGIC
BLOCK
I/O
I/O
MC19
MC19
64
64
SP00656
Figure 2: Xilinx XPLA2 Fast Module
sists of a programmable AND array with a programmable
OR array.
XPLA2 Logic Block Architecture
Figure 3 illustrates the XPLA2 Logic Block architecture.
Each Logic Block contains eight control terms, a PAL array,
a PLA array, and 20 macrocells. The 36 inputs from the
LZIA are available to all control terms and to each product
term in both the PAL and the PLA array. The eight control
terms can individually be configured as either SUM or
PRODUCT terms, and are used to control the asynchro-
nous preset and reset functions of the macrocell registers,
the output enables of the 20 macrocells, and for asynchro-
nous clocking. The PAL array consists of a programmable
AND array with a fixed OR array, while the PLA array con-
Each macrocell has four dedicated product terms from the
PAL array. When additional logic is required, each macro-
cell takes the extra product terms from the PLA array. The
PLA array consists of 32 extra product terms that are
shared between the 20 macrocells of the Logic Block. The
PAL product terms can be connected to the PLA product
terms through either an OR gate or an XOR gate. One input
to the XOR gate can be connected to all the PLA terms,
which provides for extremely efficient logic synthesis. An
eight bit XOR function can be implemented in only 20 prod-
uct terms. Each macrocell can use the output from the OR
gate or the XOR gate in either normal or inverted state.
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XCR3320: 320 Macrocell SRAM CPLD
LZIA
INPUTS
36
8
CONTROL
4
4
4
MC0
MC1
MC2
PAL
ARRAY
4
MC19
PLA
ARRAY
(32)
PATENT PENDING
SP00589A
Figure 3: Xilinx XPLA2 Logic Block Architecture
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XCR3320: 320 Macrocell SRAM CPLD
XPLA2 Macrocell Architecture
applied, and that the preset/reset feature for each macro-
cell can also be disabled. Each macrocell can choose
between an asynchronous reset or an asynchronous pre-
set function, but both cannot be simultaneously used on the
same register. The global rstn function can always be used,
regardless of whether or not asynchronous reset or preset
control terms are enabled. Control terms CT2, CT3, CT4
and CT5 are used to enable or disable the macrocell's out-
put buffer. The output buffers can also be always enabled or
always disabled. All CoolRunner devices also provide a
Global 3-state (GTS) pin, which, when pulled high, will
3-state all the outputs of the device. This pin is provided to
support "In-Circuit Testin" or "Bed-of-Nails" testing used
during manufacturing.
Figure 4 shows the XPLA2 macrocell architecture used in
the XCR3320. The macrocell can be configured as either a
D- or T-type flip-flop or a combinatorial logic function. A
D-type flip-flop is generally more useful for implementing
state machines and data buffering while a T-type flip-flop is
generally more useful in implementing counters. Each of
these flip-flops can be clocked from any one of four
sources. Two of the clock sources (CLK0 and CLK1) are
from the eight dedicated, low-skew, global clock networks
designed to preserve the integrity of the clock signal by
reducing skew between rising and falling edges. These
clocks are designated as "synchronous" clocks and must
be driven by an external source. Both CLK0 and CLK1 can
clock the macrocell flip-flops on either the rising edge or the
falling edge of the clock signal. The other clock sources are
designated as "asynchronous" and are connected to two of
the eight control terms (CT6 and CT7) provided in each
logic block. These clocks can be individually configured as
any PRODUCT term or SUM term equation created from
the 36 signals available inside the logic block. Thus, in each
Logic Block, there are up to four possible clocks; and in
each Fast Module, there are up to ten possible clocks.
Throughout the entire device, there are up to 40 possible
clocks–eight from the dedicated, low-skew, global clocks,
and two for each of the 16 logic blocks.
For the macrocells in the Logic Block that are associated
with I/O pins, there are two feedback paths to the LZIA: one
from the macrocell, and one from the I/O pin. The LZIA
feedback path before the output buffer is the macrocell
feedback path, while the LZIA feedback path after the out-
put buffer is the I/O pin feedback path. When these macro-
cells are used as outputs, the output buffer is enabled, and
either feedback path can be used to feedback the logic
implemented in the macrocell. When the I/O pins are used
as inputs, the output buffer of these macrocells will be
3-stated and the input signal will be fed into the LZIA via the
I/O feedback path. In this case the logic functions imple-
mented in the buried macrocell can be fed back into the
LZIA via the macrocell feedback path. For macrocells that
are not associated with I/O pins, there is one feedback path
to the LZIA. Logic functions implemented in these buried
macrocells are fed back into the LZIA via this path. All
unused inputs and I/O pins should be properly terminated.
Please refer to “Terminations” on page 8.
The remaining six control terms of each logic block
(CT0-CT5) are used to control the asynchronous pre-
set/reset of the flip-flops and the enable/disable of the out-
put buffers in each macrocell. Control terms CT0 and CT1
are used to control the asynchronous preset/reset of the
macrocell's flip-flop. Note that the power-on reset leaves all
macrocells in the "zero" state when power is properly
TO LZIA
D/T
Q
gts
INIT*
CLK0
CLK0
GND
CT0
CT1
CT2
CT3
CT4
CT5
CLK1
CLK1
CT6
GND
CT7
V
CC
GND
rstn
SP00590
*SEE XPLA2 MACROCELL ARCHITECTURE DESCRIPTION
Figure 4: XCR3320 Macrocell Architecture
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XCR3320: 320 Macrocell SRAM CPLD
PAL array in a Fast Module, and there are fixed delays
added for use of the PLA array or the GZIA. The tCO
(pin-to-pin) timing specification never changes. For exam-
ple, a combinatorial logic function of four or fewer product
terms constructed from inputs within the same logic block
would have a tPD delay of 7.5 ns. If the logic function were
more than four product terms wide, the delay would be tPD
plus the fixed PLA delay, or 7.5 +1.5 = 9.0 ns. A function
that used the PAL array and inputs from a different Fast
Module would have a propagation delay of tPD plus the
fixed GZIA delay, or 7.5 + 2.0 = 9.5 ns.
Simple Timing Model
Figure 5 shows the XCR3320 timing model. The XCR3320
timing model is very simple compared to the models of
competing architectures. There are three main timing
parameters: the pin-to-pin delay for combinatorial logic
functions (tPD), the input pin to register set up time (tSU),
and the register clock to valid output time (tCO). As the
model shows, timing is only dependent on whether or not
the PLA array is used, and whether or not the logic function
is created within a single Fast Module or uses the GZIA.
The timing starts with a set time for tPD and tSU through the
Within a Fast Module:
t
= COMBINATORIAL PAL
PD_PAL
t
= COMBINATORIAL PAL + PLA
PD_PLA
INPUT PIN
OUTPUT PIN
OUTPUT PIN
REGISTERED
t
= PAL
= PAL + PLA
REGISTERED
SU_PAL
t
t
SU_PLA
CO
INPUT PIN
D
Q
GLOBAL CLOCK PIN
Using the Global ZIA:
t
= COMBINATORIAL PAL + GZD
PD_PAL
t
= COMBINATORIAL PAL + PLA ,+ GZD
PD_PLA
INPUT PIN
OUTPUT PIN
REGISTERED
= PAL + GZD
t
REGISTERED
SU_PAL
t
= PAL + PLA + GZD
t
SU_PLA
CO
INPUT PIN
D
Q
OUTPUT PIN
SP00591B
GLOBAL CLOCK PIN
Figure 5: XCR3320 Timing Module
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XCR3320: 320 Macrocell SRAM CPLD
both high performance and low power, breaking the para-
digm that to have low power, you must have low perfor-
mance. This also makes it possible to manufacture high
density CPLDs like the XCR3320 that consume a fraction
of the power of competing devices. Refer to Figure 6 and
Table 1 showing the ICC vs. Frequency of the XCR3320
TotalCMOS CPLD (data taken with 20 16-bit counters at
3.3V, 25°C, output buffers disabled).
TotalCMOS Design Technique for Fast Zero
Power
Xilinx is the first to offer a TotalCMOS CPLD, both in pro-
cess technology and design technique. Xilinx employs a
cascade of CMOS gates to implement its product terms
instead of the traditional sense amp approach. This CMOS
gate implementation allows Xilinx to offer CPLDs which are
200
180
160
140
120
I
CC
100
80
60
40
20
(mA)
0
0
20
40
60
80
100
120
FREQUENCY (MHz)
SP00657
Figure 6: ICC vs. Frequency at VCC = 3.3V, 25°C
Table 1: ICC vs. Frequency (VCC = 3.3V, 25°C)
Frequency (MHz)
0
1
20
40
60
77
80
100
120
Typical ICC (mA)
0.01
1.3
26
51
102
126
152
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XCR3320: 320 Macrocell SRAM CPLD
come close to ground, which could cause the device to
enter JTAG/ISP mode at unspecified times.
Terminations
The CoolRunner XCR3320 CPLDs are TotalCMOS™
devices. As with other CMOS devices, it is important to
consider how to properly terminate unused inputs and I/O
pins when fabricating a PC board. Allowing unused inputs
and I/O pins to float can cause the voltage to be in the linear
region of the CMOS input structures, which can increase
the power consumption of the device. It can also cause the
voltage on a configuration pin to float to an unwanted volt-
age level, interrupting device operation.
Configuration Introduction
The Xilinx CoolRunner series are available in technologies
which use non-volatile (EEPROM-based) and volatile
(SRAM based) configuration memory. The functionality of
the XPLA2 family of the CoolRunner series is defined by
on-chip SRAM. The devices are configured in a manner
similar to that of most FPGAs. This section describes the
configuration of the XCR3320, and applies to all similarly
configured devices to be produced by Xilinx.
The XCR3320 CPLDs have programmable on-chip
pull-down resistors on each I/O pin. These pull-downs are
automatically activated by the fitter software for all unused
I/O pins. Note that an I/O macrocell used as buried logic
that does not have the I/O pin used for input is considered
to be unused, and the pull-down resistors will be turned on.
We recommend that any unused I/O pins on the XCR3320
device be left unconnected.
Either Xilinx or third party software is used to generate a
JEDEC file. The JEDEC file contains the configuration
data, which is loaded into the XCR3320 configuration
memory to control the XCR3320 functionality. This is done
at power-up and/or with configure command. This section
provides some of the trade-offs in selecting a configuration
mode, and provides debug hints for configuration problems.
There are no on-chip pull-down structures associated with
dedicated pins used for device configuration or special
device functions like global reset and global 3-state. Xilinx
recommends that these pins be terminated consistent with
pin functionality. Xilinx recommends the use of weak
pull-up and pull-down resistors for terminating these pins.
See the appropriate configuration section for more informa-
tion on terminating dedicated pins.
There are several different methods of configuring the
XCR3320. The mode used is selected using the mode
select pins. There are three basic configuration methods:
master, slave, and peripheral. The configuration data can
be transmitted to the XCR3320 serially or in parallel bytes.
As a master, the XCR3320 generates the clock and control
signals to strobe configuration data into the XCR3320. As a
slave device, a clock is generated externally, and provided
into the XCR3320s cclk pin. In the peripheral mode, the
XCR3320 interfaces as a microprocessor peripheral.
Please note that M3 should always be High. Table 2 lists
the states for the other mode pins by configuration mode.
When using the JTAG Boundary Scan functions, it is rec-
ommended that 10kΩ pull-up resistors be used on the tdi,
tms, tck, and trstn pins. The tdo signal pin can be left float-
ing unless it is connected to the tdi of another device. Let-
ting these signals float can cause the voltage on tms to
Table 2: Configuration Modes
M2
0
M1
0
M0
0
Cclk
Output
Input
Configuration Mode
Data Format
Serial
Master serial
Slave parallel
0
0
1
Parallel
0
1
0
Reserved
0
1
1
Input
Synchronous peripheral
Master parallel - up
Parallel
Parallel
1
0
0
Output
1
0
1
Reserved
Reserved
1
1
0
1
1
1
Input
Slave serial
Serial
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XCR3320: 320 Macrocell SRAM CPLD
Design Flow Overview
configuration data from a PC or workstation hard disk into
the XCR3320. Alternately, the XCR3320 can be loaded
from non-volatile ICs such as serial or parallel EEPROMs,
after converting the JEDEC file to an MCS file using the
jed2mcsutility.
Figure 7 is a diagram of the steps used in configuring the
XCR3320. The development system is used to generate
configuration data in the JEDEC file. Using the
<design>.jedfile, there are two general methods of con-
figuring the XCR3320. The utility download can load the
DESIGN COMPILATION AND FIT
jed
jed2mcs
download
PROM PROGRAMMER
SLAVE SERIAL CONFIGURATION
SP00676
Figure 7: Design Flow
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XCR3320: 320 Macrocell SRAM CPLD
complete when the internal length count equals the loaded
length count in the length count field, and the required end
of configuration frame is written.
XCR3320 States Of Operation
Prior to becoming operational, the XCR3320 goes through
a sequence of states, including initialization, configuration,
and start-up. This section discusses these three states. In
the master configuration modes, the XCR3320 is the
source of configuration clock (cclk).
All configuration I/Os used as inputs operate with TTL-level
input thresholds during configuration. All I/Os that are not
used during the configuration process are 3-stated with
internal pull-downs. During configuration, registers are
reset. The combinatorial logic begins to function as the
XCR3320 is configured. Figure 6 shows the flow between
the initialization, configuration, and start-up states. Figure 9
gives the general timing information for configuring the
device.
When configuration is initiated, a counter in the XCR3320
is set to zero and begins to count configuration clock cycles
applied to the XCR3320. As each configuration data frame
is supplied to the XCR3320, it is internally assembled into
data words. Each data word is loaded into the internal con-
figuration memory. The configuration loading process is
POWER-UP
POWER-ON TIME DELAY
crcerrn HIGH
–
–
INITIALIZATION
–
–
hdc LOW, ldcn HIGH
done LOW
resetn
OR
prgmn
crcerrn LOW
YES
LOW
NO
CONFIGURATION
–
–
–
–
–
M[3:0] MODE IS SELECTED
resetn
OR
prgmn
CRC
ERROR
CONFIGURATION DATA FRAME WRITTEN
hdc HIGH, ldcn LOW
LOW
dout ACTIVE
crcerrn HIGH, done LOW
DEVICE CONFIGURATION COMPLETE
done RELEASED
–
–
dout ACTIVE
NO
done
HIGH
YES
START-UP
prgmn
LOW
–
–
ALL MACROCELL FF’S ARE RESET
OPERATION
I/O BECOMES ACTIVE
SP00622
Figure 8: Chart Of Initialization, Configuration, and Operating States
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XCR3320: 320 Macrocell SRAM CPLD
V
DD
t
pord
t
PW
prgmn
t
r
crcerrn
resetn
t
cclk
cclk
t
smode
M[3:0]
t
CL
I/O active
done
hdc
t
IL
ldcn
INITIALIZATION
CONFIGURATION
START UP
OPERATIONAL
SP00652
Figure 9: General Configuration Mode Timing Diagram
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XCR3320: 320 Macrocell SRAM CPLD
Table 3: General Configuration Mode Timing Characteristics
Symbol
Parameter
Min.
Max.
Unit
All Configuration Modes
tSMODE
tHMODE
tPW
M[3:0] setup time to prgmn high
M[3:0] hold time from done high
0
-
-
ns
ms
ns
ns
ns
10
50
prgmn pulse width low
Global 3-state disable
-
tgtsr
40
700
tIL
Initialization latency (prgmn high to hdc high)
XCR3320
M3 = 1
250
tPORD
tr
Master Modes
tCCLK cclk period
tCL
Power-on reset delay
1
-
ms
ms
Configuration signal rise time
1.0
M3 = 1
M3 = 1
714
135
1667
316
ns
Configuration latency (non-compressed)
XCR3320
ms
Slave Serial, Slave Parallel, And Synchronous Peripheral Modes
tCCLK
cclk period
Single device
Daisy-chain
Single device
Daisy-chain
100
1000
19
-
-
-
-
ns
ns
tCL
Configuration latency (non-compressed)
XCR3320
ms
ms
189
tion state. The resetn and prgmn pins must be high before
the XCR3320 will enter the configuration state, and the
mode pins must be stable tSMODE nanoseconds before they
rise. During the start-up and operating states, only the
assertion of prgmn causes a reconfiguration.
Initialization
Upon power-up, the device goes through an initialization
process. First, an internal power-on-reset circuit is trig-
gered when power is applied. When VCC reaches the volt-
age at which portions of the XCR3320 begin to operate
(1.5V), the configuration pins are set to be inputs or outputs
based on the configuration mode, as determined by the
mode select inputs M[2:0]. The mode pins must be stable
tSMODE nanoseconds before the rising edge of prgmn or
resetn. A time-out delay is initiated when VCC reaches
between 1.0V and 2.0V to allow the power supply voltage to
stabilize. The done output is low. At power-up, if the power
supply does not rise from 1.0V to VCC in less than 25 ms,
the user should delay configuration by inputting a low into
prgmn or resetn until VCC is greater than the recommended
minimum operating voltage (3.0V for commercial devices).
If prgmn has a rise time of greater than one microsecond,
resetn must be held low until after prgmn goes high. If the
rise time for prgmn is 1 ms or less, the order in which these
pins go high is arbitrary.
During initialization and configuration, all I/O’s are 3-stated
and the internal weak pull-downs are active. See “Termina-
tions” on page 8 for more information.
Start-up
After configuration, the XCR3320 enters the start-up
phase. This phase is the transition between the configura-
tion and operational states. This transition occurs within
three cclk cycles of the done pin going high (it is acceptable
to have additional cclk cycles beyond the three required).
The system design task in the start-up phase is to ensure
that multi-function pins (See “230-pin Function Table” on
page 36.) transition from configuration signals to user
definable I/Os without inadvertently activating devices in
the system or causing bus contention. The done signal
goes High at the beginning of the start up phase, which
allows configuration sources to be disconnected so that
there is no bus contention when the I/Os become active. In
addition to controlling the XCR3320 during start-up, addi-
tional start-up techniques to avoid contention include using
isolation devices between the XCR3320 and other circuits
in the system, re-assigning I/O locations, and keeping I/Os
3-stated until contentions are resolved. For example,
Figure 10 shows how to use the Global 3-state (GTS) sig-
nal to avoid signal contention when any multi-function pins
The High During Configuration (hdc), Low During Configu-
ration (ldcn), and done signals are active outputs in the
XCR3320’s initialization and configuration states. hdc, ldcn,
and done can be used to provide control of external logic
signals such as reset, bus enable, or EEPROM enable dur-
ing configuration. For master parallel configuration mode,
these signals provide EEPROM enable control and allow
the data pins to be shared with user logic signals.
If configuration has begun, an assertion of resetn or prgmn
initiates an abort, returning the XCR3320 to the initializa-
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XCR3320: 320 Macrocell SRAM CPLD
V
DD
t
pord
t
PW
prgmn
t
r
crcerrn
resetn
cclk
t
smode
t
smode
M[3:0]
t
CL
I/O active
t
t
gtsh
gtsr
GTS
done
hdc
t
HMODE
t
IL
ldcn
INITIALIZATION
CONFIGURATION
START UP
OPERATIONAL
INITIALIZATION
SP00653
Figure 10: Using GTS Signal with Power Up to Avoid Signal Contention with Multi-function Pins Used as I/O
are used as I/O after configuration is finished. Holding gts
high until after the multi-function pins are disconnected
from the driving source allows these pins to transition from
configuration pins to user definable I/O without signal con-
tention. In this case, the I/O become active a tGTSR delay
after the gts pin is pulled low.
The flip-flops are reset one cycle after done goes high so
that operation begins in a known state. The done outputs
from multiple XCR3320s can be wire ANDed and used as
an active-high ready signal, to disable PROMs with
active-low enable(s), or to reset to other parts of the system
(see Figure 27).
13
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XCR3320: 320 Macrocell SRAM CPLD
Configuration Data Format
Overview
The XCR3320 functionality is determined by the state of
internal configuration RAM. This section discusses the con-
figuration data format, and the function of each field in con-
figuration data packets.
2
16
1
4
4
COMPRESSION
BITS
CRC
BITS
CRC
ENABLE
PREAMBLE/
POSTAMBLE
LEADING 1s
MSB
LSB
SP00594
Configuration Data Packets
Configuration of the XCR3320 is done using configuration
packets. The configuration packet is shown in Figure 11.
The data packet consists of a header and a data frame.
There are four types of data frames. The header is shifted
into the device first, followed by one data frame. Configura-
tion of a single XCR3320 requires 338 data packets, one for
each address. All preceding data must contain only 1’s.
Once a device is configured, it retransmits data of any
polarity. Before and during configuration, all data retrans-
mitted out the daisy-chain port (dout) are 1’s.
Figure 12: 27-bit Header
The header is fixed and consists of five fields:
•
•
•
•
•
Leading 1s,
Preamble,
CRC Enable,
CRC Bits,
Compression Bits.
The leading 1s enter the device first. The following is a
description of each field in the header.
27
Leading 1s:
DATA FRAME
HEADER
This is a four or greater bit field consisting of 1s.
MSB
LSB
SP00593
Preamble/Postamble:
This is a four bit field which indicates the start of a
frame or the end of configuration:
Preamble: -0010 - signals the beginning of a config-
uration data packet.
Postamble: 0100 -signals the end of configuration.
All other values of the preamble field force configu-
ration of the entire system to restart.
Figure 11: Data Packet
The ordering of the data packets may be random, but they
cannot be mixed with other devices’ data packets. Align-
ment bits are not required between data packets. If used,
alignment bits must be included in the length count, and
they must be at least 2-bits long.
The segments CRC Enable, CRC Bits, and Compression
Bits are valid only if the Preamble field is 0010.
Cyclic Redundancy Check (CRC) Enable:
Table 4: Configuration Frame Size
In this single bit field, a 0 disables CRC checking of
the data stream. If the CRC is disabled the 16 bit
CRC field must be the default described below. A1
enables CRC error checking of the data stream.
Device
Number of frames
XCR3320
338
Data bits/standard frame
Data bits/compressed frame
Data bits/user_code frame
Data bits/isc_code frame
560
14
CRC Error Checking:
560
The CRC field is a 16 bit field. The default value is
1010_1010_1010_1010. The calculated value is
from data, address, stop bit, and first alignment bit
(starting with crc_reg[15:0] = [0]). Using verilog
operators, the crc is calculated as:
560
Maximum configuration
data – # bits/frame x # frames
189280
crc_reg[14:2] <= cr_reg[14:2] << 1;
cr_reg[2] <= cr_reg[15]^din^cr_reg[1];
cr_reg[1] <= cr_reg[0];
cr_reg[0] < cr_reg[15]^din;
cr_reg[15] <= cr_reg[15]^din^cr_reg[14];
If a CRC error is detected, configuration is halted
and must be restarted.
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XCR3320: 320 Macrocell SRAM CPLD
Compression Bits:
Compressed Frame
This 2-bit field defines the use of compression of the data
packets.
11
ADDRESS
MSB
1 (0)
2 (11)
00 - Standard mode:
The data packet contains both address and data
01 - Reset mode:
The data packet contains only the address field.
This pattern causes the configuration register to be
reset.
STOP BIT
ALIGN BITS
LSB
SP00597
igure 14: Compressed Frame
10 - Hold mode:
The data packet contains only the address field.
This pattern causes the configuration register to
hold its value.
The compressed frame contains no data.
11 - Set mode:
User Code Frame
The data packet contains only the address field.
This pattern causes the configuration register to be
set.
11
274
24
32
216
1 (0)
2 (11)
LENGTH
COUNT
DEVICE
ID
USER
CODE
STOP
BIT
ALIGN
BITS
Data Frames
ADDRESS UNUSED
MSB
The four types of data frames are standard, compressed,
user_code, and isc_code. All fields must be completely
filled, with 1s used to fill unused bits. The definition of each
frame is described below:
LSB
SP00598
Figure 15: User Code Frame
Standard Frame
The user code is located at address 336.
11
546
1 (0)
2 (11)
Length Count:
This is a 24 bit field containing the length of the
data stream transmitted to configure all of the
devices in the daisy chain. This field is only used by
a XCR3320 if it is in the master mode.
ADDRESS
DATA FRAME
STOP BIT
ALIGN BITS
MSB
LSB
SP00595
Device ID:
igure 13: Standard Frame
Address:
This is a 32-bit field containing XCR3320 device ID:
0000_001_001_010000_1_000_00000010101_1
User Code:
This is an 11 bit field for providing 338 (336 SRAM
plus 2user) addresses.
This is a 216 bit field reserved for user information.
ISC Code Frame
Data:
546 bit field.
The isc_code address is 337.
Stop bit:
This is a one bit field which must be 0.
11
2
272
272
1 (0)
2 (11)
ADDRESS
ISC CODE
UNUSED
STOP BIT
ALIGN BITS
Align bit:
This is a two bit field which must be 11.
MSB
LSB
UNUSED
SP00599
Figure 16: ISC Frame
The ISC frame allows the user to write an ISC code to the
device.
15
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XCR3320: 320 Macrocell SRAM CPLD
command, whether a single serial EEPROM is used or mul-
tiple serial ROMs are cascaded, whether the serial
EEPROM contains a single or multiple configuration pro-
grams, etc.
Reconfiguration
To reconfigure the XCR3320 when the device is operating
in the system, a low pulse is input into prgmn. The I/Os not
used for configuration are 3-stated. The XCR3320 then
samples the mode select inputs and begins re-configura-
tion. The mode pins are continuously sampled, so the sig-
nals must be stable while prgmn is low. When configuration
is compete, done is released, allowing it to be pulled high.
Data is read into the XCR3320 sequentially from the serial
ROM. The DATA output from the serial EEPROM is con-
nected directly into the din input of the XCR3320. The cclk
output from the XCR3320 is connected to the CLOCK input
of the serial EEPROM. During the configuration process,
cclk clocks one data bit into the XCR3320 on each rising
edge.
CRC Error Checking
CRC checking is done on each frame if enabled by setting
the CRCen bit in the header. If there is an error, a CRC
error is flagged by pulling crcerrn low. The XCR3320 is
forced into the initialization state, and then moves into the
configuration state after prgmn and resetn go high. The
XCR3320 will also pull crcerrn low if an invalid preamble is
detected within a configuration data packet.
Since the data and clock are direct connects, the
XCR3320/serial EEPROM interface task is to use the sys-
tem or XCR3320 to enable the RESET/OE and CE of the
serial EEPROM(s). The serial EEPROM’s RESET/OE is
programmable to function with RESET active-low and OE
active-high, which allows hdc from the XCR3320 to control
this function.
XCR3320 Configuration Modes
Likewise, the serial EEPROM could be programmed to
function with RESET active high and OE active low, allow-
ing the ldcn pin from the XCR3320 to control this function.
The XCR3320 done pin is connected to the serial
EEPROM CE to enable the EEPROMs during configuration
and disable them when configuration is complete.
The method for configuring the XCR3320 is selected by the
m0, m1, and m2 inputs. The m3 input should be high for all
modes. In master modes, cclk is an output with a nominal
frequency of 1 MHz. In slave modes, cclk is an input with a
maximum frequency of 10 MHz if configuring only a single
device, and 1 MHz if devices are daisy chained.
In Figure 17, the serial EEPROMs RESET/OE pin has
been programmed to function with RESET active low and
OE active high, and it is controlled by the XCR3320’s hdc
pin. This resets the serial EEPROMs during the initializa-
tion state and enables their output during the configuration
state. If a bit error is found during configuration, hdc will go
low, signifying the XCR3320 is back in initialization state
and also resetting the EEPROMs. This restarts the config-
uration process.
Master Serial Mode
In the master serial mode, the XCR3320 loads the configu-
ration data from an external serial ROM. The configuration
data is either loaded automatically at start-up or on a com-
mand to reconfigure. Serial EEPROMs from Altera, Atmel,
Lucent, Microchip, and Xilinx can be used to configure the
XCR3320 in the master serial mode. This provides a simple
four-pin interface in an eight-pin package. Serial EEPROMs
are available in 32K, 64K, 128K, 256K, and 1M bit densi-
ties.
The XCR3320 done pin is routed to the CE pin of the
EEPROMs. The Low signal on done during configuration
enable the serial EEPROMs. At the completion of configu-
ration, the High on done disables the EEPROMs.
Configuration in the master serial mode can be done at
power-up and/or upon a configure command. The system
or the XCR3320 must activate the serial EEPROM’s
RESET/OE and CE inputs. At power-up, the XCR3320 and
serial EEPROM each contain internal power-on reset cir-
cuitry which allows the XCR3320 to be configured without
the system providing an external signal. The power-on
reset circuitry causes the serial EEPROMs’ internal
address pointer to be reset. After power-up, the XCR3320
automatically enters its initialization phase.
In Figure 17, a serial EEPROM is programmed to configure
a XCR3320. When configuration data requirements exceed
the capacity of a single serial EEPROM, multiple serial
EEPROMs can be cascaded to support the configuration of
a single (or multiple) XCR3320(s). After the last bit from the
first serial ROM is read, the serial ROM outputs CEO Low
and 3-states the DATA output. The next serial ROM recog-
nizes the Low on CE input and outputs configuration data
on the DATA output. After configuration is complete, the
XCR3320’s done output into CE disables the serial
EEPROMs.
The serial EEPROM/XCR3320 interface used depends on
such factors as the availability of a system reset pulse,
availability of an intelligent host to generate a configure
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XCR3320: 320 Macrocell SRAM CPLD
TO DAISY–CHAINED
DEVICES
dout
din
DATA
CLK
cclk
done
hdc
CE
RESET/OE
V
V
CC
CC
CEO
XCR3320
prgmn
resetn
V
EXTERNAL
CONTROLLER
IF DESIRED
CC
M3
M2
M1
M0
SP00666
Figure 17: Master Serial Configuration
t
CL
CCLK
t
CH
t
S
t
H
DIN
BIT N
t
D
DOUT
BIT N
SP00584
Figure 18: Master Serial Configuration Mode Timing Diagram
Table 5: Master Serial Configuration Mode Timing Characteristics
Symbol
tS
Parameter
Min.
60
Nom.
Max.
Unit
ns
din setup time
-
-
-
tH
din hold time
0
-
ns
tD
cclk to dout delay
cclk low time (M3 = 1)
cclk high time (M3 = 1)
cclk frequency (M3 = 1)
-
-
300
833
833
1.4
ns
tCL
tCH
tC
357
357
0.6
500
500
1.0
ns
ns
MHz
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XCR3320: 320 Macrocell SRAM CPLD
Master Parallel Mode
In applications in which a serial EEPROM stores multiple
configuration programs, the subsequent configuration pro-
gram(s) are stored in EEPROM locations that follow the last
address for the previous configuration program. The user
must ensure that the serial EEPROMs address pointer is
not reset, causing the first device configuration to be
reloaded.
The master parallel configuration mode is generally used to
interface to industry-standard byte-wide memory such as
256K and larger EEPROMs. Figure 19 provides the inter-
face for master parallel mode. The XCR3320 outputs a
20-bit address on A[19:0] to memory and reads one byte of
configuration data every eighth cclk. The parallel bytes are
internally serialized starting with the least significant bit,
D0. The starting memory address is 00000 Hex and the
XCR3320 increments the address for each byte loaded.
The starting address is output when the device enters the
configuration state. The XCR3320 latches the data byte on
the second rising edge of cclk. This next data byte is
latched in the XCR3320 seven cclk cycles later.
Contention on the XCR3320’s din pin must be avoided.
During configuration, din receives configuration data. After
configuration, it is a user I/O.
DESIGN COMPILATION AND FIT
jed
jed2mcs
download
PROM PROGRAMMER
SLAVE SERIAL CONFIGURATION
SP00676
Figure 19: Master
A[19:0]
t
S
t
H
D[7:0]
CCLK
DOUT
BYTE N
BYTE N + 1
t
CH
t
CL
D0
D1
D2
D3
D4
D5
D6
D7
D0
D1
D2
D3
t
D
BYTE N
BYTE N + 1
SP00585
Figure 20: Master Parallel Configuration Mode Timing Diagram
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XCR3320: 320 Macrocell SRAM CPLD
.
Table 6: Master Parallel Configuration Mode Timing Characteristics
Symbol
tAV
Parameter
Min.
0
Nom.
Max.
200
-
Unit
ns
cclk to address valid
-
tS
D[7:0] setup time to cclk high
60
0
ns
tH
D[7:0] hold time from cclk high
cclk low time
-
ns
tCL
tCH
tD
M3 = 1
M3 = 1
357
357
-
500
500
833
833
300
1.4
ns
cclk high time
ns
cclk to dout delay
cclk frequency
ns
fC
M3 = 1
0.6
1.0
MHz
XCR3320 for daisy-chained devices. Note that the cclk fre-
quency for daisy-chained operation is limited to 1 MHz.
Synchronous Peripheral Mode
In the synchronous peripheral mode, byte-wide data is
input into D[7:0] on the rising edge of the cclk input. The
first data byte is clocked in on the second cclk after hdc
goes high. Subsequent data bytes are clocked in on every
eighth rising edge of cclk. The process repeats until all of
the data is loaded into the XCR3320. The serial data
begins shifting out on dout 0.5 cycles after the parallel data
was loaded. It requires additional cclks after the last byte is
loaded to complete the shifting. Figure 21 shows the inter-
face for synchronous peripheral mode. When configuring a
single device, the frequency of cclk can be up to 10 MHz.
As with master modes, this mode can be used for the lead
Also note that CS1 is a multi-function pin, which means that
it is available as a user I/O during normal device operation.
As with all user I/O on the XCR3320, CS1 has an internal
pull-down resistor that is automatically activated if the I/O
pin is not used (see “Terminations” on page 8 for more
information). If CS1 is left attached to VCC after configura-
tion, and it is not used as an I/O, the internal pull-down must
be disabled or a path from VCC to ground is created. To dis-
able the pull-down, use the XPLA property statement
‘signal name:pin number tri-state’ to disable
the resistor.
TO DAISY-CHAINED
DEVICES
8
D[7:0]
dout
done
crcerrn
cclk
MICRO–
PROCESSOR
OR
V
prgmn
CC
V
SYSTEM
CC
XCR3320
cs1
EXTERNALLY CONTROLLED
IF DESIRED
resetn
cs0n
wrn
M3
M2
SPMI
SEE TABLE 9
M1
M0
SP00675
Figure 21: Synchronous Peripheral Configuration
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XCR3320: 320 Macrocell SRAM CPLD
t
CH
CCLK
CS0N
t
CL
CS1
hdc
t
H
t
S
D[7:0]
DOUT
BYTE 0
BYTE 1
D7
t
D
D0
D1
D2
D3
D4
D5
D6
D0
D1
SP00609
Figure 22: Synchronous Peripheral Configuration Mode Timing Diagram
Table 7: Synchronous Peripheral Configuration Mode Timing Characteristics
Symbol Parameter
tS
Min.
20
0
Max.
Unit
ns
D[7:0] setup time
D[7:0] hold time
cclk high time
0
-
tH
ns
tCH
Single device
50
500
50
500
-
-
ns
Daisy-chain device
Single device
-
ns
tCL
fC
cclk low time
-
ns
Daisy-chain device
Single device
-
ns
cclk frequency
10
1
MHz
MHz
Daisy-chain device
-
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XCR3320: 320 Macrocell SRAM CPLD
Slave Serial Mode
ation, cclk is routed into all slave serial mode devices in
parallel and the frequency is limited to 1 MHz. The dout pin
of the lead device is connected to the din pin of the next
device and so on. In daisy-chained operation, all down-
stream devices use slave serial mode regardless of the
configuration mode of the lead device.
Figure 23 shows the interface for the slave serial configura-
tion mode. The configuration data is provided into the
XCR3320’s din input synchronous with the cclk input. After
the XCR3320 has loaded its configuration data, it re-trans-
mits incoming configuration data on dout. When configur-
ing a single device, the frequency of cclk can be up to 10
MHz.
Multiple slave XCR3320s can be loaded with identical con-
figurations simultaneously. This is done by loading the con-
figuration data into the din inputs in parallel.
A device in slave serial mode can be used as the lead
device in a daisy-chain. When used in daisy-chained oper-
TO DAISY–CHAINED
DEVICES
dout
XCR3320
crcerrn
prgmn
done
cclk
MICRO–
PROCESSOR
OR
DOWNLOAD
CABLE
V
CC
din
EXTERNALLY CONTROLLED
IF DESIRED
V
CC
resetn
M3
M2
M1
M0
SP00668
Figure 23: Slave Serial Configuration Schematic
BIT N – 1
BIT N
BIT N + 1
DIN
t
S
t
H
CCLK
DOUT
t
D
t
CL
t
CH
BIT N
BIT N + 1
BIT N – 1
SP00610
Figure 24: Slave Serial Configuration Mode Timing Diagram
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XCR3320: 320 Macrocell SRAM CPLD
Table 8: Slave Serial Configuration Mode Timing Characteristics
Symbol
tS
Parameter
Min
20
0
Max.
Unit
ns
din setup time
din hold time
cclk high time
0
-
tH
ns
tCH
Single device
50
500
50
500
-
-
ns
Daisy-chain device
Single device
-
ns
tCL
fC
cclk low time
-
ns
Daisy-chain device
Single device
-
ns
cclk frequency
10
1
MHz
MHz
Daisy-chain device
-
cycles after the parallel data was loaded. It requires addi-
tional cclks after the last byte is loaded to complete the
shifting. Figure 25 shows the interface for slave parallel
mode. When configuring a single device, the frequency of
cclk can be up to 10 MHz.
Slave Parallel Mode
The slave parallel mode is essentially the same as the syn-
chronous peripheral mode, except that the chip select pins
(cs1 and cs0n) are not used. As in the synchronous periph-
eral mode, byte-wide data is input into D[7:0] on the rising
edge of the cclk input. The first data byte is clocked in on
the second cclk after hdc goes High. Subsequent data
bytes are clocked in on every eighth rising edge of cclk. The
process repeats until all of the data is loaded into the
XCR3320. The serial data begins shifting out on dout 0.5
As with synchronous peripheral mode, the slave parallel
mode can be used as the lead XCR3320 for daisy-chained
devices. Note that the cclk frequency for daisy-chain oper-
ation is limited to 1 MHz.
TO DAISY–CHAINED
DEVICES
dout
XCR3320
crcerrn
prgmn
MICRO–
PROCESSOR
done
V
cclk
CC
8
D[7:0]
EXTERNALLY CONTROLLED
IF DESIRED
V
CC
resetn
M3
CS1
M2
M1
M0
WRN
CS0N
SP00669
Figure 25: Slave Parallel Configuration Schematic
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XCR3320: 320 Macrocell SRAM CPLD
t
CH
CCLK
t
CL
hdc
t
H
t
S
D[7:0]
DOUT
BYTE 1
D7
BYTE 0
t
D
D0
D1
D2
D3
D4
D5
D6
D0
D1
SP00654
Figure 26: Slave Parallel Configuration Mode Timing Diagram
Table 9: Slave Parallel Configuration Mode Timing Characteristics
Symbol
tS
Parameter
Min.
20
0
Max.
Unit
ns
D[7:0] setup time
D[7:0] hold time
cclk high time
0
-
tH
ns
tCH
Single device
50
500
50
500
-
-
ns
Daisy-chain device
Single device
-
ns
tCL
fC
cclk low time
-
ns
Daisy-chain device
Single device
-
ns
cclk frequency
10
1
MHz
MHz
Daisy-chain device
-
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XCR3320: 320 Macrocell SRAM CPLD
high when all devices in the daisy-chain have completed
configuration. All devices now move to the start-up state
simultaneously.
Daisy Chain Operation
Multiple XCR3320s can be configured by using a
daisy-chain of XCR3320s. Daisy-chaining uses a lead
XCR3320 and one or more XCR3320s configured in slave
serial mode. The lead XCR3320 can be configured in any
mode. Figure 27 shows the connections for loading multiple
XCR3320s in a daisy-chain configuration with the lead
devices configured in master parallel mode. Figure 28
shows the connections for loading multiple XCR3320’s with
the lead device configured in master serial mode.
The generation of cclk for the daisy-chained devices which
are in slave serial mode differs depending on the configura-
tion mode of the lead device. A master parallel mode device
uses its internal timing generator to produce an internal
cclk. If the lead device is configured in either synchronous
peripheral, slave serial mode, or slave parallel mode, cclk is
an input and is mated to the lead device and to all of the
daisy-chained devices in parallel. The configuration data is
read into din of slave devices on the positive edge of cclk,
and shifted out dout on the negative edge of cclk. Note that
daisy-chain operation is limited to a cclk frequency of
1 MHz. If a CRC error or an invalid preamble is detected by
a slave device, crcerrn will be pulled low and in turn pull
prgmn low, halting configuration for all devices. If a CRC
error is detected by the master device, hdc will be pulled
low, resetting the EEPROM to the first address and restart-
ing configuration.
Daisy-chained XCR3320s are connected in series. An
upstream XCR3320 which has received the preamble out-
puts a high on dout, ensuring that downstream XCR3320s
do not receive frame start bits. When the lead device
receives the postamble, its configuration is complete. At
this point, the configuration RAM of the lead device is full
and its done pin is released. The lead device continues to
load configuration data until the internal frame bit counter
reaches the length count or all the done pins of the chain
have gone high. Since the configuration RAM of the lead
device is full, this data is shifted out serially to the down-
stream devices on the dout pin. As the configuration is
completed for the downstream devices, each will release its
done pin. Because the done pins of each device in the
chain are wire-anded together, the done pin will be pulled
The development software can create a composite configu-
ration file for configuring daisy-chained XCR3320s. The
configuration data consists of multiple concatenated data
packets.
cclk
cclk
din
cclk
dout
dout
dout
din
A[19:0]
MASTER
A[19:0]
EEPROM
SLA
SLAVE #2
VE #1
PARALLEL/LEAD
D[7:0]
D[7:0]
V
CC
done
done
done
OE
CE
prgmn
prgmn
prgmn
V
V
CC
CC
V
CC
crcerrn
crcerrn
crcerrn
M3
M2
M1
M0
M3
M2
M1
M0
M3
M2
M1
M0
PROGRAM
V
CC
hdc
ldcn
hdc
ldcn
hdc
ldcn
SP00670
Figure 27: Daisy-Chain Schematic with Lead Device in Master Parallel
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XCR3320: 320 Macrocell SRAM CPLD
V
CC
cclk
din
cclk
din
cclk
din
cclk
dout
dout
dout
dout
V
CC
V
CC
MASTER SERIAL
LEAD
SLAVE #1
SLAVE #2
EEPROM
pgrmn
resetn
pgrmn
resetn
pgrmn
resetn
done
done
done
reset/OE
CE
V
V
V
CC
CC
CC
crcerrn
hdc
crcerrn
hdc
crcerrn
hdc
M3
M2
M1
M0
M3
M2
M1
M0
M3
M2
M1
M0
SP00665
Figure 28: Daisy Chain Schematic with Master Serial Lead Device
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XCR3320: 320 Macrocell SRAM CPLD
-
Reduces/eliminates the need for expensive test
equipment
JTAG Testing Capability
JTAG is the commonly-used acronym for the Boundary
Scan Test (BST) feature defined for integrated circuits by
IEEE Standard 1149.1. This standard defines input/output
pins, logic control functions, and commands which facilitate
both board and device level testing without the use of spe-
cialized test equipment. BST provides the ability to test the
external connections of a device, test the internal logic of
the device, and capture data from the device during normal
operation. BST provides a number of benefits in each of the
following areas:
-
-
Reduces test preparation time
Reduces spare board inventories
The Xilinx XCR3320's JTAG interface includes a TAP Port
and a TAP Controller, both of which are defined by the IEEE
1149.1 JTAG Specification. As implemented in the Xilinx
XCR3320, the TAP Port includes five pins (refer to
Table 10) described in the JTAG specification: tCK, tMS, tDI,
DO, and tRSTN. These pins should be connected to an
external pull-up resistor to keep the JTAG signals from
floating when they are not being used.
t
•
Testability
Table 11 defines the dedicated pins used by the mandatory
JTAG signals for the XCR3320.
-
Allows testing of an unlimited number of
interconnects on the printed circuit board
Testability is designed in at the component level
Enables desired signal levels to be set at specific
pins (Preload)
Data from pin or core logic signals can be examined
during normal operation
-
-
The JTAG specifications define two sets of commands to
support boundary-scan testing: high-level commands and
low-level commands. High-level commands are executed
via board test software on an a user test station such as
automated test equipment, a PC, or an engineering work-
station (EWS). Each high-level command comprises a
sequence of low level commands. These low-level com-
mands are executed within the component under test, and
therefore must be implemented as part of the TAP Control-
ler design. The set of low-level boundary-scan commands
implemented in the XCR3320 is defined in Table 11. By
supporting this set of low-level commands, the XCR3320
allows execution of all high-level boundary-scan com-
mands.
-
•
Reliability
-
-
-
-
Eliminates physical contacts common to existing test
fixtures (e.g., “bed-of-nails”)
Degradation of test equipment is no longer a
concern
Facilitates the handling of smaller, surface-mount
components
Allows for testing when components exist on both
sides of the printed circuit board
•
Cost
Table 10: JTAG Pin Description
Pin
Name
Description
tck
Test Clock Output
Clock pin to shift the serial data and instructions in and out of the tdi and tdo pins,
respectively. tck is also used to clock the TAP Controller state machine.
tms
Test Mode Select
Serial input pin selects the JTAG instruction mode. tms should be driven high during
user mode operation.
tdi
Test Data Input
Serial input pin for instructions and test data. Data is shifted in on the rising edge of tck.
tdo
Test Data Output
Serial output pin for instructions and test data. Data is shifted out on the falling edge of
tck. The signal is tri-stated if data is not being shifted out of the device.
trstn
Test Reset
Forces TAP controller to test logic reset state. This signal is active low.
Table 11: XCR3320 JTAG Pinout by Package Type
Device: XCR3320
(Pin Number / Macrocell #)
tCK
V4
41
tMS
W4
43
tDL
U5
42
tDO
Y4
44
tRSTN
L18
97
256-pin PBGA
160-pin LQFP
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XCR3320: 320 Macrocell SRAM CPLD
Table 12: XCR3320 Low-Level JTAG Boundary-Scan Commands
Instruction
(Instruction Code)
Register Used
Description
The mandatory SAMPLE/PRELOAD instruction allows a snapshot of the normal
operation of the component to be taken and examined. It also allows data values to be
loaded onto the latched parallel outputs of the Boundary-Scan Shift-Register prior to
selection of the other boundary-scan test instructions.
SAMPLE/PRELOAD
(00010)
Boundary-Scan Register
EXTEST
(00000)
Boundary-Scan Register
The mandatory EXTEST instruction allows testing of off-chip circuitry and board level
interconnections. Data would typically be loaded onto the latched parallel outputs of
Boundary-Scan Shift-Register using the SAMPLE/PRELOAD instruction prior to
selection of the EXTEST instruction.
BYPASS
(11111)
Bypass Register
Places the 1-bit bypass register between the tdi and tdo pins, which allows the BST
data to pass synchronously through the selected device to adjacent devices during
normal device operation. The BYPASS instruction can be entered by holding tdi at a
constant high value and completing an Instruction-Scan cycle.
IDCODE
(00001)
Boundary-Scan Register
Selects the IDCODE register and places it between tdi and tdo, allowing the IDCODE
to be serially shifted out of tdo. The IDCODE instruction permits blind interrogation of
the components assembled onto a printed circuit board. Thus, in circumstances where
the component population may vary, it is possible to determine what components exist
in a product.
HIGHZ
(00101)
Bypass Register
The HIGHZ instruction places the component in a state in which all of its system logic
outputs are placed in an inactive drive state (e.g., high impedance). In this state, an
in-circuit test system may drive signals onto the connections normally driven by a
component output without incurring the risk of damage to the component. The HIGHZ
instruction also forces the Bypass Register between tDI and tDO.
INTEST
(00011)
Boundary-Scan Register
The INTEST instruction allows testing of the on-chip system logic while the component
is assembled on the board. The boundary-scan register is connected between TDI and
TDO. Using the INTEST instruction, test stimuli are shifted in one at a time and applied
to the on-chip system logic. The test results are captured into the boundary-scan
register and are examined by subsequent shifting, Data would typically be loaded onto
the latched parallel outputs of boundary-scan shift-register stages using the
SAMPLE/PRELOAD instruction prior to selection of the INTEST instruction.
NOTE: Following use of the INTEST instruction, the on-chip system logic may be in an
indeterminate state that will persist until a system reset is applied. Therefore, the
on-chip system logic may need to be reset on return or normal (i.e., non-test)
operation.
27
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XCR3320: 320 Macrocell SRAM CPLD
TCK
TMS
t
S
t
H
t
t
CL
CH
TDI
t
D
TDO
SP00613
Figure 29: Boundary Scan Timing Diagram
Table 13: Boundary Scan Timing Characteristics
Symbol
tS
Parameter
Min
20
0
Max.
-
-
Unit
ns
tdi/tms to tck setup time
tdi/tms from tck hold time
tck high time
tH
ns
tCH
tCL
fTCK
tD
50
50
-
-
ns
tck low time
-
ns
tck frequency
10
35
MHz
ns
tck to tdo delay
-
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XCR3320: 320 Macrocell SRAM CPLD
PC-ISP software. Table 14 shows the ISC commands sup-
ported by the XCR3320
Device Configuration Through JTAG
In addition to the normal configuration modes, the
XCR3320 can also be configured through the JTAG port.
This feature is very useful for design prototyping and debug
before the device is put into the final product. In System
Configuration of the XCR3320 is supported by Xilinx
To configure the device through the JTAG port, mode pins
M0, M1, and M2 should all be held low. M3, as always,
should be high and the JTAG pins should be terminated as
described in “Terminations” on page 8 of this data sheet.
Table 14: Low Level ISP Commands
Instruction
(Register Used)
Instruction
Code
Description
Enable
(ISP Shift Register)
1001
Enables the Erase, Program, and Verify commands. Using the ENABLE
instruction before the Erase, Program, and Verify instructions allows the user
to specify the outputs the device using the JTAG Boundary-Scan
SAMPLE/PRELOAD command.
Erase
(ISP Shift Register)
1010
1011
Erases the entire EEPROM array. The outputs during this operation can be
defined by user by using the JTAG SAMPLE/PRELOAD command.
Program
(ISP Shift Register)
Programs the data in the ISP Shift Register into the addressed EEPROM row.
The outputs during this operation can be defined by user by using the JTAG
SAMPLE/PRELOAD command.
Verify
(ISP Shift Register)
1100
Transfers the data from the addressed row to the ISP Shift Register. The data
can then be shifted out and compared with the JEDEC file. The outputs during
this operation can be defined by the user.
29
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XCR3320: 320 Macrocell SRAM CPLD
Absolute Maximum Ratings1
Symbol
Parameter
Min
-0.5
-1.2
-0.5
-30
Max.
4.6
Unit
V
VCC
VIN
Supply voltage
Input voltage
Output voltage
Input current
5.75
VCC +0.5
30
V
VOUT
IIN
V
mA
°C
°C
TJ
Junction temperature range
Storage temperature range
-40
150
TSTG
Note:
-65
150
1. Stresses above these listed may cause malfunction or permanent damage to the device. This is a stress rating only.
Functional operation at these or any other condition above those indicated in the operational and programming specification
is not implied.
Operating Range
Product Grade
Commercial
Industrial
Temperature
Voltage
0 to 70°C
-40 to 85°C
3.3V ±10%
3.3V ±10%
DC Electrical Characteristics For Commercial Grade Devices
Commercial temperature range: VCC = 3.0V to 3.6V; 0°C < TAMB < 70°C
Symbol
VIH
Parameter
Test Conditions
Min.
Max.
Unit
Input high voltage
2.0
-0.3
5.5
0.8
-
V
V
VIL
Input low voltage
Output high voltage
Output low voltage
VOH
VOL
II
IOH = -8 mA
IOL = 8 mA
2.4
V
-
0.4
10
V
Input leakage current VI = 0 or 5.5V
-10
µA
µA
pF
pF
pF
kΩ
kΩ
ICCSB
CIN
Standby current
Input capacitance
I/O capacitance
TAMB = 25°C; no output loads, inputsatVCC or VSS
TAMB = 25°C; VCC = 3.3V; f = 1 MHz
TAMB = 25°C; VCC = 3.3V; f = 1 MHz
.
-
100
10
-
CIO
-
-
10
CCLK
RDONE
RPD
Clock pin capacitance TAMB = 25°C; VCC = 3.3V; f = 1 MHz
done pull-up resistor VCC = 3.0V; VIN = 0V
12
5
20
Unused I/O pull-down VCC = 3.6V; VIN = VCC
resistor
100
400
IOZH
IOZL
Input leakage
Input leakage
VIN = 5.5V or 3.6V
VIN = 0V
-10
-10
10
10
mA
mA
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XCR3320: 320 Macrocell SRAM CPLD
AC Electrical Characteristics For Commercial Grade Devices
Commercial temperature range: VCC = 3.0V to 3.6V; 0°C < TAMB < 70°C
Symbol
Parameter
C7
C10
Unit
Min. Max. Min. Max.
Timing Requirements
tCL
Clock LOW time
2.5
2.5
3.0
4.5
5.5
3.0
3.0
4.0
5.5
6.5
ns
ns
ns
ns
ns
ns
tCH
Clock HIGH time
tSU_PAL
tSU_PLA
tSU_XOR
tH
PAL setup time (Global clock)
PLA setup time (Global clock)
XOR setup time (Global clock)
Hold time (Global clock)
0
0
Output Characteristics
tPD_PAL
tPD_PLA
tPD_XOR
Input to output delay through PAL
Input to output delay through PLA
Input to output delay through XOR
7.5
9.0
10.0
11.5
12.5
6.0
ns
ns
ns
ns
10.0
4.5
tPDF_PAL Input (or feedback node) to internal feedback node delay time through
PAL
tPDF_PLA Input (or feedback node) to internal feedback node delay time through
PLA
6.0
7.0
7.5
8.5
ns
ns
tPDF_XOR Input (or feedback node) to internal feedback node delay time through
XOR
tCF
Global clock to feedback delay
3.0
6.0
1.0
3.5
7.5
1.5
ns
ns
tCO
Global clock to out delay
tCS
Clock skew (variance for switching outputs with common global clock)
Maximum flip-flop toggle rate:
ns
fMAX1
200
166
MHz
1
-------------------
CH
t
CL + t
fMAX2
Maximum internal frequency:
166
111
133
87
MHz
MHz
1
-----------------------------
CF
t
SU – PAL + t
fMAX3
Maximum external frequency:
1
-----------------------------
CO
t
SU – PAL + t
tBUFF
tSSR
tEA
Output buffer delay (fast)
3.0
5.0
4.0
6.0
ns
ns
Slow slew rate incremental delay
Output enable delay
10.0
10.0
10.0
10.0
10.5
9.5
12.0
12.0
12.0
12.0
12.0
11.0
12.0
2.5
ns
ns
ns
ns
ns
ns
ns
ns
tER
Output disable delay1
Global 3-state enable
Global 3-state disable
Input to register reset
Input to register preset
Global reset to register reset
Global ZIA delay
tGTSA
tGTSR
tRR
tRP
tGRR
tGZIA
Note:
10
2.0
1. Output CL = 5.0 pF.
31
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XCR3320: 320 Macrocell SRAM CPLD
DC Electrical Characteristics For Industrial Grade Devices
Industrial temperature range: VCC = 3.0V to 3.6V; -40°C < TAMB < 85°C
Symbol
VIH
Parameter
Input high voltage
Input low voltage
Output high voltage
Output low voltage
Test Conditions
Min.
2.0
-0.3
2.4
-
Max.
5.5
0.8
-
Unit
V
VIL
V
VOH
VOL
II
IOH = -8 mA
IOL = 8 mA
V
0.4
10
V
Input leakage current VI = 0 or 5.5V
-10
-
µA
µA
pF
pF
pF
kΩ
kΩ
ICCSB
CIN
Standby current
Input capacitance
I/O capacitance
Tamb = 25°C; no output loads, inputs at VCC or VSS
TAMB = 25°C; VCC = 3.3V; f = 1 MHz
TAMB = 25°C; VCC = 3.3V; f = 1 MHz
.
100
10
-
CIO
-
10
CCLK
RDONE
RPD
Clock pin capacitance TAMB = 25°C; VCC = 3.3V; f = 1 MHz
done pull-up resistor VCC = 3.0V; VIN = 0V
-
12
5
20
Unused I/O pull-down VCC = 3.6V; VIN = VCC
resistor
100
400
IOZH
IOZL
Input leakage
Input leakage
VIN = 5.5V or 3.6V
VIN = 0.0 V
-10
-10
10
10
mA
mA
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XCR3320: 320 Macrocell SRAM CPLD
AC Electrical Characteristics For Industrial Grade Devices
Industrial temperature range: VCC = 3.0V to 3.6V; -40°C < TAMB < 85°C
N8
Symbol
Parameter
Unit
Min.
Max.
Timing Requirements
tCL
Clock LOW time
Clock HIGH time
2.5
2.5
3.5
5.0
6.0
ns
ns
ns
ns
ns
ns
tCH
tSU_PAL
tSU_PLA
tSU_XOR
tH
PAL setup time (Global clock)
PLA setup time (Global clock)
XOR setup time (Global clock)
Hold time (Global clock)
0
Output Characteristics
tPD_PAL
tPD_PLA
tPD_XOR
tPDF_PAL
Input to output delay through PAL
8.5
10
ns
ns
ns
ns
Input to output delay through PLA
Input to output delay through XOR
11
Input (or feedback node) to internal feedback node
delay time through PAL
5.0
tPDF_PLA
tPDF_XOR
Input (or feedback node) to internal feedback node
delay time through PLA
6.5
7.5
ns
ns
Input (or feedback node) to internal feedback node
delay time through XOR
tCF
tCO
tCS
Global clock to feedback delay
Global clock to out delay
3.5
7.0
1.0
ns
ns
ns
Clock skew (variance for switching outputs with
common global clock)
fMAX1
Maximum flip-flop toggle rate:
200
MHz
1
-------------------
CH
t
CL + t
fMAX2
Maximum internal frequency:
143
95
MHz
MHz
1
-----------------------------
CF
t
SU – PAL + t
fMAX3
Maximum external frequency:
1
-----------------------------
CO
t
SU – PAL + t
tBUFF
tSSR
tEA
Output buffer delay (fast)
3.5
5.5
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Slow slew rate incremental delay
Output enable delay
11.0
11.0
11.0
11.0
11.5
10.0
11
tER
Output disable delay1
Global 3-state enable
Global 3-state disable
Input to register reset
Input to register preset
Global reset to register reset
Global ZIA delay
tGTSA
tGTSR
tRR
tRP
tGRR
tGZIA
Note:
2.5
1. Output CL = 5.0 pF.
33
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XCR3320: 320 Macrocell SRAM CPLD
Thevenin Equivalent
V
L
= 0.5 V
DD
200Ω
DUT OUTPUT
25 pF
SP00629
Voltage Waveform
+3.0V
90%
10%
0V
t
R
t
F
2.0 ns
2.0 ns
SP00630
MEASUREMENTS:
All circuit delays are measured at the +1.5V level of
inputs and outputs, unless otherwise specified.
Input Pulses
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XCR3320: 320 Macrocell SRAM CPLD
Device Pin Diagrams
XCR3320 256-pin Plastic BGA
A1 BALL PAD CORNER
20 19 18 17 16 15 14 13 12 11 10
9
8
7
6
5
4
3
2
1
A
B
C
D
E
F
G
H
J
K
L
OM VIEW
BOTT
M
N
P
R
T
U
V
W
Y
SP00671
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XCR3320: 320 Macrocell SRAM CPLD
Table 15: 230-pin Function Table
Function is Fast Module_Logic Block_Macrocell. For example, F1_0_56 means Fast Module 1, Logic Block 0, Macrocell 5.
Function Pkg Ball Function Pkg Ball Function Pkg Ball Function Pkg Ball Function Pkg Ball Function Pkg Ball
GND
A1
A2
F0_0_9
F0_0_10
F0_0_9
pgrm
C1
C2
F0_0_2*
F0_0_3
F0_0_4*
F0_0_5
F1_2_5
F1_2_4
F1_2_3
F1_2_2
E1
E2
clk_3
gts
L1
L2
F3_2_6*
F3_2_7
F3_2_8
GND
U1
U2
F3_2_11
GND
W1
W2
F0_2_11
F0_2_9
cclk
A3
C3
E3
GND
VCC
L3
U3
F3_0_9
tms
W3
A4
C4
E4
L4
U4
W4
F0_2_5*
F0_2_2*
F0_3_0
F0_3_3
F0_3_6
F0_3_9
F0_3_10
F1_1_10
F1_1_7
F1_1_4
F1_1_1
F1_0_1
F1_0_4
F1_0_8
F1_0_10
F1_0_11
A5
F0_2_7
F0_2_4
F0_2_1
F0_3_1
FO_3_4
F0_3_7
F1_1_11
F1_1_8
F1_1_5*
F1_1_2
F1_0_0
F1_0_3
F1_0_7
GND
C5
E17
E18
E19
E20
VCC
L17
L18
L19
L20
tdi
U5
F3_0_6
F3_0_3
F3_0_0*
F3_1_2
F3_1_5
F3_1_8
F3_1_11
F2_3_9
F2_3_6*
F2_3_3*
F2_3_0
F2_2_2*
F2_2_5*
F2_2_10
GND
W5
A6
C6
trstn
VCC
U6
W6
A7
C7
GND
CLK_7
VCC
U7
W7
A8
C8
VCC
U8
W8
A9
C9
GND
U9
W9
A10
A11
A12
A13
A14
A15
A16
A17
A18
A19
A20
C10
C11
C12
C13
C14
C15
C16
C17
C18
C19
C20
F0_1_1
F0_1_0*
F0_0_0*
F0_0_1
F1_2_1
F1_2_0
F1_3_0
F1_3_1
F1
F2
F3_3_11
F3_3_10
F3_3_9
GND
M1
M2
VCC
U10
U11
U12
U13
U14
U15
U16
U17
U18
U19
U20
W10
W11
W12
W13
W14
W15
W16
W17
W18
W19
W20
VCC
F3
M3
GND
F4
M4
VCC
F17
F18
F19
F20
GND
M17
M18
M19
M19
VCC
F2_1_9
F2_1_10
F2_1_11
F2_2_6
F2_2_8
GND
F2_0_8
F2_0_7
F2_0_6*
F1_2_10
F1_2_9
F0_1_4*
F0_1_3*
F0_1_2*
VCC
G1
G2
F3_3_8
F3_3_7
F3_3_6
F3_3_5
F2_1_5*
F2_1_6
F2_1_7
F2_1_8
N1
N2
F2_0_11
G3
N3
F0_0_11
GND
B1
B2
F0_0_6*
F0_0_7
F0_0_8
GND
D1
D2
G4
N4
F3_2_9
F3_2_10
GND
V1
V2
F3_0_11
F3_0_10
F3_0_8
tdo
Y1
Y2
VCC
G17
G18
G19
G20
N17
N18
N19
N20
F0_2_10
resetn
B3
D3
F1_3_2*
F1_3_3
F1_3_4*
V3
Y3
B4
D4
tck
V4
Y4
F0_2_6
F0_2_3
F0_2_0*
F0_3_2
F0_3_5
F0_3_8
F0_3_11
F1_1_9
F1_1_6*
F1_1_3
F1_1_0
F1_0_2
F1_0_5*
F1_0_9
GND
B5
F0_2_8
done
D5
F3_0_7
F3_0_4*
F3_0_1
F3_1_1
F3_1_4*
F3_1_7
F2_3_11
F2_3_8
F2_3_5*
F2_3_2
F2_2_0*
F2_2_3
F2_2_7
GND
V5
F3_0_5*
F3_0_2*
F3_1_0*
F3_1_3
F3_1_6
F3_1_9
F3_1_10
F2_3_10
F2_3_7
F2_3_4
F2_3_1*
F2_2_1
F2_2_4
F2_2_9
F2_2_11
GND
Y5
B6
D6
V6
Y6
B7
VCC
D7
F0_1_8
F0_1_7
F0_1_6
F0_1_5
F0_1_5
F1_3_6
F1_3_7
F1_3_8
H1
H2
F3_3_4
F3_3_3*
F3_3_2
VCC
P1
P2
V7
Y7
B8
VCC
D8
V8
Y8
B9
GND
D9
H3
P3
V9
Y9
B10
B11
B12
B13
B14
B15
B16
B17
B18
B19
B20
VCC
D10
D11
D12
D13
D14
D15
D16
D17
D18
D19
D20
H4
P4
V10
V11
V12
V13
V14
V15
V16
V17
V18
V19
V20
Y10
Y11
Y12
Y13
Y14
Y15
Y16
Y17
Y18
Y19
Y20
VCC
H17
H18
H19
H20
VCC
P17
P18
P19
P20
GND
F2_1_2
F2_1_3
F2_1_4
VCC
VCC
VCC
F1_0_6
GND
F0_1_11
F0_1_10
F0_1_9
GND
J1
J2
F3_3_1*
F3_3_0
F3_2_0
F3_2_1*
F2_0_1*
F2_0_0
F2_1_0
F2_1_1*
F3_2_2
F3_2_3*
F3_2_4
F3_2_5
F2_0_5
F2_0_4
F2_0_3*
F2_0_2
R1
R2
F1_2_8
F1_2_7
F1_2_6*
J3
R3
J4
R4
F2_0_10
F2_0_9
F1_2_11
GND
J17
J18
J19
J20
K1
R17
R18
R19
R20
T1
F1_3_9
F1_3_10
F1_3_10
clk_2
clk_1
K2
T2
clk_0
K3
T3
VCC
K4
T4
VCC
K17
K18
K19
K20
T17
T18
T19
T20
clk_4
clk_5
clk_6
*Represents multi-function pin
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XCR3320: 320 Macrocell SRAM CPLD
260-pin Description Table
Function is Fast Module_Logic block_Macrocell. For example, F1_0_5 means Fast Module 1, Logic block 0, Macrocell 5.
Table 16: Pin Description
Symbol
Pin Numbers Type
Description
VCC
D7, D8, D10,
D11, D13,
-
-
I
Positive power supply.
D14, D15, G4,
G17, K4, K17,
L4, L17, P4,
P17, U6, U7,
U8, U10, U11,
U13, U14
GND
A1, B2, B19,
C3, C18, D4,
D9, D12, D17,
J4, J17, L3,
L19, M4, M17,
U4, U9, U12,
U17, V3, V18,
W2, W19, Y20
Ground supply.
resetn
B4
During configuration, resetn forces the start of initialization. After configuration,
resetn is a direct input which can be used to asynchronously reset all the flip-flops. If
the global reset is not being used, this pin should be pulled high. If the rise time of the
prgmn signal is greater than 1 microsecond, this signal must be held low until prgmn
is high.
cclk
A4
D6
I/O In the master modes, cclk is an output which strobes configuration data in. In the
slave or synchronous peripheral mode, cclk is an input synchronous with the data on
din or D[7:0]. After configuration, this pin should be pulled low.
done
I/O done is a bi-directional signal with a weak pull-up resistor attached. As an output,
done pulling high indicates configuration is complete. As an input, a low level on done
will delay the enabling of user I/O. If only one device is used, this pin can be left
floating. If multiple devices are daisy chained, an external pull-up should be used.
prgmn
C4
I
prgmn is an active-low input that forces the restart of configuration and initialization
and resets the boundary-scan circuitry. After configuration, the pin should be pulled
high. This signal must have a rise time less than 1 microsecond. If the rise time of this
signal is greater than 1 microsecond, resetn must be held low until prgmn is high.
spmi
mpmi
din
Y5
O
O
I
Special purpose configuration pin that must be left floating during configuration for all
configuration modes. After configuration the pin is a user-programmable I/O, and no
external termination is required. See “Terminations” on page 8 for more information.
W13
E1
Special purpose configuration pin that must be left floating during configuration for all
configuration modes. After configuration the pin is a user-programmable I/O, and no
external termination is required. See “Terminations” on page 8 for more information.
During slave serial or master serial configuration modes, din accepts serial
configuration data synchronous with cclk. During parallel configuration modes, din is
the D[0] input. After configuration, the pin is a user-programmable I/O, and no
external termination is required. See “Terminations” on page 8 for more information.
M2
M0
M1
M3
N17
G18
G20
A6
I
I
M2/M1/M0 are used to select the configuration mode. After configuration, the pins are
user-programmable I/O, and no external termination is required. See “Terminations”
on page 8 for more information.
M3 should be pulled high during configuration for all configuration modes. After
configuration, the pin is a user-programmable I/O, and no external termination is
required. See “Terminations” on page 8 for more information.
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XCR3320: 320 Macrocell SRAM CPLD
Table 16: Pin Description (Continued)
Symbol
Pin Numbers Type
Description
tdi
tdo
tck
tms
trstn
U5
Y4
V4
W4
L18
I
O
I
I
I
Test Data In, Test Data Out, Test Clock, Test Mode Select, Test Reset are
dedicated pins for boundary-scan through the JTAG port. If JTAG is not being used,
tdi, tck, tms, and trstn should be terminated with a weak pull-up resistor. tdo can be
left unterminated. See “Terminations” on page 8 for more information.
hdc
B7
O
High During Configuration (hdc) is output high when the XCR3320 is in the
configuration state. hdc is used as a control output indicating that configuration is in
progress. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
ldcn
V9
O
Low During Configuration (ldcn) is output low when the XCR3320 is in the
configuration state. ldcnis used as a control output indicating that configuration is in
progress. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
crcerrn
C13
I/O crcerrn goes Low when the XCR3320 detects a CRC error or an invalid peramble
during configuration. The XCR3320 that detected the error will go into the initialization
state and will not resume configuration until prgmn and resetn are both high. Once
configuration has resumed crcerrn will go high. During configuration, an internal
pull-up is enabled. If only one device is used, this pin can be left floating. If multiple
devices are daisy chained, an external pull-up should be used. After configuration,
the pin is a user-programmable I/O, and no external termination is required. See
“Terminations” on page 8 for more information.
gts
L2
I
Global 3-state is an active-High dedicated input used to 3-state the I/Os and activate
the internal pull-down resistors. If this feature is not used, the pin should be pulled
Low.
cs0n
cs1
wrn
B17
W17
B13
I
cs0n/cs1/wrn are used in the peripheral configuration mode. The XCR3320 is
selected when cs0n and wrn are Low and cs1 is High. After configuration, these pins
are user-programmable I/O. cs0N and wrn require no external termination. See
“Terminations” on page 8 for more information. If cs1 is not used as an I/O after
configuration in synchronous peripheral mode, the 3-state property should be used
to disable the internal pull-down resistor. See the section on “Synchronous Peripheral
Mode” on page 19 for more information.
A[19:0]
N4, P2, R1,
R4, T2, P19,
U1, V6, Y6,
W7, Y7, V13,
W14, Y15,
V15, W16,
U20, T19,
O
In the master parallel configuration mode, A[19:0] address the configuration
EEPROM. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
R17, R20
D[7:0]
dout
G1, A5, G3,
D1, F2, F3, E3,
E1
I
During master parallel, peripheral, and slave parallel configuration modes, D[7:0]
receive configuration data. After configuration, the pin is a user-programmable I/O,
and no external termination is required. See “Terminations” on page 8 for more
information.
D20
O
During configuration, dout is the serial data out that is used to drive the din of
daisy-chained slave devices. Data on dout changes on the falling edge of cclk. After
configuration, the pin is a user-programmable I/O, and no external termination is
required. See “Terminations” on page 8 for more information.
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XCR3320: 320 Macrocell SRAM CPLD
XCR3320 - 160-Pin Plastic TQFP
160
121
120
1
TQFP
40
81
41
80
SP00672
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XCR3320: 320 Macrocell SRAM CPLD
Table 17: 160-pin Function Table
Function is Fast Module_Logic Block_Macrocell. For example, F1_0_5 means Fast Module 1, Logic Block 0, Macrocell 5.
Number
1
Function
F0_0_6*
F0_0_5
F0_0_4*
F0_0_3
F0_0_2*
F0_0_1
F0_0_0
GND
Number
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
Function
TCK
Number
Function
VCC
Number
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
Function
VCC
2
TDI
82
83
F2_0_6*
F2_0_5
F2_0_4
F2_0_3*
F2_0_2
F2_0_1*
F2_0_0
GND
F1_0_6
F1_0_5*
GND
3
TMS
4
TDO
84
5
F3_0_6
F3_0_5*
GND
85
F1_0_4
F1_0_3
F1_0_2
F1_0_1
F1_0_0
VCC
6
86
7
87
8
F3_0_4*
F3_0_3
F3_0_2*
F3_0_1
F3_0_0*
VCC
88
9
F0_1_0
F0_1_1
F0_1_2 *
F0_1_3
F0_1_4*
F0_1_5
VCC
89
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
90
F2_1_0
F2_1_1*
F2_1_2
F2_1_3*
F2_1_4
F2_1_5*
F2_1_6
TRSTN
GND
91
F1_1_0
F1_1_1
F1_1_2
F1_1_3
F1_1_4
F1_1_5*
GND
92
93
F3_1_0*
F3_1_1
F3_1_2
F3_1_3
F3_1_4*
F3_1_5
GND
94
95
F0_1_6
GND
96
97
clk_0
98
F1_1_6*
VCC
clk_1
99
VCC
clk_2
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
CLK_7
CLK_6
CLK_5
CLK_4
GND
F0_3_6
GND
clk_3
F3_1_6
VCC
gts
F0_3_5
F0_3_4
F0_3_3
F0_3_2
F0_3_1
F0_3_0
VCC
VCC
F2_3_6*
GND
GND
F3_3_6
F3_3_5*
F3_3_4
F3_3_3*
F3_3_2
F3_3_1*
F3_3_0
GND
F2_3_5*
F2_3_4
F2_3_4*
F2_3_2
F2_3_1*
F2_3_0
VCC
F1_3_6
VCC
F1_3_5
F1_3_4*
F1_3_3
F1_3_2*
F1_3_1
F1_3_0
GND
F0_2_0*
F0_2_1
F0_2_2*
F0_2_3
F0_2_4
GND
F2_2_0*
F2_2_1
F2_2_2*
F2_2_3
F2_2_4
GND
F3_2_0
F3_2_1*
F3_2_2
F3_2_3*
F3_2_4
F3_2_5
F3_2_6*
VCC
F1_2_0
F1_2_1
F1_2_2
F1_2_3
F1_2_4
F1_2_5
F1_2_6*
F0_2_5*
F0_2_6
CCLK
F2_2_5*
F2_2_6
VCC
DONE
RESETN
PGRM
*Represents multi-function pins
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XCR3320: 320 Macrocell SRAM CPLD
160 Pin Description Table
Function is Fast Module_Logic block_Macrocell. For example, F1_0_5 means Fast Module 1, Logic block 0, Macrocell 5.
Table 18: Pin Function Description
Symbol
Pin Number Type
Description
VCC
15, 23, 40, 53,
62, 71, 80, 81,
99, 106, 121,
130, 139, 148
-
Positive power supply.
Ground supply.
GND
8, 17, 24, 32,
47, 60, 64, 77,
89, 98, 104,
113, 124, 137,
141, 154
-
resetn
159
I
During configuration, resetn forces the start of initialization. After configuration,
resetn is a direct input which can be used to asynchronously reset all the flip-flops. If
the global reset is not being used, this pin should be pulled High. If the rise time of
the prgmn signal is greater than 1 µs, this signal must be held low until prgmn is High.
cclk
157
158
I/O In the master modes, cclk is an output which strobes configuration data in. In the
slave or synchronous peripheral mode, cclk is an input synchronous with the data on
din or D[7:0]. After configuration, this pin should be pulled Low.
done
I/O done is a bi-directional signal with a weak pull-up resistor attached. As an output,
done pulling High indicates configuration is complete. As an input, a Low level on
done will delay the enabling of user I/O. If only one device is used, this pin can be left
floating. If multiple devices are daisy chained, an external pull-up should be used.
prgmn
160
I
prgmn is an active-low input that forces the restart of configuration and initialization
and resets the boundary-scan circuitry. After configuration, the pin should be pulled
high. This signal must have a rise time less than 1 microsecond. If the rise time of this
signal is greater than 1 microsecond, resetn must be held low until prgmn is high.
spmi
mpmi
din
46
63
5
O
O
I
Special purpose configuration pin that must be left floating during configuration for all
configuration modes. After configuration the pin is a user-programmable I/O, and no
external termination is required. See “Terminations” on page 8 for more information.
Special purpose configuration pin that must be left floating during configuration for all
configuration modes. After configuration the pin is a user-programmable I/O, and no
external termination is required. See “Terminations” on page 8 for more information.
During slave serial or master serial configuration modes, din accepts serial
configuration data synchronous with cclk. During parallel configuration modes, din is
the D[0] input. After configuration, the pin is a user-programmable I/O, and no
external termination is required. See the section on terminations for more information.
M2
M0
M1
M3
95
I
I
M2/M1/M0 are used to select the configuration mode. After configuration, the pins are
user-programmable I/O, and no external termination is required. See “Terminations”
on page 8 for more information.
110
108
151
M3 should be pulled high during configuration for all configuration modes. After
configuration, the pin is a user-programmable I/O, and no external termination is
required. See “Terminations” on page 8 for more information.
tdi
tdo
tck
tms
trstn
42
44
41
43
97
I
O
I
I
I
Test Data In, Test Data Out, Test Clock, Test Mode Select, Test Reset are
dedicated pins for boundary-scan through the JTAG port. If JTAG is not being used,
tdi, tck, tms, and trstn should be terminated with a weak pull-up resistor. tdo can be
left unterminated. See “Terminations” on page 8 for more information.
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XCR3320: 320 Macrocell SRAM CPLD
Table 18: Pin Function Description (Continued)
Symbol
Pin Number Type
Description
hdc
149
O
High During Configuration (hdc) is output high when the XCR3320 is in the
configuration state. hdc is used as a control output indicating that configuration is in
progress. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
ldcn
58
O
Low During Configuration (ldcn) is output low when the XCR3320 is in the
configuration state. ldcnis used as a control output indicating that configuration is in
progress. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
crcerrn
136
I/O crcerrn goes Low when the XCR3320 detects a CRC error or an invalid peramble
during configuration. The XCR3320 that detected the error will go into the initialization
state and will not resume configuration until prgmn and resetn are both High. Once
configuration has resumed crcerrn will go High. During configuration, an internal
pull-up is enabled. If only one device is used, this pin can be left floating. If multiple
devices are daisy chained, an external pull-up should be used. After configuration,
the pin is a user-programmable I/O, and no external termination is required. See
“Terminations” on page 8 for more information.
gts
22
I
Global 3-state is an active-high dedicated input used to 3-state the I/Os and activate
the internal pull-down resistors. If this feature is not used, the pin should be pulled
Low.
cs0n
cs1
wrn
123
78
138
I
cs0n/cs1/wrn are used in the peripheral configuration mode. The XCR3320 is
selected when cs0n and wrn are Low and cs1 is High. After configuration, these pins
are user-programmable I/O. cs0N and wrn require no external termination. See
“Terminations” on page 8for more information. If cs1 is not used as an I/O after
configuration in synchronous peripheral mode, the 3-state property should be used
to disable the internal pull-down resistor. See “Synchronous Peripheral Mode” on
page 19 for more information.
A[19:0]
26, 28, 30, 34,
36, 93, 39, 48,
50, 52, 54, 65,
67, 69, 72, 74,
82, 85, 87, 91
O
In the master parallel configuration mode, A[19:0] address the configuration
EEPROM. After configuration, the pin is a user-programmable I/O, and no external
termination is required. See “Terminations” on page 8 for more information.
D[7:0]
dout
13, 155, 11, 1,
9, 7, 3, 5
I
During master parallel, peripheral, and slave parallel configuration modes, D[7:0]
receive configuration data. After configuration, the pin is a user-programmable I/O,
and no external termination is required. See “Terminations” on page 8 for more
information.
120
O
During configuration, dout is the serial data out that is used to drive the din of
daisy-chained slave devices. Data on dout changes on the falling edge of cclk.
After configuration, the pin is a user-programmable I/O, and no external termination
is required. See “Terminations” on page 8 for more information.
DS033 (v1.1) February 10, 2000
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R
XCR3320: 320 Macrocell SRAM CPLD
Ordering Information
Example: XCR3320 -7 TQ 144 C
Temperature Range
Number of Pins
Package Type
Device Type
Speed Options
Temperature Range
Speed Options
C = Commercial, TA = 0°C to +70°C
I = Industrial, TA = –40°C to +85°C
-10: 10 ns pin-to-pin delay
-8: 8 ns pin-to-pin delay
-7: 7.5 ns pin-to-pin delay
Packaging Options
TQ144: 144-pin TQFP
BG256: 256-ball BGA
Component Availability
Pins
144
256
Type
Plastic TQFP
Plastic BGA
Code
TQ144
BG256
XCR3320
-10
-8
C
I
C
I
-7
C
C
Revision Table
Date
Version #
Revision
8/19/99
2/10/00
1.0
1.1
Initial Xilinx release.
Converted to Xilinx Format and updated.
43
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