IRFR3209A [ETC]
TRANSISTOR | MOSFET | N-CHANNEL | 400V V(BR)DSS | 3.1A I(D) | TO-252AA ; 晶体管| MOSFET | N沟道| 400V V( BR ) DSS | 3.1AI (D ) | TO- 252AA\n型号: | IRFR3209A |
厂家: | ETC |
描述: | TRANSISTOR | MOSFET | N-CHANNEL | 400V V(BR)DSS | 3.1A I(D) | TO-252AA
|
文件: | 总7页 (文件大小:118K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
IRFR320, IRFU320
Data Sheet
January 2002
3.1A, 400V, 1.800 Ohm, N-Channel Power
MOSFETs
Features
• 3.1A, 400V
• r = 1.800Ω
These are N-Channel enhancement mode silicon gate
power field effect transistors. They are advanced power
MOSFETs designed, tested, and guaranteed to withstand a
specified level of energy in the breakdown avalanche mode
of operation. All of these power MOSFETs are designed for
applications such as switching regulators, switching
convertors, motor drivers, relay drivers, and drivers for high
power bipolar switching transistors requiring high speed and
low gate drive power. These types can be operated directly
from integrated circuits.
DS(ON)
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
• Related Literature
- TB334 “Guidelines for Soldering Surface Mount
Components to PC Boards”
Formerly developmental type TA17404.
Ordering Information
Symbol
D
PART NUMBER
IRFR320
IRFU320
PACKAGE
TO-252AA
TO-251AA
BRAND
IFR320
IFU320
G
NOTE: When ordering, use the entire part number. Add the suffix 9A
to obtain the TO-252AA variant in tape and reel, i.e., IRFR3209A.
S
Packaging
JEDEC TO-251AA
JEDEC TO-252AA
SOURCE
DRAIN
GATE
GATE
DRAIN
(FLANGE)
DRAIN
SOURCE
DRAIN (FLANGE)
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
IRFR320, IRFU320
o
Absolute Maximum Ratings
T = 25 C, Unless Otherwise Specified
C
IRFR320, IRFU320
UNITS
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
400
400
3.1
2.0
12
±20
50
0.4
190
V
V
A
A
A
V
W
DS
Drain to Gate Voltage (R
= 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
GS
DGR
Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
D
D
o
T
= 100 C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
C
Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
DM
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
GS
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
D
o
W/ C
mJ
AS
o
Operating and Storage Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Maximum Temperature for Soldering
T
-55 to 150
C
J, STG
o
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
300
260
C
L
o
Package Body for 10s, See Techbrief 334. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
C
pkg
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
o
o
1. T = 25 C to 125 C.
J
o
Electrical Specifications
T
= 25 C, Unless Otherwise Specified
C
PARAMETER
SYMBOL
TEST CONDITIONS
= 0V, (Figure 10)
MIN
400
2.0
-
TYP MAX UNITS
Drain to Source Breakdown Voltage
Gate Threshold Voltage
BV
I
= 250µA, V
D GS
-
-
-
-
-
-
4.0
25
250
-
V
V
DSS
V
V
V
V
V
= V , I = 250µA
DS
GS(TH)
GS
DS
DS
DS
D
Zero Gate Voltage Drain Current
I
= Rated BV
, V
DSS GS
= 0V
µA
µA
A
DSS
o
= 0.8 x Rated BV
, V
= 0V, T = 125 C
-
DSS GS
, V = 10V,
DS(ON)MAX GS
J
On-State Drain Current (Note 2)
Gate to Source Leakage Current
I
> I
D(ON)
x r
3.1
D(ON)
(Figure 7)
I
V
= ±20V
-
-
±100
nA
Ω
GSS
GS
= 1.7A, V
Drain to Source On Resistance (Note 2)
Forward Transconductance (Note 2)
Turn-On Delay Time
r
I
= 10V, (Figures 8, 9)
-
1.600 1.800
DS(ON)
D
GS
≥ 10V, I = 2.0A, (Figure 12)
g
V
1.7
2.6
10
14
30
13
13
-
S
fs
d(ON)
DS
D
t
V
V
= 200V, I ≈ 3.1A, R
= 18Ω, R = 63Ω,
-
-
-
-
-
15
21
45
20
20
ns
ns
ns
ns
nC
DD
GS
D
GS
L
= 10V
Rise Time
t
r
MOSFET Switching Times are Essentially Indepen-
dent of Operating Temperature
Turn-Off Delay Time
t
d(OFF)
Fall Time
t
f
Total Gate Charge
Q
V
= 10V, I = 3.1A, V
DS
= 0.8 x Rated BV
DSS,
g(TOT)
GS
D
(Gate to Source + Gate to Drain)
I
= 1.5mA, (Figure 14)
G(REF)
Gate Charge is Essentially Independent of Operat-
ing Temperature
Gate to Source Charge
Gate to Drain “Miller” Charge
Input Capacitance
Q
Q
-
-
-
-
-
-
2.2
7.2
350
64
3.3
nC
nC
pF
pF
pF
nH
gs
11
-
gd
C
V
= 25V, V = 0V, f = 1MHz, (Figure 11)
GS
ISS
DS
Output Capacitance
C
-
OSS
RSS
Reverse Transfer Capacitance
Internal Drain Inductance
C
8.1
4.5
-
L
Measured From the Drain Modified MOSFET
Lead, 6.0mm (0.25in) from Symbol Showing the
-
D
S
Package to Center
of Die
Internal Device
Inductances
D
Internal Source Inductance
L
Measured From the
Source Lead, 6.0mm
(0.25in) from Package to
Source Bonding Pad
-
7.5
-
nH
L
D
G
L
S
S
o
o
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
R
R
-
-
-
-
2.5
C/W
C/W
θJC
Typical Solder Mount
110
θJA
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
IRFR320, IRFU320
Source to Drain Diode Specifications
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
3.1
UNITS
Continuous Source to Drain Current
I
Modified MOSFET
Symbol Showing the In-
tegral Reverse P-N
Junction Rectifier
-
-
-
-
A
A
SD
D
Pulse Source to Drain Current
(Note 3)
I
12
SDM
G
S
o
Source to Drain Diode Voltage (Note 2)
V
T = 25 C, I
J
= 3.1A, V
= 0V,
-
-
1.6
V
SD
SD
GS
(Figure 13)
o
Reverse Recovery Time
Reverse Recovery Charge
NOTES:
t
T = 25 C, I
J
= 3.1A, dI /dt = 100A/µs
120
270
1.4
600
3.0
ns
rr
SD
SD
o
Q
T = 25 C, I
= 3.1A, dI /dt = 100A/µs
SD
0.64
µC
RR
J
SD
2. Pulse test: pulse width ≤ 300µs, duty cycle ≤ 2%.
3. Repetitive rating: pulse width limited by maximum junction temperature. See Transient Thermal Impedance curve (Figure 3).
o
4. V
DD
= 50V, starting T = 25 C, L = 3.1mH, R
= 25Ω, peak I = 3.1A.
GS AS
J
Typical Performance Curves Unless Otherwise Specified
1.2
1.0
0.8
0.6
0.4
0.2
4.0
3.2
2.4
1.6
0.8
0
0
125
25
50
75
100
125
150
0
25
50
75
100
175
150
o
o
T
, CASE TEMPERATURE ( C)
T , CASE TEMPERATURE ( C)
C
C
FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE
TEMPERATURE
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
CASE TEMPERATURE
10
0.5
1
0.2
P
DM
0.1
0.05
0.02
0.01
0.1
-2
t
t
1
2
NOTES:
DUTY FACTOR: D = t /t
SINGLE PULSE
1
2
PEAK T = P
x Z
x R + T
J
DM
θJC
θJC C
10
-5
-4
10
-3
10
-2
10
10
t , RECTANGULAR PULSE DURATION (s)
0.1
1
10
1
FIGURE 3. MAXIMUM TRANSIENT THERMAL IMPEDANCE
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
IRFR320, IRFU320
Typical Performance Curves Unless Otherwise Specified (Continued)
100
10
1
5
4
V
= 10V
GS
OPERATION IN THIS
AREA IS LIMITED
V
= 6.0V
GS
BY r
DS(ON)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
10µs
3
2
100µs
V
= 5.5V
GS
1ms
10ms
DC
V
= 5.0V
= 4.5V
GS
1
0
T
T
= MAX RATED
J
V
= 4.0V
GS
V
o
GS
= 25 C
C
SINGLE PULSE
0.1
0
40
80
120
160
200
1
10
100
1000
V
, DRAIN TO SOURCE VOLTAGE (V)
V , DRAIN TO SOURCE VOLTAGE (V)
DS
DS
FIGURE 4. FORWARD BIAS SAFE OPERATING AREA
FIGURE 5. OUTPUT CHARACTERISTICS
5
10
1
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 10V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
GS
V
Š≥ 350V
DS
4
V
= 6.0V
GS
3
2
V
= 5.5V
GS
o
o
T
= 150 C
T
= 25 C
J
J
0.1
-2
V
= 5.0V
= 4.5V
GS
1
0
V
= 4.0V
V
GS
GS
10
0
6
9
12
15
3
0
2
4
6
8
10
V
, DRAIN TO SOURCE VOLTAGE (V)
V
, GATE TO SOURCE VOLTAGE (V)
DS
GS
FIGURE 6. SATURATION CHARACTERISTICS
FIGURE 7. TRANSFER CHARACTERISTICS
10
8
3.0
2.4
1.8
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 10V, I = 1.7A
GS
D
V
= 10V
GS
6
V
= 20V
GS
1.2
0.6
4
2
0
0
-40
0
40
80
120
160
0
3
6
9
12
15
o
I , DRAIN CURRENT (A)
T , JUNCTION TEMPERATURE ( C)
D
J
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
IRFR320, IRFU320
Typical Performance Curves Unless Otherwise Specified (Continued)
1.25
1.15
1.05
750
600
450
300
150
0
I
= 250µA
V
= 0V, f = 1MHz
D
GS
ISS
C
C
C
= C
+ C
GS
= C
GD
RSS
OSS
GD
≈ C + C
DS
GD
C
ISS
C
OSS
0.95
0.85
C
RSS
0.75
-40
0
40
80
120
160
2
1
2
5
10
, DRAIN TO SOURCE VOLTAGE (V)
DS
2
5
10
o
T , JUNCTION TEMPERATURE ( C)
V
J
FIGURE 10. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
5
100
PULSE DURATION = 80µs
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
DUTY CYCLE = 0.5% MAX
V
= 0V
GS
4
o
10
1
T
= 25 C
J
3
o
o
o
T
= 150 C
T = 25 C
J
T
= 150 C
J
J
2
1
0
0.1
0
0.3
0.6
0.9
1.2
1.5
0
1
2
3
4
5
I , DRAIN CURRENT (A)
V , SOURCE TO DRAIN VOLTAGE (V)
SD
D
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENT
FIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
20
I
= 3.1A
D
V
V
V
= 320V
= 200V
= 80V
DS
DS
DS
16
12
8
4
0
0
4
8
12
16
20
Q
, TOTAL GATE CHARGE (nC)
G(TOT)
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
IRFR320, IRFU320
Test Circuits and Waveforms
V
DS
BV
DSS
L
t
P
V
DS
I
VARY t TO OBTAIN
P
AS
+
V
DD
R
REQUIRED PEAK I
G
AS
V
DD
-
V
GS
DUT
t
P
I
0V
AS
0
0.01Ω
t
AV
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT
FIGURE 16. UNCLAMPED ENERGY WAVEFORMS
t
t
ON
OFF
t
d(OFF)
t
d(ON)
t
t
f
r
R
L
V
DS
90%
90%
+
V
DD
10%
10%
R
G
0
0
-
DUT
90%
50%
V
GS
50%
PULSE WIDTH
10%
V
GS
FIGURE 17. SWITCHING TIME TEST CIRCUIT
FIGURE 18. RESISTIVE SWITCHING WAVEFORMS
V
DS
(ISOLATED
SUPPLY)
CURRENT
REGULATOR
V
DD
Q
SAME TYPE
AS DUT
g(TOT)
V
GS
12V
BATTERY
0.2µF
Q
gd
50kΩ
0.3µF
Q
gs
D
S
V
DS
G
DUT
0
0
I
G(REF)
0
V
I
DS
G(REF)
I
CURRENT
SAMPLING
RESISTOR
I
CURRENT
SAMPLING
RESISTOR
G
D
FIGURE 19. GATE CHARGE TEST CIRCUIT
FIGURE 20. GATE CHARGE WAVEFORMS
©2002 Fairchild Semiconductor Corporation
IRFR320, IRFU320 Rev. B
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
â
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STAR*POWER™
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OPTOLOGIC™
OPTOPLANAR™
PACMAN™
FASTr™
FRFET™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SyncFET™
GlobalOptoisolator™
GTO™
HiSeC™
ISOPLANAR™
LittleFET™
MicroFET™
MicroPak™
MICROWIRE™
CROSSVOLT™
DenseTrench™
DOME™
POP™
Power247™
PowerTrenchâ
QFET™
EcoSPARK™
E2CMOSTM
TinyLogic™
QS™
EnSignaTM
TruTranslation™
UHC™
QT Optoelectronics™
Quiet Series™
SILENTSWITCHERâ
FACT™
FACT Quiet Series™
UltraFETâ
STAR*POWER is used under license
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITYARISING OUT OF THE APPLICATION OR USE OFANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Obsolete
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4
相关型号:
IRFR320BTM
Power Field-Effect Transistor, 3.1A I(D), 400V, 1.75ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3
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