HM62V256LT-8SL [ETC]

x8 SRAM ; X8 SRAM\n
HM62V256LT-8SL
型号: HM62V256LT-8SL
厂家: ETC    ETC
描述:

x8 SRAM
X8 SRAM\n

内存集成电路 静态存储器 光电二极管
文件: 总17页 (文件大小:129K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HM62V256 Series  
256 k SRAM (32-kword × 8-bit)  
ADE-203-136F (Z)  
Rev. 6.0  
Nov. 1997  
Features  
Low voltage operation SRAM  
Operating Supply Voltage: 2.7 V to 3.6 V  
0.8 µm Hi-CMOS process  
High speed  
Access time: 70/85/100 ns (max)  
Low power  
Standby: 0.15 µW (typ)  
Completely static memory  
No clock or timing strobe required  
Directly LVTTL compatible: All inputs and outputs  
Ordering Information  
Type No.  
Access Time  
Package  
HM62V256LFP-10T  
100 ns  
450 mil 280 pin plastic SOP (FP-28DA)  
HM62V256LFP-7SLT  
HM62V256LFP-10SLT  
70 ns  
100 ns  
HM62V256LFP-8ULT  
HM62V256LT-10  
85 ns  
100 ns  
85 ns  
8 mm × 14 mm 32 pin TSOP (normal type) (TFP-32DA)  
8 mm × 13.4 mm 28-pin TSOP (normal type) (TFP-28DA)  
HM62V256LT-8SL  
HM62V256LTM-10  
100 ns  
HM62V256LTM-7SL  
HM62V256LTM-10SL  
70 ns  
100 ns  
HM62V256LTM-8UL  
85 ns  
HM62V256 Series  
Pin Arrangement  
HM62V256LT Series  
HM62V256LFPSeries  
OE  
A11  
NC  
A9  
A10  
CS  
1
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
WE  
A13  
A8  
A14  
A12  
A7  
2
2
NC  
3
3
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
VSS  
I/O2  
I/O1  
I/O0  
A0  
4
A8  
5
4
A6  
A13  
WE  
VCC  
A14  
A12  
A7  
6
5
A9  
A5  
7
8
6
A11  
OE  
A10  
A4  
9
7
A3  
10  
11  
12  
13  
14  
15  
16  
8
A2  
A6  
A5  
9
CS  
A1  
NC  
A4  
NC  
10  
11  
12  
13  
14  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
A0  
A1  
I/O0  
I/O1  
I/O2  
VSS  
A3  
A2  
(Top view)  
HM62V256LTM Series  
A10  
CS  
OE  
A11  
A9  
22  
23  
24  
25  
26  
27  
28  
1
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
10  
9
(Top view)  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
A8  
A13  
WE  
V
CC  
V
A14  
A12  
A7  
SS  
I/O2  
I/O1  
I/O0  
A0  
2
3
A6  
4
A5  
5
A1  
A2  
A4  
6
A3  
7
8
(Top view)  
Pin Description  
Pin name  
A0 to A14  
I/O0 to I/O7  
CS  
Function  
Address inputs  
Data input/output  
Chip select  
WE  
Write enable  
Output enable  
No connection  
Power supply  
Ground  
OE  
NC  
VCC  
VSS  
2
HM62V256 Series  
Block Diagram  
V CC  
V SS  
(MSB) A12  
A5  
A7  
Memory Matrix  
A6  
Row  
Decoder  
×
512 512  
A8  
A13  
A14  
A4  
(LSB) A3  
I/O0  
Column I/O  
Input  
Data  
Control  
Column Decoder  
I/O7  
A1 A0 A10 A9 A11  
A2  
(LSB)  
(MSB)  
Timing Pulse Generator  
Read/Write Control  
CS  
WE  
OE  
3
HM62V256 Series  
Function Table  
WE  
X
CS  
H
L
OE  
X
Mode  
VCC Current  
I/O Pin  
High-Z  
High-Z  
Dout  
Ref. Cycle  
Not selected  
Output disable  
Read  
ISB, ISB1  
ICC  
H
H
L
H
L
ICC  
Read cycle (1)–(3)  
Write cycle (1)  
Write cycle (2)  
L
L
H
L
Write  
ICC  
Din  
L
L
Write  
ICC  
Din  
Note: X: H or L  
Absolute Maximum Ratings  
Parameter  
Symbol  
Value  
Unit  
V
Power supply voltage*1  
Terminal voltage*1  
VCC  
–0.5 to 4.6  
–0.5*2 to VCC+0.5*3  
1.0  
VT  
V
Power dissipation  
PT  
W
Operating temperature  
Storage temperature  
Storage temperature under bias  
Notes: 1. Relative to VSS  
Topr  
Tstg  
Tbias  
0 to + 70  
°C  
°C  
°C  
–55 to +125  
–10 to +85  
2. VT min: –3.0 V for pulse half-width 50 ns  
3. Maximum voltage is 4.6V  
Recommended DC Operating Conditions (Ta = 0 to +70°C)  
Parameter  
Symbol  
VCC  
Min  
2.7  
Typ  
3.0  
0
Max  
Unit  
V
Supply voltage  
3.6  
VSS  
0
0
V
Input high(logic 1) voltage  
Input low(logic 0) voltage  
VIH  
0.7VCC  
–0.3 *1  
VCC+0.3  
0.2VCC  
V
VIL  
V
Note: 1. VT min: –3.0 V for pulse half-width 50 ns  
4
HM62V256 Series  
DC Characteristics (Ta = 0 to +70°C, VCC = 2.7 V to 3.6V, VSS = 0 V)  
Parameter  
Symbol Min  
Typ*1 Max Unit Test conditions  
Input leakage current  
Output leakage current  
|ILI|  
1
1
µA  
µA  
VSS Vin VCC  
|ILO|  
CS = VIH or OE = VIH or WE = VIL,  
VSS VI/O VCC  
Operating power supply current  
(DC)  
ICCDC1  
ICCDC2  
15  
10  
30  
mA  
mA  
mA  
CS = VIL, others = V /VIL  
IH  
II/O = 0 mA  
CS 0.2 V, VIH VCC – 0.2 V,  
VIL 0.2 V, II/O = 0 mA  
Average  
HM62V256-7 ICCAC1  
min cycle, duty = 100 %,  
operating power  
supply current  
II/O = 0 mA CS = VIL,  
others = VIH/VIL  
HM62V256-8 ICCAC1  
HM62V256-10 ICCAC1  
ICCAC2  
27  
24  
15  
mA  
Cycle time 1 µs, duty = 100%  
II/O = 0 mA, CS 0.2 V,  
VIH VCC – 0.2 V, VIL 0.2 V  
Standby power supply current  
ISB  
0.1  
1
mA  
CS = VIH  
ISB1  
0.05 50  
0.05 10*2  
0.05 4*3  
µA  
Vin 0 V, CS VCC – 0.2 V,  
Output low voltage  
Output high voltage  
VOL  
VOH  
0.2  
V
V
IOL = 20 µA  
VCC – 0.2 —  
IOH = –20 µA  
Notes: 1. Typical values are at VCC = 3.0 V, Ta = +25°C and not guaranteed.  
2. This characteristic is guaranteed only for L-SL version.  
3. This characteristic is guaranteed only for L-UL version.  
Capacitance (Ta = 25°C, f = 1.0 MHz)  
Parameter  
Symbol  
Cin  
Min  
Typ  
Max  
5
Unit  
pF  
Test Conditions  
Vin = 0 V  
Input capacitance*1  
Input/output capacitance*1  
CI/O  
8
pF  
VI/O = 0 V  
Note: 1. This parameter is sampled and not 100% tested.  
5
HM62V256 Series  
AC Characteristics (Ta = 0 to +70°C, VCC = 2.7 V to 3.6 V, unless otherwise noted.)  
Test Conditions  
Input pulse levels: 0.4 V to 2.4 V  
Input rise and fall time: 5 ns  
Input and output timing reference level: 1.4 V  
Output Load  
500  
Dout  
1.4 V  
50 pF*  
(Including scope & jig)  
Read Cycle  
HM62V256  
-7  
-8  
-10  
Parameter  
Symbol Min  
Max Min  
Max Min  
Max Unit Notes  
Read cycle time  
tRC  
70  
10  
5
70  
70  
35  
25  
25  
85  
10  
5
85  
85  
45  
30  
30  
100  
10  
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
tAA  
100  
100  
50  
Chip select access time  
tACS  
tOE  
Output enable to output valid  
Chip selection to output in low-Z  
Output enable to output in low-Z  
Chip deselection to output in high-Z  
Output disable to output in high-Z  
Output hold from address change  
tCLZ  
tOLZ  
tCHZ  
tOHZ  
tOH  
2
2
0
0
0
35  
35  
1, 2  
1, 2  
0
0
0
10  
10  
10  
Notes: 1. tCHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and  
are not referred to output voltage levels.  
2. This parameter is sampled and not 100% tested.  
6
HM62V256 Series  
Read Timing Waveform (1) (WE = VIH)  
Error! Unknown switch argument.  
Read Timing Waveform (2) (WE = VIH, CS = VIL, OE = VIL)  
t
RC  
Valid address  
Address  
Dout  
t
t
AA  
OH  
t
OH  
Valid data  
Read Timing Waveform (3) (WE = VIH, OE = VIL)*1  
t
ACS  
CS  
t
CLZ  
t
CHZ  
High impedance  
Valid data  
Dout  
Notes:  
1. Address must be valid prior to or simultaneously with CS going low.  
7
HM62V256 Series  
Write Cycle  
HM62V256  
-7  
-8  
-10  
Parameter  
Symbol Min  
Max Min  
Max Min  
Max Unit Notes  
Write cycle time  
tWC  
tCW  
tAS  
70  
50  
0
25  
25  
85  
75  
0
30  
30  
100  
80  
0
35  
35  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Chip selection to end of write  
Address setup time  
4
5
Address valid to end of write  
Write pulse width  
tAW  
tWP  
tWR  
tWHZ  
tDW  
tDH  
50  
45  
0
75  
55  
0
80  
60  
0
3, 8  
6
Write recovery time  
Write to output in high-Z  
Data to write time overlap  
Data hold from write time  
Output active from end of write  
Output disable to output in high-Z  
0
0
0
1, 2, 7  
30  
0
35  
0
40  
0
tOW  
tOHZ  
10  
0
10  
0
10  
0
2
1, 2, 7  
Notes: 1. tOHZ and tWHZ are defined as the time at which the outputs achieve the open circuit conditions and  
are not referred to output voltage levels.  
2. This parameter is sampled and not 100% tested.  
3. A write occurs during the overlap (tWP) of a low CS and a low WE. A write begins at the  
later transition of CS going low or WE going low. A write ends at the earlier transition of CS  
going high or WE going high. tWP is measured from the beginning of write to the end of write.  
4. tCW is measured from CS going low to the end of write.  
5. tAS is measured from the address valid to the beginning of write.  
6. tWR is measured from the earlier of WE or CS going high to the end of write cycle.  
7. During this period, I/O pins are in the output state so that the input signals of the opposite phase  
to the outputs must not be applied.  
8. In the write cycle with OE low fixed, tWP must satisfy the following equation to avoid a problem of  
data bus contention, tWP tWHZ max + tDW min.  
8
HM62V256 Series  
Write Timing Waveform (1) (OE Clock)  
tWC  
Address  
Valid address  
tAW  
tWR  
OE  
tCW  
CS  
*1  
tWP  
tAS  
WE  
tOHZ  
High impedance  
tDW  
Dout  
tDH  
High impedance  
Din  
Valid data  
Notes:  
1. If CS goes low simultaneously with WE going low or after WE going low, the outputs remain  
in the high impedance state.  
9
HM62V256 Series  
Write Timing Waveform (2) (OE Low Fixed)  
tWC  
Address  
Valid address  
tCW  
tWR  
CS  
*1  
tAW  
tOH  
tWP  
WE  
tAS  
tWHZ  
tOW  
*3  
*2  
Dout  
tDW  
tDH  
*4  
High impedance  
Din  
Valid data  
Notes:  
1. If CS goes low simultaneously with WE going low or after WE going low, the outputs remain  
in the high impedance state.  
2. Dout is the same phase of the write data of this write cycle.  
3. Dout is the read data of next address.  
4. If CS is low during this period, I/O pins are in the output state. Therefore, the input signals  
of the opposite phase to the output must not be applied to them.  
10  
HM62V256 Series  
Low VCC Data Retention Characteristics (Ta = 0 to +70°C)  
Parameter  
Symbol  
VDR  
Min  
2.0  
Typ*1 Max Unit Test conditions*6  
VCC for data retention  
Data retention current  
3.6  
V
CS VCC – 0.2 V, Vin 0 V  
ICCDR  
0.05 27*2  
µA  
VCC = 2.7 V, Vin 0 V  
CS VCC – 0.2 V  
0
0.05 7*3  
0.05 2*4  
Chip deselect to data retention time  
Operation recovery time  
tCDR  
tR  
ns  
ns  
See retention waveform  
*5  
tRC  
Notes: 1. Typical values are at VCC = 2.7 V, Ta = 25°C and not guaranteed.  
2. 9 µA max at Ta = 0 to 40°C.  
3. This characteristics guaranteed for only L-SL version. 2.0 µA max at Ta = 0 to 40°C.  
4. This characteristics guaranteed for only L-UL version. 0.4 µA max at Ta = 0 to 40°C.  
5. tRC = read cycle time.  
6. CS controls address buffer, WE buffer, OE buffer, and Din buffer. If CS controls data retention  
mode, other input levels (address, WE, OE, I/O) can be in the high impedance state.  
Low VCC Data Retention Timing Waveform  
Data retention mode  
VCC  
2.7 V  
tR  
tCDR  
0.7 V  
CC  
VDR  
CS  
>
CS VCC – 0.2 V  
0 V  
11  
HM62V256 Series  
Package Dimensions  
HM62V256LFP Series (FP-28DA)  
Unit: mm  
18.00  
18.75 Max  
15  
28  
1
14  
11.80 ± 0.30  
1.12 Max  
1.70  
0° – 8°  
1.27  
1.00 ± 0.20  
0.15  
0.40 ± 0.08  
0.38 ± 0.06  
M
0.20  
Hitachi Code  
FP-28DA  
JEDEC  
EIAJ  
Conforms  
Conforms  
Dimension including the plating thickness  
Base material dimension  
Weight (reference value) 0.82 g  
12  
HM62V256 Series  
Package Dimensions (cont.)  
HM62V256LT Series (TFP-32DA)  
Unit: mm  
8.00  
8.20 Max  
17  
32  
1
16  
0.50  
0.22 ± 0.08  
0.20 ± 0.06  
0.08  
M
0.80  
14.00 ± 0.20  
0.45 Max  
0° – 5°  
0.50 ± 0.10  
0.10  
Hitachi Code  
JEDEC  
EIAJ  
TFP-32DA  
Conforms  
Conforms  
Dimension including the plating thickness  
Base material dimension  
Weight (reference value) 0.26 g  
13  
HM62V256 Series  
Package Dimensions (cont.)  
HM62V256LTM Series (TFP-28DA)  
Unit: mm  
8.00  
8.20 Max  
8
21  
22  
7
28  
1
0.55  
0.22 ± 0.05  
0.20 ± 0.04  
0.10 M  
0.80  
13.40 ± 0.30  
0.63 Max  
0° – 5°  
0.50 ± 0.10  
0.10  
Hitachi Code  
TFP-28DA  
JEDEC  
EIAJ  
Dimension including the plating thickness  
Base material dimension  
Weight (reference value) 0.22 g  
14  
HM62V256 Series  
When using this document, keep the following in mind:  
1. This document may, wholly or partially, be subject to change without notice.  
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of  
this document without Hitachi’s permission.  
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any  
other reasons during operation of the user’s unit according to this document.  
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and  
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any intellectual  
property claims or other problems that may result from applications based on the examples described  
herein.  
5. No license is granted by implication or otherwise under any patents or other rights of any third party or  
Hitachi, Ltd.  
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL  
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.  
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are  
requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL  
APPLICATIONS.  
Hitachi, Ltd.  
Semiconductor & IC Div.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan  
Tel: Tokyo (03) 3270-2111  
Fax: (03) 3270-5109  
For further information write to:  
Hitachi Semiconductor  
(America) Inc.  
2000 Sierra Point Parkway  
Brisbane, CA. 94005-1897  
U S A  
Hitachi Europe GmbH  
Continental Europe  
Dornacher Straße 3  
D-85622 Feldkirchen  
München  
Hitachi Europe Ltd.  
Electronic Components Div.  
Northern Europe Headquarters  
Whitebrook Park  
Lower Cookham Road  
Maidenhead  
Berkshire SL6 8YA  
United Kingdom  
Tel: 01628-585000  
Fax: 01628-585160  
Hitachi Asia Pte. Ltd.  
16 Collyer Quay #20-00  
Hitachi Tower  
Singapore 049318  
Tel: 535-2100  
Tel: 800-285-1601  
Fax:303-297-0447  
Tel: 089-9 91 80-0  
Fax: 089-9 29 30-00  
Fax: 535-1533  
Hitachi Asia (Hong Kong) Ltd.  
Unit 706, North Tower,  
World Finance Centre,  
Harbour City, Canton Road  
Tsim Sha Tsui, Kowloon  
Hong Kong  
Tel: 27359218  
Fax: 27306071  
Copyright © Hitachi, Ltd., 1997. All rights reserved. Printed in Japan.  
15  
HM62V256 Series  
Revision Record  
Rev. Date  
Contents of Modification  
Drawn by Approved by  
1.0  
2.0  
3.0  
Dec. 25, 1992  
Initial issue  
Y. Saito  
Y. Saito  
Y. Saito  
Y. Kawashima  
K. Yoshizaki  
T. Matumoto  
Sep. 10, 1993  
Mar. 17, 1994  
Addition of full specification  
DC Characteristics  
I
CCDR2 (max): 10 mA to 15 mA  
4.0  
Nov. 17 1994  
Jun. 19, 1995  
Addition of HM62V256LTM Series (TFP-28DA)  
Addition of Block Diagram  
Absolute maximum ratings  
Addition of note 3  
AC Characteristics  
Addition of note 12  
Y. Saito  
K. Yoshizaki  
5.0  
Change of format  
M. Higuchi K. Yoshizaki  
Features  
Access time: 85/100 ns to 70/85/100 ns  
Low power standby: 0.60 µW to 0.15 µW  
Deletion of HM62V256LFP-8/8SL  
Deletion of HM62V256LT-8/10SL  
Deletion of HM62V256LTM-8/8SL  
Addition of HM62V256LFP-7SLT/8ULT  
Addition of HM62V256LTM-7SL/8UL  
Change of Block Diagram  
Absolute Maximum Ratings  
Terminal voltage VT: –0.5 to VCC + 0.3 to  
Terminal voltage VT: –0.5 to VCC + 0.5  
DC Characteristics  
Addition of note 3  
t
I
I
CCAC1 (min): 27/24 mA to 30/ 27/ 24 mA  
SB1 (typ): 0.2/0.2 µA to 0.05/0.05/0.05 µA  
SB1 (max): 50/10 µA to 50/10/4 µA  
Capacitance  
Input Capacitance  
Cin (max): 8 pF to 5 pF  
Input/output Capacitance  
CI/O (max): 10 pF to 8 pF  
AC Characteristics  
Change order of notes  
t
RC (min): 85/100 ns to 70/85/100 ns  
tAA (max): 85/100 ns to 70/85/100 ns  
t
t
t
t
t
ASC (max): 85/100 ns to 70/85/100 ns  
OE (max): 45/50 ns to 35/45/50 ns  
CLZ (min): 10/10 ns to 10/10/10 ns  
OLZ (min): 5/5 ns to 5/5/5 ns  
CHZ (max): 30/35 ns to 25/30/35 ns  
tOHZ (max): 30/35 ns to 25/30/35 ns  
tOH (min): 10/10 ns to 10/10/10 ns  
t
t
t
WC (min): 85/100 ns to 70/85/100 ns  
CW (min): 75/80 ns to 50/75/80 ns  
AW (min): 75/80 ns to 50/75/80 ns  
16  
HM62V256 Series  
Revision Record (cont)  
Rev. Date  
5.0 Jun. 19, 1995  
Contents of Modification  
Drawn by Approved by  
AC Characteristics  
M. Higuchi K. Yoshizaki  
tWP (min): 55/60 ns to 45/55/60 ns  
t
t
WHZ (max): 30/35 ns to 25/30/35 ns  
DW (min): 35/40 ns to 30/35/40 ns  
tOW (min): 10/10 ns to 10/10/10 ns  
tOHZ (max): 30 35 ns to 25/30/35 ns  
Low VCC Data Retention Characteristics  
Addition of note 4  
t
t
CCDR (typ): 0.2/0.2 µA to 0.05/0.05/0.05 µA  
CCDR (max): 27/7 µA to 27/7/2 µA  
6.0  
Nov. 1997  
Change of format  
Change of Subtitle  
17  

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RENESAS

HM62V8100L

Wide Temperature Range Version 8 M SRAM (1024-kword x 8-bit)
RENESAS

HM62V8100LBPI-5

Wide Temperature Range Version 8 M SRAM (1024-kword x 8-bit)
RENESAS

HM62V8100LBPI-5

Standard SRAM, 1MX8, 55ns, CMOS, PBGA48, 0.75 MM PITCH, CSP-48
HITACHI

HM62V8100LBPI-5SL

Wide Temperature Range Version 8 M SRAM (1024-kword x 8-bit)
RENESAS

HM62V8100LBPI-5SL

Standard SRAM, 1MX8, 55ns, CMOS, PBGA48, 0.75 MM PITCH, CSP-48
HITACHI

HM62V8100LBPI-7

Standard SRAM, 1MX8, 70ns, CMOS, PBGA48, 0.75 MM PITCH, CSP-48
HITACHI