5962-9170001HXC [ETC]
Operational Amplifier ; 运算放大器\n
| 型号： | 5962-9170001HXC |
| 厂家： | 
ETC |
| 描述： | Operational Amplifier
|
| 文件： | 总11页 (文件大小：47K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
Update drawing requirements to MIL-PRF-38534.
DATE (YR-MO-DA)
01-02-14
APPROVED
Raymond Monnin
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
A
1
A
2
A
3
A
4
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5
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7
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8
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9
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SHEET
10
PMIC N/A
PREPARED BY
Steve Duncan
DEFENSE SUPPLY CENTER COLUMBUS
POST OFFICE BOX 3990
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
Gary Zahn
COLUMBUS, OHIO 43216-5000
http://www.dscc.dla.mil
APPROVED BY
Greg Lude
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
MICROCIRCUIT, HYBRID, LINEAR, HIGH
POWER, OPERATIONAL AMPLIFIER
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
91-10-29
AMSC N/A
REVISION LEVEL
A
SIZE
A
CAGE CODE
67268
5962-91700
SHEET
1 OF 10
DSCC FORM 2233
APR 97
5962-E238-01
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class
G (lowered high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead
finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation
hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
91700
01
H
X
X
Federal
stock class
designator
\
RHA
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
designator
(see 1.2.1)
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
Circuit function
PA09M, MIOP42119
Power operational amplifier
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as
follows:
Device class
Device performance documentation
D, E, G, H, or K
Certification and qualification to MIL-PRF-38534
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Descriptive designator
See figure 1
Terminals
8
Package style
Flange mount
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings.
Supply voltage (VS).....................................................................
Output current (IO).......................................................................
Power dissipation (PD) 1/ ............................................................
Input voltage (differential) ...........................................................
Input voltage (common mode)....................................................
Lead temperature (soldering, 10 seconds).................................
Junction temperature (TJ) ...........................................................
Storage temperature range.........................................................
40 V dc
5.0 A
78 W
40 V dc
40 V dc
+300 C
+150 C
-65 C to +150 C
1.4 Recommended operating conditions.
Supply voltage (VS).....................................................................
Case operating temperature range (TC)......................................
35 V dc
-55 C to +125 C
1/ Derate at 1.8 C/W above case temperature (TC) of +25 C.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91700
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
2
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
SIZE
STANDARD
5962-91700
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
3
DSCC FORM 2234
APR 97
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked in MIL-HDBK-103 and
QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1015 of MIL-STD-883.
C
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
c. Constant acceleration may be performed after burn-in upon approval by the qualifying activity.
SIZE
STANDARD
5962-91700
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55 C +125 C
Group A
subgroups
Device
type
Limits
Unit
T
C
VS = 35 dc
unless otherwise specified
Min
Max
Supply current
IS
VIN = 0 V dc, G = 100,
1
2
3
01
01
85
140
165
mA
VCM = 0 V dc
Input offset voltage
VOS
VIN = 0 V dc, G = 100,
VS = 12 V dc
1
2
3
-5.3
-8.3
-7.7
+5.3 mV
+8.3
+7.7
VIN = 0 V dc, G = 100,
VS = 35 V dc
1
2
3
-3.0
-6.0
-5.4
+3.0 mV
+6.0
+5.4
VIN = 0 V dc, G = 100,
VS = 40 V dc
1
2
3
-3.5
-6.5
-5.9
+3.5 mV
+6.5
+5.9
Input bias current, +IN
Input bias current, -IN
Input offset current
Output voltage
+IB
-IB
1,3
2
01
01
01
01
100
pA
VIN = 0 V dc, RBIAS 100 M
VIN = 0 V dc, RBIAS 100 M
VIN = 0 V dc, RBIAS 100 M
10.0 nA
1,3
2
100
pA
10.0 nA
50.0 pA
10.0 nA
V
IOS
1,3
2
VO
4,5,6
33
VS = 40 V dc, IO = 66 mA,
RL = 500
5
15
V
V
V
VS = 23.5 V dc, IO = 1 A,
RL = 15
TC = +125 C
4,6
4,6
30
VS = 38 V dc, IO = 2 mA,
RL = 15
TC = +25 C, -55 C
11.3
VS = 21.3 V dc, IO = 3 A,
RL = 3.75
TC = +25 C, -55 C
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91700
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55 C +125 C
Group A
subgroups
Device
type
Limits
Unit
T
C
VS = 35 V dc
unless otherwise specified
Min
3.4
Max
6
Current limits
ICL
4
01
mA
RL = 3.75 , VS = 32.2 V dc,
TC = +25 C
Stability/noise
Slew rate
EN
SR
G = 1, CL = 1.5 nF
4,5,6
4,6
01
01
1.0
mV
25
20
80
500
500
RL = 500 , VIN 4 VP-P
V/ s
5
Open loop gain
AOL
4,5,6
01
01
dB
dB
RL = 500 , f = 15 Hz,
VIN 0.4 VP-P
Common mode
rejection
CMR
4,5,6
64
VS = 34.5 V dc, f = dc,
VCM = 22.5 V dc
1/ During all group A testing, terminal connection BAL (pin 2) is left open.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91700
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
6
DSCC FORM 2234
APR 97
Case outline X.
Symbol
Millimeters
Min Max
Inches
Min Max
A
B
C
D
E
F
38.35 39.37 1.510 1.550
19.30 19.81 0.760 0.780
7.37
0.290
0.97
2.03
1.07 0.038 0.042
2.54 0.080 0.100
40 BSC
12.7 BSC
40 BSC
0.500 BSC
1.186 BSC
0.593 BSC
G
H
J
30.12 BSC
15.06 BSC
K
Q
R
11.68 12.70 0.460 0.500
3.84 4.09 0.151 0.161
25.15 25.65 0.990 1.010
NOTES:
1. The U. S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-
pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall
take precedence.
2. Pin numbers are for reference and may not be marked on package.
FIGURE 1. Case outline(s).
SIZE
STANDARD
5962-91700
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
7
DSCC FORM 2234
APR 97
Device type
01
Case outline
X
Terminal number
Terminal symbol
1
2
3
4
5
6
7
8
Output
Balance (BAL)
+VS
+IN
-IN
-VS
RL
CL
FIGURE 2. Terminal connections.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91700
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
8
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
Final electrical parameters
Group A test requirements
1*, 2, 3, 4, 5, 6
1, 2, 3, 4, 5, 6
1, 4
Group C end-point electrical
parameters
End-point electrical parameters
for radiation hardness assurance
(RHA) devices
Not applicable
* PDA applies to subgroup 1.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 7, 8, 9, 10, and 11 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test, method 1005 of MIL-STD-883.
(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1005 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1005 of MIL-STD-883.
C
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91700
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
9
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished in accordance with MIL-PRF-38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Post Office Box 3990, Columbus, Ohio 43216-
5000, or telephone (614) 692-0512.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-
103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
SIZE
STANDARD
5962-91700
A
MICROCIRCUIT DRAWING
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
A
10
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 01-02-14
Approved sources of supply for SMD 5962-91700 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-9170001HXA
5962-9170001HXC
31757
31757
MIOP42119/883
MIOP42119/883
5962-9170001HXA
5962-9170001HXC
60024
60024
PA09M/883
PA09M/883
1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the
manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its
availability.
2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the
performance requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
31757
Micropac Industries, Incorporated
905 E. Walnut Street
Garland, TX 75040
Point of contact: 912 E. Walnut Street
Garland, TX 75040
60024
Apex Microtechnology Corporation
5980 N. Shannon Road
Tucson, AZ 85741
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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