5962-9167601KYA [ETC]
Analog Filter ; 模拟滤波器\n
ETC 
REVISIONS
LTR
C
DESCRIPTION
Added a class K device. Redrew entire document. -sld
DATE (YR-MO-DA)
98-04-09
APPROVED
K. A. Cottongim
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
REV
C
1
C
2
C
3
C
4
C
5
C
6
C
7
C
8
C
9
C
C
C
C
SHEET
10
11
12
13
PMIC N/A
PREPARED BY
Steve Duncan
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216
STANDARD
MICROCIRCUIT DRAWING
CHECKED BY
Michael C. Jones
APPROVED BY
Gregory Lude
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
MICROCIRCUIT, DIGITAL, OPTICAL COUPLED
FILTER, HYBRID,
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
DRAWING APPROVAL DATE
92-07-07
AMSC N/A
REVISION LEVEL
C
SIZE
A
CAGE CODE
5962-91676
67268
SHEET
1 OF
13
DSCC FORM 2233
APR 97
5962-E271-98
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G
(lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes
are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness
assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
ꢀ
ꢀ
ꢀ
91676
01
ꢀ
ꢀ
H
ꢀ
ꢀ
ꢀ
X
ꢀ
ꢀ
ꢀ
X
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
ꢀ
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-
PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA
device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
Circuit function
66079, 66079-300
Single channel, optocoupler
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as
follows:
Device class
Device performance documentation
D, E, G, H, or K
Certification and qualification to MIL-PRF-38534
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
X
Y
See figure 1
See figure 1
7
7
Co-axial
Bolthead co-axial
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
2
DESC FORM 2234
APR 97
1.3 Absolute maximum ratings. 1/
Supply voltage range (VCC ) ............................................................................ +7.0 V dc (1 minute maximum)
Input current .................................................................................................... 20 mA
Storage temperature range ............................................................................. -65(C to +150(C
Power dissipation (TC = +125(C).................................................................... 175 mW
Lead temperature (soldering, 10 seconds)...................................................... +260(C
Junction temperature (TJ)................................................................................ +175(C
1.4 Recommended operating conditions.
Supply voltage range (VCC) ............................................................................. +4.5 V dc to +5.5 V dc
High level input current.................................................................................... 12.5 mA minimum 2/
Low level input current .................................................................................... 250 ꢀA dc maximum
Normalized fanout (TTL load).......................................................................... 6 maximum
Case operating temperature range (TC).......................................................... -55(C to +125(C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of
this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the
issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Methods and Procedures for Microelectronics.
MIL-STD-973 - Configuration Management.
MIL-STD-1835 - Microcircuit Case Outlines.
HANDBOOK
DEPARTMENT OF DEFENSE
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ This condition permits at least 20 percent hF (CTR) degradation. This initial switching threshold is 10 mA dc or less.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
3
DESC FORM 2234
APR 97
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the appilcable device
class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Switching test ciircuit and waveforms. The switching test circuit and waveforms shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified
in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or
function as described herein.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
4
DESC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
Group A
subgroups
Device
type
Limits
Unit
-55ꢀC ꢀ T ꢀ+125ꢀC
C
4.5 V dc ꢀ VCC ꢀ 5.5 V dc
unless otherwise specified
Min
Max
0.6
Low level output voltage
High level output current
High level supply current
Low level supply current
Input forward voltage
VOL
VCC = 5.5 V, IF = 10 mA,
1,2,3
1,2,3
1,2,3
1,2,3
1,2
01
01
01
01
01
V
IOL = 10 mA 1/
IOH
VCC = 5.5 V, VO = 5.5 V,
IF = 250 mA
250
ꢀA
mA
mA
V
ICCH
ICCL
VF
VCC = 5.5 V, IF = 0 mA
VCC = 5.5 V, IF = 20 mA
IF = 20 mA
20
30
1.75
3
1.85
1.0
Input reverse breakdown
voltage
VBR
IR = 10 ꢀA
1,2,3
01
01
5
V
Input to output insulation
leakage current 2/
I
IO
V
IO = 1000 V dc, t = 5 sec,
1
ꢀA
relative humidity = 45%,
TC = +25(C
Input to output capacitance
3/ 6/
CIO
f = 1 MHz, TC = +25(C
1
1
01
01
3.0
1.0
pF
Input to case isolation
leakage current
IIC
VIC = 500 V, pins 1 and 2
ꢀA
shorted together,
TC = +25(C
Output to case isolation
leakage current
IOC
VOC = 500 V, pins 4, 5, and
6 are shorted together,
TC = +25(C
1
4
01
01
1.0
5.0
ꢀA
Input to case capacitance
CIC
f = 1 MHz, Tc = +25(C
pf
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
5
DESC FORM 2234
APR 97
TABLE I. Electrical performance characteristics - Continued
Test
Symbol
Conditions
Group A
subgroups
Device
type
Limits
Unit
-55ꢀC ꢀ T ꢀ+125ꢀC
C
4.5 V dc ꢀ VCC ꢀ 5.5 V dc
unless otherwise specified
Min
Max
Propagation delay time, 4/
low to high output level
tPLH
R1 = 5106, CL = 15 pf,
IF = 13 mA
9
01
01
100
ns
10,11
9
140
100
Propagation delay time, 5/
high to low output level
tPHL
R1 = 5106, CL = 15 pf,
IF = 13 mA
ns
10,11
140
Common mode transient
immunity at ouput high
level 6/
·CMH·
·CML·
VCM - 10 Vp-p, IF = 0 mA,
VO = 2 V min, RL = 5106
9,10,11
01
01
1000
1000
V/ꢀs
V/ꢀs
Common mode transient
immunity at ouput low
level 6/
VCM - 10 Vp-p, IF = 10 mA,
VO = 0.8 V max, RL = 5106
9,10,11
1/ It is essential that a ceramic bypass capacitor of .01 ꢀf be connected from VCC to ground.
2/ Device considered a two-terminal device, pins 1 through 3 are shorted together and pins 4 through 7 are shorted together.
3/ Measured between each input pair shorted together and all outputs shorted together.
4/ The tPLH propagation delay is measured from the 6.5 mA point on the trailing edge of the input pulse to the 1.5 V point on
the trailing edge of the output pulse.
5/ The tPHL propagation delay is measured from the 6.5 mA point on the leading edge of the input pulse to the 1.5 V point on
the leading edge of the output pulse.
6/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameters
shall be guaranteed to the limits specified in table I for all lots not specifically tested.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
6
DESC FORM 2234
APR 97
CASE X
Inches
.005
.008
.012
.016
.019
.070
.100
.137
.167
.209
.212
.500
.535
.560
.562
mm
.127
.203
.305
.406
.483
1.778
2.540
3.480
4.242
5.308
5.384
12.700
13.590
14.224
14.275
NOTES:
1. Dimensions are in inches:
2. Metric equivalents are for general information only.
3. Measured at base of the header.
FIGURE 1. Case outline.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
7
DESC FORM 2234
APR 97
CASE Y
Inches
.005
.010
.015
.016
.019
.062
.070
.100
.200
.209
.212
.215
.223
.225
.232
.233
.243
.250
.270
.312
.500
.560
mm
.127
.254
.381
.406
.483
1.575
1.778
2.540
5.080
5.309
5.385
5.461
5.664
5.715
5.893
5.918
6.172
6.350
6.858
7.925
12.700
14.224
NOTES:
1. Dimensions are in inches:
2. Metric equivalents are for general information only.
3. Measured at base of the header.
FIGURE 1. Case outline - Continued.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
8
DESC FORM 2234
APR 97
Device type
01
X and Y
Case outlines
Terminal numbers
Terminal connections
Anode
1
2
3
4
5
6
7
Cathode
No connection
VCC
VOUT
Ground
No connection
FIGURE 2. Terminal connections.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
9
DESC FORM 2234
APR 97
NOTES:
1. All input pulses supplied by generators having the following characteristics: ZO = 506, tr = 5 ns.
2. CL includes probe and stray wiring capacitance.
FIGURE 3. Switching test circuit and waveforms.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-91676
A
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
10
DESC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A test
table)
Interim electrical parameters
Final electrical parameters
Group A test requirements
1
1*,2,3,4,9,10,11
1,2,3,4,9,10,11
1,2,3
Group C end-point electrical
parameters
MIL-STD-883, group E end-point
electrical parameters for RHA
devices
Subgroups**
(in accordance with method
5005, group A test table)
* PDA applies to subgroup 1.
** When applicable to this standard microcircuit drawing,
the subgroups shall be defined.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1015 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1015 of MIL-STD-883.
A
b.Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.Tests shall be as specified in table II herein.
b.Subgroups 5, 6, 7,and 8 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
11
DESC FORM 2234
APR 97
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.End-point electrical parameters shall be as specified in table II herein.
b.Steady-state life test, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in test method 1005 of MIL-STD-883.
(2)
T as specified in accordance with table I of method 1005 of MIL-STD-883.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein). RHA levels shall be M, D, R, and H. RHA quality conformance inspection sample tests shall be performed at
the RHA level specified in the acquisition document.
a.RHA tests for levels M, D, R, and H shall be performed through each level to determine at what levels the devices meet
the RHA requirements. These RHA tests shall be performed for initial qualification and after design or process changes
which may affect the RHA performance of the device.
b.End-point electrical parameters shall be as specified in table II herein.
c. Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. It shall pass the
specified group A electrical parameters in table I for subgroups specified in table II herein.
d.The devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38534 for RHA level being
tested, and meet the postirradiation end-point electrical parameter limits as defined in table I at T = +25(C ꢁ5 percent,
A
after exposure.
e.Prior to and during total dose irradiation testing, the devices shall be biased to establish a worst case condition as
specified in the radiation exposure circuit.
f. For device classes H and K, subgroups 1 and 2 in table V, method 5005 of MIL-STD-883 shall be tested as appropriate
for device construction.
g.When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
12
DESC FORM 2234
APR 97
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692,
Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-7603.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone (614)
692-0512.
6.6 Sources of supply. Sources of supply are listed in QML-38534. The vendors listed in QML-38534 have submitted a
certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
SIZE
STANDARD
5962-91676
A
MICROCIRCUIT DRAWING
REVISION LEVEL
C
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
13
DESC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 98-04-09
Approved sources of supply for SMD 5962-91676 are listed below for immediate acquisition information only and shall
be added to QML-38534 during the next revision. QML-38534 will be revised to include the addition or deletion of
sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to
and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of QML-38534.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-9167601HXA
5962-9167601HXC
31757
31757
66079-001
66079-001
5962-9167601HYA
5962-9167601HYC
31757
31757
66079-000
66079-000
5962-9167601KXA
5962-9167601KXC
31757
31757
66079-300
66079-300
5962-9167601KYA
5962-9167601KYC
31757
31757
66079-301
66079-301
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the Vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
Vendor name
and address
31757
Micropac Industries, Incorporated
Optoelectronic Division
905 East Walnut Street
Garland, TX 75040-6611
Point of contact: Optoelectronic Division
725 East Walnut Street
Garland, TX 75040
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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