5962-8987601FA [ETC]

BJT ; BJT\n
5962-8987601FA
型号: 5962-8987601FA
厂家: ETC    ETC
描述:

BJT
BJT\n

晶体 晶体管 开关
文件: 总11页 (文件大小:55K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATE (YYMMDD)  
92-10-27  
Form Approved  
OMB No. 0704-0188  
NOTICE OF REVISION (NOR)  
(See MIL-STD-480 for instructions)  
This revision described below has been authorized for the document listed.  
Public reporting burden for this collection is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data  
sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send comments regarding this burden  
estimate or any other aspect of this collection of information, including suggestions for reducing this burden, to Washington Headquarters Services,  
Directorate for Information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office of  
Information and Regulatory Affairs, Office of Management and Budget, Washington, DC 20503.  
1. ORIGINATOR NAME AND ADDRESS  
Defense Electronics Supply Center  
Dayton, Ohio 45444-5277  
2. CAGE CODE  
3. NOR NO.  
67268  
5962-R005-93  
5. DOCUMENT NO.  
4. CAGE CODE  
5962-89876  
67268  
7. REVISION LETTER  
6. TITLE OF DOCUMENT  
(Current) New  
(New) A  
Microcircuits, Linear, Transistor Array, Monolithic Silicon  
8. ECP NO.  
No registered users  
9. CONFIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIES  
All  
10. DESCRIPTION OF REVISION  
Sheet 1: Revisions ltr column; add "A".  
Revisions description column; add "Changes in accordance with NOR 5962-R005-93".  
Revisions date column; add "92-10-27".  
Revision level block; add "A".  
Rev status above sheet number 1, 2, and 6, add "A".  
Sheet 2: 1.2.2 Case outline; Under case outline letter column add "F", under descriptive designator column add  
"GDFP2-F16 or CDFP3-F16", under terminals column add "16", and under package style column add "flat pack".  
1.3 Absolute maximum ratings; Delete "Thermal resistance, junction-to-ambient ( J )- - - - 80 C/W" and  
A
substitute "Thermal resistance, junction-to-ambient ( J ): Case E - - - 80 C/W, Case F - - - 115 C/W".  
A
Delete "Power dissipation (P ) 1/ - - - - 1.0 W" and substitute "Power dissipation (P ): Case E - - - 1.0 W,  
D
D
Case F - - - 1.09 W".  
Under footnotes, delete "1/ Absolute maximum rating for power dissipation is for one darlington pair only.  
Derate 12.5 mW/ C above +25 C ambient." and substitute "1/ Absolute maximum rating for power dissipation is for  
one darlington pair only. Derate case outline E at 12.5 mW/ C above +25 C ambient and case outline F at  
8.7 mW/ C above +25 C ambient."  
Revision level block; add "A".  
Sheet 6: Figure 1; for case outline, delete "E" and substitute "E, F".  
Revision level block; add "A".  
11. THIS SECTION FOR GOVERNMENT USE ONLY  
a. CHECK ONE  
X EXISTING DOCUMENT SUPPLEMENTED  
BY THIS NOR MAY BE USED IN  
MANUFACTURE.  
REVISED DOCUMENT MUST BE  
RECEIVED BEFORE MANUFACTURER  
MAY INCORPORATE THIS CHANGE.  
CUSTODIAN OF MASTER DOCUMENT  
SHALL MAKE ABOVE REVISION AND  
FURNISH REVISED DOCUMENT TO:  
b. ACTIVITY AUTHORIZED TO APPROVE  
CHANGE FOR GOVERNMENT  
SIGNATURE AND TITLE  
Sandra Rooney  
DATE (YYMMDD)  
DESC-ECS  
92-10-27  
for Branch Chief  
12. ACTIVITY ACCOMPLISHING  
REVISION  
REVISION COMPLETED (Signature)  
DATE (YYMMDD)  
92-10-27  
Marcia B Kelleher  
DESC-ECS  
DD Form 1695, JUL 88  
Previous editions are obsolete.  
REVISIONS  
LTR  
DESCRIPTION  
DATE (YR-MO-DA)  
APPROVED  
REV  
SHEET  
REV  
SHEET  
REV STATUS  
OF SHEETS  
REV  
1
2
3
4
5
6
7
8
9
SHEET  
PREPARED BY  
Dan Wonnell  
PMIC N/A  
DEFENSE ELECTRONICS SUPPLY CENTER  
DAYTON, OHIO 45444  
STANDARDIZED  
CHECKED BY  
Charles E. Besore  
MILITARY  
DRAWING  
MICROCIRCUIT, LINEAR, TRANSISTOR  
ARRAY, MONOLITHIC SILICON  
APPROVED BY  
Michael A. Frye  
THIS DRAWING IS AVAILABLE  
FOR USE BY ALL  
DEPARTMENTS  
AND AGENCIES OF THE  
DEPARTMENT OF DEFENSE  
DRAWING APPROVAL DATE  
92-08-27  
CAGE CODE  
SIZE  
A
5962-89876  
67268  
REVISION LEVEL  
AMSC N/A  
SHEET  
1
OF  
9
DESC FORM 193  
JUL 91  
5962-E466  
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.  
1. SCOPE  
1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,  
"Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".  
1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following example:  
5962-89876  
01  
E
X
Drawing number  
Device type  
(1.2.1)  
Case outline  
(1.2.2)  
Lead finish per  
MIL-M-38510  
1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:  
Device type  
01  
Generic number  
2023  
Circuit function  
7 gate darlington transistor array  
1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835, and as follows:  
Outline letter  
E
Descriptive designator  
Terminals  
16  
Package style  
Dual-in-line  
GDIP1-T16 or CDIP2-T16  
1.3 Absolute maximum ratings.  
Output voltage (V ) - - - - - - - - - - - - - - - - - - - - -  
CE  
95 V dc  
30 V dc  
500 mA  
3.0 A  
25 mA  
1.0 W  
Input voltage (V ) - - - - - - - - - - - - - - - - - - - - - - -  
IN  
Peak output current (I  
Ground terminal current (I  
Continuous input current (I ) - - - - - - - - - - - - - - -  
IN  
Power dissipation (P ) 1/ - - - - - - - - - - - - - - - - -  
D
) - - - - - - - - - - - - - - - - -  
OUT  
) - - - - - - - - - - - - -  
GND  
Storage temperature range - - - - - - - - - - - - - - - - -  
-65 C to +150 C  
Junction temperature (T ) - - - - - - - - - - - - - - - - - -  
+175 C  
80 C/W  
J
Thermal resistance, junction-to-ambient (  
1.4 Recommended operating conditions.  
) - - - -  
JA  
Ambient operating temperature range (T ) - - - - - -  
-55 C to +125 C  
A
1/ Absolute maximum rating for power dissipation is for one darlington pair only.  
Derate 12.5 mW/ C above +25 C ambient.  
SIZE  
STANDARDIAZED  
MILITARY DRAWING  
5962-89876  
A
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
2
DESC FORM 193A  
JUL 91  
2. APPLICABLE DOCUMENTS  
2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard,  
and bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in  
the solicitation, form a part of this drawing to the extent specified herein.  
SPECIFICATION  
MILITARY  
MIL-M-38510  
STANDARD  
MILITARY  
- Microcircuits, General Specification for.  
MIL-STD-883  
MIL-STD-1835  
- Test Methods and Procedures for Microelectronics.  
- Microcircuit Case Outlines.  
BULLETIN  
MILITARY  
MIL-BUL-103  
- List of Standardized Military Drawings (SMD's).  
(Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition  
functions should be obtained from the contracting activity or as directed by the contracting activity.)  
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the  
text of this drawing shall take precedence.  
3. REQUIREMENTS  
3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, "Provisions  
for the use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein.  
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified  
in MIL-M-38510 and herein.  
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.  
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.  
3.2.3 Switching test circuit and waveforms. The switching test circuit and waveforms shall be as specified on figure 2.  
3.3. Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics  
are as specified in table I and shall apply over the full ambient operating temperature range.  
3.4. Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The  
electrical tests for each subgroup are described in table I.  
SIZE  
STANDARDIAZED  
5962-89876  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
3
DESC FORM 193A  
JUL 91  
TABLE I. Electrical performance characteristics.  
Test  
Symbol  
Conditions  
-55 C  
unless otherwise specified  
Group A  
subgroups  
Device  
type  
Limits  
Min  
Unit  
T
+125 C  
A
Max  
100  
1.8  
1.5  
1.3  
1.6  
1.3  
1.1  
1.8  
1.5  
1.3  
2.4  
2.7  
3.0  
3.3  
3.6  
3.9  
1350  
Output leakage  
current  
I
V
= 95 V  
CE  
1,2,3  
2
01  
01  
A
V
CEX  
Collector emitter  
saturation voltage  
V
I
= 350 mA, I = 500 A  
B
CE(sat)  
C
I
I
I
I
I
I
I
I
= 200 mA, I = 350 A  
B
C
C
C
C
C
C
C
C
= 100 mA, I = 250 A  
B
= 350 mA, I = 500 A  
B
1
3
= 200 mA, I = 350 A  
B
= 100 mA, I = 250 A  
B
= 350 mA, I = 850 A  
B
= 200 mA, I = 550 A  
B
= 100 mA, I = 350 A  
B
Input voltage  
V
V
V
V
V
V
V
V
I
= 2.0 V, I = 200 mA  
2
01  
V
IN(ON)  
CE  
C
= 2.0 V, I = 250 mA  
C
CE  
CE  
CE  
CE  
CE  
= 2.0 V, I = 300 mA  
C
= 2.0 V, I = 200 mA  
C
1,3  
= 2.0 V, I = 250 mA  
C
= 2.0 V, I = 300 mA  
C
Input current  
Input current  
I
= 3.85 V  
1,2,3  
2
01  
01  
650  
20  
A
A
IN(ON)  
IN  
I
= 500 A  
IN(OFF)  
C
SIZE  
STANDARDIAZED  
MILITARY DRAWING  
5962-89876  
A
DEFENSE ELECTRONICS SUPPLY CENTER  
DAYTON, OHIO 45444  
REVISION LEVEL  
SHEET  
4
DESC FORM 193A  
JUL 91  
TABLE I. Electrical performance characteristics - Continued.  
Test  
Symbol  
Conditions  
-55 C  
unless otherwise specified  
Group A  
Device  
type  
Limits  
Min  
Unit  
T
+125 C  
subgroups  
A
Max  
50  
Clamp diode leakage  
current  
I
V = 95 V  
R
1,2,3  
1,2,3  
01  
01  
A
V
R
Clamp diode forward  
leakage  
V
F
I
= 350 mA  
2.0  
F
Turn-on delay  
Turn-off delay  
t
See figure 2  
See figure 2  
9,10,11  
9,10,11  
01  
01  
1000  
1000  
ns  
ns  
PHL  
t
PLH  
3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed  
in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an  
approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-EC prior to listing  
as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-STD-883 (see 3.1  
herein) and the requirements herein.  
3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with  
each lot of microcircuits delivered to this drawing.  
3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-883 (see 3.1  
herein).  
3.9 Verification and review. DESC, DESC's agent, and the acquiring activity retain the option to review the manufacturer's  
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the  
reviewer.  
4. QUALITY ASSURANCE PROVISIONS  
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to  
the extent specified in MIL-STD-883 (see 3.1 herein).  
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior  
to quality conformance inspection. The following additional criteria shall apply:  
a. Burn-in test, method 1015 of MIL-STD-883.  
(1) Test condition A,B,C, or D using the circuit submitted with the certificate of compliance  
(see 3.6 herein).  
(2) T = +125 C, minimum.  
A
b. Interim and final electrical test parameters shall be as specified in table II herein, except  
interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer.  
SIZE  
STANDARDIAZED  
5962-89876  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
5
DESC FORM 193A  
JUL 91  
Device type  
Case outline  
01  
E
Terminal  
number  
Terminal symbol  
1
IN1  
2
IN2  
3
IN3  
4
IN4  
5
IN5  
6
IN6  
7
IN7  
8
GND  
COM  
OUT7  
OUT6  
OUT5  
OUT4  
OUT3  
OUT2  
OUT1  
9
10  
11  
12  
13  
14  
15  
16  
FIGURE 1. Terminal connections.  
SIZE  
STANDARDIAZED  
MILITARY DRAWING  
5962-89876  
A
DEFENSE ELECTRONICS SUPPLY CENTER  
DAYTON, OHIO 45444  
REVISION LEVEL  
SHEET  
6
DESC FORM 193A  
JUL 91  
FIGURE 2. Switching test circuit and waveforms.  
SIZE  
STANDARDIAZED  
5962-89876  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
DAYTON, OHIO 45444  
REVISION LEVEL  
SHEET  
7
DESC FORM 193A  
JUL 91  
TABLE II. Electrical test requirements.  
MIL-STD-883 Test Requirements  
Subgroups  
(per method  
5005, table I)  
Interim electrical parameters  
(method 5004)  
1
Final electrical test parameters  
(method 5004)  
1*, 2, 3  
Group A test requirements  
(method 5005)  
1, 2, 3, 9,  
10, 11**  
Groups C and D end-point  
electrical parameters  
(method 5005)  
1, 2, 3  
* PDA applies to subgroup 1.  
** Subgroups 10 and 11, if not tested, shall be guaranteed  
to the specified limits in table I.  
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883  
including groups A, B, C, and D inspections. The following additional criteria shall apply.  
4.3.1 Group A inspection.  
a. Tests shall be as specified in table II herein.  
b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.  
4.3.2 Groups C and D inspections.  
a. End-point electrical parameters shall be as specified in table II herein.  
b. Steady-state life test conditions, method 1005 of MIL-STD-883.  
(1) Test condition A, B, C, or D using the circuit submitted with the certificate of  
compliance (see 3.6 herein).  
(2) T = +125 C, minimum.  
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.  
SIZE  
STANDARDIAZED  
5962-89876  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
8
DESC FORM 193A  
JUL 91  
5. PACKAGING  
5.1 Packaging requirements.The requirements for packaging shall be in accordance with  
MIL-M-38510.  
6. NOTES  
6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and  
qualified military devices that will perform the required function are not available for OEM application. When a military specification  
exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be  
inactivated and will not be used for new design.  
The QPL-38510 product shall be the preferred item for all applications.  
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared  
specification or drawing.  
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the  
individual documents. This coordination will be accomplished in accordance with MIL-STD-481 using DD Form 1693, Engineering  
Change Proposal (Short Form).  
6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system application  
requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for  
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should  
contact DESC-EC, telephone (513) 296-6047.  
6.5 Comments. Comments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or telephone  
(513) 296-5377.  
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-BUL-103. The vendors listed in MIL-BUL-103  
have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-EC.  
SIZE  
STANDARDIAZED  
5962-89876  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
9
DESC FORM 193A  
JUL 91  
STANDARDIZED MILITARY DRAWING SOURCE APPROVAL BULLETIN  
DATE: 92-08-27  
Approved sources of supply for SMD 5962-89876 are listed below for immediate acquisition only and shall be added to  
MIL-BUL-103 during the next revision. MIL-BUL-103 will be revised to include the addition or deletion of sources. The vendors  
listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. This  
bulletin is superseded by the next dated revision of MIL-BUL-103.  
Standardized  
military drawing  
PIN  
Vendor  
CAGE  
number  
Vendor  
similar  
PIN 1/  
5962-8987601EX  
31019  
34333  
ULS2023H/883  
or  
ULS2023R/883  
SG2023J/883B  
1/ Caution. Do not use this number for item acquisition.  
Items acquired to this number may not satisfy the  
performance requirements of this drawing.  
Vendor CAGE  
number  
Vendor name  
and address  
31019  
Allegro Microsystems Incorporated  
3900 Welsh Road  
Willow Grove, PA 19090-2909  
34333  
Silicon General  
11861 Western Avenue  
Garden Grove, CA 92641  
The information contained herein is disseminated for convenience only and  
the Government assumes no liability whatsoever for any inaccuracies in this  
information bulletin.  

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