54F04LMQB [ETC]

LOGIC GATE|HEX INVERTER|F-TTL|LLCC|20PIN|CERAMIC ; 逻辑门|六反相器| F - TTL | LLCC | 20PIN |陶瓷\n
54F04LMQB
型号: 54F04LMQB
厂家: ETC    ETC
描述:

LOGIC GATE|HEX INVERTER|F-TTL|LLCC|20PIN|CERAMIC
逻辑门|六反相器| F - TTL | LLCC | 20PIN |陶瓷\n

文件: 总4页 (文件大小:17K)
中文:  中文翻译
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MILITARY DATA SHEET  
Original Creation Date: 03/06/96  
Last Update Date: 07/30/96  
MN54F04-X REV 1A0  
Last Major Revision Date: 03/06/96  
HEX INVERTER  
General Description  
This device contains four independent gates, each of which performs the logic INVERT  
function.  
Industry Part Number  
NS Part Numbers  
54F04  
54F04DMQB  
54F04FMQB  
54F04LMQB  
Prime Die  
M004  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1
MILITARY DATA SHEET  
MN54F04-X REV 1A0  
Features  
- Guaranteed 4000V minimum ESD protection  
2
MILITARY DATA SHEET  
MN54F04-X REV 1A0  
(Absolute Maximum Ratings)  
(Note 1)  
Storage Temperature  
-65 C to +150 C  
Ambient Temperature under Bias  
Junction Temperature under Bias  
Vcc Pin Potential to Ground Pin  
-55 C to +125 C  
-55 C to +175 C  
-0.5V to +7.0V  
Input Voltage  
(Note 2)  
-0.5V to +7.0V  
Input Current  
(Note 2)  
-30 mA to +5.0mA  
Voltage Applied to Output in HIGH State (with Vcc=0V)  
Standard Output  
-0.5V to Vcc  
-0.5V to +5.5V  
TRI-STATE Output  
Current Applied to Output in LOW State (Max)  
twice the rated Iol(mA)  
4000V  
ESD Last Passing Voltage (Min)  
Note 1: Absolute Maximum ratings are those values beyond which the device may be damaged or  
have its useful life impaired. Functional operation under these conditions is not  
implied.  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
Recommended Operating Conditions  
Free Air Ambient Temperature  
Commercial  
Military  
0 C to +70 C  
-55 C to +125 C  
Supply Voltage  
Military  
+4.5V to +5.5V  
+4.5V to +5.5V  
Commercial  
3
MILITARY DATA SHEET  
MN54F04-X REV 1A0  
Electrical Characteristics  
DC PARAMETER  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C  
PIN-  
SUB-  
SYMBOL  
IIH  
PARAMETER  
CONDITIONS  
NOTES  
MIN  
MAX UNIT  
NAME  
GROUPS  
Input High  
Current  
VCC=5.5V, VM=2.7V, VINH=5.5V  
1, 3 INPUTS  
1, 3 INPUTS  
1, 3 INPUTS  
1, 3 OUTPUTS  
20  
uA  
uA  
mA  
V
1, 2,  
3
IBVI  
IIL  
Input High  
Current  
VCC=5.5V, VM=7.0V, VINH=5.5V  
100  
1, 2,  
3
Input LOW Current VCC=5.5V, VM=0.5V, VINH=5.5V  
-0.6  
0.5  
1, 2,  
3
VOL  
Output LOW  
Voltage  
VCC=4.5V, VIH=2.0V, IOL=20mA,  
VINH=5.5V  
1, 2,  
3
VOH  
Output HIGH  
Voltage  
VCC=4.5V, VIL=0.8V, IOH=-1.0mA,  
VINH=5.5V  
1, 3 OUTPUTS 2.5  
1, 3 OUTPUTS -60  
1, 3 INPUTS  
1, 3 VCC  
V
1, 2,  
3
IOS  
Short-Circuit  
Current  
VCC=5.5V, VINH=5.5V, VM=0.0V  
-150  
-1.2  
4.2  
mA  
V
1, 2,  
3
VCD  
Input Clamp Diode VCC=4.5V, IM=-18mA, VINH=5.5V  
Voltage  
1, 2,  
3
ICCH  
ICCL  
ICEX  
Supply Current  
VCC=5.5V, VINL=0.0V  
mA  
mA  
uA  
1, 2,  
3
Supply Current  
VCC=5.5V, VINH=5.5V  
1, 3 VCC  
15.3  
250  
1, 2,  
3
Output HIGH  
Leakage Current  
VCC=5.5V, VINH=5.5V, VM=5.5V,  
VINL=0.0V  
1, 3 OUTPUTS  
1, 2,  
3
AC PARAMETER  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns SEE AC FIGS  
tpLH  
Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V  
@-55/125C  
2, 4 An to  
On  
2.4  
2.0  
1.5  
1.5  
5.0  
7.0  
4.3  
6.5  
ns  
ns  
ns  
ns  
9
2, 4 An to  
On  
10, 11  
9
tpHL  
Propagation Delay VCC=5.0V @25C VCC=4.5V & 5.5V  
@-55/125C  
2, 4 An to  
On  
2, 4 An to  
On  
10, 11  
Note 1: Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,  
3, 7 & 8.  
Note 2: Screen tested 100% on each device at +25C temperature only, subgroup A9.  
Note 3: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C  
temperature, subgroup A1, 2, 3, 7 & 8.  
Note 4: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C subgroup A9, &  
periodically at +125C & -55C temperature subgroups 10 & 11.  
4

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