ZXMN3A14FTA [DIODES]

30V N-CHANNEL ENHANCEMENT MODE MOSFET; 30V N沟道增强型MOSFET
ZXMN3A14FTA
型号: ZXMN3A14FTA
厂家: DIODES INCORPORATED    DIODES INCORPORATED
描述:

30V N-CHANNEL ENHANCEMENT MODE MOSFET
30V N沟道增强型MOSFET

晶体 晶体管 开关 光电二极管
文件: 总7页 (文件大小:213K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ZXMN3A14F  
30V N-CHANNEL ENHANCEMENT MODE MOSFET  
SUMMARY  
V
=30V : R  
(
)=0.065 ; I =3.9A  
(BR)DSS  
DS on D  
DESCRIPTION  
This new generation of Trench MOSFETs from Zetex utilizes a unique structure  
that combines the benefits of low on-resistance with fast switching speed. This  
makes them ideal for high efficiency, low voltage, power management  
applications.  
FEATURES  
SOT23  
Low on-resistance  
Fast switching speed  
Low threshold  
Low gate drive  
SOT23 package  
APPLICATIONS  
DC-DC Converters  
Power Management functions  
Disconnect switches  
Motor control  
PINOUT  
ORDERING INFORMATION  
DEVICE  
REEL  
SIZE  
TAPE  
WIDTH  
QUANTITY  
PER REEL  
ZXMN3A14FTA  
7”  
8mm  
8mm  
3000 units  
ZXMN3A14FTC  
13”  
10000 units  
DEVICE MARKING  
314  
ISSUE 1 - OCTOBER 2005  
1
SEMICONDUCTORS  
ZXMN3A14F  
ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
SYMBOL  
LIMIT  
UNIT  
Drain-Source Voltage  
Gate-Source Voltage  
V
V
30  
V
DSS  
GS  
Ϯ20  
V
(b)  
(b)  
(a)  
Continuous Drain Current @ V = 10V; T =25°C  
I
3.9  
A
GS  
A
D
@ V = 10V; T =70°C  
3.2  
A
GS  
A
@ V = 10V; T =25°C  
3.2  
A
GS  
A
(c)  
Pulsed Drain Current  
I
I
I
18  
A
A
DM  
S
(b)  
Continuous Source Current (Body Diode)  
2.3  
(c)  
Pulsed Source Current (Body Diode)  
18  
A
SM  
(a)  
Power Dissipation at T =25°C  
A
P
1
W
D
Linear Derating Factor  
8
1.5  
mW/°C  
W
(b)  
Power Dissipation at T =25°C  
A
P
D
Linear Derating Factor  
12  
mW/°C  
°C  
Operating and Storage Temperature Range  
T , T  
-55 to +150  
j
stg  
THERMAL RESISTANCE  
PARAMETER  
SYMBOL  
VALUE  
125  
UNIT  
°C/W  
°C/W  
(a)  
Junction to Ambient  
R
R
JA  
JA  
(b)  
Junction to Ambient  
83  
NOTES  
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions.  
(b) For a device surface mounted on FR4 PCB measured at t Յ 5 sec.  
(c) Repetitive rating - 25mm x 25mm FR4 PCB, D=0.02, pulse width 300s - pulse width limited by maximum junction temperature.  
ISSUE 1 - OCTOBER 2005  
2
SEMICONDUCTORS  
ZXMN3A14F  
CHARACTERISTICS  
ISSUE 1 - OCTOBER 2005  
3
SEMICONDUCTORS  
ZXMN3A14F  
ELECTRICAL CHARACTERISTICS (at T  
= 25°C unless otherwise stated)  
amb  
SYMBOL  
PARAMETER  
MIN.  
TYP. MAX. UNIT CONDITIONS  
STATIC  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate-Body Leakage  
V
I
30  
V
A  
nA  
V
I = 250A, V =0V  
D GS  
(BR)DSS  
1
VDS= 30V, VGS=0V  
VGS=Ϯ12V, VDS=0V  
ID= 250A, VDS=VGS  
VGS= 10V, ID= 3.2A  
VGS= 4.5V, ID= 2.6A  
VDS= 15V, ID= 3.2A  
DSS  
GSS  
I
100  
Gate-Source Threshold Voltage  
V
R
1.0  
GS(th)  
DS(on)  
Static Drain-Source On-State  
0.048 0.065  
0.069 0.095  
(1)  
Resistance  
(1) (3)  
Forward Transconductance  
g
7.1  
S
fs  
(3)  
DYNAMIC  
Input Capacitance  
C
C
C
448  
82  
pF  
pF  
pF  
iss  
VDS= 15V, VGS=0V  
f=1MHz  
Output Capacitance  
oss  
rss  
Reverse Transfer Capacitance  
49  
(2) (3)  
SWITCHING  
Turn-On-Delay Time  
Rise Time  
t
t
t
t
2.4  
2.5  
13.1  
5.3  
8.6  
1.4  
1.8  
ns  
ns  
ns  
ns  
nC  
nC  
nC  
d(on)  
VDD= 15V, VGS= 10V  
r
I = 1A  
D
Turn-Off Delay Time  
Fall Time  
d(off)  
f
RG6.0⍀  
Total Gate Charge  
Gate-Source Charge  
Gate Drain Charge  
SOURCE-DRAIN DIODE  
Q
Q
Q
VDS= 15V, VGS= 10V  
ID= 3.2A  
g
gs  
gd  
(1)  
Diode Forward Voltage  
V
0.85  
0.95  
V
Tj=25°C, IS= (2.5)A,  
SD  
V
GS=0V  
(3)  
Reverse Recovery Time  
t
13  
7
ns  
Tj=25°C, IF= (1.6)A,  
rr  
(3)  
Reverse Recovery Charge  
Q
NC  
di/dt=100A/s  
rr  
NOTES  
(1) Measured under pulsed conditions. Pulse width Յ 300s; duty cycle Յ2%.  
(2) Switching characteristics are independent of operating junction temperature.  
(3) For design aid only, not subject to production testing.  
ISSUE 1 - OCTOBER 2005  
4
SEMICONDUCTORS  
ZXMN3A14F  
TYPICAL CHARACTERISTICS  
ISSUE 1 - OCTOBER 2005  
5
SEMICONDUCTORS  
ZXMN3A14F  
TYPICAL CHARACTERISTICS  
ISSUE 1 - OCTOBER 2005  
6
SEMICONDUCTORS  
ZXMN3A14F  
PACKAGE OUTLINE  
PAD LAYOUT  
Controlling dimensions are in millimetres. Approximate conversions are given in inches  
PACKAGE DIMENSIONS  
MILLIMETRES  
INCHES  
MILLIMETRES  
INCHES  
DIM  
DIM  
MIN  
2.67  
1.20  
MAX  
3.05  
1.40  
1.10  
0.53  
0.15  
MIN  
MAX  
0.120  
0.055  
0.043  
0.021  
MIN  
0.33  
0.01  
2.10  
0.45  
MAX  
0.51  
0.10  
2.50  
0.64  
MIN  
MAX  
0.020  
0.004  
0.0985  
0.025  
A
B
C
D
F
0.105  
0.047  
H
K
0.013  
0.0004  
0.083  
0.018  
L
0.37  
0.085  
0.015  
M
N
0.0034 0.0059  
0.075 NOM  
0.95 NOM  
10Њ TYP  
0.0375 NOM  
G
1.90 NOM  
10Њ TYP  
© Zetex Semiconductors plc 2005  
Europe  
Americas  
Asia Pacific  
Corporate Headquarters  
Zetex GmbH  
Zetex Inc  
Zetex (Asia) Ltd  
Zetex Semiconductors plc  
Zetex Technology Park  
Chadderton, Oldham, OL9 9LL  
United Kingdom  
Streitfeldstraße 19  
D-81673 München  
Germany  
700 Veterans Memorial Hwy  
Hauppauge, NY 11788  
USA  
3701-04 Metroplaza Tower 1  
Hing Fong Road, Kwai Fong  
Hong Kong  
Telefon: (49) 89 45 49 49 0  
Fax: (49) 89 45 49 49 49  
europe.sales@zetex.com  
Telephone: (1) 631 360 2222  
Fax: (1) 631 360 8222  
usa.sales@zetex.com  
Telephone: (852) 26100 611  
Fax: (852) 24250 494  
asia.sales@zetex.com  
Telephone (44) 161 622 4444  
Fax: (44) 161 622 4446  
hq@zetex.com  
These offices are supported by agents and distributors in major countries world-wide.  
This publication is issued to provide outline information only which (unless agreed by the Company in writing) may not be used, applied or reproduced  
for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. The Company  
reserves the right to alter without notice the specification, design, price or conditions of supply of any product or service.  
For the latest product information, log on to www.zetex.com  
ISSUE 1 - OCTOBER 2005  
7
SEMICONDUCTORS  

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