3D7522H-1 [DATADELAY]

Manchester Decoder, CMOS, PDSO8, 0.300 INCH, ROHS COMPLIANT, GULLWING, DIP-8;
3D7522H-1
型号: 3D7522H-1
厂家: DATA DELAY DEVICES, INC.    DATA DELAY DEVICES, INC.
描述:

Manchester Decoder, CMOS, PDSO8, 0.300 INCH, ROHS COMPLIANT, GULLWING, DIP-8

光电二极管
文件: 总4页 (文件大小:274K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
3D7522  
MONOLITHIC MANCHESTER  
DECODER  
ata  
(SERIES 3D7522)  
FEATURES  
PACKAGES  
All-silicon, low-power CMOS  
RX  
N/C  
N/C  
CLK  
N/C  
N/C  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
VDD  
N/C  
technology  
TTL/CMOS compatible inputs and  
outputs  
Vapor phase, IR and wave  
solderable  
Auto-insertable (DIP pkg.)  
Low ground bounce noise  
Maximum data rate: 50 MBaud  
Data rate range: ±15%  
N/C  
N/C  
N/C  
N/C  
RX  
CLK  
N/C  
1
2
3
4
8
7
6
5
VDD  
N/C  
N/C  
GND  
8
DATB  
GND  
DATB  
3D7522-xxx  
DIP (.300)  
3D7522M-xxx DIP (.300)  
3D7522G-xxx Gull Wing (.300)  
3D7522D-xxx SOIC (.150)  
3D7522H-xxx Gull Wing (.300)  
3D7522Z-xxx SOIC (.150)  
For mechanical dimensions, click here.  
For package marking details, click here.  
FUNCTIONAL DESCRIPTION  
PIN DESCRIPTIONS  
The 3D7522 product family consists of monolithic CMOS Manchester  
Decoders. The unit accepts at the RX input a bi-phase-level,  
embedded-clock signal. In this encoding mode, a logic one is  
represented by a high-to-low transition within the bit cell, while a logic  
zero is represented by a low-to-high transition. The recovered clock  
and data signals are presented on CLK and DATB, respectively, with  
RX  
Signal Input  
CLK  
Signal Output (Clock)  
DATB Signal Output (Data)  
VDD +5 Volts  
GND Ground  
the data signal inverted. The operating baud rate (in MBaud) is specified by the dash number. The input  
baud rate may vary by as much as ±15% from the nominal device baud rate without compromising the  
integrity of the information received.  
Because the 3D7522 is not PLL-based, it does not require a long preamble in order to lock onto the  
received signal. Rather, the device requires at most one bit cell before the data presented at the output is  
valid. This is extremely useful in cases where the information arrives in bursts and the input is otherwise  
turned off.  
The all-CMOS 3D7522 integrated circuit has been designed as a reliable, economic alternative to hybrid  
TTL Manchester Decoders. It is TTL- and CMOS-compatible, capable of driving ten 74LS-type loads. It is  
offered in standard 8-pin and 14-pin auto-insertable DIPs and space saving surface mount 8-pin and 14-pin  
SOICs.  
TABLE 1: PART NUMBER SPECIFICATIONS  
PART  
BAUD RATE (MBaud)  
NUMBER  
3D7522-0.5  
3D7522-1  
Nominal  
Minimum  
0.43  
Maximum  
0.50  
1.00  
5.00  
0.57  
1.15  
0.85  
3D7522-5  
4.25  
5.75  
3D7522-10  
3D7522-20  
3D7522-25  
3D7522-50  
10.00  
20.00  
25.00  
50.00  
8.50  
11.50  
23.00  
28.75  
57.50  
17.00  
21.25  
42.50  
NOTES: Any baud rate between 0.5 and 50 MBaud not shown is also available at no extra cost.  
2006 Data Delay Devices  
Doc #06002  
5/8/2006  
DATA DELAY DEVICES, INC.  
1
3 Mt. Prospect Ave. Clifton, NJ 07013  
3D7522  
APPLICATION NOTES  
The 3D7522 Manchester Decoder samples the  
input at precise pre-selected intervals to retrieve  
the data and to recover the clock from the  
received data stream. Its architecture comprises  
finely tuned delay elements and proprietary  
circuitry which, in conjunction with other circuits,  
implement the data decoding and clock recovery  
function.  
OUTPUT SIGNAL CHARACTERISTICS  
The 3D7522 presents at its outputs the decoded  
data (inverted) and the recovered clock. The  
decoded data is valid at the rising edge of the  
clock.  
The clock recovery function operates in two  
modes dictated by the input data stream bit  
sequence. When a data bit is succeeded by its  
inverse, the clock recovery circuit is engaged and  
forces the clock output low for a time equal to  
one over twice the baud rate. Otherwise, the  
input is presented at the clock output unchanged,  
shifted in time.  
INPUT SIGNAL CHARACTERISTICS  
Encoded data transmitted from a source arrives  
at its destination corrupted. Such corruption of  
the received data manifests itself as jitter and/or  
pulse width distortion at the input to the device.  
The instantaneous deviations from nominal Baud  
Rate and/or Pulse Width (high or low) adversely  
impact the data extraction and clock recovery  
function if their published limits are exceeded.  
See Table 4, Allowed Baud Rate/Duty Cycle.  
When engaged, the clock recovery circuit  
generates a low-going pulse of fixed width.  
Therefore, the clock duty cycle is strongly  
dependent on the baud rate, as this will affect  
the clock-high duration.  
The 3D7522 Manchester Decoder Data Input is  
TTL compatible. The user should assure that  
the 1.5 volt TTL threshold is used when referring  
to all timing, especially the input pulse widths.  
The clock output falling edge is not operated on  
by the clock recovery circuitry. It, therefore,  
preserves more accurately the clock frequency  
information embedded in the transmitted data.  
Therefore, it can be used, if it is desired, to  
retrieve clock frequency information.  
FREQUENCY (JITTER) ERRORS  
The 3D7522 Manchester Decoder, being a self-  
timed device, is tolerant of frequency modulation  
(jitter) present in the input data stream, provided  
that the input data pulse width variations remain  
within the allowable ranges.  
POWER SUPPLY AND  
TEMPERATURE CONSIDERATIONS  
CMOS integrated circuitry is strongly dependent  
on power supply and temperature. The  
monolithic 3D7522 Manchester Decoder utilizes  
novel and innovative compensation circuitry to  
minimize timing variations induced by fluctuations  
in power supply and/or temperature.  
.
1
ENCODED  
0
1
0
1
0
0
1
RECEIVED  
(RX)  
tC  
tCL  
tCWL  
tCD  
CLOCK  
(CLK)  
DATA  
(DATB)  
DECODED  
1
0
1
1
0
0
1
Figure 1: Timing Diagram  
Doc #06002  
5/8/2006  
DATA DELAY DEVICES, INC.  
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com  
2
3D7522  
DEVICE SPECIFICATIONS  
TABLE 2: ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
DC Supply Voltage  
Input Pin Voltage  
Input Pin Current  
Storage Temperature  
Lead Temperature  
SYMBOL  
VDD  
MIN  
-0.3  
-0.3  
-10  
MAX  
7.0  
UNITS NOTES  
V
V
VIN  
VDD+0.3  
10  
IIN  
TSTRG  
TLEAD  
mA  
C
25C  
-55  
150  
300  
C
10 sec  
TABLE 3: DC ELECTRICAL CHARACTERISTICS  
(-40C to 85C, 4.75V to 5.25V)  
PARAMETER  
SYMBOL  
MIN  
MAX  
UNITS  
mA  
V
NOTES  
Static Supply Current*  
High Level Input Voltage  
Low Level Input Voltage  
High Level Input Current  
Low Level Input Current  
High Level Output Current  
IDD  
VIH  
VIL  
IIH  
5
2.0  
0.8  
1.0  
1.0  
-4.0  
V
VIH = VDD  
VIL = 0V  
VDD = 4.75V  
VOH = 2.4V  
VDD = 4.75V  
VOL = 0.4V  
CLD = 5 pf  
µA  
IIL  
IOH  
µA  
mA  
Low Level Output Current  
IOL  
4.0  
mA  
ns  
Output Rise & Fall Time  
TR & TF  
2
*IDD(Dynamic) = 2 * CLD * VDD * F  
Input Capacitance = 10 pf typical  
Output Load Capacitance (CLD) = 25 pf max  
where: CLD = Average capacitance load/pin (pf)  
F = Input frequency (GHz)  
TABLE 4: AC ELECTRICAL CHARACTERISTICS  
(-40C to 85C, 4.75V to 5.25V, except as noted)  
SYMBOL  
PARAMETER  
MIN  
5
TYP  
MAX  
50  
UNITS  
MBaud  
MBaud  
NOTES  
Nominal Input Baud Rate  
Allowed Input Baud Rate Deviation  
fBN  
fB  
-0.15 fBN  
0.15 fBN  
0C to 70C  
25C, 5.00V  
Allowed Input Baud Rate Deviation  
Allowed Input Baud Rate Deviation  
fB  
fB  
-0.05 fBN  
-0.03 fBN  
0.05 fBN  
0.03 fBN  
MBaud 4.75V to 5.25V  
MBaud  
-55C to 125C  
4.75V to 5.25V  
Allowed Input Duty Cycle  
Bit Cell Time  
42.5  
50.0  
1000/fB  
0.75 tc  
500/fBN  
4.0  
57.5  
%
ns  
ns  
ns  
ns  
tc  
tCL  
Input Data Edge to Clock Falling Edge  
Clock Width Low  
tCWL  
±2ns or 5%  
Clock Falling Edge to Data Transition  
tCD  
3.0  
5.0  
Doc #06002  
5/8/2006  
DATA DELAY DEVICES, INC.  
3
3 Mt. Prospect Ave. Clifton, NJ 07013  
3D7522  
SILICON DELAY LINE AUTOMATED TESTING  
TEST CONDITIONS  
INPUT:  
OUTPUT:  
Ambient Temperature: 25oC ± 3oC  
Supply Voltage (Vcc): 5.0V ± 0.1V  
Rload  
Cload  
:
:
10KΩ ± 10%  
5pf ± 10%  
Input Pulse:  
High = 3.0V ± 0.1V  
Threshold: 1.5V (Rising & Falling)  
Low = 0.0V ± 0.1V  
50Max.  
Source Impedance:  
Rise/Fall Time:  
3.0 ns Max. (measured  
between 0.6V and 2.4V )  
PWIN = 1/(2*BAUD)  
PERIN = 1/BAUD  
Device  
Digital  
Scope  
10KΩ  
Under  
Test  
Pulse Width:  
Period:  
5pf  
470Ω  
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.  
PRINTER  
COMPUTER  
SYSTEM  
WAVEFORM  
GENERATOR  
OUT  
IN DEVICE UNDER OUT  
TEST (DUT)  
IN  
DIGITAL SCOPE  
TRIG  
TRIG  
Figure 2: Test Setup  
PERIN  
PWIN  
tRISE  
tFALL  
INPUT  
VIH  
2.4V  
1.5V  
2.4V  
1.5V  
0.6V  
SIGNAL  
VIL  
0.6V  
tPLH  
tPHL  
OUTPUT  
SIGNAL  
VOH  
1.5V  
1.5V  
VOL  
Figure 3: Timing Diagram  
Doc #06002  
5/8/2006  
DATA DELAY DEVICES, INC.  
Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com  
4

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