DS2761BE [DALLAS]

High-Precision Li+ Battery Monitor; 高精度,Li +电池监视器
DS2761BE
型号: DS2761BE
厂家: DALLAS SEMICONDUCTOR    DALLAS SEMICONDUCTOR
描述:

High-Precision Li+ Battery Monitor
高精度,Li +电池监视器

电源电路 电池 电源管理电路 监视器 光电二极管
文件: 总24页 (文件大小:286K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DS2761  
High-Precision Li+ Battery Monitor  
www.maxim-ic.com  
PIN CONFIGURATION  
FEATURES  
1
2
3
4
C Lithium-Ion (Li+) Safety Circuit  
- Overvoltage Protection  
A
B
CC  
PLS  
DC  
1
2
16  
15  
14  
13  
12  
11  
10  
9
VIN  
SNS  
- Overcurrent/Short-Circuit Protection  
- Undervoltage Protection  
VDD  
PIO  
VSS  
VSS  
VSS  
PS  
PLS DC  
DQ  
3
C
D
C Zero Volt Battery Recovery Charge  
C Available in Two Configurations:  
- Internal 25mSense Resistor  
- External User-Selectable Sense Resistor  
C Current Measurement  
SNS  
CC  
IS2  
IS1  
SNS  
SNS  
SNS  
DQ  
4
5
6
7
8
Probe  
VSS  
VIN  
Probe  
E
F
VDD PIO  
PS  
IS2  
IS1  
VSS  
DS2761  
- 12-Bit Bidirectional Measurement  
- Internal Sense Resistor Configuration:  
0.625mA LSB and ±1.9A Dynamic Range  
- External Sense Resistor Configuration:  
15.625V LSB and ±64mV Dynamic  
Range  
DS2761  
16-Pin TSSOP Package  
Flip-Chip Packaging*  
Top View  
PIN DESCRIPTION  
- Charge Control Output  
CC  
DC  
C Current Accumulation:  
- Discharge Control Output  
- Internal Sense Resistor: 0.25mAhr LSB  
- External Sense Resistor: 6.25Vhr LSB  
C Voltage Measurement with 4.88mV  
Resolution  
DQ - Data Input/Output  
PIO - Programmable I/O Pin  
PLS - Battery Pack Positive Terminal Input  
- Power Switch Sense Input  
PS  
C Temperature Measurement Using Integrated  
Sensor with 0.125LC Resolution  
C System Power Management and Control  
Feature Support  
VIN - Voltage-Sense Input  
VDD - Power-Supply Input (2.5V to 5.5V)  
VSS - Device Ground  
SNS - Sense Resistor Connection  
IS1 - Current-Sense Input  
C 32 Bytes of Lockable EEPROM  
C 16 Bytes of General-Purpose SRAM  
C Dallas 1-Wire® Interface with Unique 64-bit  
Device Address  
IS2 - Current-Sense Input  
SNS Probe  
VSS Probe  
- Do Not Connect  
- Do Not Connect  
C Low Power Consumption:  
- Active Current: 60A typ, 90A max  
- Sleep Current:  
1A typ, 2A max  
* Mechanical drawing for the 16-pin TSSOP and DS2761 flip-chip package can be found at:  
http://pdfserv.maxim-ic.com/arpdf/Packages/16tssop.pdf  
http://pdfserv.maxim-ic.com/arpdf/Packages/chips/2761x.pdf  
1-Wire is a registered trademark of Dallas Semiconductor.  
1 of 24  
072303  
DS2761  
ORDERING INFORMATION  
PART  
MARKING DESCRIPTION  
DS2761AE  
D2761EA  
D2761EB  
D2761EA  
D2761EB  
2761A25  
2761B25  
TSSOP, External Sense Resistor, 4.275V VOV  
TSSOP, External Sense Resistor, 4.35V VOV  
DS2761AE on Tape-and-Reel  
DS2761BE  
DS2761AE/T&R  
DS2761BE/T&R  
DS2761AE-025  
DS2761BE-025  
DS2761BE on Tape-and-Reel  
TSSOP, 25mSense Resistor, 4.275V VOV  
TSSOP, 25mSense Resistor, 4.35V VOV  
DS2761AE-025 in Tape-and-Reel  
DS2761AE-025/T&R 2761A25  
DS2761BE-025/T&R 2761B25  
DS2761BE-025 in Tape-and-Reel  
DS2761AX-025/T&R DS2761AR Flip-Chip, 25mSense Resistor, Tape-and-Reel, 4.275V VOV  
DS2761BX-025/T&R DS2761BR Flip-Chip, 25mSense Resistor, Tape-and-Reel, 4.35V VOV  
DS2761AX/T&R  
DS2761BX/T&R  
DS2761A  
DS2761B  
Flip-Chip, External Sense Resistor, Tape-and-Reel, 4.275V VOV  
Flip-Chip, External Sense Resistor, Tape-and-Reel, 4.35V VOV  
Note: Additional VOV options are available, contact Maxim/Dallas Semiconductor sales.  
DESCRIPTION  
The DS2761 high-precision Li+ battery monitor is a data-acquisition, information-storage, and safety-  
protection device tailored for cost-sensitive battery pack applications. This low-power device integrates  
precise temperature, voltage, and current measurement, nonvolatile (NV) data storage, and Li+ protection  
into the small footprint of either a TSSOP package or flip-chip package. The DS2761 is a key component  
in applications including remaining capacity estimation, safety monitoring, and battery-specific data  
storage.  
Through its 1-Wire interface, the DS2761 gives the host system read/write access to status and control  
registers, instrumentation registers, and general-purpose data storage. Each device has a unique factory-  
programmed 64-bit net address that allows it to be individually addressed by the host system, supporting  
multibattery operation.  
The DS2761 is capable of performing temperature, voltage, and current measurement to a resolution  
sufficient to support process monitoring applications such as battery charge control, remaining capacity  
estimation, and safety monitoring. Temperature is measured using an on-chip sensor, eliminating the need  
for a separate thermistor. Bidirectional current measurement and accumulation are accomplished using  
either an internal 25msense resistor or an external device. The DS2761 also features a programmable  
I/O pin that allows the host system to sense and control other electronics in the pack, including switches,  
vibration motors, speakers, and LEDs.  
Three types of memory are provided on the DS2761 for battery information storage: EEPROM, lockable  
EEPROM, and SRAM. EEPROM memory saves important battery data in true NV memory that is  
unaffected by severe battery depletion, accidental shorts, or ESD events. Lockable EEPROM becomes  
ROM when locked to provide additional security for unchanging battery data. SRAM provides  
inexpensive storage for temporary data.  
2 of 24  
DS2761  
Figure 1. BLOCK DIAGRAM  
1-WIRE  
REGISTERS AND  
USER MEMORY  
DQ  
INTERFACE  
AND  
LOCKABLE EEPROM  
SRAM  
ADDRESS  
VOLTAGE  
THERMAL  
SENSE  
REFERENCE  
TEMPERATURE  
VOLTAGE  
VIN  
MUX  
ADC  
CURRENT  
+
TIMEBASE  
IS1  
ACCUM. CURRENT  
STATUS / CONTROL  
-
IS2  
PIO  
PLS  
PS  
LI-ION PROTECTION  
CC  
DC  
INTERNAL SENSE RESISTOR CONFIGURATION ONLY  
25m  
CHIP GROUND  
SNS  
V
SS  
IS2  
IS1  
TEST CURRENT AND RECOVERY CHARGE DETAIL  
IRC  
PLS  
VDD  
ITST  
ITST  
VSS  
3 of 24  
DS2761  
Table 1. DETAILED PIN DESCRIPTION  
SYMBOL  
TSSOP  
FLIP  
CHIP  
C1  
DESCRIPTION  
1
3
7
Charge Protection Control Output. Controls an external p-channel  
CC  
DC  
DQ  
high-side charge protection FET.  
B2  
B4  
Discharge Protection Control Output. Controls an external p-channel  
high-side discharge protection FET.  
Data Input/Out. 1-Wire data line. Open-drain output driver. Connect  
this pin to the DATA terminal of the battery pack. Pin has an internal  
1A pull-down for sensing disconnection.  
14  
2
E2  
B1  
Programmable I/O Pin. Used to control and monitor user-defined  
PIO  
PLS  
external circuitry. Open drain to VSS.  
Battery Pack Positive Terminal Input. The DS2761 monitors the pack  
plus terminal through PLS to detect overcurrent and overload conditions,  
as well as the presence of a charge source. Additionally, a charge path to  
recover a deeply depleted cell is provided from PLS to VDD. In sleep  
mode (with SWEN = 0), any capacitance or voltage source connected to  
PLS is discharged internally to VSS through 200A (nominal) to assure  
reliable detection of a valid charge source. For details of other internal  
connections to PLS and associated conditions see the Li+ Protection  
Circuitry section.  
10  
E4  
D1  
Power Switch Sense Input. The device wakes up from Sleep Mode  
when it senses the closure of a switch to VSS on this pin. Pin has an  
internal 1A pull-up to VDD.  
PS  
VIN  
VDD  
VSS  
16  
15  
Voltage Sense Input. The voltage of the Li+ cell is monitored via this  
input pin. This pin has a weak pullup to VDD.  
E1  
F3  
Power Supply Input. Connect to the positive terminal of the Li+ cell  
through a decoupling network.  
13,14,  
15  
Device Ground. Connect directly to the negative terminal of the Li+ cell.  
For the external sense resistor configuration, connect the sense resistor  
between VSS and SNS.  
SNS  
IS1  
4,5,6  
A3  
D4  
Sense Resistor Connection. Connect to the negative terminal of the  
battery pack. In the internal sense resistor configuration, the sense resistor  
is connected between VSS and SNS.  
Current Sense Input. This pin is internally connected to VSS through a  
4.7kresistor. Connect a 0.1F capacitor between IS1 and IS2 to  
complete a low-pass input filter.  
9
IS2  
8
C4  
C2  
Current Sense Input. This pin is internally connected to SNS through a  
4.7kresistor.  
SNS  
Probe  
VSS  
N/A  
Do Not Connect.  
Do Not Connect.  
N/A  
D2  
Probe  
4 of 24  
DS2761  
Figure 2. APPLICATION EXAMPLE  
102 x 2  
BAT+  
PACK+  
150ꢀ  
1kꢀ  
1kꢀ  
1kꢀ  
DS2761  
CC  
PLS  
DC  
VIN  
VDD  
PIO  
VSS  
VSS  
VSS  
PS  
104  
150ꢀ  
SNS  
SNS  
SNS  
DQ  
150ꢀ  
PS  
DATA  
IS2  
IS1  
4.7kꢀ  
102  
104  
PACK-  
BAT-  
(1)  
RSNS  
(2)  
RSNS-INT  
SNS  
VSS  
RKS  
IS1  
RKS  
IS2  
voltage  
sense  
DS2761  
1) RSNS is present for external sense resistor configurations only.  
2) RSNS-INT is present for internal sense resistor configurations only.  
5 of 24  
DS2761  
POWER MODES  
The DS2761 has two power modes: active and sleep. While in active mode, the DS2761 continually  
measures current, voltage, and temperature to provide data to the host system and to support current  
accumulation and Li+ safety monitoring. In sleep mode, the DS2761 ceases these activities. The DS2761  
enters sleep mode when any of the following conditions occurs:  
C The PMOD bit in the Status Register has been set to 1 and the DQ line is low for longer than  
2s (pack disconnection)  
C The voltage on VIN drops below undervoltage threshold VUV for tUVD (cell depletion)  
C The pack is disabled through the issuance of a SWAP command (SWEN bit = 1)  
The DS2761 returns to active mode when any of the following occurs:  
C The PMOD bit has been set to 1 and the SWEN bit is set to 0 and the DQ line is pulled high  
(pack connection)  
C The  
pin is pulled low (power switch)  
PS  
C The voltage on PLS becomes greater than the voltage on VIN (charger connection) with the SWEN bit  
set to 0  
C The pack is enabled through the issuance of a SWAP command (SWEN bit = 1)  
The DS2761 defaults to sleep mode when power is first applied.  
Li+ PROTECTION CIRCUITRY  
During active mode, the DS2761 constantly monitors cell voltage and current to protect the battery from  
overcharge (overvoltage), overdischarge (undervoltage), and excessive charge and discharge currents  
(overcurrent, short circuit). Conditions and DS2761 responses are described in the sections below and  
summarized in Table 2 and Figure 3.  
Table 2. Li+ PROTECTION CONDITIONS AND DS2761 RESPONSES  
CONDITION  
NAME  
ACTIVATION  
RELEASE  
THRESHOLD  
VIN < VCE, or  
VIS -2mV  
THRESHOLD DELAY  
RESPONSE  
high  
Overvoltage  
VIN > VOV  
tOVD  
CC  
(1)  
Undervoltage  
VIN < VUV  
tUVD  
VPLS > VDD  
,
high,  
CC DC  
(charger connected)  
Sleep Mode  
(2)  
(3)  
Overcurrent, Charge  
Overcurrent, Discharge  
Short Circuit  
VIS = VIS1 - VIS2. Logic high = VPLS for  
delivered from pin SNS.  
VIS > VOC  
VIS < -VOC  
tOCD  
tOCD  
tSCD  
VPLS < VDD - VTP  
VPLS > VDD - VTP  
VPLS > VDD - VTP  
,
high  
high  
CC DC  
(2)  
(4)  
(4)  
DC  
VSNS > VSC  
high  
DC  
and VDD for  
All voltages are with respect to VSS. ISNS references current  
DC.  
CC  
1) If VDD < 2.2V, release is delayed until the recovery charge current (IRC) passed from PLS to VDD charges the battery and  
allows VDD to exceed 2.2V.  
2) For the internal sense resistor configuration, the overcurrent thresholds are expressed in terms of current: I  
> I for  
OC  
SNS  
charge direction and I  
< -I for discharge direction  
SNS  
OC  
3) With test current I  
4) With test current I  
flowing from PLS to VSS (pulldown on PLS)  
flowing from VDD to PLS (pullup on PLS)  
TST  
TST  
Overvoltage. If the cell voltage on VIN exceeds the overvoltage threshold, VOV, for a period longer than  
overvoltage delay, tOVD, the DS2761 shuts off the external charge FET and sets the OV flag in the  
protection register. When the cell voltage falls below charge enable threshold VCE, the DS2761 turns the  
6 of 24  
DS2761  
charge FET back on (unless another protection condition prevents it). Discharging remains enabled  
during overvoltage, and the DS2761 re-enables the charge FET before VIN < VCE if a discharge current of  
-80mA (VIS -2mV) or less is detected.  
Undervoltage. If the voltage of the cell drops below undervoltage threshold VUV for a period longer than  
undervoltage delay tUVD, the DS2761 shuts off the charge and discharge FETs, sets the UV flag in the  
protection register, and enters sleep mode. The DS2761 provides a current-limited recovery charge path  
from PLS to VDD to gently charge severely depleted cells during sleep mode.  
Overcurrent, Charge Direction. The voltage difference between the IS1 pin and the IS2 pin (VIS = VIS1  
-
VIS2) is the filtered voltage drop across the current-sense resistor. If VIS exceeds overcurrent threshold  
VOC for a period longer than overcurrent delay tOCD, the DS2761 shuts off both external FETs and sets the  
COC flag in the protection register. The charge current path is not re-established until the voltage on the  
PLS pin drops below VDD - VTP. The DS2761 provides a test current of value ITST from PLS to VSS to pull  
PLS down in order to detect the removal of the offending charge current source.  
Overcurrent, Discharge Direction. If VIS is less than -VOC for a period longer than tOCD, the DS2761  
shuts off the external discharge FET and sets the DOC flag in the protection register. The discharge  
current path is not re-established until the voltage on PLS rises above VDD - VTP. The DS2761 provides a  
test current of value ITST from VDD to PLS to pull PLS up in order to detect the removal of the offending  
low-impedance load.  
Short Circuit. If the voltage on the SNS pin with respect to VSS exceeds short-circuit threshold VSC for a  
period longer than short-circuit delay tSCD, the DS2761 shuts off the external discharge FET and sets the  
DOC flag in the protection register. The discharge current path is not re-established until the voltage on  
PLS rises above VDD - VTP. The DS2761 provides a test current of value ITST from VDD to PLS to pull  
PLS up in order to detect the removal of the short circuit.  
Figure 3. Li+ PROTECTION CIRCUITRY EXAMPLE WAVEFORMS  
VOV  
VCE  
VCELL  
VUV  
CHARGE  
VIS  
VOC  
0
-VOC  
-VSC  
DISCHARGE  
(1)  
VPLS  
VSS  
tOVD  
tOVD  
tOCD  
CC  
DC  
VDD  
VSS  
tSCD  
tOCD  
tUVD  
ACTIVE  
SLEEP  
MODE  
INACTIVE  
(1) To allow the device to react quickly to short circuits, detection occurs on the SNS pin rather than on the  
filtered IS1 and IS2 pins. The actual short-circuit detect condition is VSNS > VSC.  
7 of 24  
DS2761  
Summary. All of the protection conditions described above are OR'ed together to affect the  
and  
DC  
CC  
outputs.  
= (Undervoltage) or (Overcurrent, Either Direction) or (Short Circuit) or  
(Protection Register Bit DE = 0) or (Sleep Mode)  
DC  
CC  
= (Overvoltage) or (Undervoltage) or (Overcurrent, Charge Direction) or (Protection Register  
bit CE = 0) or (Sleep Mode)  
CURRENT MEASUREMENT  
In the active mode of operation, the DS2761 continually measures the current flow into and out of the  
battery by measuring the voltage drop across a current-sense resistor. The DS2761 is available in two  
configurations: 1) internal 25mcurrent-sense resistor, and 2) external user-selectable sense resistor. In  
either configuration, the DS2761 considers the voltage difference between pins IS1 and IS2 (VIS = VIS1  
-
VIS2) to be the filtered voltage drop across the sense resistor. A positive VIS value indicates current is  
flowing into the battery (charging), while a negative VIS value indicates current is flowing out of the  
battery (discharging).  
VIS is measured with a signed resolution of 12-bits. The current register is updated in two’s-complement  
format every 88ms (128/fsample) with an average of 128 readings. Currents outside the range of the  
register are reported at the limit of the range. The format of the current register is shown in Figure 4.  
For the internal sense resistor configuration, the DS2761 maintains the current register in units of amps,  
with a resolution of 0.625mA and full-scale range of no less than M1.9A (see Note 7 on IFS spec for more  
details). The DS2761 automatically compensates for internal sense resistor process variations and  
temperature effects when reporting current.  
For the external sense resistor configuration, the DS2761 writes the measured VIS voltage to the current  
register, with a resolution of 15.625V and a full-scale range of M64mV.  
Figure 4. CURRENT REGISTER FORMAT  
MSB—Address 0E  
211 210 29 28 27 26 25  
LSb  
LSB—Address 0F  
24 23 22 21 20  
S
X
X
X
MSb  
MSb  
LSb  
Units: 0.625mA for Internal Sense Resistor  
15.625V for External Sense Resistor  
CURRENT ACCUMULATOR  
The current accumulator facilitates remaining capacity estimation by tracking the net current flow into  
and out of the battery. Current flow into the battery increments the current accumulator while current  
flow out of the battery decrements it. Data is maintained in the current accumulator in two’s-complement  
format. The format of the current accumulator is shown in Figure 5.  
8 of 24  
DS2761  
When the internal sense resistor is used, the DS2761 maintains the current accumulator in units of amp-  
hours, with a resolution of 0.25mAhrs and full-scale range of M8.2Ahrs. When using an external sense  
resistor, the DS2761 maintains the current accumulator in units of volt-hours, with a resolution of  
6.25Vhrs and a full scale range of M205mVhrs.  
The current accumulator is a read/write register that can be altered by the host system as needed.  
Figure 5. CURRENT ACCUMULATOR FORMAT  
MSB—Address 10  
LSB—Address 11  
S
214 213 212 211 210 29 28  
LSb  
27 26 25 24 23 22 21 20  
MSb  
MSb  
LSb  
Units: 0.25mAhrs for Internal Sense Resistor  
6.25Vhrs for External Sense Resistor  
CURRENT OFFSET COMPENSATION  
Current measurement and current accumulation are both internally compensated for offset on a continual  
basis minimizing error resulting from variations in device temperature and voltage. Additionally, a  
constant bias can be utilized to alter any other sources of offset. This bias resides in EEPROM address  
33h in two’s-complement format and is subtracted from each current measurement. The current offset  
bias is applied to both the internal and external sense resistor configurations. The factory default for the  
current offset bias is a value of 0.  
Figure 6. CURRENT OFFSET BIAS  
Address 33  
S
26 25 24 23 22 21 20  
MSb  
LSb  
Units: 0.625mA for Internal Sense Resistor  
15.625V for External Sense Resistor  
VOLTAGE MEASUREMENT  
The DS2761 continually measures the voltage between pins VIN and VSS over a range of 0 to 4.75V. The  
voltage register is updated in two’s-complement format every 3.4ms with a resolution of 4.88mV.  
Voltages above the maximum register value are reported as the maximum value. The voltage register  
format is shown in Figure 7.  
9 of 24  
DS2761  
Figure 7. VOLTAGE REGISTER FORMAT  
MSB—Address 0C  
29 28 27 26 25 24 23  
LSb  
LSB—Address 0D  
22 21 20  
MSb  
S
X
X
X
X
X
MSb  
LSb  
Units: 4.88mV  
TEMPERATURE MEASUREMENT  
The DS2761 uses an integrated temperature sensor to continually measure battery temperature.  
Temperature measurements are placed in the temperature register every 220ms in two’s-complement  
format with a resolution of 0.125°C over a range of M127°C. The temperature register format is shown in  
Figure 8.  
Figure 8. TEMPERATURE REGISTER FORMAT  
MSB—Address 18  
29 28 27 26 25 24 23  
LSb  
LSB—Address 19  
22 21 20  
MSb  
S
X
X
X
X
X
MSb  
LSb  
Units: 0.125LC  
PROGRAMMABLE I/O  
To use the PIO pin as an output, write the desired output value to the PIO bit in the special feature  
register. Writing a 0 to the PIO bit enables the PIO output driver, pulling the PIO pin to VSS. Writing a 1  
to the PIO bit disables the output driver, allowing the PIO pin to be pulled high or used as an input. To  
sense the value on the PIO pin, read the PIO bit. The DS2761 turns off the PIO output driver and sets the  
PIO bit high when in sleep mode or when DQ is low for more than 2s, regardless of the state of the  
PMOD bit.  
POWER SWITCH INPUT  
The DS2761 provides a power control function that uses the discharge protection FET to gate battery  
power to the system. The  
pin, internally pulled to VDD through a 1A current source, is continuously  
PS  
monitored for a low-impedance connection to VSS. If the DS2761 is in sleep mode, the detection of a low  
on the pin causes the device to transition into active mode, turning on the discharge FET. If the  
PS  
DS2761 is already in active mode, activity on  
has no effect other than the latching of its logic low  
PS  
level in the  
bit in the special feature register. The reading of a 0 in the  
bit should be immediately  
PS  
PS  
followed by writing a 1 to the  
bit to ensure that a subsequent low forced on the  
pin is latched into  
PS  
PS  
the  
bit.  
PS  
10 of 24  
DS2761  
MEMORY  
The DS2761 has a 256-byte linear address space with registers for instrumentation, status, and control in  
the lower 32 bytes, with lockable EEPROM and SRAM memory occupying portions of the remaining  
address space. All EEPROM and SRAM memory is general purpose except addresses 30h, 31h, and 33h,  
which should be written with the default values for the protection register, status register, and current  
offset register, respectively. When the MSB of any two-byte register is read, both the MSB and LSB are  
latched and held for the duration of the read data command to prevent updates during the read and ensure  
synchronization between the two register bytes. For consistent results, always read the MSB and the LSB  
of a two-byte register during the same read data command sequence.  
EEPROM memory is shadowed by RAM to eliminate programming delays between writes and to allow  
the data to be verified by the host system before being copied to EEPROM. All reads and writes to/from  
EEPROM memory actually access the shadow RAM. In unlocked EEPROM blocks, the write data  
command updates shadow RAM. In locked EEPROM blocks, the write data command is ignored. The  
copy data command copies the contents of shadow RAM to EEPROM in an unlocked block of EEPROM  
but has no effect on locked blocks. The recall data command copies the contents of a block of EEPROM  
to shadow RAM regardless of whether the block is locked or not.  
Table 3. MEMORY MAP  
ADDRESS (HEX)  
DESCRIPTION  
READ/WRITE  
00  
01  
Protection Register  
Status Register  
Reserved  
R/W  
R
02–06  
07  
EEPROM Register  
R/W  
R/W  
08  
Special Feature Register  
Reserved  
09–0B  
0C  
Voltage Register MSB  
Voltage Register LSB  
Current Register MSB  
Current Register LSB  
Accumulated Current Register MSB  
Accumulated Current Register LSB  
Reserved  
R
R
0D  
0E  
R
0F  
R
10  
R/W  
R/W  
11  
12–17  
18  
Temperature Register MSB  
Temperature Register LSB  
Reserved  
R
R
19  
1A–1F  
20–2F  
30–3F  
40–7F  
80–8F  
90–FF  
EEPROM, block 0  
EEPROM, block 1  
Reserved  
SRAM  
Reserved  
R/W*  
R/W*  
R/W  
* Each EEPROM block is read/write until locked by the LOCK command, after which it is read-only.  
11 of 24  
DS2761  
PROTECTION REGISTER  
The protection register consists of flags that indicate protection circuit status and switches that give  
conditional control over the charging and discharging paths. Bits OV, UV, COC, and DOC are set when  
corresponding protection conditions occur and remain set until cleared by the host system. The default  
values of the CE and DE bits of the protection register are stored in lockable EEPROM in the  
corresponding bits in address 30h. A recall data command for EEPROM block 1 recalls the default values  
into CE and DE. The format of the protection register is shown in Figure 9. The function of each bit is  
described in detail in the following paragraphs.  
Figure 9. PROTECTION REGISTER FORMAT  
Address 00  
Bit 7  
OV  
Bit 6  
UV  
Bit 5  
Bit 4  
Bit 3  
CC  
Bit 2  
DC  
Bit 1  
CE  
Bit 0  
DE  
COC  
DOC  
OV—Overvoltage Flag. When set to 1, this bit indicates the battery pack has experienced an overvoltage  
condition. This bit must be reset by the host system.  
UV—Undervoltage Flag. When set to 1, this bit indicates the battery pack has experienced an  
undervoltage condition. This bit must be reset by the host system.  
COC—Charge Overcurrent Flag. When set to 1, this bit indicates the battery pack has experienced a  
charge-direction overcurrent condition. This bit must be reset by the host system.  
DOC—Discharge Overcurrent Flag. When set to 1, this bit indicates the battery pack has experienced a  
discharge-direction overcurrent condition. This bit must be reset by the host system.  
CC CC Pin Mirror. This read-only bit mirrors the state of the CC output pin.  
DC DC Pin Mirror. This read-only bit mirrors the state of the DC output pin.  
CE—Charge Enable. Writing a 0 to this bit disables charging (CC output high, external charge FET off)  
regardless of cell or pack conditions. Writing a 1 to this bit enables charging, subject to override by the  
presence of any protection conditions. The DS2761 automatically sets this bit to 1 when it transitions  
from sleep mode to active mode.  
DE—Discharge Enable. Writing a 0 to this bit disables discharging (DC output high, external discharge  
FET off) regardless of cell or pack conditions. Writing a 1 to this bit enables discharging, subject to  
override by the presence of any protection conditions. The DS2761 automatically sets this bit to 1 when it  
transitions from sleep mode to active mode.  
STATUS REGISTER  
The default values for the status register bits are stored in lockable EEPROM in the corresponding bits of  
address 31h. A recall data command for EEPROM block 1 recalls the default values into the status  
register bits. The format of the status register is shown in Figure 10. The function of each bit is described  
in detail in the following paragraphs.  
12 of 24  
DS2761  
Figure 10. STATUS REGISTER FORMAT  
Address 01  
Bit 4 Bit 3  
PMOD RNAOP SWEN  
Bit 7  
X
Bit 6  
X
Bit 5  
Bit 2  
X
Bit 1  
X
Bit 0  
X
PMOD—Sleep Mode Enable. A value of 1 in this bit enables the DS2761 to enter sleep mode when the  
DQ line goes low for greater than 2s and to leave sleep mode when the DQ line goes high. A value of 0  
disables DQ-related transitions into and out of sleep mode. This bit is read-only. The desired default value  
should be set in bit 5 of address 31h. The factory default is 0.  
RNAOP—Read Net Address Opcode. A value of 0 in this bit sets the opcode for the read net address  
command to 33h, while a 1 sets the opcode to 39h. This bit is read-only. The desired default value should  
be set in bit 4 of address 31h. The factory default is 0.  
SWEN—SWAP Command Enable. A value of 1 in this bit location enables the recognition of a SWAP  
command. If set to 0, SWAP commands are ignored. The desired default value should be set in bit 3 of  
address 31h. This bit is read-only. The factory default is 0.  
X—Reserved Bits.  
EEPROM REGISTER  
The format of the EEPROM register is shown in Figure 11. The function of each bit is described in detail  
in the following paragraphs.  
Figure 11. EEPROM REGISTER FORMAT  
Address 07  
Bit 7  
EEC  
Bit 6  
LOCK  
Bit 5  
X
Bit 4  
X
Bit 3  
X
Bit 2  
X
Bit 1  
BL1  
Bit 0  
BL0  
EEC—EEPROM Copy Flag. A 1 in this read-only bit indicates that a copy data command is in progress.  
While this bit is high, writes to EEPROM addresses are ignored. A 0 in this bit indicates that data may be  
written to unlocked EEPROM blocks.  
LOCK—EEPROM Lock Enable. When this bit is 0, the lock command is ignored. Writing a 1 to this bit  
enables the lock command. After the lock command is executed, the LOCK bit is reset to 0. The factory  
default is 0.  
BL1—EEPROM Block 1 Lock Flag. A 1 in this read-only bit indicates that EEPROM block 1 (addresses  
30 to 3F) is locked (read-only) while a 0 indicates block 1 is unlocked (read/write).  
BL0—EEPROM Block 0 Lock Flag. A 1 in this read-only bit indicates that EEPROM block 0 (addresses  
20 to 2F) is locked (read-only) while a 0 indicates block 0 is unlocked (read/write).  
X—Reserved Bits.  
13 of 24  
DS2761  
SPECIAL FEATURE REGISTER  
The format of the special feature register is shown in Figure 12. The function of each bit is described in  
detail in the following paragraphs.  
Figure 12. SPECIAL FEATURE REGISTER FORMAT  
Address 08  
Bit 7  
PS  
Bit 6  
PIO  
Bit 5  
Bit 4  
X
Bit 3  
X
Bit 2  
X
Bit 1  
X
Bit 0  
X
MSTR  
PS PS Pin Latch. This bit latches a low state on the PS pin, and is cleared only by writing a 1 to this  
location. Writing this bit to a 1 immediately upon reading of a 0 value is recommended.  
PIO—PIO Pin Sense and Control. See the Programmable I/O section for details on this read/write bit.  
MSTR—SWAP Master Status Bit. This bit indicates whether a device has been selected through the  
SWAP command. Selection of this device through the SWAP command and the appropriate net address  
results in setting this bit, indicating that this device is the master. A 0 signifies that this device is not the  
master.  
X—Reserved Bits.  
1-WIRE BUS SYSTEM  
The 1-Wire bus is a system that has a single bus master and one or more slaves. A multidrop bus is a 1-  
Wire bus with multiple slaves. A single-drop bus has only one slave device. In all instances, the DS2761  
is a slave device. The bus master is typically a microprocessor in the host system. The discussion of this  
bus system consists of four topics: 64-bit net address, hardware configuration, transaction sequence, and  
1-Wire signaling.  
64-BIT NET ADDRESS  
Each DS2761 has a unique, factory-programmed 1-Wire net address that is 64 bits in length. The first  
eight bits are the 1-Wire family code (30h for DS2761). The next 48 bits are a unique serial number. The  
last eight bits are a cyclic redundancy check (CRC) of the first 56 bits (see Figure 13). The 64-bit net  
address and the 1-Wire I/O circuitry built into the device enable the DS2761 to communicate through the  
1-Wire protocol detailed in the 1-Wire Bus System section of this data sheet.  
Figure 13. 1-WIRE NET ADDRESS FORMAT  
8-BIT CRC  
MSb  
48-BIT SERIAL NUMBER  
8-BIT FAMILY  
CODE (30H)  
LSb  
CRC GENERATION  
The DS2761 has an 8-bit CRC stored in the most significant byte of its 1-Wire net address. To ensure  
error-free transmission of the address, the host system can compute a CRC value from the first 56 bits of  
the address and compare it to the CRC from the DS2761. The host system is responsible for verifying the  
CRC value and taking action as a result. The DS2761 does not compare CRC values and does not prevent  
14 of 24  
DS2761  
a command sequence from proceeding as a result of a CRC mismatch. Proper use of the CRC can result  
in a communication channel with a very high level of integrity.  
The CRC can be generated by the host using a circuit consisting of a shift register and XOR gates as  
shown in Figure 10, or it can be generated in software. Additional information about the Dallas 1-Wire  
CRC is available in Application Note 27, Understanding and Using Cyclic Redundancy Checks with  
Dallas Semiconductor Touch Memory Products. (This application not can be found on the Maxim/Dallas  
Semiconductor website at www.maxim-ic.com).  
In the circuit in Figure 14, the shift register bits are initialized to 0. Then, starting with the least  
significant bit of the family code, one bit at a time is shifted in. After the 8th bit of the family code has  
been entered, then the serial number is entered. After the 48th bit of the serial number has been entered,  
the shift register contains the CRC value.  
Figure 14. 1-WIRE CRC GENERATION BLOCK DIAGRAM  
INPUT  
MSb  
LSb  
XOR  
XOR  
XOR  
HARDWARE CONFIGURATION  
Because the 1-Wire bus has only a single line, it is important that each device on the bus be able to drive  
it at the appropriate time. To facilitate this, each device attached to the 1-Wire bus must connect to the  
bus with open-drain or tri-state output drivers. The DS2761 used an open-drain output driver as part of  
the bidirectional interface circuitry shown in Figure 15. If a bidirectional pin is not available on the bus  
master, separate output and input pins can be connected together.  
The 1-Wire bus must have a pullup resistor at the bus-master end of the bus. For short line lengths, the  
value of this resistor should be approximately 5k. The idle state for the 1-Wire bus is high. If, for any  
reason, a bus transaction must be suspended, the bus must be left in the idle state in order to properly  
resume the transaction later. If the bus is left low for more than 120s, slave devices on the bus begin to  
interpret the low period as a reset pulse, effectively terminating the transaction.  
Figure 15. 1-WIRE BUS INTERFACE CIRCUITRY  
Vpullup  
BUS MASTER  
DS2761 1-WIRE PORT  
(2.0V to 5.5V)  
4.7kꢀ  
Rx  
Rx  
Tx  
1A  
Tx  
(typ)  
Rx = RECEIVE  
Tx = TRANSMIT  
100ꢀ  
MOSFET  
15 of 24  
DS2761  
TRANSACTION SEQUENCE  
The protocol for accessing the DS2761 through the 1-Wire port is as follows:  
C Initialization  
C Net Address Command  
C Function Command  
C Transaction/Data  
The sections that follow describe each of these steps in detail.  
All transactions of the 1-Wire bus begin with an initialization sequence consisting of a reset pulse  
transmitted by the bus master followed by a presence pulse simultaneously transmitted by the DS2761  
and any other slaves on the bus. The presence pulse tells the bus master that one or more devices are on  
the bus and ready to operate. For more details, see the 1-Wire Signaling section.  
NET ADDRESS COMMANDS  
Once the bus master has detected the presence of one or more slaves, it can issue one of the net address  
commands described in the following paragraphs. The name of each ROM command is followed by the  
8-bit opcode for that command in square brackets. Figure 16 presents a transaction flowchart of the net  
address commands.  
Read Net Address [33h or 39h]. This command allows the bus master to read the DS2761’s 1-Wire net  
address. This command can only be used if there is a single slave on the bus. If more than one slave is  
present, a data collision occurs when all slaves try to transmit at the same time (open drain produces a  
wired-AND result). The RNAOP bit in the status register selects the opcode for this command, with  
RNAOP = 0 indicating 33h, and RNAOP = 1 indicating 39h.  
Match Net Address [55h]. This command allows the bus master to specifically address one DS2761 on  
the 1-Wire bus. Only the addressed DS2761 responds to any subsequent function command. All other  
slave devices ignore the function command and wait for a reset pulse. This command can be used with  
one or more slave devices on the bus.  
Skip Net Address [CCh]. This command saves time when there is only one DS2761 on the bus by  
allowing the bus master to issue a function command without specifying the address of the slave. If more  
than one slave device is present on the bus, a subsequent function command can cause a data collision  
when all slaves transmit data at the same time.  
Search Net Address [F0h]. This command allows the bus master to use a process of elimination to  
identify the 1-Wire net addresses of all slave devices on the bus. The search process involves the  
repetition of a simple three-step routine: read a bit, read the complement of the bit, then write the desired  
value of that bit. The bus master performs this simple three-step routine on each bit location of the net  
address. After one complete pass through all 64 bits, the bus master knows the address of one device. The  
remaining devices can then be identified on additional iterations of the process. See Chapter 5 of the Book  
of DS19xx iButton® Standards for a comprehensive discussion of a net address search, including an actual  
example. (This publication can be found on the Maxim/Dallas Semiconductor website at www.maxim-  
ic.com).  
16 of 24  
DS2761  
SWAP [AAh]. SWAP is a ROM level command specifically intended to aid in distributed multiplexing  
applications and is described specifically with regards to power control using the 27xx series of products.  
The term power control refers to the ability of the DS2761 to control the flow of power into or out the  
battery pack using control pins DC and CC . The SWAP command is issued followed by the net address.  
The effect is to cause the addressed device to enable power to or from the system while simultaneously  
(break-before-make) deselecting and powering down (SLEEP) all other packs. This switching sequence is  
controlled by a timing pulse issued on the DQ line following the net address. The falling edge of the pulse  
is used to disable power with the rising edge enabling power flow by the selected device. The DS2761  
recognizes a SWAP command, device address, and timing pulse only if the SWEN bit is set.  
FUNCTION COMMANDS  
After successfully completing one of the net address commands, the bus master can access the features of  
the DS2761 with any of the function commands described in the following paragraphs and summarized in  
Table 4. The name of each function is followed by the 8-bit opcode for that command in square brackets.  
Read Data [69h, XX]. This command reads data from the DS2761 starting at memory address XX. The  
LSb of the data in address XX is available to be read immediately after the MSb of the address has been  
entered. Because the address is automatically incremented after the MSb of each byte is received, the LSb  
of the data at address XX + 1 is available to be read immediately after the MSb of the data at address XX.  
If the bus master continues to read beyond address FFh, the DS2761 outputs logic 1 until a reset pulse  
occurs. Addresses labeled “Reserved” in the memory map contain undefined data. The read data  
command can be terminated by the bus master with a reset pulse at any bit boundary.  
Write Data [6Ch, XX]. This command writes data to the DS2761 starting at memory address XX. The  
LSb of the data to be stored at address XX can be written immediately after the MSb of address has been  
entered. Because the address is automatically incremented after the MSb of each byte is written, the LSb  
to be stored at address XX + 1 can be written immediately after the MSb to be stored at address XX. If  
the bus master continues to write beyond address FFh, the DS2761 ignores the data. Writes to read-only  
addresses, reserved addresses and locked EEPROM blocks are ignored. Incomplete bytes are not written.  
Writes to unlocked EEPROM blocks are to shadow RAM rather than EEPROM. See the Memory section  
for more details.  
Copy Data [48h, XX]. This command copies the contents of shadow RAM to EEPROM for the 16-byte  
EEPROM block containing address XX. Copy data commands that address locked blocks are ignored.  
While the copy data command is executing, the EEC bit in the EEPROM register is set to 1 and writes to  
EEPROM addresses are ignored. Reads and writes to non-EEPROM addresses can still occur while the  
copy is in progress. The copy data command execution time, tEEC, is 2ms typical and starts after the last  
address bit is transmitted.  
Recall Data [B8h, XX]. This command recalls the contents of the 16-byte EEPROM block containing  
address XX to shadow RAM.  
Lock [6Ah, XX]. This command locks (write-protects) the 16-byte block of EEPROM memory  
containing memory address XX. The LOCK bit in the EEPROM register must be set to l before the lock  
command is executed. If the LOCK bit is 0, the lock command has no effect. The lock command is  
permanent; a locked block can never be written again.  
17 of 24  
DS2761  
Table 4. FUNCTION COMMANDS  
COMMAND BUS STATE AFTER  
COMMAND  
DESCRIPTION  
PROTOCOL  
COMMAND  
PROTOCOL  
BUS DATA  
Reads data from  
memory starting at  
Up to 256 bytes  
of data  
Read Data  
Write Data  
Copy Data  
69h, XX  
6Ch, XX  
48h, XX  
Master Rx  
Master Tx  
Bus idle  
address XX  
Writes data to memory  
starting at address XX  
Copies shadow RAM  
data to EEPROM block  
containing address XX  
Recalls EEPROM block  
containing address XX  
to shadow RAM  
Up to 256 bytes  
of data  
None  
None  
None  
Recall Data  
Lock  
B8h, XX  
6Ah, XX  
Bus idle  
Bus idle  
Permanently locks the  
block of EEPROM  
containing address XX  
18 of 24  
DS2761  
Figure 16. NET ADDRESS COMMAND FLOW CHART  
MASTER Tx  
RESET PULSE  
DS2761 Tx  
PRESENCE PULSE  
MASTER Tx  
NET ADDRESS  
COMMAND  
33h / 39h  
READ  
NO  
55h  
NO  
F0h  
NO  
AAh  
NO  
CCh  
NO  
MATCH  
SEARCH  
SWAP  
SKIP  
YES  
YES  
YES  
YES  
YES  
MASTER Tx  
BIT 0  
MASTER Tx  
BIT 0  
MASTER Tx  
FUNCTION  
COMMAND  
DS2761 Tx  
FAMILY CODE  
1 BYTE  
DS2761 Tx BIT 0  
DS2761 Tx BIT 0  
MASTER Tx BIT 0  
DS2761 Tx  
SERIAL NUMBER  
6 BYTES  
BIT 0  
NO  
NO  
BIT 0  
NO  
BIT 0  
MATCH ?  
MATCH ?  
MATCH ?  
DS2761 Tx  
CRC  
1 BYTE  
YES  
YES  
YES  
MASTER Tx  
BIT 1  
MASTER Tx  
BIT 1  
DS2761 Tx BIT 1  
DS2761 Tx BIT 1  
MASTER Tx BIT 1  
BIT 1  
NO  
NO  
BIT 1  
NO  
BIT 1  
MATCH ?  
MATCH ?  
MATCH ?  
YES  
YES  
YES  
MASTER Tx  
BIT 63  
MASTER Tx  
BIT 63  
DS2761 Tx BIT 63  
DS2761 Tx BIT 63  
MASTER Tx BIT 63  
MASTER Tx  
FUNCTION  
COMMAND  
NO  
YES  
BIT 63  
BIT 63  
YES  
MATCH ?  
MATCH ?  
NO  
FALLING EDGE  
OF DQ  
RISING EDGE  
OF DQ  
DS2761 TO  
DS2761 TO  
SLEEP MODE  
ACTIVE MODE  
19 of 24  
DS2761  
I/O SIGNALING  
The 1-Wire bus requires strict signaling protocols to insure data integrity. The four protocols used by the  
DS2761 are as follows: the initialization sequence (reset pulse followed by presence pulse), write 0, write  
1, and read data. All of these types of signaling except the presence pulse are initiated by the bus master.  
The initialization sequence required to begin any communication with the DS2761 is shown in Figure 17.  
A presence pulse following a reset pulse indicates that the DS2761 is ready to accept a net address  
command. The bus master transmits (Tx) a reset pulse for tRSTL. The bus master then releases the line and  
goes into receive mode (Rx). The 1-Wire bus line is then pulled high by the pullup resistor. After  
detecting the rising edge on the DQ pin, the DS2761 waits for tPDH and then transmits the presence pulse  
for tPDL  
.
Figure 17. 1-WIRE INITIALIZATION SEQUENCE  
tRSTL  
tRSTH  
tPDH  
tPDL  
PACK+  
PACK-  
DQ  
LINE TYPE LEGEND:  
BUS MASTER ACTIVE LOW  
DS2761 ACTIVE LOW  
RESISTOR PULLUP  
BOTH BUS MASTER AND  
DS2761 ACTIVE LOW  
WRITE-TIME SLOTS  
A write-time slot is initiated when the bus master pulls the 1-Wire bus from a logic-high (inactive) level  
to a logic-low level. There are two types of write-time slots: write 1 and write 0. All write-time slots must  
be tSLOT (60s to 120s) in duration with a 1s minimum recovery time, tREC, between cycles. The  
DS2761 samples the 1-Wire bus line between 15s and 60s after the line falls. If the line is high when  
sampled, a write 1 occurs. If the line is low when sampled, a write 0 occurs (see Figure 18). For the bus  
master to generate a write 1 time slot, the bus line must be pulled low and then released, allowing the line  
to be pulled high within 15s after the start of the write time slot. For the host to generate a write 0 time  
slot, the bus line must be pulled low and held low for the duration of the write-time slot.  
READ-TIME SLOTS  
A read-time slot is initiated when the bus master pulls the 1-Wire bus line from a logic-high level to a  
logic-low level. The bus master must keep the bus line low for at least 1s and then release it to allow the  
DS2761 to present valid data. The bus master can then sample the data tRDV (15s) from the start of the  
read-time slot. By the end of the read-time slot, the DS2761 releases the bus line and allows it to be  
pulled high by the external pullup resistor. All read-time slots must be tSLOT (60s to 120s) in duration  
with a 1s minimum recovery time, tREC, between cycles. See Figure 18 for more information.  
20 of 24  
DS2761  
Figure 18. 1-WIRE WRITE- AND READ-TIME SLOTS  
WRITE 0 SLOT  
WRITE 1 SLOT  
tSLOT  
tSLOT  
tLOW1  
t
LOW0  
t
REC  
PACK+  
PACK-  
DQ  
DS2761 SAMPLE WINDOW  
MIN TYP
 
MAX  
15s  
DS2761 SAMPLE WINDOW  
MIN TYP
 
MAX  
15s  
>1s  
15s  
30s  
15s  
30s  
READ 0 SLOT  
READ 1 SLOT  
tSLOT  
tSLOT  
t
REC  
PACK+  
PACK–  
DQ  
>1s  
MASTER SAMPLE WINDOW  
LINE TYPE LEGEND:  
MASTER SAMPLE WINDOW  
tRDV  
tRDV  
BUS MASTER ACTIVE LOW  
DS2761 ACTIVE LOW  
BOTH BUS MASTER AND  
DS2761 ACTIVE LOW  
RESISTOR PULLUP  
Figure 19. SWAP COMMAND TIMING  
tSWL  
DQ  
tSWOFF  
CC , DC  
tSWON  
CC , DC  
21 of 24  
DS2761  
ABSOLUTE MAXIMUM RATINGS*  
Voltage on PLS and CC Pin, Relative to VSS  
Voltage on PIO Pin, Relative to VSS  
Voltage on VIN and PS, Relative to VSS  
Voltage on any Other Pin, Relative to VSS  
Continuous Internal Sense Resistor Current  
Pulsed Internal Sense Resistor Current  
Operating Temperature Range  
-0.3V to +18V  
-0.3V to +12V  
-0.3V to VDD + 0.3  
-0.3V to +6V  
M2.5A  
M50A for <100µs/sec, <1000 pulses  
-40°C to +85°C  
Storage Temperature Range  
-55°C to +125°C  
Soldering Temperature  
See IPC/JEDECJ-STD-020A  
* This is a stress rating only and functional operation of the device at these or any other conditions above  
those indicated in the operation sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods of time may affect reliability.  
RECOMMENDED DC  
OPERATING CONDITIONS  
(-20LC to +70LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
Supply Voltage  
Data Pin  
SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES  
VDD  
DQ  
2.5  
5.5  
+5.5  
V
V
1
1
-0.3  
DC ELECTRICAL CHARACTERISTICS  
(-20LC to +70LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
SYMBOL CONDITIONS MIN  
TYP MAX UNITS NOTES  
Active Current  
IACTIVE  
DQ = VDD,  
norm. operation  
DQ = 0V,  
60  
1
90  
2
A  
A  
Sleep Mode Current  
ISLEEP  
no activity,  
floating  
PS  
Input Logic High:  
DQ, PIO  
Input Logic High:  
VIH  
VIH  
VIL  
1.5  
V
V
V
1
1
1
VDD  
-
PS  
PS  
0.2V  
Input Logic Low:  
DQ, PIO  
0.4  
0.2  
VIL  
VOH  
V
V
1
1
Input Logic Low:  
Output Logic High:  
IOH = -0.1mA  
IOH = -0.1mA  
IOL = 0.1mA  
IOL = 4mA  
VPLS  
-
0.4V  
CC  
Output Logic High:  
VOH  
VOL  
VOL  
VDD  
-
V
V
V
1
1
1
0.4V  
DC  
Output Logic Low:  
0.4  
0.4  
CC , DC  
Output Logic Low:  
DQ, PIO  
DQ Pulldown Current  
Input Resistance: VIN  
Internal Current-Sense  
Resistor  
IPD  
RIN  
RSNS  
1
A  
Mꢀ  
mꢀ  
5
20  
25  
30  
+25LC  
DQ Low to Sleep time  
tSLEEP  
2.1  
s
22 of 24  
DS2761  
ELECTRICAL CHARACTERISTICS:  
PROTECTION CIRCUITRY  
(0LC to +50LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
SYMBOL  
MIN  
TYP  
MAX  
UNITS  
NOTES  
Overvoltage Detect  
VOV  
4.325  
4.250  
4.10  
2.5  
1.8  
45  
4.350  
4.275  
4.15  
2.6  
1.9  
47.5  
8.0  
200  
1
4.375  
4.300  
4.20  
2.7  
2.0  
50  
V
1, 2  
Charge Enable  
VCE  
VUV  
IOC  
V
V
A
mV  
A
1
1
3
1, 4  
3
1
Undervoltage Detect  
Overcurrent Detect  
Overcurrent Detect  
Short-Circuit Detect  
Short-Circuit Detect  
Overvoltage Delay  
Undervoltage Delay  
Overcurrent Delay  
Short-Circuit Delay  
Test Threshold  
VOC  
ISC  
5.0  
150  
0.8  
90  
11  
VSC  
tOVD  
tUVD  
tOCD  
tSCD  
VTP  
ITST  
IRC  
250  
1.2  
110  
20  
120  
1.5  
40  
mV  
sec  
ms  
ms  
s  
100  
10  
5
80  
100  
1.0  
20  
0.5  
10  
V
Test Current  
Recovery Charge Current  
A  
mA  
0.5  
1
2
13  
ELECTRICAL CHARACTERISTICS:  
TEMPERATURE, VOLTAGE, CURRENT  
(-20LC to +50LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
Temperature Resolution  
Temperature Full-Scale  
Magnitude  
Temperature Error  
Voltage Resolution  
Voltage Full-Scale  
Magnitude  
Voltage Offset Error  
Voltage Gain Error  
Current Resolution  
SYMBOL  
TLSB  
MIN  
TYP  
MAX  
UNITS  
LC  
NOTES  
0.125  
TFS  
127  
LC  
TERR  
VLSB  
VFS  
5
6
M3  
LC  
mV  
V
4.88  
4.75  
1.9  
VOERR  
VGERR  
ILSB  
1
5
LSB  
%
0.625  
15.625  
2.56  
mA  
V  
A
3
4
Current Full-Scale  
Magnitude  
Current Offset Error  
Current Gain Error  
IFS  
3, 4  
7
64  
mV  
LSB  
%
IOERR  
IGERR  
1
3
1
8
3, 9  
4
Accumulated Current  
Resolution  
qCA  
fSAMP  
tERR  
0.25  
6.25  
1456  
mAhr  
µVhr  
Hz  
3
4
Current Sampling  
Frequency  
Internal Timebase Accuracy  
%
10  
M1  
M3  
23 of 24  
DS2761  
ELECTRICAL CHARACTERISTICS:  
1-WIRE INTERFACE  
(-20LC to +70LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
SYMBOL MIN  
TYP  
MAX  
UNITS  
s  
NOTES  
Time Slot  
tSLOT  
60  
1
120  
Recovery Time  
tREC  
s  
Write 0 Low Time  
Write 1 Low Time  
Read Data Valid  
tLOW0  
tLOW1  
tRDV  
60  
1
120  
15  
15  
s  
s  
s  
Reset Time High  
tRSTH  
tRSTL  
tPDH  
480  
480  
15  
60  
0.2  
0
s  
Reset Time Low  
960  
60  
240  
120  
1
s  
Presence Detect High  
Presence Detect Low  
SWAP Timing Pulse Width  
SWAP Timing Pulse Falling  
s  
tPDL  
s  
tSWL  
s  
tSWOFF  
s  
12  
12  
Edge to DC Release  
SWAP Timing Pulse Rising Edge  
tSWON  
CDQ  
0
1
s  
to DC Engage  
DQ Capacitance  
60  
pF  
EEPROM RELIABILITY SPECIFICATION  
(-20LC to +70LC, 2.5V ? VDD ? 5.5V)  
PARAMETER  
SYMBOL MIN  
TYP  
MAX  
UNITS  
NOTES  
Copy to EEPROM Time  
EEPROM Copy Endurance  
tEEC  
NEEC  
2
10  
ms  
cycles  
25000  
11  
NOTES  
1) All voltages are referenced to VSS.  
2) See the Ordering Information section to determine the corresponding part number for each VOV value.  
3) Internal current-sense resistor configuration.  
4) External current-sense resistor configuration.  
5) Self-heating due to output pin loading and sense resistor power dissipation can alter the reading from  
ambient conditions.  
6) Voltage offset measurement is with respect to VOV at +25°C.  
7) The current register supports measurement magnitudes up to 2.56A using the internal sense resistor  
option and 64mV with the external resistor option. Compensation of the internal sense resistor value  
for process and temperature variation can reduce the maximum reportable magnitude to 1.9A.  
8) Current offset error null to ±1LSB typically requires 3.5s in-system calibration by user.  
9) Current gain error specification applies to gain error in converting the voltage difference at IS1 and  
IS2, and excludes any error remaining after the DS2761 compensates for the internal sense resistor’s  
temperature coefficient of 3700ppm/LC to an accuracy of M500ppm/LC. The DS2761 does not  
compensate for external sense resistor characteristics, and any error terms arising from the use of an  
external sense resistor should be taken into account when calculating total current measurement error.  
10) Typical value for tERR is at 3.6V and +25LC.  
11) Four year data retention at +70LC.  
12) Typical load capacitance on DC and CC is 1000pF.  
13) Test conditions are PLS = 4.1V, VDD = 2.5V. Maximum current for conditions of PLS = 15V,  
VDD = 0V is 10mA.  
24 of 24  

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