CY7C199D-10VXIT [CYPRESS]

256 K (32 K × 8) Static RAM; 256 K( 32 K A ?? 8 )静态RAM
CY7C199D-10VXIT
型号: CY7C199D-10VXIT
厂家: CYPRESS    CYPRESS
描述:

256 K (32 K × 8) Static RAM
256 K( 32 K A ?? 8 )静态RAM

文件: 总14页 (文件大小:476K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY7C199D  
256 K (32 K × 8) Static RAM  
256  
K (32 K × 8) Static RAM  
Features  
Functional Description  
Temperature ranges  
–40 °C to 85 °C  
The CY7C199D is a high performance CMOS static RAM  
organized as 32,768 words by 8-bits. Easy memory expansion is  
provided by an active LOW chip enable (CE), an active LOW  
output enable (OE) and tri-state drivers. This device has an  
automatic power-down feature, reducing the power consumption  
when deselected. The input and output pins (I/O0 through I/O7)  
are placed in a high impedance state when the device is  
deselected (CE HIGH), the outputs are disabled (OE HIGH), or  
during a write operation (CE LOW and WE LOW).  
Pin and function compatible with CY7C199C  
High speed  
tAA = 10 ns  
Low active power  
ICC = 80 mA at 10 ns  
Low CMOS standby power  
ISB2 = 3 mA  
Write to the device by taking chip enable (CE) and write enable  
(WE) inputs LOW. Data on the eight I/O pins (I/O0 through I/O7)  
is then written into the location specified on the address pins (A0  
through A14).  
2.0 V data retention  
Automatic power-down when deselected  
Read from the device by taking chip enable (CE) and output  
enable (OE) LOW while forcing write enable (WE) HIGH. Under  
these conditions, the contents of the memory location specified  
by the address pins appears on the I/O pins.  
Complementary metal oxide semiconductor (CMOS) for  
optimum speed/power  
Transistor-transistor logic (TTL) compatible inputs and outputs  
Easy memory expansion with CE and OE features  
Available in Pb-free 28-pin 300-Mil-wide molded small outline  
J-lead package (SOJ) and 28-pin thin small outline package  
(TSOP) I packages  
Logic Block Diagram  
I/O0  
I/O1  
I/O2  
I/O3  
I/O4  
I/O5  
I/O6  
I/O7  
Cypress Semiconductor Corporation  
Document Number: 38-05471 Rev. *I  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised June 2, 2011  
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CY7C199D  
Contents  
Pin Configuration .............................................................3  
Selection Guide ................................................................3  
Maximum Ratings .............................................................4  
Operating Range ...............................................................4  
Electrical Characteristics .................................................4  
Capacitance ......................................................................5  
Thermal Resistance ..........................................................5  
AC Test Loads and Waveforms .......................................5  
Switching Characteristics ................................................6  
Data Retention Characteristics .......................................7  
Data Retention Waveform ................................................7  
Switching Waveforms ......................................................7  
Truth Table ........................................................................9  
Ordering Information ........................................................9  
Ordering Code Definitions ...........................................9  
Package Diagrams ..........................................................10  
Acronyms ........................................................................12  
Document Conventions .................................................12  
Units of Measure .......................................................12  
Document History Page .................................................13  
Sales, Solutions, and Legal Information ......................14  
Worldwide Sales and Design Support .......................14  
Products ....................................................................14  
PSoC Solutions .........................................................14  
Document Number: 38-05471 Rev. *I  
Page 2 of 14  
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CY7C199D  
Pin Configuration  
Figure 1. 28-pin SOJ (Top View)  
Figure 2. 28-pin TSOP I (Top View)  
OE  
22  
23  
24  
25  
26  
27  
28  
1
2
3
4
5
6
A
0
21  
A
A
A
A
1
2
3
4
20 CE  
A
A
A
A
A
V
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
CC  
19  
18  
17  
16  
15  
14  
I/O  
I/O  
I/O  
I/O  
I/O  
7
6
5
4
3
WE  
A
4
A
3
WE  
A
TSOP I  
Top View  
(not to scale)  
V
2
CC  
A
A
A
A
A
A
10  
11  
12  
13  
14  
1
A
A
5
6
7
GND  
I/O  
OE  
13  
2
1
0
A
A
A
A
0
12 I/O  
CE  
I/O  
I/O  
I/O  
I/O  
I/O  
8
9
11  
10  
9
I/O  
7
A
A
A
14  
I/O  
I/O  
I/O  
A
A
0
1
2
6
5
4
3
10  
11  
13  
12  
7
8
GND  
Selection Guide  
Description  
-10 (Industrial)  
Unit  
ns  
Maximum access time  
10  
80  
3
Maximum operating current  
mA  
mA  
Maximum CMOS standby current  
Document Number: 38-05471 Rev. *I  
Page 3 of 14  
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CY7C199D  
DC input voltage [1] ............................. –0.5 V to VCC + 0.5 V  
Output current into outputs (LOW) ............................. 20 mA  
Maximum Ratings  
Exceeding the maximum ratings may impair the useful life of the  
device. These user guidelines are not tested.  
Static discharge voltage ........................................ > 2,001 V  
(per MIL-STD-883, method 3015)  
Storage temperature ................................ –65 C to +150 C  
Latch-up current ................................................... > 140 mA  
Ambient temperature with  
power applied .......................................... –55 C to +125 C  
Operating Range  
Supply voltage on  
CC to relative GND [1] ................................–0.5 V to +6.0 V  
Ambient  
V
Range  
VCC  
Speed  
Temperature  
DC voltage applied to outputs  
in high Z State [1] ................................0.5 V to VCC + 0.5 V  
Industrial –40 C to +85 C 5 V 0.5 V  
10 ns  
Electrical Characteristics  
Over the operating range  
CY7C199D-10  
Parameter  
VOH  
Description  
Test Conditions  
Unit  
Min  
2.4  
Max  
Output HIGH voltage  
Output LOW voltage  
Input HIGH voltage [1]  
Input LOW voltage [1]  
Input leakage current  
Output leakage current  
IOH = –4.0 mA  
IOL = 8.0 mA  
0.4  
V
VOL  
VIH  
VIL  
IIX  
V
2.2  
–0.5  
–1  
–1  
VCC + 0.5  
0.8  
V
V
GND < VI < VCC  
+1  
µA  
µA  
mA  
mA  
mA  
mA  
mA  
IOZ  
ICC  
GND < VO < VCC, output disabled  
+1  
VCC operating supply current VCC = VCC(max)  
OUT = 0 mA,  
f = fmax = 1/tRC  
,
100 MHz  
83 MHz  
66 MHz  
40 MHz  
80  
I
72  
58  
37  
ISB1  
ISB2  
Automatic CE power-down  
current— TTL Inputs  
VCC = VCC(max), CE > VIH,  
VIN > VIH or VIN < VIL, f = fmax  
10  
Automatic CE power-down  
current— CMOS Inputs  
VCC = VCC(max), CE > VCC – 0.3 V,  
VIN > VCC – 0.3 V or VIN < 0.3 V, f = 0  
3
mA  
Note  
1.  
V
= –2.0 V and V  
= V + 1 V for pulse durations of less than 5 ns.  
IH(max) CC  
IL(min)  
Document Number: 38-05471 Rev. *I  
Page 4 of 14  
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CY7C199D  
Capacitance  
Parameter [2]  
Description  
Test Conditions  
TA = 25 C, f = 1 MHz, VCC = 5.0 V  
Max  
Unit  
pF  
CIN  
Input capacitance  
8
8
COUT  
Output capacitance  
pF  
Thermal Resistance  
Parameter [2]  
Description  
Test Conditions  
28-pin SOJ 28-pin TSOP I Unit  
JA  
Thermal resistance  
(junction to ambient)  
Still air, soldered on a 3 × 4.5 inch,  
four-layer printed circuit board  
59.16  
54.65  
C/W  
JC  
Thermal resistance  
(junction to case)  
40.84  
21.49  
C/W  
AC Test Loads and Waveforms  
Figure 3. AC Test Loads and Waveforms [3]  
Z = 50  
ALL INPUT PULSES  
90%  
OUTPUT  
3.0 V  
10%  
GND  
90%  
10%  
50  
1.5 V  
30pF*  
* CAPACITIVE LOAD CONSISTS  
OF ALL COMPONENTS OF THE  
TEST ENVIRONMENT  
Rise Time: 3 ns  
Fall Time: 3 ns  
(b)  
(a)  
High Z characteristics:  
R1 480   
5 V  
OUTPUT  
R2  
255   
5 pF  
INCLUDING  
JIG AND SCOPE  
(c)  
Notes  
2. Tested initially and after any design or process changes that may affect these parameters.  
3. AC characteristics (except high Z) are tested using the load conditions shown in Figure 3 (a). High Z characteristics are tested for all speeds using the test load  
shown in Figure 3 (c).  
Document Number: 38-05471 Rev. *I  
Page 5 of 14  
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CY7C199D  
Switching Characteristics  
Over the operating range  
CY7C199D-10  
Parameter [4]  
Description  
Unit  
Min  
Max  
Read Cycle  
[5]  
tpower  
tRC  
VCC(typical) to the first access  
100  
10  
s  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Read cycle time  
tAA  
Address to data valid  
Data hold from address change  
CE LOW to data valid  
OE LOW to data valid  
OE LOW to low Z  
10  
tOHA  
tACE  
tDOE  
3
10  
5
[6]  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
0
[6, 7]  
[6]  
OE HIGH to high Z  
5
CE LOW to low Z  
3
[6, 7]  
CE HIGH to high Z  
5
[8]  
tPU  
CE LOW to power-up  
CE HIGH to power-down  
0
[8]  
tPD  
10  
Write Cycle [9, 10]  
tWC  
tSCE  
tAW  
Write cycle time  
10  
7
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
CE LOW to write end  
Address setup to write end  
Address hold from write end  
Address setup to write start  
WE pulse width  
7
tHA  
0
tSA  
0
tPWE  
tSD  
7
Data setup to write end  
Data hold from write end  
WE LOW to high Z  
6
tHD  
0
[6]  
tHZWE  
[6, 7]  
tLZWE  
WE HIGH to low Z  
3
Notes  
4. Test conditions assume signal transition time of 3 ns or less for all speeds, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V, and output loading of the  
specified I /I and 30-pF load capacitance.  
OL OH  
5.  
t
gives the minimum amount of time that the power supply should be at typical V values until the first memory access can be performed.  
POWER CC  
6. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
7.  
t
, t  
, and t  
are specified with C = 5 pF as in part (b) of Figure 3 on page 5. Transition is measured 200 mV from steady-state voltage.  
HZOE HZCE  
HZWE L  
8. This parameter is guaranteed by design and is not tested.  
9. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate a write  
by going HIGH. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write.  
10. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of t  
and t .  
SD  
HZWE  
Document Number: 38-05471 Rev. *I  
Page 6 of 14  
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CY7C199D  
Data Retention Characteristics  
Over the operating range  
Parameter  
VDR  
ICCDR  
Description  
VCC for data retention  
Conditions  
Min  
2.0  
Max  
Unit  
V
Data retention current  
VCC = VDR = 2.0 V, CE > VCC – 0.3 V,  
VIN > VCC – 0.3 V or VIN < 0.3 V  
3
mA  
[11]  
tCDR  
Chip deselect to data retention time  
Operation recovery time  
0
ns  
ns  
[12]  
tR  
15  
Data Retention Waveform  
DATA RETENTION MODE  
VCC  
CE  
4.5 V  
4.5 V  
V
DR  
> 2 V  
t
t
R
CDR  
Switching Waveforms  
Figure 4. Read Cycle No. 1: Address Transition Controlled [13, 14]  
tRC  
ADDRESS  
DATA OUT  
tAA  
tOHA  
PREVIOUS DATA VALID  
Figure 5. Read Cycle No. 2 OE Controlled [14, 15]  
DATA VALID  
t
RC  
CE  
OE  
t
ACE  
t
t
HZOE  
t
DOE  
HZCE  
t
LZOE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PD  
t
PU  
VCC  
SUPPLY  
CURRENT  
ICC  
ISB  
50%  
50%  
Notes  
11. Tested initially and after any design or process changes that may affect these parameters.  
12. Full device operation requires linear V ramp from V to V > 50 µs or stable at V > 50 µs.  
CC(min)  
CC  
DR  
CC(min)  
13. Device is continuously selected. OE, CE = V .  
IL  
14. WE is HIGH for read cycle.  
15. Address valid prior to or coincident with CE transition LOW.  
Document Number: 38-05471 Rev. *I  
Page 7 of 14  
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CY7C199D  
Switching Waveforms (continued)  
Figure 6. Write Cycle No. 1: CE Controlled [16, 17, 18]  
t
WC  
ADDRESS  
CE  
t
SCE  
t
SA  
t
t
HA  
AW  
WE  
t
t
HD  
SD  
DATA I/O  
DATA VALID  
IN  
Figure 7. Write Cycle No. 3 WE Controlled, OE LOW [18, 19]  
t
WC  
ADDRESS  
CE  
t
t
HA  
AW  
t
SA  
WE  
t
t
HD  
SD  
NOTE 20  
DATAIN VALID  
DATA IO  
t
t
LZWE  
HZWE  
Notes  
16. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate  
a write by going HIGH. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write.  
17. Data I/O is high impedance if OE = V  
.
IH  
18. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.  
19. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of t  
and t  
.
HZWE  
SD  
20. During this period the I/Os are in the output state and input signals should not be applied.  
Document Number: 38-05471 Rev. *I  
Page 8 of 14  
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CY7C199D  
Truth Table  
CE  
H
L
WE  
X
OE  
X
Inputs/Outputs  
Mode  
Deselect/power-down  
Read  
Power  
High Z  
Data out  
Data in  
High Z  
Standby (ISB  
Active (ICC  
Active (ICC  
Active (ICC  
)
H
L
)
L
L
X
Write  
)
L
H
H
Deselect, output disabled  
)
Ordering Information  
Cypress offers other versions of this type of product in many different configurations and features. The following table contains only  
the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at http://www.cypress.com  
and refer to the product summary page at http://www.cypress.com/products or contact your local sales representative.  
Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives and distributors. To find the office  
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.  
Speed  
(ns)  
Package  
Diagram  
Operating  
Range  
Package Type  
Ordering Code  
CY7C199D-10VXI  
CY7C199D-10ZXI  
10  
51-85031 28-pin (300-Mil) Molded SOJ (Pb-free)  
51-85071 28-pin TSOP Type I (Pb-free)  
Industrial  
Please contact your local Cypress sales representative for availability of these parts.  
Ordering Code Definitions  
I
CY  
7
C
1
9
9
D - XX  
X
X
Temperature Grade: I  
I = Industrial  
Pb-free  
Package Type: V or Z  
V = 28 pin (300-Mil) Molded SOJ  
Z = 28 pin TSOP Type 1  
Speed Grade: 10 ns  
Process Technology: 90 nm  
Bus Width = × 8  
Density = 256 K  
Fast SRAM Family  
Technology Code: C = CMOS  
Marketing Code: 7 = SRAM  
Company ID: CY = Cypress  
Document Number: 38-05471 Rev. *I  
Page 9 of 14  
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CY7C199D  
Package Diagrams  
Figure 8. 28-pin SOJ 300-Mils V28.3 (Molded SOJ V21)  
51-85031 *D  
Document Number: 38-05471 Rev. *I  
Page 10 of 14  
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CY7C199D  
Package Diagrams (continued)  
Figure 9. 28-pin TSOP Type 1 (8 × 13.4 × 1.2 mm) Z28 (Standard)  
51-85071 *I  
Document Number: 38-05471 Rev. *I  
Page 11 of 14  
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CY7C199D  
Acronyms  
Document Conventions  
Units of Measure  
Acronym  
Description  
CE  
chip enable  
Symbol  
°C  
Unit of Measure  
CMOS  
I/O  
complementary metal oxide semiconductor  
input/output  
degree Celsius  
micro Amperes  
micro seconds  
milli Amperes  
milli meter  
µA  
µs  
mA  
mm  
ns  
OE  
output enable  
SOJ  
SRAM  
TSOP  
TTL  
small outline J-lead  
static random access memory  
thin small outline package  
transistor-transistor logic  
write enable  
nano seconds  
pico Farad  
Volts  
pF  
V
WE  
W
Watts  
Document Number: 38-05471 Rev. *I  
Page 12 of 14  
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CY7C199D  
Document History Page  
Document Title: CY7C199D, 256 K (32 K × 8) Static RAM  
Document Number: 38-05471  
Orig. of Submission  
Revision  
ECN  
Description of Change  
Change  
Date  
**  
201560  
233728  
SWI  
See ECN Advance Information datasheet for C9 IPP  
*A  
RKF  
See ECN DC parameters modified as per EROS (Spec # 01-02165)  
Pb-free Offering in Ordering Information  
*B  
262950  
RKF  
See ECN Removed 28-LCC Pinout and Package Diagrams  
Added Data Retention Characteristics table  
Added Tpower Spec in Switching Characteristics table  
Shaded Ordering Information  
*C  
*D  
307594  
820660  
RKF  
VKN  
See ECN Reduced Speed bins to -10, -12 and -15 ns  
See ECN Converted from Preliminary to Final  
Removed 12 ns and 15 ns speed bin  
Removed Commercial Operating range  
Removed “L” part  
Removed 28-pin PDIP and 28-pin SOIC package  
Changed Overshoot spec from VCC+2V to VCC+1V in footnote #2  
Changed ICC spec from 60 mA to 80 mA for 100 MHz speed bin  
Added ICC specs for 83 MHz, 66 MHz and 40 MHz speed bins  
Updated Thermal Resistance table  
Updated Ordering Information Table  
*E  
2745093  
VKN  
See ECN Included 28-Pin SOIC package  
Changed VIH level from 2.0V to 2.2V  
For Industrial grade, changed tSD from 5 ns to 6 ns, and tHZWE from 6 ns to 5 ns  
Included Automotive-E information  
*F  
2897087  
3023234  
AJU  
03/22/10  
Removed obsolete parts from ordering information table  
Updated package diagrams  
*G  
RAME  
09/06/2010 Added Auto-E SOIC package related info  
Changed TDOE spec from 10 ns to 11 ns in CY7C199D-25.  
Added Ordering Code Definitions.  
Added Acronyms and Document Conventions.  
*H  
*I  
3130763  
3271782  
PRAS  
PRAS  
01/07/11  
Dislodged Automotive information to a new datasheet (001-65530)  
06/02/2011 Updated Functional Description (Removed “For best practice  
recommendations, refer to the Cypress application note AN1064, SRAM System  
Guidelines.”).  
Updated Package Diagrams.  
Updated in new template.  
Document Number: 38-05471 Rev. *I  
Page 13 of 14  
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CY7C199D  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
Products  
Automotive  
cypress.com/go/automotive  
cypress.com/go/clocks  
cypress.com/go/interface  
cypress.com/go/powerpsoc  
cypress.com/go/plc  
PSoC Solutions  
Clocks & Buffers  
Interface  
psoc.cypress.com/solutions  
PSoC 1 | PSoC 3 | PSoC 5  
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Memory  
cypress.com/go/memory  
cypress.com/go/image  
cypress.com/go/psoc  
Optical & Image Sensing  
PSoC  
Touch Sensing  
USB Controllers  
Wireless/RF  
cypress.com/go/touch  
cypress.com/go/USB  
cypress.com/go/wireless  
© Cypress Semiconductor Corporation, 2004-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of  
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as  
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and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress  
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
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Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document Number: 38-05471 Rev. *I  
Revised June 2, 2011  
Page 14 of 14  
All products and company names mentioned in this document may be the trademarks of their respective holders.  
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