CY7C1021DV33-10ZSXAT [CYPRESS]

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CY7C1021DV33-10ZSXAT
型号: CY7C1021DV33-10ZSXAT
厂家: CYPRESS    CYPRESS
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CY7C1021DV33  
1-Mbit (64K x 16) Static RAM  
Features  
Functional Description[1]  
Temperature Ranges  
The CY7C1021DV33 is a high-performance CMOS static  
RAM organized as 65,536 words by 16 bits. This device has  
an automatic power-down feature that significantly reduces  
power consumption when deselected.  
— Industrial: –40°C to 85°C  
— Automotive-A: –40°C to 85°C  
— Automotive-E: –40°C to 125°C  
• Pin-and function-compatible with CY7C1021CV33  
• High speed  
Writing to the device is accomplished by taking Chip Enable  
(CE) and Write Enable (WE) inputs LOW. If Byte Low Enable  
(BLE) is LOW, then data from I/O pins (I/O0 through I/O7), is  
written into the location specified on the address pins (A0  
through A15). If Byte High Enable (BHE) is LOW, then data  
from I/O pins (I/O8 through I/O15) is written into the location  
specified on the address pins (A0 through A15).  
— tAA = 10 ns  
• Low active power  
— ICC = 60 mA @ 10 ns  
Reading from the device is accomplished by taking Chip  
Enable (CE) and Output Enable (OE) LOW while forcing the  
Write Enable (WE) HIGH. If Byte Low Enable (BLE) is LOW,  
then data from the memory location specified by the address  
pins will appear on I/O0 to I/O7. If Byte High Enable (BHE) is  
LOW, then data from memory will appear on I/O8 to I/O15. See  
the truth table at the end of this data sheet for a complete  
description of Read and Write modes.  
• Low CMOS standby power  
— ISB2 = 3 mA  
• 2.0V data retention  
• Automatic power-down when deselected  
• CMOS for optimum speed/power  
• Independent control of upper and lower bits  
• Available in Pb-free 44-pin 400-Mil wide Molded SOJ,  
44-pin TSOP II and 48-ball VFBGA packages  
The input/output pins (I/O0 through I/O15) are placed in a  
high-impedance state when the device is deselected (CE  
HIGH), the outputs are disabled (OE HIGH), the BHE and BLE  
are disabled (BHE, BLE HIGH), or during a Write operation  
(CE LOW, and WE LOW).  
The CY7C1021DV33 is available in Pb-free 44-pin 400-Mil  
wide Molded SOJ, 44-pin TSOP II and 48-ball VFBGA  
packages.  
Logic Block Diagram  
DATA IN DRIVERS  
A7  
A6  
A5  
64K x 16  
A4  
I/O0–I/O7  
RAM Array  
A3  
A2  
A1  
A0  
I/O8–I/O15  
COLUMN DECODER  
BHE  
WE  
CE  
OE  
BLE  
Note  
1. For guidelines on SRAM system design, please refer to the “System Design Guidelines” Cypress application note, available on the internet at www.cypress.com  
Cypress Semiconductor Corporation  
Document #: 38-05460 Rev. *F  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised December 14, 2010  
[+] Feedback  
CY7C1021DV33  
Selection Guide  
–10 (Industrial/Automotive-A)  
–12 (Automotive-E)[2]  
Unit  
ns  
10  
60  
3
Maximum Access Time  
12  
100  
15  
mA  
mA  
Maximum Operating Current  
Maximum CMOS Standby Current  
Pin Configuration[3]  
SOJ/TSOP II  
Top View  
48-ball VFBGA  
Top View  
A
A
A
A
A
7
OE  
BHE  
BLE  
I/O  
15  
I/O  
I/O  
13  
I/O  
1
2
3
4
5
6
7
8
44  
4
3
5
1
4
3
2
5
6
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
6
A
A
A
2
1
A
A
A
NC  
I/O  
OE  
BLE  
0
1
2
A
B
C
0
I/O  
A
A
4
BHE  
CE  
CE  
8
3
0
I/O  
0
1
2
3
I/O  
I/O  
I/O  
V
14  
I/O  
10  
A
A
6
I/O  
I/O  
I/O  
1
5
9
2
9
10  
11  
12  
13  
14  
15  
16  
12  
I/O  
A
I/O  
V
CC  
V
NC  
NC  
3
D
E
F
SS  
7
11  
V
SS  
CC  
V
SS  
V
CC  
I/O  
I/O  
I/O  
I/O  
I/O  
NC  
4
5
6
7
V
V
SS  
I/O  
I/O  
11  
10  
CC  
12  
4
I/O  
I/O  
I/O  
9
I/O  
A
A
I/O  
I/O  
I/O  
6
14  
15  
5
13  
14  
8
WE 17  
A
NC  
A
A
A
I/O  
7
18  
G
H
15  
I/O  
NC  
WE  
8
13  
12  
15  
A
A
A
A
19  
20  
21  
22  
14  
13  
12  
9
A
A
10  
11  
A
A
A
A
NC  
NC  
10  
9
11  
8
NC  
NC  
Notes  
2. Automotive product information is Preliminary.  
3. NC pins are not connected on the die.  
Document #: 38-05460 Rev. *F  
Page 2 of 13  
[+] Feedback  
CY7C1021DV33  
Current into Outputs (LOW)......................................... 20 mA  
Maximum Ratings  
Static Discharge Voltage...........................................> 2001V  
(per MIL-STD-883, Method 3015)  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Latch-up Current......................................................>200 mA  
Storage Temperature .................................65C to +150C  
Ambient Temperature with  
Power Applied.............................................55C to +125C  
Operating Range  
Ambient  
Temperature  
Supply Voltage on VCC to Relative GND[4] .... –0.3V to +4.6V  
Range  
VCC  
Speed  
DC Voltage Applied to Outputs  
Industrial  
–40 C to +85 C 3.3V 0.3V  
10 ns  
10 ns  
12 ns  
in High-Z State[4] ......................................–0.3V to VCC+0.3V  
Automotive-A –40 C to +85 C  
Automotive-E –40 C to +125 C  
DC Input Voltage[4]...................................–0.3V to VCC+0.3V  
DC Electrical Characteristics Over the Operating Range  
–10 (Ind’l/Auto-A)  
–12 (Auto-E)  
Min. Max.  
Parameter  
Description  
Test Conditions  
Unit  
Min.  
Max.  
VOH  
VOL  
VIH  
VIL  
IIX  
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
Input LOW Voltage[4]  
Input Leakage Current  
Output Leakage Current  
VCC = Min., IOH = –4.0 mA  
VCC = Min., IOL = 8.0 mA  
2.4  
2.4  
V
V
0.4  
VCC + 0.3  
0.8  
0.4  
2.0  
0.3  
1  
2.0  
0.3  
5  
VCC + 0.3  
V
0.8  
+5  
+5  
-
V
GND < VI < VCC  
+1  
A  
A  
mA  
mA  
mA  
mA  
mA  
IOZ  
ICC  
GND < VI < VCC, Output Disabled  
1  
+1  
5  
VCC Operating  
Supply Current  
VCC = Max.,  
IOUT = 0 mA,  
f = fMAX = 1/tRC  
100 MHz  
83 MHz  
66 MHz  
40 MHz  
60  
55  
100  
90  
60  
50  
45  
30  
ISB1  
ISB2  
AutomaticCEPower-Down Max. VCC, CE > VIH  
Current —TTL Inputs VIN > VIH or VIN < VIL, f = fMAX  
10  
AutomaticCEPower-Down Max. VCC, CE > VCC – 0.3V,  
3
15  
mA  
Current —CMOS Inputs  
VIN > VCC – 0.3V or VIN < 0.3V, f = 0  
Capacitance[5]  
Parameter  
CIN  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
Max.  
Unit  
pF  
TA = 25C, f = 1 MHz, VCC = 3.3V  
8
8
COUT  
pF  
Thermal Resistance[5]  
Parameter  
JA  
Description  
Test Conditions  
SOJ TSOP II VFBGA Unit  
Thermal Resistance  
(Junction to Ambient)  
Still Air, soldered on a 3 × 4.5 inch,  
four-layer printed circuit board  
59.52  
53.91  
36  
C/W  
JC  
Thermal Resistance  
(Junction to Case)  
36.75  
21.24  
9
C/W  
Notes  
4. V (min.) = –2.0V and V (max) = V + 1V for pulse durations of less than 5 ns.  
IL  
IH  
CC  
5. Tested initially and after any design or process changes that may affect these parameters.  
Document #: 38-05460 Rev. *F  
Page 3 of 13  
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CY7C1021DV33  
AC Test Loads and Waveforms[6]  
ALL INPUT PULSES  
3.0V  
Z = 50  
90%  
10%  
90%  
10%  
OUTPUT  
50  
30 pF*  
GND  
* CAPACITIVE LOAD CONSISTS  
OF ALL COMPONENTS OF THE  
TEST ENVIRONMENT  
1.5V  
Fall Time: 1 V/ns  
Rise Time: 1 V/ns  
(b)  
(a)  
High-Z characteristics:  
R 317  
3.3V  
OUTPUT  
5 pF  
R2  
351  
(c)  
Note  
6. AC characteristics (except High-Z) are tested using the load conditions shown in Figure (a). High-Z characteristics are tested for all speeds using the test load  
shown in Figure (c).  
Document #: 38-05460 Rev. *F  
Page 4 of 13  
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CY7C1021DV33  
Switching Characteristics Over the Operating Range[7]  
-10 (Ind’l/Auto-A)  
-12 (Auto-E)  
Parameter  
Description  
Min.  
Max.  
Min.  
Max.  
Unit  
Read Cycle  
[8]  
tpower  
VCC(typical) to the first access  
Read Cycle Time  
100  
10  
100  
12  
s  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tRC  
tAA  
Address to Data Valid  
Data Hold from Address Change  
CE LOW to Data Valid  
OE LOW to Data Valid  
OE LOW to Low-Z[10]  
OE HIGH to High-Z[9, 10]  
CE LOW to Low-Z[10]  
CE HIGH to High-Z[9, 10]  
CE LOW to Power-Up  
CE HIGH to Power-Down  
Byte Enable to Data Valid  
Byte Enable to Low-Z  
Byte Disable to High-Z  
10  
12  
tOHA  
tACE  
tDOE  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
3
3
10  
5
12  
6
0
3
0
0
3
0
5
5
6
6
[11]  
tPU  
[11]  
tPD  
10  
5
12  
6
tDBE  
tLZBE  
tHZBE  
Write Cycle[12]  
tWC  
0
0
6
6
Write Cycle Time  
10  
8
12  
9
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tSCE  
CE LOW to Write End  
tAW  
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
8
9
tHA  
0
0
tSA  
0
0
tPWE  
tSD  
7
8
Data Set-Up to Write End  
Data Hold from Write End  
WE HIGH to Low-Z[10]  
WE LOW to High-Z[9, 10]  
Byte Enable to End of Write  
5
6
tHD  
0
0
tLZWE  
tHZWE  
tBW  
3
3
5
6
7
8
Notes  
7. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V.  
8. t  
9. t  
gives the minimum amount of time that the power supply should be at typical V values until the first memory access can be performed.  
POWER  
CC  
, t  
, t  
, andt  
are specified with a load capacitance of 5 pF as in (c) of AC Test Loads. Transitionismeasuredwhentheoutputsenterahighimpedancestate  
HZOE HZBE HZCE  
HZWE  
10. At any given temperature and voltage condition, t  
is less than t  
, t  
is less than t  
, and t  
is less than t  
for any given device.  
HZCE  
LZCE HZOE  
LZOE  
HZWE  
LZWE  
11. This parameter is guaranteed by design and is not tested.  
12. The internal Write time of the memory is defined by the overlap of CE LOW, WE LOW and BHE/BLE LOW. CE, WE and BHE/BLE must be LOW to initiate a Write  
and the transition of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that  
terminates the Write.  
Document #: 38-05460 Rev. *F  
Page 5 of 13  
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CY7C1021DV33  
Data Retention Characteristics Over the Operating Range  
Parameter  
VDR  
Description  
VCC for Data Retention  
Conditions  
Min. Max.  
Unit  
V
2
ICCDR  
Data Retention Current  
VCC = VDR = 2.0V, CE > VCC – 0.3V, Industrial  
3
15  
mA  
mA  
ns  
VIN > VCC – 0.3V or VIN < 0.3V  
Automotive  
[5]  
tCDR  
Chip Deselect to Data Retention Time  
Operation Recovery Time  
0
[13]  
tR  
tRC  
ns  
Data Retention Waveform  
DATA RETENTION MODE  
3.0V  
3.0V  
VDR > 2V  
V
CC  
t
t
R
CDR  
CE  
Switching Waveforms  
Read Cycle No. 1 (Address Transition Controlled)[14, 15]  
tRC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
Read Cycle No. 2 (OE Controlled)[15, 16]  
ADDRESS  
t
RC  
CE  
t
ACE  
OE  
t
HZOE  
t
DOE  
t
LZOE  
BHE, BLE  
t
HZCE  
t
DBE  
t
LZBE  
t
HZBE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PD  
ICC  
ISB  
t
PU  
VCC  
SUPPLY  
CURRENT  
50%  
50%  
Notes  
13. Full device operation requires linear V ramp from V to V  
> 50 s or stable at V > 50 s.  
CC(min.)  
CC  
DR  
CC(min.)  
14. Device is continuously selected. OE, CE, BHE and/or BLE = V .  
IL  
15. WE is HIGH for Read cycle.  
16. Address valid prior to or coincident with CE transition LOW.  
Document #: 38-05460 Rev. *F  
Page 6 of 13  
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CY7C1021DV33  
Switching Waveforms (continued)  
Write Cycle No. 1 (CE Controlled)[17, 18]  
t
WC  
ADDRESS  
t
SA  
t
SCE  
CE  
t
AW  
t
HA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
t
SD  
HD  
DATA I/O  
Write Cycle No. 2 (BLE or BHE Controlled)  
t
WC  
ADDRESS  
t
SA  
t
BW  
BHE, BLE  
t
AW  
t
HA  
t
PWE  
WE  
CE  
t
SCE  
t
t
SD  
HD  
DATA I/O  
Notes  
17. Data I/O is high impedance if OE or BHE and/or BLE = V  
.
IH  
18. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.  
Document #: 38-05460 Rev. *F  
Page 7 of 13  
[+] Feedback  
CY7C1021DV33  
Switching Waveforms (continued)  
Write Cycle No. 3 (WE Controlled, OE LOW)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
AW  
t
HA  
t
SA  
t
PWE  
WE  
t
BW  
BHE, BLE  
t
HZWE  
t
t
SD  
HD  
DATA I/O  
t
LZWE  
Truth Table  
CE OE WE BLE BHE  
I/O0–I/O7  
High-Z  
I/O8–I/O15  
Mode  
Power  
H
L
X
L
X
H
X
L
X
L
High-Z  
Data Out  
High-Z  
Data Out  
Data In  
High-Z  
Data In  
High-Z  
High-Z  
Power-down  
Read – All bits  
Standby (ISB  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
Data Out  
Data Out  
High-Z  
Data In  
Data In  
High-Z  
High-Z  
High-Z  
)
L
H
L
Read – Lower bits only  
Read – Upper bits only  
Write – All bits  
)
H
L
)
L
X
L
L
)
L
H
L
Write – Lower bits only  
Write – Upper bits only  
)
H
X
H
)
L
L
H
X
H
X
X
H
Selected, Outputs Disabled  
Selected, Outputs Disabled  
)
)
Document #: 38-05460 Rev. *F  
Page 8 of 13  
[+] Feedback  
CY7C1021DV33  
Ordering Information  
Speed  
(ns)  
Package  
Name  
Operating  
Range  
Package Type  
Ordering Code  
10  
CY7C1021DV33-10VXI  
CY7C1021DV33-10ZSXI  
CY7C1021DV33-10BVXI  
CY7C1021DV33-10ZSXA  
CY7C1021DV33-12ZSXE  
51-85082  
51-85087  
51-85150  
51-85087  
51-85087  
44-pin (400-Mil) Molded SOJ (Pb-free)  
44-pin TSOP Type II (Pb-free)  
48-ball VFBGA (Pb-free)  
Industrial  
10  
12  
44-pin TSOP Type II (Pb-free)  
44-pin TSOP Type II (Pb-free)  
Automotive-A  
Automotive-E  
Ordering Code Definitions  
CY 7 1 02 D V33 - XX XXX X  
C
1
Temperature Range: X = I or A or E  
I = Industrial; A = Automotive-A; E = Automotive-E  
Package Type: XXX = VX or ZSX or BVX  
VX = 44-pin Molded SOJ (Pb-free)  
ZSX = 44-pin TSOP Type II (Pb-free)  
BVX = 48-ball VFBGA (Pb-free)  
Speed: XX = 10 ns or 12 ns  
V33 = Voltage range (3 V to 3.6 V)  
D = C9, 90 nm Technology  
1 = Data width × 16-bits  
02 = 1-Mbit density  
1 = Fast Asynchronous SRAM family  
Technology Code: C = CMOS  
7 = SRAM  
CY = Cypress  
Please contact your local Cypress sales representative for availability of these parts.  
Document #: 38-05460 Rev. *F  
Page 9 of 13  
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CY7C1021DV33  
Package Diagrams  
Figure 1. 44-pin (400-Mil) Molded SOJ (51-85082)  
51-85082 *C  
Figure 2. 44-pin Thin Small Outline Package Type II (51-85087)  
51-85087 *C  
Document #: 38-05460 Rev. *F  
Page 10 of 13  
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CY7C1021DV33  
Package Diagrams (continued)  
Figure 3. 48-ball VFBGA (6 x 8 x 1 mm) (51-85150)  
51-85150 *F  
All products and company names mentioned in this document are the trademarks of their respective holders.  
Document #: 38-05460 Rev. *F  
Page 11 of 13  
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CY7C1021DV33  
Document History Page  
Document Title: CY7C1021DV33, 1-Mbit (64K x 16) Static RAM  
Document Number: 38-05460  
Orig. of  
REV.  
ECN NO. Issue Date  
Description of Change  
Advance Information data sheet for C9 IPP  
Change  
**  
201560  
233693  
See ECN  
See ECN  
SWI  
*A  
RKF  
DC parameters are modified as per Eros (Spec # 01-02165).  
Pb-free Offering In Ordering Information  
*B  
263769  
See ECN  
RKF  
Changed I/O1 – I/O16 to I/O0 – I/O15  
Added Data Retention Characteristics table  
Added Tpower Spec in Switching Characteristics table  
Shaded Ordering Information  
*C  
*D  
307601  
520652  
See ECN  
See ECN  
RKF  
VKN  
Reduced Speed bins to –8 and –10 ns  
Converted from Preliminary to Final  
Removed Commercial Operating range  
Removed 8 ns speed bin  
Added ICC values for the frequencies 83MHz, 66MHz and 40MHz  
Added Automotive Information  
Updated Thermal Resistance table  
Updated Ordering Information Table  
Changed Overshoot spec from VCC+2V to VCC+1V in footnote #4  
*E  
*F  
2898399 03/24/2010  
3109897 12/14/2010  
AJU  
AJU  
Updated Package Diagrams  
Added Ordering Code Definitions.  
Updated Package Diagrams.  
Document #: 38-05460 Rev. *F  
Page 12 of 13  
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CY7C1021DV33  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the  
office closest to you, visit us at cypress.com/sales.  
Products  
Automotive  
cypress.com/go/automotive  
cypress.com/go/clocks  
cypress.com/go/interface  
cypress.com/go/powerpsoc  
cypress.com/go/plc  
PSoC Solutions  
Clocks & Buffers  
Interface  
psoc.cypress.com/solutions  
PSoC 1 | PSoC 3 | PSoC 5  
Lighting & Power Control  
Memory  
cypress.com/go/memory  
cypress.com/go/image  
cypress.com/go/psoc  
Optical & Image Sensing  
PSoC  
Touch Sensing  
USB Controllers  
Wireless/RF  
cypress.com/go/touch  
cypress.com/go/USB  
cypress.com/go/wireless  
Document #: 38-05460 Rev. *F  
Page 13 of 13  
© Cypress Semiconductor Corporation, 2004-2010. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the  
use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to  
be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its  
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CY7C1021DV33-10ZSXI

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