CY6264-55SNCT [CYPRESS]

Standard SRAM, 8KX8, 55ns, CMOS, PDSO28, 0.300 INCH, SOIC-28;
CY6264-55SNCT
型号: CY6264-55SNCT
厂家: CYPRESS    CYPRESS
描述:

Standard SRAM, 8KX8, 55ns, CMOS, PDSO28, 0.300 INCH, SOIC-28

文件: 总8页 (文件大小:256K)
中文:  中文翻译
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1CY6264  
PRELIMINARY  
CY6264  
8K x 8 Static RAM  
over 70% when deselected. The CY6264 is packaged in a  
450-mil (300-mil body) SOIC.  
Features  
• 55, 70 ns access times  
• CMOS for optimum speed/power  
An active LOW write enable signal (WE) controls the writ-  
ing/reading operation of the memory. When CE and WE in-  
1
• Easy memory expansion with CE , CE , and OE fea-  
puts are both LOW and CE is HIGH, data on the eight data  
1
2
2
tures  
input/output pins (I/O through I/O ) is written into the memory  
0
7
location addressed by the address present on the address  
pins (A through A ). Reading the device is accomplished by  
• TTL-compatible inputs and outputs  
• Automatic power-down when deselected  
0
12  
selecting the device and enabling the outputs, CE and OE  
1
active LOW, CE active HIGH, while WE remains inactive or  
Functional Description  
2
HIGH. Under these conditions, the contents of the location ad-  
dressed by the information on address pins is present on the  
eight data input/output pins.  
The CY6264 is a high-performance CMOS static RAM orga-  
nized as 8192 words by 8 bits. Easy memory expansion is  
provided by an active LOW chip enable (CE ), an active HIGH  
1
The input/output pins remain in a high-impedance state unless  
the chip is selected, outputs are enabled, and write enable  
(WE) is HIGH. A die coat is used to insure alpha immunity.  
chip enable (CE ), and active LOW output enable (OE) and  
2
three-state drivers. Both devices have an automatic pow-  
er-down feature (CE ), reducing the power consumption by  
1
Logic Block Diagram  
Pin Configuration  
SOIC  
Top View  
NC  
V
CC  
1
2
3
4
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
A
WE  
CE  
4
A
5
2
A
A
3
6
I/O  
0
A
A
2
A
1
7
5
6
7
8
INPUT BUFFER  
A
8
I/O  
1
A
9
OE  
A
A
A
A
0
10  
11  
12  
CE  
1
9
A
1
I/O  
2
I/O  
I/O  
I/O  
I/O  
I/O  
7
6
5
4
3
10  
11  
12  
13  
14  
A
2
I/O  
I/O  
I/O  
0
1
2
A
I/O  
3
3
A
256 x 32 x 8  
ARRAY  
4
GND  
A
5
I/O  
4
A
6
CY6264-2  
A
A
8
7
I/O  
5
I/O  
6
POWER  
DOWN  
CE  
1
I/O  
7
COLUMN DECODER  
CE  
2
WE  
OE  
CY6264-1  
Selection Guide  
CY6264-55  
CY6264-70  
Maximum Access Time (ns)  
55  
70  
Maximum Operating Current (mA)  
100  
100  
Maximum Standby Current (mA)  
20/15  
20/15  
Shaded area contains advanced information.  
Cypress Semiconductor Corporation  
3901 North First Street  
San Jose  
CA 95134  
October 1994 – Revised June 1996  
408-943-2600  
PRELIMINARY  
CY6264  
Output Current into Outputs (LOW)............................. 20 mA  
Maximum Ratings  
Static Discharge Voltage .......................................... >2001V  
(per MIL-STD-883, Method 3015)  
(Above which the useful life may be impaired. For user guide-  
lines, not tested.)  
Latch-Up Current.................................................... >200 mA  
Storage Temperature ................................. –65°C to +150°C  
Ambient Temperature with  
Power Applied............................................. –55°C to +125°C  
Operating Range  
Ambient  
Supply Voltage to Ground Potential............... –0.5V to +7.0V  
Range  
Temperature  
V
CC  
DC Voltage Applied to Outputs  
[1]  
Commercial  
0°C to +70°C  
5V ± 10%  
in High Z State ............................................ –0.5V to +7.0V  
[1]  
DC Input Voltage ......................................... –0.5V to +7.0V  
Electrical Characteristics Over the Operating Range  
6264-55  
6264-70  
Min. Max.  
Parameter  
Description  
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
Test Conditions  
= Min., I = –4.0 mA  
Min.  
Max.  
Unit  
V
V
V
V
2.4  
2.4  
OH  
OL  
IH  
CC  
CC  
OH  
V
V
V
= Min., I = 8.0 mA  
0.4  
0.4  
V
OL  
2.2  
–0.5  
–5  
V
2.2  
–0.5  
–5  
V
V
CC  
CC  
[1]  
Input LOW Voltage  
0.8  
+5  
+5  
0.8  
V
IL  
I
I
Input Load Current  
GND < V < V  
CC  
+5  
+5  
µA  
µA  
IX  
I
Output Leakage  
Current  
GND < V < V ,  
CC  
–5  
–5  
OZ  
I
Output Disabled  
I
I
I
I
Output Short  
Circuit Current  
V
V
= Max.,  
–300  
100  
20  
–300  
100  
20  
mA  
mA  
mA  
mA  
OS  
CC  
[2]  
= GND  
OUT  
V
Operating  
V
= Max.,  
= 0 mA  
CC  
CC  
CC  
Supply Current  
I
OUT  
Automatic CE  
Power–Down Current  
Max. V , CE > V  
IH,  
Min. Duty Cycle=100%  
SB1  
SB2  
1
CC  
1
Automatic CE  
Power–Down Current  
Max. V , CE > V – 0.3V,  
V
15  
15  
1
CC  
1
CC  
> V – 0.3V or V < 0.3V  
IN CC IN  
Shaded area contains advanced information.  
Capacitance[3]  
Parameter  
Description  
Input Capacitance  
Output Capacitance  
Test Conditions  
T = 25°C, f = 1 MHz,  
Max.  
Unit  
C
C
7
7
pF  
pF  
IN  
A
V
= 5.0V  
CC  
OUT  
Notes:  
1. Minimum voltage is equal to -3.0V for pulse durations less than 30 ns.  
2. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.  
3. Tested initially and after any design or process changes that may affect these parameters.  
AC Test Loads and Waveforms  
R1 481  
R1 481Ω  
5V  
5V  
ALL INPUT PULSES  
90%  
OUTPUT  
OUTPUT  
3.0V  
GND  
90%  
10%  
30 pF  
5 pF  
R2  
255Ω  
R2  
255Ω  
10%  
< 5 ns  
INCLUDING  
JIG AND  
SCOPE  
INCLUDING  
JIG AND  
SCOPE  
< 5 ns  
CY6264-3  
CY6264-4  
(a)  
(b)  
Equivalent to:  
THÉVENIN EQUIVALENT  
167Ω  
OUTPUT  
1.73V  
2
PRELIMINARY  
CY6264  
[4]  
Switching Characteristics Over the Operating Range  
6264-55  
Max.  
6264-70  
Max.  
Parameter  
Description  
Min.  
55  
5
Min.  
70  
Unit  
READ CYCLE  
t
t
t
t
t
t
t
t
t
t
t
Read Cycle Time  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Address to Data Valid  
55  
70  
AA  
Data Hold from Address Change  
5
OHA  
CE LOW to Data Valid  
55  
40  
25  
70  
70  
35  
ACE1  
ACE2  
DOE  
1
CE HIGH to Data Valid  
2
OE LOW to Data Valid  
OE LOW to Low Z  
3
5
LZOE  
HZOE  
LZCE1  
LZCE2  
HZCE  
[5]  
OE HIGH to High Z  
20  
30  
[6]  
CE LOW to Low Z  
5
3
5
5
1
CE HIGH to Low Z  
2
[5, 6]  
CE HIGH to High Z  
20  
25  
30  
30  
1
CE LOW to High Z  
2
t
t
CE LOW to Power-Up  
0
0
ns  
ns  
PU  
PD  
1
CE HIGH to Power-Down  
1
[7]  
WRITE CYCLE  
t
t
t
t
t
t
t
t
t
t
t
Write Cycle Time  
50  
40  
30  
40  
0
70  
60  
50  
55  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
WC  
CE LOW to Write End  
SCE1  
SCE2  
AW  
1
CE HIGH to Write End  
2
Address Set-Up to Write End  
Address Hold from Write End  
Address Set-Up to Write Start  
WE Pulse Width  
HA  
0
0
SA  
25  
25  
0
40  
35  
0
PWE  
SD  
Data Set-Up to Write End  
Data Hold from Write End  
HD  
[5]  
WE LOW to High Z  
20  
30  
HZWE  
WE HIGH to Low Z  
5
5
LZWE  
Shaded area contains advanced information.  
Notes:  
4. Test conditions assume signal transition time of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified  
OL/IOH and 30-pF load capacitance.  
I
5. tHZOE, tHZCE, and tHZWE are specified with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.  
6. At any given temperature and voltage condition, tHZCE is less than tLZCE for any given device.  
7. The internal write time of the memory is defined by the overlap of CE1 LOW, CE2 HIGH, and WE LOW. Both signals must be LOW to initiate a write and either  
signal can terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.  
3
PRELIMINARY  
CY6264  
Switching Waveforms  
[8, 9]  
Read Cycle No.1  
t
RC  
ADDRESS  
t
AA  
t
OHA  
DATA OUT  
PREVIOUS DATA VALID  
DATA VALID  
CY6264-5  
[10, 11]  
Read Cycle No. 2  
t
RC  
CE  
1
CE  
2
t
ACE  
OE
t
HZOE  
t
DOE  
t
HZCE  
t
LZOE  
HIGH  
IMPEDANCE  
HIGH IMPEDANCE  
DATA OUT  
DATA VALID  
t
LZCE  
t
PD  
t
PU  
ICC  
V
CC  
SUPPLY  
CURRENT  
50%  
50%  
ISB  
CY6264-6  
[9, 11]  
Write Cycle No.1 (WE Controlled)  
t
WC  
ADDRESS  
t
SCE1  
CE  
1
CE  
2
t
SCE2  
OE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
t
HD  
SD  
DATA VALID  
DATA IN  
DATA I/O  
IN  
t
t
LZWE  
HZWE  
HIGH IMPEDANCE  
DATA UNDEFINED  
CY6264-7  
Notes:  
8. Device is continuously selected. OE, CE = VIL. CE2 = VIH.  
9. Address valid prior to or coincident with CE transition LOW.  
10. WE is HIGH for read cycle.  
11. Data I/O is High Z if OE = VIH, CE1 = VIH, or WE = VIL  
.
4
PRELIMINARY  
CY6264  
Switching Waveforms (continued)  
[9, 11, 12]  
Write Cycle No. 2 (CE Controlled)  
t
WC  
ADDRESS  
CE  
1
t
SCE1  
t
SA  
t
SCE2  
CE  
2
t
t
HA  
AW  
t
PWE  
WE  
t
t
HD  
SD  
DATA VALID  
DATA IN  
IN  
t
HZWE  
HIGH IMPEDANCE  
DATA I/O  
DATA UNDEFINED  
CY6264-8  
Note:  
12. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.  
Typical DC and AC Characteristics  
NORMALIZED SUPPLY CURRENT  
vs. SUPPLY VOLTAGE  
NORMALIZED SUPPLY CURRENT  
vs. AMBIENT TEMPERATURE  
OUTPUT SOURCE CURRENT  
vs. OUTPUT VOLTAGE  
120  
100  
80  
1.4  
1.2  
1.0  
1.2  
1.0  
0.8  
I
I
CC  
CC  
0.8  
0.6  
0.4  
V
=5.0V  
CC  
0.6  
0.4  
60  
T =25°C  
A
40  
V
V
IN  
=5.0V  
=5.0V  
CC  
0.2  
0.0  
20  
0
I
SB  
0.2  
0.0  
I
SB  
55  
25  
125  
0.0  
1.0  
2.0  
3.0  
4.0  
4.0  
4.5  
5.0  
5.5  
6.0  
AMBIENT TEMPERATURE (°C)  
OUTPUT VOLTAGE (V)  
SUPPLY VOLTAGE (V)  
NORMALIZED ACCESS TIME  
vs. AMBIENT TEMPERATURE  
OUTPUT SINK CURRENT  
vs.OUTPUT VOLTAGE  
NORMALIZED ACCESS TIME  
vs. SUPPLY VOLTAGE  
140  
120  
1.6  
1.4  
1.4  
1.3  
1.2  
100  
80  
V
CC  
=5.0V  
1.2  
1.0  
T =25°C  
A
1.1  
1.0  
60  
T =25°C  
A
V
CC  
=5.0V  
40  
0.8  
20  
0
0.9  
0.8  
0.6  
55  
0.0  
1.0  
2.0  
3.0  
4.0  
25  
125  
4.0  
4.5  
5.0  
5.5  
6.0  
AMBIENT TEMPERATURE (°C)  
OUTPUT VOLTAGE (V)  
SUPPLY VOLTAGE (V)  
5
PRELIMINARY  
CY6264  
Typical DC and AC Characteristics (continued)  
TYPICAL POWER-ON CURRENT  
vs. SUPPLY VOLTAGE  
TYPICAL ACCESS TIME CHANGE  
vs. OUTPUT LOADING  
NORMALIZED I vs. CYCLE TIME  
CC  
3.0  
2.5  
2.0  
1.5  
30.0  
25.0  
20.0  
15.0  
1.25  
1.00  
0.75  
0.50  
V
=5.0V  
CC  
T =25°C  
A
V
CC  
=0.5V  
1.0  
0.5  
0.0  
10.0  
5.0  
V
=4.5V  
CC  
T =25°C  
A
0.0  
0.0  
1.0  
2.0  
3.0  
4.0  
5.0  
0
200 400  
600 800 1000  
10  
20  
30  
40  
SUPPLY VOLTAGE(V)  
CAPACITANCE(pF)  
CYCLE FREQUENCY (MHz)  
Truth Table  
CE  
H
X
CE  
X
WE  
X
OE  
X
Input/Output  
High Z  
Mode  
1
2
Deselect/Power-Down  
Deselect  
L
X
X
High Z  
L
H
H
L
Data Out  
Data In  
Read  
L
H
L
X
Write  
L
H
H
H
High Z  
Deselect  
Address Designators  
Address  
Name  
Address  
Function  
Pin  
Number  
A4  
A5  
X3  
X4  
X5  
X6  
X7  
Y1  
Y4  
Y3  
Y0  
Y2  
X0  
X1  
X2  
2
3
A6  
4
A7  
5
A8  
6
A9  
7
A10  
A11  
A12  
A0  
8
9
10  
21  
23  
24  
25  
A1  
A2  
A3  
6
PRELIMINARY  
CY6264  
Ordering Information  
Speed  
Package  
Operating  
Range  
(ns)  
Ordering Code  
CY6264-55SC  
Name  
Package Type  
[13]  
55  
S23  
28-Lead 330-Mil SOIC  
28-Lead 330-Mil SOIC  
28-Lead 300-Mil SOIC  
28-Lead 300-Mil SOIC  
Commercial  
Commercial  
Commercial  
Commercial  
[13]  
70  
CY6264-70SC  
S23  
55  
CY6264-55SNC  
CY6264-70SNC  
S22  
70  
S22  
Shaded area contains advanced information.  
Note:  
13. Not recommended for new designs.  
Document #: 38-00425-A  
Package Diagrams  
28-Lead 450-Mil (300-Mil Body Width) SOIC S22  
7
PRELIMINARY  
CY6264  
Package Diagrams (continued)  
28-Lead (330-Mil) SOIC S23  
© Cypress Semiconductor Corporation, 1996. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use  
of anycircuitry other than circuitry embodied in a CypressSemiconductor product. Nor does it conveyor imply any license under patent or other rights. CypressSemiconductor does not authorize  
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress  
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.  

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