5962-8872501XX [CYPRESS]
Standard SRAM, 256KX1, 35ns, CMOS, CQCC28, CERAMIC, LCC-28;型号: | 5962-8872501XX |
厂家: | CYPRESS |
描述: | Standard SRAM, 256KX1, 35ns, CMOS, CQCC28, CERAMIC, LCC-28 输入元件 静态存储器 输出元件 内存集成电路 |
文件: | 总11页 (文件大小:144K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SRAM
MT5C2561
Austin Semiconductor, Inc.
256K x 1 SRAM
PIN ASSIGNMENT
SRAM MEMORY ARRAY
(Top View)
AVAILABLE AS MILITARY
SPECIFICATIONS
• SMD 5962-88725
• SMD 5962-88544
• MIL-STD-883
24-Pin DIP (C)
(300 MIL)
A6
A7
A8
1
2
3
4
5
6
7
8
9
10
24
23
22
21
20
19
18
17
16
15
14
13
Vcc
A5
A4
A3
A2
FEATURES
A9
• High Speed: 35, 45, 55, and 70
• Battery Backup: 2V data retention
• Low power standby
• High-performance, low-power, CMOS double-metal
process
• Single +5V (+10%) Power Supply
• Easy memory expansion with CE\
• All inputs and outputs are TTL compatible
A10
A11
A14
A15
A0
A1
A17
A16
A13
A12
D
Q
WE\ 11
Vss 12
CE\
28-Pin LCC (EC)
OPTIONS
• Timing
MARKING
3
2 1 28 27
26
25
24
23
22
21
20
19
18
35ns access
45ns access
55ns access
70ns access
-35
-45
-55*
-70*
NC
A4
NC
A9
A10
A11
A14
A15
A0 10
Q 11
NC 12
4
5
6
7
8
9
A3
A2
A1
A17
A16
A13
NC
• Package(s)
13 14 15 16 17
Ceramic DIP (300 mil)
CeramicLCC
C
EC
No. 106
No. 204
• Operating Temperature Ranges
Industrial (-40oC to +85oC)
IT
XT
GENERAL DESCRIPTION
Military (-55oC to +125oC)
The Austin Semiconductor SRAM family employs
high-speed, low-power CMOS and are fabricated using double-
layer metal, double-layer polysilicon technology.
• 2V data retention/low power
L
For flexibility in high-speed memory applications,
Austin Semiconductor offers chip enable (CE\) on all organiza-
tions. This enhancement can place the outputs in High-Z for
additional flexibility in system design. The x1 configuration
features separate data input and output.
*Electrical characteristics identical to those provided for the 45ns
access devices.
Writing to these devices is accomplished when write
enable (WE\) and CE\ inputs are both LOW. Reading is accom-
plished when WE\ remains HIGH and CE\ goes LOW. The
device offers a reduced power standby mode when disabled.
This allows system designs to achieve low standby power re-
quirements.
For more products and information
please visit our web site at
www.austinsemiconductor.com
These devices operate from a single +5V power sup-
ply and all inputs and outputs are fully TTL compatible.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
1
SRAM
MT5C2561
Austin Semiconductor, Inc.
FUNCTIONAL BLOCK DIAGRAM
VCC
GND
A13
A14
A15
A16
A17
A0
D
Q
262,144-BIT
MEMORY ARRAY
A1
CE\
A2
A3
A4
WE\
POWER
DOWN
COLUMN DECODER
A5 A6 A7 A8 A9 A10 A11 A12
TRUTHTABLE
MODE
CE\ WE\
DQ
POWER
STANDBY
READ
WRITE
H
L
L
X
H
L
HIGH-Z STANDBY
Q
ACTIVE
ACTIVE
HIGH-Z
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
2
SRAM
MT5C2561
Austin Semiconductor, Inc.
*Stresses greater than those listed under "Absolute Maximum
Voltage on Any Pin Relative to Vss..................................-0.5V to +7V Ratings" may cause permanent damage to the device. This is
ABSOLUTE MAXIMUM RATINGS*
Voltage on Vcc Supply Relative to Vss.............................-0.5V to +7V
Voltage Applied to Q.........................................................-0.5V to +6V
Storage Temperature......................................................-65oC to +150oC
Power Dissipation..............................................................................1W
Short Circuit Output Current.........................................................50mA
Lead Temperature (soldering 10 seconds)....................................+260oC
Junction Temperature..................................................................+175oC
a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the
operation section of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods
may affect reliability.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC OPERATING CONDITIONS
(-55oC < TC < 125oC; VCC = 5V +10%)
DESCRIPTION
CONDITIONS
MIN
MAX
UNITS
NOTES
SYM
2.2
V
1
VIH
VCC+0.5
Input High (Logic 1) Voltage
-0.5
-10
0.8
10
V
1, 2
VIL
ILI
Input Low (Logic 0) Voltage
Input Leakage Current
µA
0V<VIN<VCC
Output(s) disabled
0V<VOUT<VCC
Output Leakage Current
-10
2.4
10
µA
ILO
Output High Voltage
Output Low Voltage
V
V
1
1
IOH = -4.0mA
VOH
VOL
0.4
I
OL = 8.0mA
MAX
PARAMETER
CONDITIONS
SYM
-35
-45 UNITS NOTES
Power Supply
Current: Operating
120
120
100
25
mA
mA
mA
3
3
ICCSP
CE\ < VIL; VCC = MAX
f = MAX = 1/tRC (MIN)
Output Open
100
25
ICCLP
CE\ > VIH; All Other Inputs
< VIL or > VIH, VCC = MAX
f = 0 Hz
Power Supply
Current: Standby
ISBT1
CE\ > VCC -0.2V; VCC = MAX
VIL < VSS +0.2V
VIH > VCC -0.2V; f = 0 Hz
ISBCSP
20
3
20
3
mA
mA
ISBCLP
"L" Version Only
CAPACITANCE
PARAMETER
CONDITIONS
SYM
MAX
UNITS
NOTES
TA = 25oC, f = 1MHz
Vcc = 5V
Input Capacitance
CI
10
12
pF
4
Output Capacitance
CO
pF
4
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
3
SRAM
MT5C2561
Austin Semiconductor, Inc.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(Note 5) (-55oC < TC < 125oC;VCC = 5V +10%)
-35
-45
DESCRIPTION
MIN
MAX
MIN
MAX
UNITS NOTES
SYMBOL
READ CYCLE
tRC
tAA
tACE
tOH
READ cycle time
35
45
ns
ns
ns
ns
Address access time
35
35
45
45
Chip Enable access time
Output hold from address change
3
3
3
3
tLZCE
tHZCE
tPU
ns
ns
ns
ns
7
6, 7
4
Chip Enable to output in Low-Z
Chip disable to output in High-Z
Chip Enable to power-up time
Chip disable to power-down time
WRITE CYCLE
20
35
20
45
0
0
tPD
4
tWC
tCW
tAW
WRITE cycle time
35
30
30
0
45
40
40
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Enable to end of write
Address valid to end of write
Address setup time
tAS
tAH
Address hold from end of write
WRITE pulse width
5
5
tWP
30
20
0
40
20
0
tDS
Data setup time
tDH
Data hold time
tLZWE
tHZWE
Write disable to output in Low-Z
Write Enable to output in High-Z
0
0
7
0
15
0
20
6, 7
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
4
SRAM
MT5C2561
Austin Semiconductor, Inc.
ACTEST CONDITIONS
Input pulse levels ...................................... Vss to 3.0V
Input rise and fall times ......................................... 5ns
Input timing reference levels ................................ 1.5V
Output reference levels ....................................... 1.5V
Output load ................................. See Figures 1 and 2
167Ω
167Ω
Q
Q
VTH =1.73V
VTH =1.73V
5pF
30pF
Fig. 2 Output Load
Equivalent
Fig. 1 Output Load
Equivalent
allowing for actual tester RC time constant.
NOTES
7. At any given temperature and voltage condition, tHZCE is
less than tLZCE, and tHZWE is less than tLZWE and tHZOE is
1. All voltages referenced to VSS (GND).
2. -3V for pulse width < 20ns
3. ICC is dependent on output loading and cycle rates.
The specified value applies with the outputs
less than tLZOE
.
8. WE\ is HIGH for READ cycle.
9. Device is continuously selected. Chip enable is held in
its active state.
10. Address valid prior to, or coincident with, latest
occurring chip enable.
11. tRC = Read Cycle Time.
12. Chip enable (CE\) and write enable (WE\) can initiate and
terminate a WRITE cycle.
unloaded, and f =
1
Hz.
tRC (MIN)
4. This parameter is guaranteed but not tested.
5. Test conditions as specified with the output loading
as shown in Fig. 1 unless otherwise noted.
6. tLZCE, tLZWE, tLZOE, tHZCE, tHZOE and tHZWE are
specified with CL = 5pF as in Fig. 2. Transition is
measured ±200mV typical from steady state voltage,
DATA RETENTION ELECTRICAL CHARACTERISTICS (L Version Only)
DESCRIPTION
CONDITIONS
SYM
MIN
MAX UNITS NOTES
VCC for Retention Data
2
---
V
VDR
CE\ > (VCC - 0.2V)
µA
Data Retention Current
VCC = 2V ICCDR
900
VIN > (VCC - 0.2V)
or < 0.2V
Chip Deselect to Data
Retention Time
tCDR
tR
0
---
ns
ns
4
Operation Recovery Time
4, 11
tRC
LOWVcc DATA RETENTIONWAVEFORM
DATA RETENTION MODE
VCC
4.5V
4.5V
VDR > 2V
tCDR
tR
VIH
VIL
VDR
CE\
DON’T CARE
UNDEFINED
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
5
SRAM
MT5C2561
Austin Semiconductor, Inc.
READ CYCLE NO. 1 8, 9
t
RC
VALID
ADDRESS
Q
t
AA
tOH
PREVIOUS DATA VALID
DATA VALID
READ CYCLE NO. 2 7, 8, 10
tR
C
CE\
tLZCE
tHZCE
t
E
ACE
DATA VALID
Q
Icc
t
PU
tP
D
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
6
SRAM
MT5C2561
Austin Semiconductor, Inc.
WRITE CYCLE NO. 1 12
(Chip Enabled Controlled)
tWC
ADDRESS
tA
W
tAH
tAS
tCW
CE\
t
WP
WE\
tDH
t
DS
DATA VAILD
D
Q
HIGH Z
7, 12
WRITE CYCLE NO. 2
(Write Enabled Controlled)
tW
C
ADDRESS
tAW
tAW
tAH
tCW
CE\
tAS
t
WP
WE\
tDS
tDH
tDH
D
Q
DATA VALID
tHZWE
tLZWE
HIGH-Z
DON’T CARE
UNDEFINED
NOTE: Output enable (OE\) is inactive (HIGH).
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
7
SRAM
MT5C2561
Austin Semiconductor, Inc.
MECHANICAL DEFINITIONS*
ASI Case #106 (Package Designator C)
SMD #5962-88544 & #5962-88725, Case Outline L
D
A
Q
L
Pin 1
b
e
S1
b2
E
NOTE
c
0o to 15o
eA
SMD SPECIFICATIONS
SYMBOL
MIN
---
0.014
0.045
0.008
---
MAX
0.200
0.026
0.065
0.018
1.280
0.310
A
b
b2
c
D
E
0.220
eA
e
0.300 BSC
0.100 BSC
L
Q
S1
0.125
0.015
0.005
0.200
0.060
---
NOTE: These dimensions are per the SMD. ASI's package dimensional limits
may differ, but they will be within the SMD limits.
*All measurements are in inches.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
8
SRAM
MT5C2561
Austin Semiconductor, Inc.
MECHANICAL DEFINITIONS*
ASI Case #204 (Package Designator EC)
SMD# 5962-88544, Case Outline X
D1
B2
D2
L2
e
E3
E
E1
E2
h x 45o
D
L
hx45o
B1
D3
A
A1
SMD SPECIFICATIONS
SYMBOL
MIN
MAX
0.120
0.088
0.028
A
A1
B1
B2
D
0.060
0.050
0.022
0.072 REF
0.342
0.358
D1
D2
D3
E
0.200 BSC
0.100 BSC
---
0.540
0.358
0.560
E1
E2
E3
e
0.400 BSC
0.200 BSC
---
0.558
0.050 BSC
0.040 REF
h
L
L2
0.045
0.075
0.055
0.095
NOTE: These dimensions are per the SMD. ASI's package dimensional limits
may differ, but they will be within the SMD limits.
*All measurements are in inches.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
9
SRAM
MT5C2561
Austin Semiconductor, Inc.
ORDERING INFORMATION
EXAMPLE: MT5C2561EC-70/XT
EXAMPLE: MT5C2561C-45L/IT
Device
Number
Package Speed
Device
Number
Package Speed
Options** Process
Options** Process
Type
ns
Type
ns
MT5C2561
MT5C2561
MT5C2561
MT5C2561
C
-35
L
L
L
L
/*
/*
/*
/*
MT5C2561
MT5C2561
MT5C2561
MT5C2561
EC
-35
L
L
L
L
/*
/*
/*
/*
C
C
C
-45
-55
-70
EC
EC
EC
-45
-55
-70
*AVAILABLE PROCESSES
IT = Industrial Temperature Range
XT = Extended Temperature Range
883C = Full Military Processing
-40oC to +85oC
-55oC to +125oC
-55oC to +125oC
** OPTIONS
L = 2V Data Retention/Low Power
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
10
SRAM
MT5C2561
Austin Semiconductor, Inc.
ASI TO DSCC PART NUMBER
CROSS REFERENCE*
ASI Package Designator C
ASI Package Designator EC
ASI Part #
SMD Part #
5962-8872501LX
5962-8872502LX
5962-8872503LX
5962-8872504LX
ASI Part #
SMD Part #
5962-8872501XX
5962-8872502XX
5962-8872503XX
5962-8872504XX
MT5C2561C-35/883C
MT5C2561C-45/883C
MT5C2561C-55/883C
MT5C2561C-70/883C
MT5C2561EC-35/883C
MT5C2561EC-45/883C
MT5C2561EC-55/883C
MT5C2561EC-70/883C
MT5C2561C-35L883C
MT5C2561C-45L883C
MT5C2561C-55L883C
MT5C2561C-70L883C
5962-8854401LX
5962-8854402LX
5962-8854403LX
5962-8854404LX
MT5C2561EC-35L883C
MT5C2561EC-45L883C
MT5C2561EC-55L883C
MT5C2561EC-70L883C
5962-8854401XX
5962-8854402XX
5962-8854403XX
5962-8854404XX
* ASI part number is for reference only. Orders received referencing the SMD part number will be processed per the SMD.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
MT5C2561
Rev. 2.5 1/01
11
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