MHU04N65 [CITC]

Silicon N-Channel Power MOSFET;
MHU04N65
型号: MHU04N65
厂家: Chip Integration Technology Corporation    Chip Integration Technology Corporation
描述:

Silicon N-Channel Power MOSFET

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中文:  中文翻译
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MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Main Product Characteristics  
Outline  
TO-251  
ID  
4A  
VDSS  
PD(TC=25oC)  
650V  
75W  
2.3Ω  
RDS(ON)Typ  
Features  
Fast switching.  
ESD improved capability.  
Low gate charge. (Typical Data:13nC)  
Low reverse transfer capacitances.(Typical:2.2pF)  
100% single pulse avalanche energy test.  
1.Gate 2.Drain 3.Source  
Drain  
Application  
Power switch circuit of adaptor and charger.  
Mechanical data  
Gate  
Epoxy:UL94-V0 rated flame retardant  
Case : JEDEC TO-251 molded plastic body over  
passivated chip  
Lead : Axial leads, solderable per MIL-STD-202,  
Method 208 guranteed.  
Source  
Inner Equivalent principium Chart  
Absolute(TC = 25OC unless otherwise specified)  
Symbol  
VDSS  
PARAMETER  
CONDITIONS  
MHU04N65  
UNIT  
V
Drain-Source Voltage  
650  
Continuous Drain Current  
4
ID  
TC = 100OC  
A
Continuous Drain Current  
3.2  
IDM  
VGS  
EAS  
IAR  
Pulsed Drain Current(Note:1)  
Gate-Source Voltage  
16  
±30  
V
mJ  
A
Single Pulse Avalanche Energy(Note:2)  
Avalanche Current(Note:1)  
150  
2.5  
Repetitive Avalanche Energy(Note:1)  
EAR  
30  
mJ  
Power Dissipation  
Derating factor above 25OC  
75  
W
Power Dissipation  
PD  
0.6  
5.0  
W/OC  
V/ns  
V
OC  
OC  
Peak Diode Recovery dv/dt(Note:3)  
Gate source ESD  
dV/dt  
VESD(G-S)  
TJ, TSTG  
TL  
HBM-C = 100pF, R = 1.5kΩ  
3000  
Operating Junction and Storage Temperature Range  
Maximum temperature for soldering  
150,-55 ~ +150  
300  
NOTE : 1.Repetitive rating; pulse width limited by maximum junction temperature.  
2.L=10.0mH, ID = 5.5A, Start TJ = 25OC.  
3.ISD =4A,di/dt 100A/us, VDDBVDS, Start TJ = 25OC.  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
1
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Electrical characteristics(TC = 25OC unless otherwise specified)  
OFF Characteristics  
CONDITIONS  
Symbol MIN. TYP. MAX. UNIT  
VDSS  
PARAMETER  
Drain-Source Breakdown Voltage  
Bvdss Temperature Coefficient  
VGS = 0V, ID = 250µA  
650  
V
ID = 250µA, Reference 25OC  
VDS = 650V, VGS = 0V, Ta = 25°C  
VDS = 520V, VGS = 0V, Ta = 125°C  
VGS = +20V  
ΔBVDSS /ΔTJ  
0.67  
V/OC  
1
Drain-Source Leakage Current  
IDSS  
100  
10  
µA  
Gate to Source Forward Leakage  
Gate to Source Reverse Leakage  
IGSS(F)  
IGSS(R)  
VGS = -20V  
-10  
ON Characteristics  
PARAMETER  
CONDITIONS  
VDS = VGS, ID = 250µA  
VGS = 10V, ID = 2A  
Symbol MIN. TYP. MAX. UNIT  
VGS(th)  
Gate Threshold Voltage  
2.0  
4.0  
2.8  
V
RDS(on)  
Drain-to-Source On-Resistance  
2.3  
Ω
Pulse Width tp≤300µs,δ≤2%  
Dynamic Characteristics  
PARAMETER  
CONDITIONS  
Symbol MIN. TYP. MAX. UNIT  
gfs  
VDS = 15V, ID = 2A  
Forward Trans conductance  
Input Capacitance  
3.5  
560  
50  
S
Ciss  
Coss  
Crss  
Output Capacitance  
VDS = 25V, VGS = 0V, f = 1.0MHz  
pF  
Reverse Transfer Capacitance  
2.2  
Resistive Switching Characteristics  
PARAMETER  
CONDITIONS  
Symbol MIN. TYP. MAX. UNIT  
td(ON)  
Turn-on Delay Time  
Rise Time  
14  
tr  
22  
ID = 4A, VDD = 325V, RG = 10Ω  
ns  
td(OFF)  
Turn-off Delay Time  
Fail Time  
29  
tf  
15  
Qg  
Total Gate Charge  
13  
Qgs  
Gate-Source Charge  
Gate-Drain (”Miller”) Charge  
ID = 4A, VDD = 520V, VGS = 10V  
2.7  
5.5  
nC  
Qgd  
Source-Drain Diode Characteristics  
PARAMETER  
CONDITIONS  
Boby Diode  
Symbol MIN. TYP. MAX. UNIT  
IS  
ISM  
VSD  
trr  
Continuous Source Current  
Maximum Pulse Current  
Diode Forward Voltage  
4
A
Boby Diode  
16  
1.5  
IS = 4.0A, VGS = 0V  
V
IS = 4A, TJ = 25OC, dIF/dt = 100A/μs,  
VGS = 0V  
Reverse recovery time  
ns  
250  
Reverse recovery charge  
Qrr  
1200  
nC  
Pulse Width tp≤380µs,δ≤2%  
Thermal characteristics  
PARAMETER  
CONDITIONS  
Symbol MIN. TYP. MAX. UNIT  
RθJC  
RθJA  
Junction to Case  
1.67  
62.5  
Thermal Resistance  
OC/W  
Junction to Ambient  
Gate-source Zener Diode  
PARAMETER  
CONDITIONS  
Symbol MIN. TYP. MAX. UNIT  
Gate-Source Breakdown Voltage  
IGS = ±1mA(open Drain)  
VGSO  
30  
V
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
2
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Rating and characteristic curves  
Fig.1- Maximum Forward Bias Safe Operating Area  
100  
Fig.2- Maximum Power Dissipation vs Case Temperature  
80  
70  
60  
50  
40  
30  
20  
10  
0
10  
1ms  
1
10ms  
OPERATION IN THIS AREA  
100ms  
MAY BE LIMITED BY RDS(ON)  
DC  
0.1  
TJ=MAX RATED  
TC=25Single Pulse  
0.01  
1
10  
1000  
100  
0
25  
50  
75  
100  
125  
150  
Drain-to-Source Voltage , Vds (V)  
Case Temperature , Tc, (C)  
Fig.3- Maximum Continuous Drain Current VS Case Temperaure  
6
Fig.4- Typical Output Characteristics  
6
4.5  
3
PULSE DURATION=10μs  
DUTY FACTOR=0.5%MAX  
5
4
3
2
1
0
Tc = 25℃  
VGS=15V  
VGS=7V  
VGS=6V  
VGS=6.5V  
VGS=5.5V  
1.5  
0
VGS=4.5V  
0
25  
75  
100  
125  
150  
50  
0
5
10  
15  
20  
25  
Case Temperature , Tc, (C)  
Drain-to-Source Voltage , Vds (V)  
Fig.5- Maximum Effective Thermal Impendence, Junction to Case  
1
50%  
20%  
10%  
0.1  
0.01  
5%  
PDM  
2%  
t1  
t2  
1%  
Single pulse  
NOTES:  
DUTY FACTOR D=t1/ t2  
PEAK Tj=PDM*ZthJC*RthJC+TC  
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
Rectangular Pulse Duration,(S)  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
3
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Rating and characteristic curves  
Fig.6- Maximum Peak Current Capability  
100  
10  
FOR TEMPERATURES  
ABOVE 25DERATE PEAK  
CURRENT AS FOLLOWS:  
TRANSCONDUCTANCE MAY LIMIT  
CURRENT IN THIS REGION  
150 - TC  
125  
I = I 25  
1
1.00E-05  
1.00E-04  
1.00E-03  
1.00E-02  
P u lse W id th , (S)  
1.00E-01  
1.00E+00  
1.00E+01  
Fig.8- Typical Drain to Source ON Resistance vs Gate  
Voltage and Drain Current  
Fig.7- Typical Transfer Characteristics  
7
6
5
4
3
2
1
9
PULSE DURATION = 10μs  
DUTY FACTOR = 0.5%MAX  
Tc =25 ℃  
PULSE DURATION = 10μs  
DUTY CYCLE =0.5%MAX  
VDS=30V  
7.5  
6
ID= 4A  
ID= 2A  
ID= 1A  
4.5  
3
-55℃  
+25℃  
+150℃  
1.5  
0
2
3
4
5
6
4
6
8
10  
12  
14  
Gate to Source Voltage, Vgs (V)  
Gate to Source Voltage, Vgs (V)  
Fig.10- Typical Drain to Source ON resistance  
vs Junction Temperature  
Fig.9- Typical Drain to Source ON resistance vs Drain Current  
4
2.5  
PULSE DURATION = 10μs  
DUTY CYCLE= 0.5%MAX  
Tc =25 ℃  
PULSE DURATION = 10μs  
DUTY CYCLE= 0.5%MAX  
VGS=10V ID=2A  
2.25  
2
3.5  
3
1.75  
1.5  
1.25  
1
VGS=10V  
2.5  
2
0.75  
0.5  
-50  
0
50  
100  
150  
0
1
2
3
4
Junction temperature ,Tj (C)  
Drain Current , Id (A)  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
4
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Rating and characteristic curves  
Fig.11- Typical Threshold Voltage vs Junction Temperature  
Fig.12- Typical Breakdown Voltage vs Junction Temperature  
1.1  
1.15  
1.1  
1.05  
1
1.05  
1
0.95  
0.9  
0.85  
0.8  
0.95  
VGS=0V  
ID=250μA  
0.75  
0.7  
VGS=0V  
ID=250μA  
0.9  
0.65  
-55  
-30  
-5  
20  
45  
70  
95  
120 145 170  
-75 -50 -25  
0
25  
50  
75 100 125 150 175  
Junction temperature ,Tj (C)  
Junction temperature ,Tj (C)  
Fig.13- Typical Capacitance vs Drain to Source Voltage  
Fig.14- Typical Gate Charge vs Gate to Source Voltage  
12  
10  
8
10000  
VDS=520V  
1000  
100  
10  
Ciss  
6
Coss  
4
VGS=0V , f=1MHz  
Ciss=Cgs+Cgd  
Coss=Cds+Cgd  
Crss=Cgd  
2
Crss  
ID=4A  
0
1
0
2
4
6
8
10  
12  
14  
16  
18  
20  
0.1  
1
10  
100  
Drain-to-Source Voltage , Vds (V)  
Total Gate Charge , Qg, (nC)  
Fig.15- Typical Body Diode Transfer Characteristics  
Fig.16- Unclamped Inductive Switching Capability  
8
7
6
5
4
3
2
1
0
100  
10  
1
STARTING Tj = 25℃  
STARTING Tj = 150℃  
+150℃  
+25℃  
-55℃  
If R=0: tAV=(L* IAS) / (1.38V -VDD  
)
DSS  
DSS  
If R0: t =(L/R) In[IAS*R/ (1.38V -VDD)+1]  
R equals total Series resistance of Drain circuit  
AV  
0.1  
1
1E-06  
1E-05  
E-04  
E-03  
1E-02  
1E-01  
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
5
Time in Avalanche , tav(S)  
Source-Drain Voltage, Vsd, (V)  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Test circuit and waveform  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
6
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Test circuit and waveform  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
7
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
Package Information  
A
C
M
D
B
G
H
E
L
N
N
F
Values (mm)  
Item  
Min  
6.30  
5.70  
2.10  
0.30  
0.50  
0.30  
0.70  
1.60  
7.70  
6.00  
4.50  
2.10  
5.10  
2.09  
Max  
6.90  
6.30  
2.50  
0.60  
0.70  
0.60  
1.00  
2.40  
9.80  
6.30  
5.80  
3.70  
5.50  
2.49  
A
B
C
D
E
F
G
H
L
M
N
TO-251 Package  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
8
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
The name and content of poisonous and harmful material in products  
Hazardous Substance  
Part’s Name  
Pb  
Hg  
Cd  
Cr(VI)  
PBB  
PBDE  
≤0.1%  
≤0.1%  
≤0.01%  
≤0.1%  
≤0.1%  
≤0.1%  
Limit  
Lead Frame  
Molding Compound  
Chip  
×
Wire Bonding  
Solder  
means the hazardous material is under the criterion of SJ/T11363-2006.  
×means the hazardous material exceeds the criterion of SJ/T11363-2006.  
The plumbum element of solder exist in products presently, but within the  
Note  
range of Eurogroups RoHS.  
allowed  
Warnings  
1. Exceeding the maximum ratings of the device in performance may cause damage to the device,  
even the permanent failure, which may affect the dependability of the machine. It is suggested  
to be used under 80 percent of the maximum ratings of the device.  
2. When installing the heatsink, please pay attention to the torsional moment and the smoothness  
of the heatsink.  
3. VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect  
the device from being damaged by the static electr.icity when using it  
4. This publication is made by CITC and subject to regular change without  
notice.  
http://www.citcorp.com.tw/  
Tel:886-3-5600628  
Fax:886-3-5600636  
Add:Rm. 3, 2F., No.32, Taiyuan St., Zhubei City, Hsinchu County 302, Taiwan (R.O.C.)  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
9
MHU04N65  
Chip Integration Technology Corporation  
Silicon N-Channel Power MOSFET  
CITC reserves the right to make changes to this document and its products and specifications at any  
time without notice.  
Customers should obtain and confirm the latest product information and specifications before final  
design, purchase or use.  
CITC makes no warranty, representation or guarantee regarding the suitability of its products for any  
particular purpose, nor does CITC assume any liability for application assistance or customer product  
design.  
CITC does not warrant or accept any liability with products which are purchased or used for any  
unintended or unauthorized application.  
No license is granted by implication or otherwise under any intellectual property rights of CITC.  
CITC products are not authorized for use as critical components in life support devices or systems  
without express written approval of CITC.  
http://www.citcorp.com.tw/  
Tel:886-3-5600628  
Fax:886-3-5600636  
Add:Rm. 3, 2F., No.32, Taiyuan St., Zhubei City, Hsinchu County 302, Taiwan (R.O.C.)  
Document ID : DS-22M76  
Revised Date : 2015/08/24  
Revision : C  
10  

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