AT45DB161-TC [ATMEL]

16-Megabit 2.7-volt Only Serial DataFlash; 16兆位2.7伏,只有串行数据闪存
AT45DB161-TC
型号: AT45DB161-TC
厂家: ATMEL    ATMEL
描述:

16-Megabit 2.7-volt Only Serial DataFlash
16兆位2.7伏,只有串行数据闪存

闪存
文件: 总20页 (文件大小:227K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Single 2.7V - 3.6V Supply  
Serial Interface Architecture  
Page Program Operation  
– Single Cycle Reprogram (Erase and Program)  
– 4096 Pages (528 Bytes/Page) Main Memory  
Optional Page and Block Erase Operations  
Two 528-Byte SRAM Data Buffers – Allows Receiving of Data  
while Reprogramming of Nonvolatile Memory  
Internal Program and Control Timer  
Fast Page Program Time – 7 ms Typical  
120 µs Typical Page to Buffer Transfer Time  
Low Power Dissipation  
– 4 mA Active Read Current Typical  
– 3 µA CMOS Standby Current Typical  
13 MHz Max Clock Frequency  
Hardware Data Protection Feature  
16-Megabit  
2.7-volt Only  
Serial  
DataFlash®  
Serial Peripheral Interface (SPI) Compatible – Modes 0 and 3  
CMOS and TTL Compatible Inputs and Outputs  
Commercial and Industrial Temperature Ranges  
AT45DB161  
Preliminary  
Description  
The AT45DB161 is a 2.7-volt only, serial interface Flash memory suitable for in-sys-  
tem reprogramming. Its 17,301,504 bits of memory are organized as 4096 pages of  
528 bytes each. In addition to the main memory, the AT45DB161 also contains two  
SRAM data buffers of 528 bytes each. The buffers allow receiving of data while a  
page in the main memory is being reprogrammed. Unlike conventional Flash memo-  
(continued)  
Pin Configurations  
SOIC  
CBGA Top View  
Through Package  
Pin Name  
Function  
GND  
NC  
NC  
CS  
SCK  
SI  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
NC  
CS  
Chip Select  
Serial Clock  
Serial Input  
Serial Output  
1
2
3
4
5
2
3
NC  
4
WP  
SCK  
SI  
5
RESET  
RDY/BUSY  
NC  
6
A
B
C
D
E
SO  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
7
NC  
NC  
NC  
NC  
8
NC  
9
NC  
NC SCK GND VCC NC  
SO  
10  
11  
12  
13  
14  
NC  
NC  
NC  
NC  
CS RDY/BSY WP NC  
AT45DB161  
NC  
Hardware Page  
Write Protect Pin  
NC  
WP  
SO  
NC  
SI RESET NC  
NC  
NC  
NC  
NC  
NC  
Preliminary 16-  
Megabit 2.7-volt  
Only Serial  
RESET  
Chip Reset  
Ready/Busy  
RDY/BUSY  
PLCC  
TSOP Top View  
Type 1  
RDY/BUSY  
RESET  
WP  
1
28  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
NC  
DataFlash  
2
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
3
SCK  
SI  
5
6
7
8
9
29 WP  
NC  
4
28 RESET  
27 RDY/BUSY  
26 NC  
NC  
5
SO  
NC  
NC  
VCC  
GND  
NC  
6
7
25 NC  
8
NC  
9
NC 10  
NC 11  
NC 12  
NC 13  
24 NC  
NC  
10  
11  
12  
13  
14  
23 NC  
CS  
22 NC  
SCK  
SI  
21 NC  
SO  
Rev. 0807C–07/98  
Note: PLCC package pins 16  
and 17 are DON’T CONNECT  
ries that are accessed randomly with multiple address lines  
and a parallel interface, the DataFlash uses a serial inter-  
face to sequentially access its data. The simple serial inter-  
face facilitates hardware layout, increases system  
reliability, minimizes switching noise, and reduces package  
size and active pin count. The device is optimized for use in  
many commercial and industrial applications where high  
density, low pin count, low voltage, and low power are  
essential. Typical applications for the DataFlash are digital  
voice storage, image storage, and data storage. The  
device operates at clock frequencies up to 13 MHz with a  
typical active read current consumption of 4 mA.  
To allow for simple in-system reprogrammability, the  
AT45DB161 does not require high input voltages for pro-  
gramming. The device operates from a single power sup-  
ply, 2.7V to 3.6V, for both the program and read  
operations. The AT45DB161 is enabled through the chip  
select pin (CS) and accessed via a three-wire interface  
consisting of the Serial Input (SI), Serial Output (SO), and  
the Serial Clock (SCK).  
All programming cycles are self-timed, and no separate  
erase cycle is required before programming.  
Block Diagram  
WP  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
SCK  
CS  
I/O INTERFACE  
RESET  
V
CC  
GND  
RDY/BUSY  
SI  
SO  
Memory Array  
To provide optimal flexibility, the memory array of the  
AT45DB161 is divided into three levels of granularity com-  
prising of sectors, blocks, and pages. The Memory Archi-  
tecture Diagram illustrates the breakdown of each level and  
details the number of pages per sector and block. All pro-  
gram operations to the DataFlash occur on a page by page  
basis; however, the optional erase operations can be per-  
formed at the block or page level.  
AT45DB161  
2
AT45DB161  
Memory Architecture Diagram  
SECTOR ARCHITECTURE  
BLOCK ARCHITECTURE  
PAGE ARCHITECTURE  
BLOCK 0  
BLOCK 1  
PAGE 0  
PAGE 1  
8 Pages  
SECTOR 0  
SECTOR 1  
SECTOR 2  
SECTOR 3  
SECTOR 4  
SECTOR 5  
SECTOR 6  
SECTOR 7  
SECTOR 8  
SECTOR 9  
SECTOR 10  
SECTOR 11  
SECTOR 12  
SECTOR 13  
SECTOR 14  
SECTOR 15  
32 Blocks  
(256 Pages)  
BLOCK 30  
BLOCK 31  
BLOCK 32  
BLOCK 33  
PAGE 6  
PAGE 7  
PAGE 8  
PAGE 9  
BLOCK 62  
BLOCK 63  
BLOCK 64  
BLOCK 65  
BLOCK 66  
PAGE 14  
PAGE 15  
PAGE 16  
PAGE 17  
PAGE 18  
BLOCK 509  
BLOCK 510  
BLOCK 511  
PAGE 4093  
PAGE 4094  
PAGE 4095  
Sector = 135,168 bytes  
(128K + 4K)  
Block = 4224 bytes  
(4K + 128)  
Page = 528 bytes  
(512 + 16)  
Device Operation  
The device operation is controlled by instructions from the  
host processor. The list of instructions and their associated  
opcodes are contained in Table 1 and Table 2. A valid  
instruction starts with the falling edge of CS followed by the  
appropriate 8-bit opcode and the desired buffer or main  
memory address location. While the CS pin is low, toggling  
the SCK pin controls the loading of the opcode and the  
desired buffer or main memory address location through  
the SI (serial input) pin. All instructions, addresses, and  
data are transferred with the most significant bit (MSB) first.  
within the page. The 32 don’t care bits which follow the 24  
address bits are sent to initialize the read operation. Fol-  
lowing the 32 don’t care bits, additional pulses on SCK  
result in serial data being output on the SO (serial output)  
pin. The CS pin must remain low during the loading of the  
opcode, the address bits, and the reading of data. When  
the end of a page in main memory is reached during a main  
memory page read, the device will continue reading at the  
beginning of the same page. A low to high transition on the  
CS pin will terminate the read operation and tri-state the  
SO pin.  
Read  
BUFFER READ: Data can be read from either one of the  
two buffers, using different opcodes to specify which buffer  
to read from. An opcode of 54H is used to read data from  
buffer 1, and an opcode of 56H is used to read data from  
buffer 2. To perform a buffer read, the eight bits of the  
opcode must be followed by 14 don’t care bits, 10 address  
bits, and eight don't care bits. Since the buffer size is 528-  
bytes, 10 address bits (BFA9-BFA0) are required to specify  
the first byte of data to be read from the buffer. The CS pin  
must remain low during the loading of the opcode, the  
address bits, the don’t care bits, and the reading of data.  
When the end of a buffer is reached, the device will con-  
tinue reading back at the beginning of the buffer. A low to  
By specifying the appropriate opcode, data can be read  
from the main memory or from either one of the two data  
buffers.  
MAIN MEMORY PAGE READ: A main memory read allows  
the user to read data directly from any one of the 4096  
pages in the main memory, bypassing both of the data buff-  
ers and leaving the contents of the buffers unchanged. To  
start a page read, the 8-bit opcode, 52H, is followed by 24  
address bits and 32 don’t care bits. In the AT45DB161, the  
first two address bits are reserved for larger density  
devices (see Notes on page 10), the next 12 address bits  
(PA11-PA0) specify the page address, and the next 10  
address bits (BA9-BA0) specify the starting byte address  
3
high transition on the CS pin will terminate the read opera-  
tion and tri-state the SO pin.  
are internally self timed and should take place in a maxi-  
mum time of tEP. During this time, the status register will  
indicate that the part is busy.  
MAIN MEMORY PAGE TO BUFFER TRANSFER: A page  
of data can be transferred from the main memory to either  
buffer 1 or buffer 2. An 8-bit opcode, 53H for buffer 1 and  
55H for buffer 2, is followed by the two reserved bits, 12  
address bits (PA11-PA0) which specify the page in main  
memory that is to be transferred, and 10 don’t care bits.  
The CS pin must be low while toggling the SCK pin to load  
the opcode, the address bits, and the don’t care bits from  
the SI pin. The transfer of the page of data from the main  
memory to the buffer will begin when the CS pin transitions  
from a low to a high state. During the transfer of a page of  
data (tXFR), the status register can be read to determine  
whether the transfer has been completed or not.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH-  
OUT BUILT-IN ERASE: A previously erased page within  
main memory can be programmed with the contents of  
either buffer 1 or buffer 2. An 8-bit opcode, 88H for buffer 1  
or 89H for buffer 2, is followed by the two reserved bits, 12  
address bits (PA11-PA0) that specify the page in the main  
memory to be written, and 10 additional don’t care bits.  
When a low to high transition occurs on the CS pin, the part  
will program the data stored in the buffer into the specified  
page in the main memory. It is necessary that the page in  
main memory that is being programmed has been previ-  
ously erased. The programming of the page is internally  
self timed and should take place in a maximum time of tP.  
During this time, the status register will indicate that the  
part is busy.  
MAIN MEMORY PAGE TO BUFFER COMPARE: A page of  
data in main memory can be compared to the data in buffer  
1 or buffer 2. An 8-bit opcode, 60H for buffer 1 and 61H for  
buffer 2, is followed by 24 address bits consisting of the two  
reserved bits, 12 address bits (PA11-PA0) which specify  
the page in the main memory that is to be compared to the  
buffer, and 10 don't care bits. The loading of the opcode  
and the address bits is the same as described previously.  
The CS pin must be low while toggling the SCK pin to load  
the opcode, the address bits, and the don't care bits from  
the SI pin. On the low to high transition of the CS pin, the  
528 bytes in the selected main memory page will be com-  
pared with the 528 bytes in buffer 1 or buffer 2. During this  
time (tXFR), the status register will indicate that the part is  
busy. On completion of the compare operation, bit 6 of the  
status register is updated with the result of the compare.  
PAGE ERASE: The optional Page Erase command can be  
used to individually erase any page in the main memory  
array allowing the Buffer to Main Memory Page Program  
without Built-In Erase command to be utilized at a later  
time. To perform a Page Erase, an opcode of 81H must be  
loaded into the device, followed by two reserved bits, 12  
address bits (PA11-PA0), and 10 don’t care bits. The 12  
address bits are used to specify which page of the memory  
array is to be erased. When a low to high transition occurs  
on the CS pin, the part will erase the selected page to 1s.  
The erase operation is internally self-timed and should take  
place in a maximum time of tPE. During this time, the status  
register will indicate that the part is busy.  
BLOCK ERASE: A block of eight pages can be erased at  
one time allowing the Buffer to Main Memory Page Pro-  
gram without Built-In Erase command to be utilized to  
reduce programming times when writing large amounts of  
data to the device. To perform a Block Erase, an opcode of  
50H must be loaded into the device, followed by two  
reserved bits, nine address bits (PA11-PA3), and 13 don’t  
care bits. The nine address bits are used to specify which  
block of eight pages is to be erased. When a low to high  
transition occurs on the CS pin, the part will erase the  
selected block of eight pages to 1s. The erase operation is  
internally self-timed and should take place in a maximum  
time of tBE. During this time, the status register will indicate  
that the part is busy.  
Program  
BUFFER WRITE: Data can be shifted in from the SI pin  
into either buffer 1 or buffer 2. To load data into either  
buffer, an 8-bit opcode, 84H for buffer 1 or 87H for buffer 2,  
is followed by 14 don't care bits and 10 address bits (BFA9-  
BFA0). The 10 address bits specify the first byte in the  
buffer to be written. The data is entered following the  
address bits. If the end of the data buffer is reached, the  
device will wrap around back to the beginning of the buffer.  
Data will continue to be loaded into the buffer until a low to  
high transition is detected on the CS pin.  
BUFFER TO MAIN MEMORY PAGE PROGRAM WITH  
BUILT-IN ERASE: Data written into either buffer 1 or buffer  
2 can be programmed into the main memory. An 8-bit  
opcode, 83H for buffer 1 or 86H for buffer 2, is followed by  
the two reserved bits, 12 address bits (PA11-PA0) that  
specify the page in the main memory to be written, and 10  
additional don't care bits. When a low to high transition  
occurs on the CS pin, the part will first erase the selected  
page in main memory to all 1s and then program the data  
stored in the buffer into the specified page in the main  
memory. Both the erase and the programming of the page  
AT45DB161  
4
AT45DB161  
Block Erase Addressing  
PA11  
PA10  
PA9  
PA8  
PA7  
0
PA6  
0
PA5  
0
PA4  
0
PA3  
0
PA2  
X
PA1  
X
PA0  
X
Block  
0
0
0
0
0
0
0
0
0
0
0
1
2
3
0
0
0
0
0
0
1
X
X
X
0
0
0
0
0
1
0
X
X
X
0
0
0
0
0
1
1
X
X
X
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
1
1
0
1
0
1
X
X
X
X
X
X
X
X
X
X
X
X
508  
509  
510  
511  
MAIN MEMORY PAGE PROGRAM: This operation is a  
combination of the Buffer Write and Buffer to Main Memory  
Page Program with Built-In Erase operations. Data is first  
shifted into buffer 1 or buffer 2 from the SI pin and then pro-  
grammed into a specified page in the main memory. An 8-  
bit opcode, 82H for buffer 1 or 85H for buffer 2, is followed  
by the two reserved bits and 22 address bits. The 12 most  
significant address bits (PA11-PA0) select the page in the  
main memory where data is to be written, and the next 10  
address bits (BFA9-BFA0) select the first byte in the buffer  
to be written. After all address bits are shifted in, the part  
will take data from the SI pin and store it in one of the data  
buffers. If the end of the buffer is reached, the device will  
wrap around back to the beginning of the buffer. When  
there is a low to high transition on the CS pin, the part will  
first erase the selected page in main memory to all 1s and  
then program the data stored in the buffer into the specified  
page in the main memory. Both the erase and the program-  
ming of the page are internally self timed and should take  
place in a maximum of time tEP. During this time, the status  
register will indicate that the part is busy.  
then program the data from the buffer back into same page  
of main memory. The operation is internally self-timed and  
should take place in a maximum time of tEP. During this  
time, the status register will indicate that the part is busy.  
If a sector is programmed or reprogrammed sequentially  
page by page, then the programming algorithm shown in  
Figure 1 is recommended. Otherwise, if multiple bytes in a  
page or several pages are programmed randomly in a sec-  
tor, then the programming algorithm shown in Figure 2 is  
recommended.  
STATUS REGISTER: The status register can be used to  
determine the device’s ready/busy status, the result of a  
Main Memory Page to Buffer Compare operation, or the  
device density. To read the status register, an opcode of  
57H must be loaded into the device. After the last bit of the  
opcode is shifted in, the eight bits of the status register,  
starting with the MSB (bit 7), will be shifted out on the SO  
pin during the next eight clock cycles. The five most-signifi-  
cant bits of the status register will contain device informa-  
tion, while the remaining three least-significant bits are  
reserved for future use and will have undefined values.  
After bit 0 of the status register has been shifted out, the  
sequence will repeat itself (as long as CS remains low and  
SCK is being toggled) starting again with bit 7. The data in  
the status register is constantly updated, so each repeating  
sequence will output new data.  
AUTO PAGE REWRITE: This mode is only needed if multi-  
ple bytes within a page or multiple pages of data are modi-  
fied in a random fashion. This mode is a combination of two  
operations: Main Memory Page to Buffer Transfer and  
Buffer to Main Memory Page Program with Built-In Erase.  
A page of data is first transferred from the main memory to  
buffer 1 or buffer 2, and then the same data (from buffer 1  
or buffer 2) is programmed back into its original page of  
main memory. An 8-bit opcode, 58H for buffer 1 or 59H for  
buffer 2, is followed by the two reserved bits, 12 address  
bits (PA11-PA0) that specify the page in main memory to  
be rewritten, and 10 additional don't care bits. When a low  
to high transition occurs on the CS pin, the part will first  
transfer data from the page in main memory to a buffer and  
Ready/busy status is indicated using bit 7 of the status reg-  
ister. If bit 7 is a 1, then the device is not busy and is ready  
to accept the next command. If bit 7 is a 0, then the device  
is in a busy state. The user can continuously poll bit 7 of the  
status register by stopping SCK once bit 7 has been output.  
The status of bit 7 will continue to be output on the SO pin,  
and once the device is no longer busy, the state of SO will  
change from 0 to 1. There are eight operations which can  
5
cause the device to be in a busy state: Main Memory Page  
to Buffer Transfer, Main Memory Page to Buffer Compare,  
Buffer to Main Memory Page Program with Built-In Erase,  
Buffer to Main Memory Page Program without Built-In  
Erase, Page Erase, Block Erase, Main Memory Page Pro-  
gram, and Auto Page Rewrite.  
This gives the Serial DataFlash the ability to virtually  
accommodate a continuous data stream. While data is  
being programmed into main memory from buffer 1, data  
can be loaded into buffer 2 (or vice versa). See application  
note AN-4 (“Using Atmel’s Serial DataFlash”) for more  
details.  
The result of the most recent Main Memory Page to Buffer  
Compare operation is indicated using bit 6 of the status  
register. If bit 6 is a 0, then the data in the main memory  
page matches the data in the buffer. If bit 6 is a 1, then at  
least one bit of the data in the main memory page does not  
match the data in the buffer.  
HARDWARE PAGE WRITE PROTECT: If the WP pin is  
held low, the first 256 pages of the main memory cannot be  
reprogrammed. The only way to reprogram the first 256  
pages is to first drive the protect pin high and then use the  
program commands previously mentioned. The WP pin is  
internally pulled high; therefore, connection of the WP pin is  
not necessary if this pin and feature will not be utilized.  
However, it is recommended that the WP pin be driven high  
externally whenever possible.  
The device density is indicated using bits 5, 4, and 3 of the  
status register. For the AT45DB161, the three bits are 1, 0,  
and 1. The decimal value of these three binary bits does  
not equate to the device density; the three bits represent a  
combinational code relating to differing densities of Serial  
DataFlash devices, allowing a total of eight different density  
configurations.  
RESET: A low state on the reset pin (RESET) will terminate  
the operation in progress and reset the internal state  
machine to an idle state. The device will remain in the reset  
condition as long as a low level is present on the RESET  
pin. Normal operation can resume once the RESET pin is  
brought back to a high level.  
Read/Program Mode Summary  
The modes listed above can be separated into two groups  
— modes which make use of the flash memory array  
(Group A) and modes which do not make use of the flash  
memory array (Group B).  
The device incorporates an internal power-on reset circuit,  
so there are no restrictions on the RESET pin during  
power-on sequences. The RESET pin is also internally  
pulled high; therefore, connection of the RESET pin is not  
necessary if this pin and feature will not be utilized. How-  
ever, it is recommended that the RESET pin be driven high  
externally whenever possible.  
Group A modes consist of:  
1. Main Memory Page Read  
2. Main Memory Page to Buffer 1 (or 2) Transfer  
3. Main Memory Page to Buffer 1 (or 2) Compare  
READY/BUSY: This open drain output pin will be driven  
low when the device is busy in an internally self-timed oper-  
ation. This pin, which is normally in a high state (through an  
external pull-up resistor), will be pulled low during program-  
ming operations, compare operations, and during page-to-  
buffer transfers.  
4. Buffer 1 (or 2) to Main Memory Page Program With  
Built-In Erase  
5. Buffer 1 (or 2) to Main Memory Page Program With-  
out Built-In Erase  
6. Page Erase  
The busy status indicates that the Flash memory array and  
one of the buffers cannot be accessed; read and write  
operations to the other buffer can still be performed.  
7. Block Erase  
8. Main Memory Page Program  
9. Auto Page Rewrite  
Group B modes consist of:  
1. Buffer 1 (or 2) Read  
2. Buffer 1 (or 2) Write  
3. Status Register Read  
Power On/Reset State  
When power is first applied to the device, or when recover-  
ing from a reset condition, the device will default to SPI  
mode 3. In addition, the SO pin will be in a high impedance  
state, and a high to low transition on the CS pin will be  
required to start a valid instruction. The SPI mode will be  
automatically selected on every falling edge of CS by sam-  
pling the inactive clock state.  
If a Group A mode is in progress (not fully completed) then  
another mode in Group A should not be started. However,  
during this time in which a Group A mode is in progress,  
modes in Group B can be started.  
Status Register Format  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3  
Bit 2  
Bit 1  
Bit 0  
RDY/BUSY  
COMP  
1
0
1
X
X
X
AT45DB161  
6
AT45DB161  
Absolute Maximum Ratings*  
*NOTICE:  
Stresses beyond those listed under “Absolute  
Maximum Ratings” may cause permanent dam-  
age to the device. This is a stress rating only and  
functional operation of the device at these or any  
other conditions beyond those indicated in the  
operational sections of this specification is not  
implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device  
reliability.  
Temperature Under Bias................................ -55°C to +125°C  
Storage Temperature..................................... -65°C to +150°C  
All Input Voltages  
(including NC Pins)  
with Respect to Ground...................................-0.6V to +6.25V  
All Output Voltages  
with Respect to Ground.............................-0.6V to VCC + 0.6V  
DC and AC Operating Range  
AT45DB161  
0°C to 70°C  
-40°C to 85°C  
2.7V to 3.6V  
Com.  
Ind.  
Operating Temperature (Case)  
VCC Power Supply(1)  
Note:  
1. After power is applied and VCC is at the minimum specified data sheet value, the system should wait 20 ms before an oper-  
ational mode is started.  
7
DC Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Units  
CS, RESET, WP = VIH, all inputs  
at CMOS levels  
ISB  
Standby Current  
3
10  
µA  
Active Current, Read  
Operation  
f = 13 MHz; IOUT = 0 mA;  
VCC = 3.6V  
ICC1  
4
10  
35  
mA  
mA  
Active Current, Program/Erase  
Operation  
ICC2  
VCC = 3.6V  
15  
ILI  
Input Load Current  
Output Leakage Current  
Input Low Voltage  
VIN = CMOS levels  
VI/O = CMOS levels  
1
1
µA  
µA  
V
ILO  
VIL  
VIH  
VOL  
VOH  
0.6  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
2.0  
V
IOL = 1.6 mA; VCC = 2.7V  
0.4  
V
IOH = -100 µA  
VCC - 0.2V  
V
AC Characteristics  
Symbol  
fSCK  
tWH  
tWL  
Parameter  
Min  
Typ  
Max  
Units  
SCK Frequency  
13  
MHz  
ns  
SCK High Time  
35  
35  
SCK Low Time  
ns  
tCS  
Minimum CS High Time  
CS Setup Time  
250  
250  
250  
ns  
tCSS  
tCSH  
tCSB  
tSU  
ns  
CS Hold Time  
ns  
CS High to RDY/BUSY Low  
Data In Setup Time  
Data In Hold Time  
200  
ns  
10  
20  
0
ns  
tH  
ns  
tHO  
Output Hold Time  
ns  
tDIS  
tV  
tXFR  
tEP  
Output Disable Time  
Output Valid  
25  
30  
ns  
ns  
Page to Buffer Transfer/Compare Time  
Page Erase and Programming Time  
Page Programming Time  
Page Erase Time  
120  
10  
7
200  
20  
µs  
ms  
ms  
ms  
ms  
µs  
µs  
tP  
15  
tPE  
6
10  
tBE  
Block Erase Time  
7
15  
tRST  
tREC  
RESET Pulse Width  
RESET Recovery Time  
10  
1
Input Test Waveforms and Measurement Levels  
Output Test Load  
2.4V  
AC  
AC  
DEVICE  
UNDER  
TEST  
2.0  
DRIVING  
LEVELS  
MEASUREMENT  
LEVEL  
0.8  
0.45V  
30 pF  
tR, tF < 5 ns (10% to 90%)  
AT45DB161  
8
AT45DB161  
AC Waveforms  
Two different timing diagrams are shown below. Waveform  
1 shows the SCK signal being low when CS makes a high-  
to-low transition, and Waveform 2 shows the SCK signal  
being high when CS makes a high-to-low transition. Both  
waveforms show valid timing diagrams. The setup and hold  
times for the SI signal are referenced to the low-to-high  
transition on the SCK signal.  
Waveform 1 shows timing that is also compatible with SPI  
Mode 0, and Waveform 2 shows timing that is compatible  
with SPI Mode 3  
Waveform 1 – Inactive Clock Polarity Low  
tCS  
CS  
tCSS  
tWH  
tWL  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
tDIS  
HIGH IMPEDANCE  
tSU  
HIGH IMPEDANCE  
VALID OUT  
tH  
VALID IN  
Waveform 2 – Inactive Clock Polarity High  
tCS  
CS  
tCSS  
tWL  
tWH  
tCSH  
SCK  
SO  
SI  
tV  
tHO  
tDIS  
HIGH Z  
HIGH IMPEDANCE  
VALID OUT  
tH  
tSU  
VALID IN  
9
Reset Timing (Inactive Clock Polarity Low Shown)  
CS  
tREC  
tCSS  
SCK  
tRST  
RESET  
HIGH IMPEDANCE  
HIGH IMPEDANCE  
SO  
SI  
Command Sequence for Read/Write Operations (Except Status Register Read)  
SI  
CMD  
8 bits  
8 bits  
8 bits  
MSB  
r r X X X X X X  
X X X X X X X X  
X X X X X X X X  
LSB  
Reserved for  
Page Address  
(PA11-PA0)  
Byte/Buffer Address  
larger densities  
(BA9-BA0/BFA9-BFA0)  
Notes: 1. “r” designates bits reserved for larger densities.  
2. It is recommended that “r” be a logical “0” for densities of 16M bit or smaller.  
3. For densities larger than 16M bit, the “r” bits become the most significant Page Address bit for the appropriate density.  
AT45DB161  
10  
AT45DB161  
Write Operations  
The following block diagram and waveforms illustrate the various write sequences available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
BUFFER 1 TO  
MAIN MEMORY  
PAGE PROGRAM  
MAIN MEMORY  
PAGE PROGRAM  
THROUGH BUFFER 2  
BUFFER 2 TO  
MAIN MEMORY  
PAGE PROGRAM  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
MAIN MEMORY PAGE  
PROGRAM THROUGH  
BUFFER 1  
BUFFER 1  
WRITE  
BUFFER 2  
WRITE  
I/O INTERFACE  
SI  
Main Memory Page Program through Buffers  
· Completes writing into selected buffer  
· Starts self-timed erase/program operation  
CS  
BFA7-0  
r r , PA11-6 PA5-0, BFA9-8  
SI  
CMD  
n
n+1  
Last Byte  
Buffer Write  
· Completes writing into selected buffer  
CS  
SI  
CMD  
X
X···X, BFA9-8  
BFA7-0  
n
n+1  
Last Byte  
Buffer to Main Memory Page Program  
(Data from Buffer Programmed into Flash Page)  
Starts self-timed erase/program operation  
CS  
SI  
CMD  
r r , PA11-6  
PA5-0, XX  
X
Each transition represents  
8 bits and 8 clock cycles  
n = 1st byte written  
n+1 = 2nd byte written  
11  
Read Operations  
The following block diagram and waveforms illustrate the various read sequences available.  
FLASH MEMORY ARRAY  
PAGE (528 BYTES)  
MAIN MEMORY  
PAGE TO  
MAIN MEMORY  
PAGE TO  
BUFFER 2  
BUFFER 1  
BUFFER 1 (528 BYTES)  
BUFFER 2 (528 BYTES)  
BUFFER 1  
READ  
MAIN MEMORY  
PAGE READ  
BUFFER 2  
READ  
I/O INTERFACE  
SO  
Main Memory Page Read  
CS  
SI  
CMD  
r r , PA11-6  
PA5-0, BA9-8  
BA7-0  
X
X
X
X
n
n+1  
SO  
Main Memory Page to Buffer Transfer (Data from Flash Page Read into Buffer)  
Starts reading page data into buffer  
CS  
SI  
CMD  
r r , PA11-6  
PA5-0, XX  
X
SO  
Buffer Read  
CS  
SI  
CMD  
X
X···X, BFA9-8  
BFA7-0  
X
SO  
n
n+1  
n = 1st byte read  
Each transition represents  
8 bits and 8 clock cycles  
n+1 = 2nd byte read  
AT45DB161  
12  
AT45DB161  
Detailed Bit-Level Read Timing – Inactive Clock Polarity Low  
Main Memory Page Read  
CS  
SCK  
1
2
3
4
5
0
60  
X
61  
X
62  
X
63  
X
64  
X
65  
66  
67  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
MSB  
Buffer Read  
CS  
SCK  
1
0
2
3
4
5
0
36  
X
37  
X
38  
X
39  
X
40  
X
41  
42  
43  
tSU  
COMMAND OPCODE  
SI  
1
0
1
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
MSB  
Status Register Read  
CS  
SCK  
1
2
1
3
4
5
6
7
1
8
1
9
10  
11  
12  
16  
17  
tSU  
COMMAND OPCODE  
SI  
0
0
1
0
1
tV  
STATUS REGISTER OUTPUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
1
D
0
D
7
MSB  
LSB  
MSB  
13  
Detailed Bit-Level Read Timing – Inactive Clock Polarity High  
Main Memory Page Read  
CS  
SCK  
1
2
3
4
5
61  
62  
63  
64  
65  
66  
67  
68  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
X
X
X
X
X
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
Buffer Read  
CS  
SCK  
1
2
3
4
5
37  
38  
39  
40  
41  
42  
43  
44  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
X
X
X
X
X
tV  
DATA OUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
MSB  
Status Register Read  
CS  
SCK  
1
2
3
4
5
6
7
8
9
10  
11  
12  
17  
18  
tSU  
COMMAND OPCODE  
SI  
0
1
0
1
0
1
1
1
tV  
STATUS REGISTER OUTPUT  
HIGH-IMPEDANCE  
SO  
D
7
D
6
D
5
D
4
D
0
D
7
D
6
MSB  
LSB  
MSB  
AT45DB161  
14  
AT45DB161  
Table 1.  
Main Memory  
Page to Buffer 1  
Transfer  
Main Memory  
Page to Buffer 2  
Transfer  
Main Memory  
Page to Buffer 1  
Compare  
Main Memory  
Page to Buffer 2  
Compare  
Main Memory  
Page Read  
Buffer 1  
Read  
Buffer 2  
Read  
Buffer 1  
Write  
Buffer 2  
Write  
Opcode  
87H  
52H  
54H  
56H  
53H  
0
55H  
0
60H  
0
61H  
0
84H  
0
0
0
1
1
1
0
1
1
1
1
1
1
0
0
0
0
0
0
1
1
0
0
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
1
0
1
0
1
1
0
1
0
0
1
0
1
1
0
0
0
0
1
0
0
0
1
1
0
1
0
1
r
X
X
r
r
r
r
X
X
r
X
X
X
X
r
r
r
r
X
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
BA9  
BA8  
BA7  
BA6  
BA5  
BA4  
BA3  
BA2  
BA1  
BA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
X
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
X
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X (Don’t Care)  
r (reserved bits)  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X (64th bit)  
15  
Table 2.  
Buffer 1 to  
Main  
Memory  
Page  
Program  
without  
Built-In  
Erase  
Buffer 1 to  
Main  
Memory  
Page  
Program  
with Built-  
In Erase  
Buffer 2 to  
Main  
Memory  
Page  
Program  
with Built-  
In Erase  
Main  
Main  
Memory  
Page  
Program  
Through  
Buffer 1  
Memory  
Page  
Program  
Through  
Buffer 2  
Auto  
Page  
Rewrite  
Through  
Buffer 1  
Auto  
Page  
Rewrite  
Through  
Buffer 2  
Buffer 2 to Main  
Memory Page  
Program without  
Built-In Erase  
Page  
Erase  
Opcode  
81H  
Block  
Erase  
Status  
Register  
83H  
1
86H  
1
88H  
1
89H  
1
50H  
0
82H  
1
85H  
1
58H  
0
59H  
0
57H  
0
1
0
0
0
0
0
1
0
0
1
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
0
0
1
1
1
0
0
1
1
0
0
0
0
1
1
0
0
1
0
0
0
0
0
1
0
0
1
1
1
0
0
0
0
1
0
0
0
1
1
0
0
1
1
0
0
1
0
1
1
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
r
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
BFA9  
BFA8  
BFA7  
BFA6  
BFA5  
BFA4  
BFA3  
BFA2  
BFA1  
BFA0  
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
PA11  
PA10  
PA9  
PA8  
PA7  
PA6  
PA5  
PA4  
PA3  
PA2  
PA1  
PA0  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X (Don’t Care)  
r (reserved bits)  
AT45DB161  
16  
AT45DB161  
Figure 1. Algorithm for Programming or Reprogramming of an Entire Sector Sequentially  
START  
provide address  
and data  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
(82H, 85H)  
BUFFER to MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
END  
Notes: 1. This type of algorithm is used for applications in which an entire sector is programmed sequentially, filling the sector page-  
by-page.  
2. A page can be written using either a Main Memory Page Program operation or a Buffer Write operation followed by a Buffer  
to Main Memory Page Program operation.  
3. The algorithm above shows the programming of a single page. The algorithm will be repeated sequentially for each page  
within the entire sector.  
17  
Figure 2. Algorithm for Randomly Modifying Data  
START  
provide address of  
page to modify  
MAIN MEMORY PAGE  
If planning to modify multiple  
bytes currently stored within  
a page of the Flash array  
to BUFFER TRANSFER  
(53H, 55H)  
BUFFER WRITE  
(84H, 87H)  
MAIN MEMORY PAGE PROGRAM  
(82H, 85H)  
BUFFER to MAIN  
MEMORY PAGE PROGRAM  
(83H, 86H)  
Auto Page Rewrite(2)  
(58H, 59H)  
INCREMENT PAGE  
ADDRESS POINTER(2)  
END  
Notes: 1. To preserve data integrity, each page of a DataFlash  
sector (256 pages per sector) must be  
Sector Addressing  
updated/rewritten at least once within every 10,000  
cumulative page erase/program operations within  
that sector.  
PA11  
PA10  
PA9  
PA8  
0
Sector  
0
0
0
0
0
0
0
0
1
2
2. A Page Address Pointer must be maintained to indi-  
cate which page is to be rewritten. The Auto Page  
Rewrite command must use the address specified  
by the Page Address Pointer.  
0
1
1
0
3. Other algorithms can be used to rewrite portions of  
the Flash array. Low power applications may choose  
to wait until 10,000 cumulative page erase/program  
operations have accumulated before rewriting all  
256 pages of the sector. See application note AN-4  
(“Using Atmel’s Serial DataFlash”) for more details.  
1
1
1
1
1
1
0
1
1
1
0
1
13  
14  
15  
AT45DB161  
18  
AT45DB161  
Ordering Information  
I
CC (mA)  
fSCK (MHz)  
Active  
Standby  
Ordering Code  
Package  
Operation Range  
13  
10  
0.01  
AT45DB161-JC  
AT45DB161-RC  
AT45DB161-TC  
AT45DB161-CC  
32J  
Commercial  
28R  
28T  
24C2  
(0°C to 70°C)  
13  
10  
0.01  
AT45DB161-JI  
AT45DB161-RI  
AT45DB161-TI  
AT45DB161-CI  
32J  
Industrial  
28R  
28T  
24C2  
(-40°C to 85°C)  
Package Type  
32J  
28R  
28T  
32-Lead, Plastic J-Leaded Chip Carrier (PLCC)  
28-Lead, 0.330" Wide, Plastic Gull Wing Small Outline (SOIC)  
28-Lead, Plastic Thin Small Outline Package (TSOP)  
24-Ball, 5 x 5 Array Plastic Chip-Scale Ball Grid Array (CBGA)  
24C2  
19  
AT45DB161  
Packaging Information  
32J, 32-Lead, Plastic J-Leaded Chip Carrier (PLCC)  
Dimensions in Inches and (Millimeters)  
JEDEC STANDARD MS-016 AE  
28R, 28-Lead, 0.330" Wide, Plastic Gull Wing Small  
Outline (SOIC)  
Dimensions in Inches and (Millimeters)  
.025(.635) X 30° - 45°  
.045(1.14) X 45° PIN NO. 1  
.012(.305)  
IDENTIFY  
.008(.203)  
.530(13.5)  
.553(14.0)  
.490(12.4)  
.547(13.9)  
.032(.813)  
.021(.533)  
.013(.330)  
.595(15.1)  
.026(.660)  
.585(14.9)  
.030(.762)  
.015(3.81)  
.095(2.41)  
.060(1.52)  
.140(3.56)  
.120(3.05)  
.050(1.27) TYP  
.300(7.62) REF  
.430(10.9)  
.390(9.90)  
AT CONTACT  
POINTS  
.022(.559) X 45° MAX (3X)  
.453(11.5)  
.447(11.4)  
.495(12.6)  
.485(12.3)  
28T, 28-Lead, Plastic Thin Small Outline Package  
(TSOP)  
Dimensions in Millimeters and (Inches)*  
24C2, 24-Ball (5 x 5 array), 1.0mm Pitch, 7 x 9.5mm  
Plastic Chip-scale Ball Grid Array (CBGA)  
Dimensions in Millimeters and (Inches)*  
7.2 (0.283)  
6.8 (0.268)  
9.7 (0.381)  
9.3 (0.366)  
0.30 (0.012)  
1.40 (0.055) MAX  
1.62 (0.064)  
1.36 (0.054)  
2.87 (0.113)  
2.61 (0.103)  
4.0 (0.157)  
5
4
3
2
1
A
B
C
D
E
4.0 (0.157)  
0.46 (0.018)  
DIA BALL TYP  
1.00 (0,039) BSC  
NON-ACCUMULATIVE  
*Controlling dimension: millimeters  
*Controlling dimension: millimeters  
20  

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ATMEL

AT45DB161B-CJ

Flash, 16MX1, PBGA24, 6 X 8 MM, 1.40 MM HIEGHT, 1 MM PITCH, PLASTIC, CBGA-24
ATMEL

AT45DB161B-CL

Flash, 16MX1, PBGA24, 6 X 8 MM, 1.40 MM HIEGHT, 1 MM PITCH, PLASTIC, CBGA-24
ATMEL

AT45DB161B-CL-2.5

Flash, 16MX1, PBGA24, 6 X 8 MM, 1.40 MM HIEGHT, 1 MM PITCH, PLASTIC, CBGA-24
ATMEL

AT45DB161B-CNC

16 MEGABIT 2.5-VOLT ONLY OR 2.7-VOLT ONLY DATAFLASH
ATMEL

AT45DB161B-CNC-2.5

16 MEGABIT 2.5-VOLT ONLY OR 2.7-VOLT ONLY DATAFLASH
ATMEL

AT45DB161B-CNI

16 MEGABIT 2.5-VOLT ONLY OR 2.7-VOLT ONLY DATAFLASH
ATMEL

AT45DB161B-CNL

Flash, 16MX1, 6 X 8 MM, 1 MM HEIGHT, 1.27 MM PITCH, CASON-8
ATMEL