A64S06162AG-70F [AMICC]

16M(1M x 16bit) Normal mode & Page mode with Deep Power Down Static Random Access Memory; 16M ( 1M X 16位),正常模式和页模式与深度掉电静态随机存取存储器
A64S06162AG-70F
型号: A64S06162AG-70F
厂家: AMIC TECHNOLOGY    AMIC TECHNOLOGY
描述:

16M(1M x 16bit) Normal mode & Page mode with Deep Power Down Static Random Access Memory
16M ( 1M X 16位),正常模式和页模式与深度掉电静态随机存取存储器

存储 静态存储器
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A64S06162A  
Preliminary  
Document Title  
16M(1M x 16bit) Normal mode & Page mode with Deep Power Down Static  
Random Access Memory  
Revision history  
Rev. No.  
History  
Issue Date  
Remark  
0.0  
Initial issue  
May 24, 2005  
Preliminary  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
1
A64S06162A  
Preliminary  
MEMORY  
16M(1M x 16bit) Normal mode & Page mode with Deep Power Down  
Static Random Access Memory  
DESCRIPTION  
The A64S06162A is a 16Mb high speed, low power Static Random Access Memory(SRAM)  
organized as 1,048,576 words by 16 bits and supports Deep Power Down and Page Mode.  
The A64S06162A is a Pseudo SRAM based on successfully proven DRAM CELL SRAM which  
was specifically developed for cost sensitive, low power computing and communication  
applications such as mobile cellular phone handsets, personal digital assistants and other  
battery-operated consumer products.  
FEATURES  
• Standard Asynchronous SRAM Interface with Deep Power Down and Page Mode  
• Organization  
• Power Supply Voltage  
• Page Size  
• Page Mode Access (tPAA)  
• Data Retention Voltage  
• Deep Power Down  
: 1M x 16Bit  
: 2.7 ~ 3.3 V  
: 4 words  
: 35ns  
: 2.4V  
: 5uA  
• Tri-state Output and TTL Compatible  
PRODUCT FAMILY  
ISB1  
IccDR  
(Max)  
ICC1  
Operating  
Temperature  
Product Family  
A64S06162A  
Voltage  
2.7 ~ 3.3 V  
Speed  
70  
Mode  
Page  
(Max)  
(Max)  
-40 ~ 85 ℃  
100uA  
100uA  
2.0mA  
PIN DESCRIPTION  
FUNCTIONAL BLOCK DIAGRAM  
1
2
3
4
5
6
Ref. Cont.  
DC Generator Circuit  
A
B
C
D
E
F
/LB  
IO8  
IO9  
/OE  
/UB  
A0  
A3  
A5  
A1  
A4  
A6  
A7  
A2  
/CS  
IO1  
IO3  
IO4  
IO5  
/WE  
A11  
/PD  
IO0  
IO2  
VCC  
VSS  
IO6  
IO7  
NC  
IO0  
IO7  
Row  
Address  
IO10  
Memory Array  
8192 rows  
128 x 16 columns  
VSS IO11 A17  
IO8  
Column  
Address  
VCC IO12 VSS A16  
IO15  
IO14 IO13 A14  
A15  
A13  
A10  
Column Decoder  
G
H
IO15 A19  
A12  
A9  
Control Logic  
A18  
A8  
/CS  
/PD /OE /WE  
/UB /LB  
Note : E3 pin ( VSS) can be remain as a NC  
Name  
Function  
Name  
VCC  
Function  
/CS  
/OE  
Chip Select Input  
Output Enable Input  
Write Enable Input  
Address Input  
Power  
VSS  
/UB  
/LB  
Ground  
/WE  
Upper Byte (IO815)  
Lower Byte (IO07)  
Deep Power Down  
A0A19  
IO0IO15  
Data Input / Output  
/PD  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
2
A64S06162A  
Preliminary  
PRODUCT LIST  
Part Name  
Function  
A64S06162A-70U  
16M, 48-FBGA , 70 ns, 3.0V, -40℃∼85℃  
ABSOLUTE MAXIMUM RATING  
Item  
Symbol  
VIN, VOUT  
VCC  
Ratings  
-0.2 to VCC+0.3 V  
-0.2 to 3.6  
Unit  
V
Voltage on any pin relative to Vss  
Voltage on Vcc supply relative to Vss  
V
Power Dissipation  
PD  
TSTG  
TA  
1.0  
W
Storage temperature  
-55 to 150  
-40 ~ 85  
Operating Temperature (Extended)  
Note :  
Stresses greater than those listed under “ABSOLUTE MAXIMUM RATINGS” may cause permanent  
damage to the device. This is stress rating only and the functional operation of the device under these or  
any other conditions above those indicated in the operation of this specification is not implied.  
Exposure to the absolute maximum rating conditions for extended period may affect reliability.  
TRUTH TABLE  
/CS  
/PD  
/OE  
/WE  
/LB  
/UB  
I/O 0~7  
I/O 8~15  
MODE  
Power  
X
L
X
X
X
X
High-Z  
High-Z  
Deselected  
Deep Power  
Down  
H
X
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
H
H
X
X
H
H
L
X
X
H
H
H
H
H
L
X
H
L
X
H
X
L
High-Z  
High-Z  
High-Z  
High-Z  
Deselected  
Deselected  
Standby  
Standby  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
High-Z  
High-Z  
Output Disabled  
Output Disabled  
Lower Byte Read  
Upper Byte Read  
Word Read  
X
L
High-Z  
High-Z  
H
L
Data Out  
High-Z  
High-Z  
L
H
L
Data Out  
Data Out  
High-Z  
L
L
Data Out  
Data In  
High-Z  
X
X
X
L
H
L
Lower Byte Write  
Upper Byte Write  
Word Write  
L
H
L
Data In  
Data In  
L
L
Data In  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
3
A64S06162A  
Preliminary  
RECOMMENDED DC OPERATING CONDITIONS 1)  
Parameter  
Supply Voltage (5)  
Ground  
Symbol  
Vcc  
Min  
2.7  
0
Typ  
3.0  
0
Max  
3.3  
0
Unit  
V
Vss  
V
Vcc+0.2 2)  
0.4  
Input High Voltage  
Input Low Voltage  
0.8*Vcc  
-0.2 3)  
-
-
V
V
VIH  
VIL  
Note :  
1.TA = -40to 85, otherwise specified.  
2. Overshoot : Vcc + 1.0V in case of pulse width 20 ns.  
3. Undershoot : -1.0V in case of pulse width 20 ns.  
4. Overshoot and undershoot are sampled, not 100% tested.  
5. Stable power supply required 100 us before device operation.  
CAPACITANCE (TA = 25 , f = 1.0MHz)  
Symbol  
CIN  
Parameter  
Condition  
VIN =0V  
Max.  
8
Unit  
pF  
Input Capacitance  
Output Capacitance  
VIO =0V  
10  
pF  
COUT  
Note : This parameter is sampled and not 100% tested  
DC AND OPERATING CHARACTERISTICS  
Parameter  
Symbol  
ILI  
Test Condition  
VIN = Vss to Vcc  
Min  
Typ  
Max  
Unit  
Input Leakage Current  
-1  
1
uA  
Output Leakage Current  
ILO  
/CS = VIH, /UB=/LB= VIH or /OE=VIH or  
/WE=VIL, VIO=Vss to Vcc  
-1  
1
uA  
Icc1  
Cycle Time = 1 us, 100%duty, IIO=0mA,  
/CS 0.2V, VIN 0.2V or  
VIN Vcc-0.2V  
2.0  
20  
mA  
mA  
mA  
Icc2  
Iccp  
Cycle time=Min, IIO=0mA, 100% duty  
/CS = VIL,VIN=VIL or VIH  
/CS1 = VIL, CS2=VIH,Tpwc = min Page  
address cycling  
10  
Output Low Voltage  
Output High Voltage  
Standby Current(TTL)  
VOL  
VOH  
ISB  
IOL = 2 mA  
IOH = -1 mA  
0.4  
V
V
2.2  
/CS=VIH, /UB=/LB= VIH, Other inputs = VIH or  
VIL  
0.3  
mA  
Standby Current(CMOS)  
Deep Power Down Current  
ISB1  
ISB2  
/CS Vcc-0.2V, /UB=/LB Vcc-0.2V  
(/UB,/LB Controlled) Other inputs = 0 or Vcc  
100  
5
uA  
uA  
/PD Vss+0.2V  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
4
A64S06162A  
Preliminary  
Data Retention Electric Characteristic  
TA = -40to 85(Normal), unless otherwise specified  
Item  
Symbol  
Test Condition  
Min  
Max  
Unit  
Typ.  
(1)  
VDR  
/CS=/PD=VIH>Vcc-0.2V or  
/UB,/LB≥Vcc-0.2V,  
VIN≥VCC-0.2V or  
2.4  
3.3  
V
Voltage for Data  
Retention  
VIN≤VSS + 0.2V  
Vcc=2.4V,  
100  
uA  
Data Retention  
Current  
IccDR  
/CS=/PD=VIH>Vcc-0.2V or  
/UB,/LB≥Vcc-0.2V,  
VIN≥VCC-0.2V or  
VIN≤VSS + 0.2V  
Chip Deselect to Data  
Retention Time  
Refer to data retention wave  
form  
0
-
-
-
-
ns  
tCDR  
tR  
tRC  
ns  
Operating Recovery  
Time  
(1) Vcc = 2.4V, TA = 25℃  
Data Retention Wave Form  
Data Retention Mode  
VCC  
2.7V  
tCDR  
tR  
VIH  
VDR  
/CS Vcc-0.2V  
/CS  
VSS  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
5
A64S06162A  
Preliminary  
AC TEST CONDITIONS  
TA = -40to 85(Normal), unless otherwise specified  
PARAMETER  
Value  
Input Pulse Level  
Input Rise and Fall Time  
Input and Output Timing Reference Level  
Output Load  
0.4V to 2.2V  
5ns  
1.5V  
CL = 30pF + 1TTL Load  
AC TEST LOADS  
TTL  
CL(1)  
Note : (1) Including jig and scope capacitance  
POWER UP TIME  
At starting, maintain stable power for a minimum 100us with /CS = /PD = high.  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
6
A64S06162A  
Preliminary  
AC CHARACTERISTICS (Vcc = 2.7 ~ 3.3V, TA = -40 to 85)  
70ns  
Parameter List  
Symbol  
Unit  
Min  
70  
0
Max  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Read Cycle Time  
tRC  
tAS  
Address Set-up Time  
Address Access Time  
tAA  
70  
70  
35  
70  
Chip Select to Output  
tCO  
tOE  
R
E
A
D
Output Enable to Valid Output  
/UB,/LB Access Time  
tBA  
Chip select to Low-Z Output  
/UB, /LB Enable to Low-Z Output  
Output Enable to Low-Z Output  
Chip Disable to High-Z Output  
/UB, /LB Disable to High-Z Output  
Output Disable to High-Z Output  
Output Hold from Address Change  
Page Read Precharge Time  
Page Read Cycle Time  
tLZ  
10  
10  
5
tBLZ  
tOLZ  
tHZ  
0
25  
25  
25  
tBHZ  
tOHZ  
tOH  
tP  
0
0
10  
10  
35  
tPRC  
tPAA  
tWC  
tCW  
tAW  
tBW  
tWP  
tWR  
tWHZ  
tDW  
tDH  
Page Read Address Access Time  
Write Cycle Time  
35  
70  
60  
60  
60  
50  
0
Chip Select to End of Write  
Address Valid to End of Write  
/UB, /LB Valid to End of Write  
Write Pulse Width  
W
R
I
Write Recovery Time  
Write to Output High-Z  
0
20  
T
E
Data to Write Time Overlap  
Data Hold from Write Time  
End of Write to Output Low-Z  
Page Write Precharge Time  
Page Write Cycle Time  
40  
0
tOW  
tP  
5
10  
35  
20  
0
tPWC  
tPDW  
tPDH  
Page Write Data to Write Time overlap  
Page Write Data Hold from Write Time  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
7
A64S06162A  
Preliminary  
TIMING DIAGRAMS  
READ CYCLE (/PD = /WE = VIH)  
tRC  
Address(A2 – A19)  
Page Address(A0 – A1)  
tAA  
tP  
tCO  
/CS  
tAS  
tLZ(2)  
tBA  
/UB,/LB  
/OE  
tOE  
tHZ(1,2)  
tOHZ(1)  
DATA OUT  
Note (READ CYCLE) :  
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are  
not referenced to output voltage levels  
2. At any given temperature and voltage condition, tHZ(max.) is less than tLZ(min.) both for a given  
device and from device to device.  
3. /WE is high for the read cycle.  
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
8
A64S06162A  
Preliminary  
PAGE READ CYCLE (/PD = /WE = VIH)  
tRC  
Address (A2-A19)  
tPRC  
Page Corresponding (A0-A1)  
Addresses  
tP(5)  
tAA  
tPAA  
tCO  
/CS  
tAS  
tLZ(2)  
tBA  
/UB,/LB  
/OE  
tOE  
tHZ(1,2)  
tOHZ(1)  
DATA OUT  
Note (PAGE MODE READ CYCLE) :  
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are  
not referenced to output voltage levels  
2. At any given temperature and voltage condition, tHZ(max.) is less than tLZ(min.) both for a given  
device and from device to device.  
3. /WE is high for the read cycle.  
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.  
5. tP (precharge time) should be guaranteed for new Address.  
6. After initial page access is accomplished, the page mode operation provides fast read access speed of  
random locations within that page  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
9
A64S06162A  
Preliminary  
WRITE CYCLE 1 (/CS Controlled, /PD = VIH)  
tWC  
ADDR  
tWR  
tAS  
tCW  
/CS  
tAW  
tBW  
tP  
/UB,/LB  
/WE  
tWP  
tDW  
tDH  
High-Z  
High-Z  
Data In  
Data Valid  
High-Z  
tWC  
Data  
Out  
WRITE CYCLE 2 (/UB /LB Controlled, /PD = VIH  
ADDR  
tWR(4)  
tCW(2)  
/CS  
tP  
tAW  
tBW  
/UB,/LB  
tAS(3)  
tWP  
/WE  
tDW  
tDH  
Data In  
Data Valid  
High-Z  
Data  
Out  
Notes (WRITE CYCLE) :  
1. A write occurs during the overlap of a low /CS and low /WE. A write begins at the latest  
transition among /CS going low and /WE going low: A write end at the earliest  
transition among /CS going high and /WE going high. tWP is measured from the  
beginning of write to the end of write.  
2. tCW is measured from the later of /CS going low to the end of write.  
3. tAS is measured from the address valid to the beginning of write.  
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends  
as /CS.  
5. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
10  
A64S06162A  
Preliminary  
PAGE MODE WRITE CYCLE (/PD = VIH)  
tWC  
Address(A2 – A19)  
tPWC  
Page Address(A0 – A1)  
tP  
tCW(3)  
tBW  
/CS  
tAS(1)  
/UB,/LB  
tWP(1)  
/WE  
tPDH  
tPDW  
tDW tDH  
tPDW tPDH  
DATA IN  
DATA OUT  
High-Z  
Notes (PAGE MODE WRITE CYCLE) :  
1. A write occurs during the overlap of a low /CS and low /WE.  
A write begins at the latest transition among /CS going low in initial page mode .  
A write end at the earliest transition among /CS going high and Page Address transition.  
tWP is measured from the beginning of write to the end of write in initial page access.  
2. tPWC is measured from Page Address trasition (After initial page access)  
to Page Address transition or /CS going high.  
2. tCW is measured from the later of /CS going low to the end of write in initial page access.  
3. tAS is measured from the address valid to the beginning of write.  
4. Do not access device with cycle timing shorter than tRC for continuous periods > 16us.  
5. tP (precharge time) should be guaranteed for new Page Address.  
6. After initial page access is accomplished, the page mode operation provides fast read access speed of  
random locations within that page  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
11  
A64S06162A  
Preliminary  
Deep Power Down Mode  
100us  
1us  
/PD  
Wake Up  
Normal Operation  
Normal Operation  
Deep Power Down Mode  
Mode  
/CS  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
12  
A64S06162A  
Preliminary  
Ordering Information  
Part No.  
Package  
Access Time  
(ns)  
Operating Current  
Max. (mA)  
Power Down Mode  
Standby Current  
Max. (µA)  
A64S06162AG-70  
A64S06162AG-70F  
A64S06162AG-70U  
A64S06162AG-70UF  
70  
70  
70  
70  
20  
20  
20  
20  
5
5
5
5
48B Mini BGA  
48B Pb-Free Mini BGA  
48B Mini BGA  
48B Pb-Free Mini BGA  
•Note : -U is for -40c ~ 85c temperature grade  
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
13  
A64S06162A  
Preliminary  
PACKAGE DIMENSION FOR BGA TYPE  
Unit: millimeters  
48 BALL FINE PITCH 6mm x 8mm BGA(0.75mm ball pitch)  
Bottom View  
Top View  
B
A1 INDEX MARK  
B
B1  
6
5
4
3
2
1
#A1  
B/2  
Side View  
D
A
Y
C
Min  
Typical  
0.75  
6.00  
3.75  
8.00  
5.25  
0.35  
-
Max  
-
A
B
-
5.90  
6.10  
-
B1  
C
-
7.90  
8.10  
-
C1  
D
-
0.30  
0.40  
1.20  
0.90  
0.30  
0.10  
E
-
E1  
E2  
Y
-
0.20  
-
-
0.25  
-
AMIC Technology, Corp.  
(May, 2005, Version 0.0)  
14  

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