AM29LV010B-55JD [AMD]
1 Megabit (128 K x 8-Bit) CMOS 3.0 Volt-only Uniform Sector Flash Memory; 1兆位( 128千×8位) CMOS 3.0伏只统一部门快闪记忆体型号: | AM29LV010B-55JD |
厂家: | AMD |
描述: | 1 Megabit (128 K x 8-Bit) CMOS 3.0 Volt-only Uniform Sector Flash Memory |
文件: | 总36页 (文件大小:1001K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Am29LV010B
Data Sheet
The Am29LV010B is not offered for new designs. Please contact a Spansion representative for alter-
nates.
The following document contains information on Spansion memory products. Although the document
is marked with the name of the company that originally developed the specification, Spansion will
continue to offer these products to existing customers.
Continuity of Specifications
There is no change to this data sheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal data sheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appro and
changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
Spansion continues to support existing part numbers beginning with “Am” and “MBM”. To order these
products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local sales office for additional information about Spansion memory solutions.
Publication Number 22140 Revision D Amendment 6 Issue Date October 11, 2006
THIS PAGE LEFT INTENTIONALLY BLANK.
DATA SHEET
Am29LV010B
1 Megabit (128 K x 8-Bit)
CMOS 3.0 Volt-only Uniform Sector Flash Memory
The Am29LV010B is not offered for new designs. Please contact a Spansion representative for alternates.
DISTINCTIVE CHARACTERISTICS
❥ Single power supply operation
❥ Unlock Bypass Mode Program Command
— Full voltage range: 2.7 to 3.6 volt read and write
operations for battery-powered applications
— Reduces overall programming time when issuing
multiple program command sequences
— Regulated voltage range: 3.0 to 3.6 volt read and
write operations and for compatibility with high
performance 3.3 volt microprocessors
❥ Embedded Algorithms
— Embedded Erase algorithm automatically
preprograms and erases the entire chip or any
combination of designated sectors
❥ Manufactured on 0.32 µm process technology
❥ High performance
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
— Full voltage range: access times as fast as 55 ns
❥ Ultra low power consumption (typical values at
❥ Minimum 1,000,000 write cycle guarantee per
5 MHz)
sector
— 200 nA Automatic Sleep mode current
— 200 nA standby mode current
— 7 mA read current
❥ 20 Year data retention at 125°C
— Reliable operation for the life of the system
❥ Package option
— 15 mA program/erase current
— 32-pin TSOP
— 32-pin PLCC
❥ Flexible sector architecture
— Eight 16 Kbyte
❥ Compatibility with JEDEC standards
— Pinout and software compatible with single-
power supply Flash
— Supports full chip erase
— Sector Protection features:
— Superior inadvertent write protection
Hardware method of locking a sector to prevent
any program or erase operations within that sector
❥ Data# Polling and toggle bits
Sectors can be locked in-system or via
programming equipment
— Provides a software method of detecting program
or erase operation completion
Temporary Sector Unprotect feature allows code
changes in previously locked sectors
❥ Erase Suspend/Erase Resume
— Supports reading data from or programming data
to a sector that is not being erased
This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data
Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
Publication# 22140 Rev: D Amendment: 6
Issue Date: October 11, 2006
D A T A S H E E T
GENERAL DESCRIPTION
The Am29LV010B is a 1 Mbit, 3.0 Volt-only Flash
memory device organized as 131,072 bytes. The
Am29LV010B has a uniform sector architecture.
Erase algorithm—an internal algorithm that automati-
cally preprograms the array (if it is not already
programmed) before executing the erase operation.
During erase, the device automatically times the erase
pulse widths and verifies proper cell margin.
The device is offered in 32-pin PLCC and 32-pin TSOP
packages. The byte-wide (x8) data appears on DQ7-DQ0.
All read, erase, and program operations are accomplished
using only a single power supply. The device can also be
programmed in standard EPROM programmers.
The host system can detect whether a program or
erase operation is complete by reading the DQ7 (Data#
Polling) and DQ6 (toggle) status bits. After a program
or erase cycle has been completed, the device is ready
to read array data or accept another command.
The standard Am29LV010B offers access times of 55,
70, and 90 ns (100 ns part is also available), allowing
high speed microprocessors to operate without wait
states. To eliminate bus contention, the device has sep-
arate chip enable (CE#), write enable (WE#) and
output enable (OE#) controls.
The sector erase architecture allows memory sectors
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
The device requires only a single power supply
(2.7V-3.6V) for both read and write functions. Internally
generated and regulated voltages are provided for the
program and erase operations.
Hardware data protection measures include a low
V
detector that automatically inhibits write opera-
CC
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of
memory. This can be achieved in-system or via pro-
gramming equipment.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Com-
mands are written to the command register using
standard microprocessor write timings. Register con-
tents serve as input to an internal state-machine that
controls the erase and programming circuitry. Write
cycles also internally latch addresses and data needed
for the programming and erase operations. Reading
data out of the device is similar to reading from other
Flash or EPROM devices.
The Erase Suspend feature enables the user to put
erase on hold for any period of time to read data from,
or program data to, any sector that is not selected for
erasure. True background erase can thus be achieved.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep mode.
The system can also place the device into the standby
mode. Power consumption is greatly reduced in both
these modes.
Device programming occurs by executing the program
command sequence. This initiates the Embedded
Program algorithm—an internal algorithm that auto-
matically times the program pulse widths and verifies
proper cell margin. The Unlock Bypass mode facili-
tates faster programming times by requiring only two
write cycles to program data instead of four.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effectiveness.
The device electrically erases all bits within a sector
simultaneously via Fowler-Nordheim tunneling. The
data is programmed using hot electron injection.
Device erasure occurs by executing the erase
command sequence. This initiates the Embedded
4
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
TABLE OF CONTENTS
Distinctive Characteristics 3
General Description 4
Reading Toggle Bits DQ6/DQ2 ............................................... 19
Figure 4. Toggle Bit Algorithm ........................................................ 20
DQ5: Exceeded Timing Limits ................................................ 20
DQ3: Sector Erase Timer ....................................................... 20
Table 5. Write Operation Status..................................................... 21
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 22
Figure 5. Maximum Negative Overshoot Waveform ...................... 22
Figure 6. Maximum Positive Overshoot Waveform ........................ 22
Operating Ranges. . . . . . . . . . . . . . . . . . . . . . . . . 22
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 23
Figure 7. ICC1 Current vs. Time (Showing Active and Automatic
Product Selector Guide . . . . . . . . . . . . . . . . . . . . .6
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . .7
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . .8
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Ordering Information . . . . . . . . . . . . . . . . . . . . . . .9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . .10
Table 1. Am29LV010B Device Bus Operations .............................. 10
Requirements for Reading Array Data ................................... 10
Writing Commands/Command Sequences ............................ 10
Program and Erase Operation Status .................................... 11
Standby Mode ........................................................................ 11
Automatic Sleep Mode ........................................................... 11
Output Disable Mode .............................................................. 11
Table 2. Am29LV010B Uniform Sector Address Table................... 11
Autoselect Mode ..................................................................... 12
Table 3. Am29LV010B Autoselect Codes....................................... 12
Sector Protection/Unprotection ............................................... 12
Hardware Data Protection ...................................................... 12
Command Definitions . . . . . . . . . . . . . . . . . . . . . 13
Reading Array Data ................................................................ 13
Reset Command ..................................................................... 13
Autoselect Command Sequence ............................................ 13
Byte Program Command Sequence ....................................... 13
Figure 1. Program Operation ..........................................................14
Chip Erase Command Sequence ........................................... 14
Sector Erase Command Sequence ........................................ 15
Erase Suspend/Erase Resume Commands ........................... 15
Figure 2. Erase Operation ...............................................................16
Command Definitions ............................................................. 17
Table 4. Am29LV010B Command Definitions ................................ 17
Write Operation Status . . . . . . . . . . . . . . . . . . . . .18
DQ7: Data# Polling ................................................................. 18
Figure 3. Data# Polling Algorithm ...................................................18
DQ6: Toggle Bit I .................................................................... 19
DQ2: Toggle Bit II ................................................................... 19
Sleep Currents) .............................................................................. 24
Figure 8. ICC1 vs. Frequency .......................................................... 24
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 9. Test Setup ....................................................................... 25
Table 6. Test Specifications........................................................... 25
Key to Switching Waveforms. . . . . . . . . . . . . . . . 25
Figure 10. Input Waveforms and Measurement Levels ................. 25
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 26
Read Operations .................................................................... 26
Figure 11. Read Operations Timings ............................................. 26
Erase/Program Operations ..................................................... 27
Figure 12. Program Operation Timings .......................................... 28
Figure 13. Chip/Sector Erase Operation Timings .......................... 29
Figure 14. Data# Polling Timings (During Embedded Algorithms) . 30
Figure 15. Toggle Bit Timings (During Embedded Algorithms) ...... 30
Figure 16. DQ2 vs. DQ6 ................................................................. 31
Figure 17. Alternate CE# Controlled Write Operation Timings ...... 32
Erase and Programming Performance . . . . . . . . 32
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 33
TSOP Pin Package Capacitance . . . . . . . . . . . . . 33
PLCC Pin Capacitance . . . . . . . . . . . . . . . . . . . . . 33
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 34
PL 032—32-Pin Plastic Leaded Chip Carrier ......................... 34
TS 032—32-Pin Standard Thin Small Outline Package ......... 35
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 36
October 11, 2006 22140D6
Am29LV010B
5
D A T A S H E E T
PRODUCT SELECTOR GUIDE
Family Part Number
Am29LV010B
-70
Speed Options
Full Voltage Range: VCC = 2.7–3.6 V
-55
-90
90
90
35
Max access time, ns (tACC
)
55
55
30
70
70
30
Max CE# access time, ns (tCE
)
Max OE# access time, ns (tOE
)
Note:See “AC Characteristics” for full specifications.
BLOCK DIAGRAM
DQ0–DQ7
VCC
VSS
Sector Switches
Erase Voltage
Generator
Input/Output
Buffers
State
Control
WE#
Command
Register
PGM Voltage
Generator
Data
Latch
Chip Enable
Output Enable
Logic
STB
CE#
OE#
Y-Decoder
X-Decoder
Y-Gating
STB
VCC Detector
Timer
Cell Matrix
A0–A16
6
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
CONNECTION DIAGRAMS
A11
A9
A8
OE#
A10
CE#
1
2
3
32
31
30
A13
A14
NC
WE#
VCC
NC
A16
A15
A12
A7
4
5
6
7
8
9
10
11
12
13
14
15
16
DQ7
DQ6
DQ5
DQ4
DQ3
VSS
DQ2
DQ1
DQ0
A0
29
28
27
26
25
24
23
22
21
20
19
18
17
32-Pin Standard TSOP
A6
A5
A4
A1
A2
A3
4
3 2 1 32 31 30
A7
A6
5
6
A14
A13
29
28
A5
A4
7
A8
27
26
25
24
23
22
21
8
A9
PLCC
A3
9
A11
OE#
A10
CE#
DQ7
A2
10
11
12
13
A1
A0
DQ0
16 17
19 20
18
15
14
October 11, 2006 22140D6
Am29LV010B
7
D A T A S H E E T
PIN CONFIGURATION
A0–A16=17 addresses
DQ0–DQ7=8 data inputs/outputs
CE# = Chip enable
LOGIC SYMBOL
17
A0–A16
8
DQ0–DQ7
OE# = Output enable
WE# = Write enable
CE#
OE#
V
= 3.0 volt-only single power supply
(see Product Selector Guide for speed
options and voltage supply tolerances)
CC
WE#
V
= Device ground
SS
NC = Pin not connected internally
8
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
ORDERING INFORMATION
Standard Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combi-
nation) is formed by a combination of the elements below.
Am29LV010B
-55
E
C
TEMPERATURE RANGE
C= Commercial (0°C to +70°C)
D= Commercial (0°C to +70°C) with Pb-free package
I = Industrial (–40°C to +85°C)
F = Industrial (–40°C to +85°C) with Pb-free package
E = Extended (–55°C to +125°C)
K= Extended (–55°C to +125°C) with Pb-free package
PACKAGE TYPE
E= 32-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 032)
J= 32-Pin Rectangular Plastic Leaded Chip
Carrier (PL 032)
SPEED OPTION
See Product Selector Guide and Valid Combinations
DEVICE NUMBER/DESCRIPTION
Am29LV010B
1 Megabit (128 K x 8-Bit) CMOS Flash Memory
3.0 Volt-only Read, Program and Erase
Valid Combinations
Valid Combinations
Valid Combinations list configurations planned to be sup-
ported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
AM29LV010B-55
AM29LV010B-70
AM29LV010B-90
EC, ED, EI, EF, EE, EK
JC, JD, JI, JF, JE, JK
October 11, 2006 22140D6
Am29LV010B
9
D A T A S H E E T
DEVICE BUS OPERATIONS
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register
itself does not occupy any addressable memory loca-
tion. The register is composed of latches that store the
commands, along with the address and data informa-
tion needed to execute the command. The contents of
the register serve as inputs to the internal state
machine. The state machine outputs dictate the func-
tion of the device. Table 1 lists the device bus
operations, the inputs and control levels they require,
and the resulting output. The following subsections
describe each of these operations in further detail.
Table 1. Am29LV010B Device Bus Operations
Operation
CE#
OE#
L
WE#
H
Addresses (Note 1)
DQ0–DQ7
DOUT
Read
L
AIN
AIN
X
Write
L
H
L
DIN
Standby
VCC ± 0.3 V
X
X
High-Z
High-Z
High-Z
Output Disable
Reset
L
H
H
X
X
X
X
X
Sector Address, A6 = L, A1 = H,
A0 = L
Sector Protect (Note 2)
L
H
L
DIN, DOUT
Sector Address, A6 = H, A1 =
H, A0 = L
Sector Unprotect (Note 2)
L
H
X
L
DIN, DOUT
DIN
Temporary Sector Unprotect
X
X
AIN
Legend:
L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, DOUT = Data Out
Notes:
1. Addresses are A16–A0.
2. Sector protection/unprotection can be implemented by using programming equipment. See the “Sector Protection/Unprotec-
tion” section.
Requirements for Reading Array Data
Writing Commands/Command Sequences
To read array data from the outputs, the system must
To write a command or command sequence (which
includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
drive the CE# and OE# pins to V . CE# is the power
IL
control and selects the device. OE# is the output
control and gates array data to the output pins. WE#
CE# to V , and OE# to V .
IL
IH
should remain at V .
IH
The device features an Unlock Bypass mode to facili-
tate faster programming. Once the device enters the
Unlock Bypass mode, only two write cycles are
required to program a byte, instead of four. The “Byte
Program Command Sequence” section has details on
programming data to the device using both standard
and Unlock Bypass command sequences.
The internal state machine is set for reading array data
upon device power-up. This ensures that no spurious
alteration of the memory content occurs during the
power transition. No command is necessary in this
mode to obtain array data. Standard microprocessor
read cycles that assert valid addresses on the device
address inputs produce valid data on the device data
outputs. The device remains enabled for read access
until the command register contents are altered.
An erase operation can erase one sector, multiple sec-
tors, or the entire device. Table 2 indicates the address
space that each sector occupies. A “sector address”
consists of the address bits required to uniquely select
a sector. The “Command Definitions” section has
details on erasing a sector or the entire chip, or sus-
pending/resuming the erase operation.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifica-
tions and to Figure 11 for the timing diagram. I
DC Characteristics table represents the active current
specification for reading array data.
in the
CC1
After the system writes the autoselect command
sequence, the device enters the autoselect mode. The
10
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
system can then read autoselect codes from the but not within V
± 0.3 V, the device will be in the
CC
internal register (which is separate from the memory
array) on DQ7–DQ0. Standard read cycle timings apply
in this mode. Refer to the Autoselect Mode and Autose-
lect Command Sequence sections for more
information.
standby mode, but the standby current will be greater.
The device requires standard access time (t ) for read
CE
access when the device is in either of these standby
modes, before it is ready to read data.
If the device is deselected during erasure or program-
ming, the device draws active current until the
operation is completed.
I
in the DC Characteristics table represents the
CC2
active current specification for the write mode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
I
in the DC Characteristics table represents the
CC3
standby current specification.
Program and Erase Operation Status
During an erase or program operation, the system may
check the status of the operation by reading the status
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device
energy consumption. The device automatically enables
bits on DQ7–DQ0. Standard read cycle timings and I
CC
this mode when addresses remain stable for t
+ 30
ACC
read specifications apply. Refer to “Write Operation
Status” for more information, and to “AC Characteris-
tics” for timing diagrams.
ns. The automatic sleep mode is independent of the
CE#, WE#, and OE# control signals. Standard address
access timings provide new data when addresses are
changed. While in sleep mode, output data is latched
Standby Mode
and always available to the system. I
in the DC
CC4
When the system is not reading or writing to the device,
it can place the device in the standby mode. In this
mode, current consumption is greatly reduced, and the
outputs are placed in the high impedance state, inde-
pendent of the OE# input.
Characteristics table represents the automatic sleep
mode current specification.
Output Disable Mode
When the OE# input is at V , output from the device is
IH
The device enters the CMOS standby mode when the
disabled. The output pins are placed in the high imped-
ance state.
CE# pin is held at V ± 0.3 V. (Note that this is a more
CC
restricted voltage range than V .) If CE# is held at V ,
IH
IH
Table 2. Am29LV010B Uniform Sector Address Table
Sector
SA0
SA1
SA2
SA3
SA4
SA5
SA6
SA7
A16
0
A15
0
A14
0
Address Range
00000h-03FFFh
04000h-07FFFh
08000h-0BFFFh
0C000h-0FFFFh
10000h-13FFFh
14000h-17FFFh
18000h-1BFFFh
1C000h-1FFFFh
0
0
1
0
1
0
0
1
1
1
0
0
1
0
1
1
1
0
1
1
1
October 11, 2006 22140D6
Am29LV010B
11
D A T A S H E E T
Table 3. In addition, when verifying sector protection,
Autoselect Mode
the sector address must appear on the appropriate
highest order address bits (see Table 2). When all nec-
essary bits have been set as required, the
programming equipment may then read the corre-
sponding identifier code on DQ7-DQ0.
The autoselect mode provides manufacturer and
device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for programming equipment
to automatically match a device to be programmed with
its corresponding programming algorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in Table 4. This method
does not require V . See “Command Definitions” for
details on using the autoselect mode.
ID
When using programming equipment, the autoselect
mode requires V (11.5 V to 12.5 V) on address pin
ID
A9. Address pins A6, A1, and A0 must be as shown in
Table 3. Am29LV010B Autoselect Codes
A16 A13
to to
OE# WE# A14 A10 A9
A8
to
A7
A5
to
A2
DQ7
to
DQ0
Description
Manufacturer ID: AMD
Device ID: Am29LV010B
CE#
L
A6
L
A1
L
A0
L
L
L
H
H
X
X
X
X
VID
VID
X
X
X
X
01h
6Eh
L
L
L
H
01h
(protected)
Sector Protection Verification
L
L
H
SA
X
VID
X
L
X
H
L
00h
(unprotected)
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
command definitions). In addition, the following hard-
ware data protection measures prevent accidental
erasure or programming, which might otherwise be
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sector. The hard-
ware sector unprotection feature re-enables both
program and erase operations in previously protected
sectors.
caused by spurious system level signals during V
CC
power-up and power-down transitions, or from system
noise.
Low V
Write Inhibit
CC
The method intended only for programming equipment
When V
is less than V
, the device does not
LKO
requires V on address pin A9, and OE#. This method
CC
ID
accept any write cycles. This protects data during V
power-up and power-down. The command register and
all internal program/erase circuits are disabled, and the
device resets. Subsequent writes are ignored until V
is greater than V
is compatible with programmer routines written for
earlier 3.0 volt-only AMD flash devices. Publication
number 22134 contains further details; contact an
AMD representative to request a copy.
CC
CC
. The system must provide the
LKO
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Service. Contact an
AMD representative for details.
proper signals to the control pins to prevent uninten-
tional writes when V is greater than V
.
CC
LKO
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or
WE# do not initiate a write cycle.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
Logical Inhibit
Write cycles are inhibited by holding any one of OE# =
Hardware Data Protection
V , CE# = V or WE# = V . To initiate a write cycle,
IL
IH
IH
The command sequence requirement of unlock cycles
for programming or erasing provides data protection
against inadvertent writes (refer to Table 4 for
CE# and WE# must be a logical zero while OE# is a
logical one.
12
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
of WE#. The internal state machine is automatically
Power-Up Write Inhibit
If WE# = CE# = V and OE# = V during power up, the
reset to reading array data on power-up.
IL
IH
device does not accept commands on the rising edge
COMMAND DEFINITIONS
Writing specific address and data commands or
sequences into the command register initiates device
operations. Table 4 defines the valid register command
sequences. Writing incorrect address and data
values or writing them in the improper sequence
resets the device to reading array data.
The reset command may be written between the
sequence cycles in a program command sequence
before programming begins. This resets the device to
reading array data (also applies to programming in
Erase Suspend mode). Once programming begins,
however, the device ignores reset commands until the
operation is complete.
All addresses are latched on the falling edge of WE# or
CE#, whichever happens later. All data is latched on
the rising edge of WE# or CE#, whichever happens
first. Refer to the appropriate timing diagrams in the
“AC Characteristics” section.
The reset command may be written between the
sequence cycles in an autoselect command sequence.
Once in the autoselect mode, the reset command must
be written to return to reading array data (also applies
to autoselect during Erase Suspend).
Reading Array Data
If DQ5 goes high during a program or erase operation,
writing the reset command returns the device to
reading array data (also applies during Erase
Suspend).
The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read array
data after completing an Embedded Program or
Embedded Erase algorithm.
Autoselect Command Sequence
After the device accepts an Erase Suspend command,
the device enters the Erase Suspend mode. The
system can read array data using the standard read
timings, except that if it reads at an address within
erase-suspended sectors, the device outputs status
data. After completing a programming operation in the
Erase Suspend mode, the system may once again
read array data with the same exception. See “Erase
Suspend/Erase Resume Commands” for more infor-
mation on this mode.
The autoselect command sequence allows the host
system to access the manufacturer and devices codes,
and determine whether or not a sector is protected.
Table 4 shows the address and data requirements. This
method is an alternative to that shown in Table 3, which
is intended for PROM programmers and requires V
on address bit A9.
ID
The autoselect command sequence is initiated by
writing two unlock cycles, followed by the autoselect
command. The device then enters the autoselect
mode, and the system may read at any address any
number of times, without initiating another command
sequence. A read cycle at address XX00h retrieves the
manufacturer code. A read cycle at address XX01h
returns the device code. A read cycle containing a
sector address (SA) and the address 02h returns 01h if
that sector is protected, or 00h if it is unprotected. Refer
to Table 2 for the valid sector addresses.
The system must issue the reset command to re-
enable the device for reading array data if DQ5 goes
high, or while in the autoselect mode. See the “Reset
Command” section, next.
See also “Requirements for Reading Array Data” in the
“Device Bus Operations” section for more information.
The Read Operations table provides the read parame-
ters, and Figure 11 shows the timing diagram.
The system must write the reset command to exit the
autoselect mode and return to reading array data.
Reset Command
Writing the reset command to the device resets the
device to reading array data. Address bits are don’t
care for this command.
Byte Program Command Sequence
The device programs one byte of data for each program
operation. The command sequence requires four bus
cycles, and is initiated by writing two unlock write
cycles, followed by the program set-up command. The
program address and data are written next, which in
turn initiate the Embedded Program algorithm. The
system is not required to provide further controls or tim-
ings. The device automatically provides internally
The reset command may be written between the
sequence cycles in an erase command sequence
before erasing begins. This resets the device to reading
array data. Once erasure begins, however, the device
ignores reset commands until the operation is
complete.
October 11, 2006 22140D6
Am29LV010B
13
D A T A S H E E T
generated program pulses and verify the programmed
cell margin. Table 4 shows the address and data
requirements for the byte program command
sequence.
START
When the Embedded Program algorithm is complete,
the device then returns to reading array data and
addresses are no longer latched. The system can
determine the status of the program operation by using
DQ7 or DQ6. See “Write Operation Status” for informa-
tion on these status bits.
Write Program
Command Sequence
Data Poll
from System
Any commands written to the device during the
Embedded Program Algorithm are ignored. The Byte
Program command sequence should be reinitiated
once the device has reset to reading array data, to
ensure data integrity.
Embedded
Program
algorithm
in progress
Verify Data?
Yes
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed
from a “0” back to a “1”. Attempting to do so may halt
the operation and set DQ5 to “1,” or cause the Data#
Polling algorithm to indicate the operation was suc-
cessful. However, a succeeding read will show that the
data is still “0”. Only erase operations can convert a “0”
to a “1”.
No
No
Increment Address
Last Address?
Yes
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to
program bytes to the device faster than using the stan-
dard program command sequence. The unlock bypass
command sequence is initiated by first writing two
unlock cycles. This is followed by a third write cycle
containing the unlock bypass command, 20h. The
device then enters the unlock bypass mode. A two-
cycle unlock bypass program command sequence is all
that is required to program in this mode. The first cycle
in this sequence contains the unlock bypass program
command, A0h; the second cycle contains the program
address and data. Additional data is programmed in
the same manner. This mode dispenses with the initial
two unlock cycles required in the standard program
command sequence, resulting in faster total program-
ming time. Table 4 shows the requirements for the
command sequence.
Programming
Completed
Note:See Table 4 for program command sequence.
Figure 1. Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase
command sequence is initiated by writing two unlock
cycles, followed by a set-up command. Two additional
unlock write cycles are then followed by the chip erase
command, which in turn invokes the Embedded Erase
algorithm. The device does not require the system to
preprogram prior to erase. The Embedded Erase algo-
rithm automatically preprograms and verifies the entire
memory for an all zero data pattern prior to electrical
erase. The system is not required to provide any con-
trols or timings during these operations. Table 4 shows
the address and data requirements for the chip erase
command sequence.
During the unlock bypass mode, only the Unlock
Bypass Program and Unlock Bypass Reset commands
are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset
command sequence. The first cycle must contain the
data 90h; the second cycle the data 00h. Addresses
are don’t cares for both cycles. The device then returns
to reading array data.
Any commands written to the chip during the
Embedded Erase algorithm are ignored. The Chip
Erase command sequence should be reinitiated once
the device has returned to reading array data, to
ensure data integrity.
Figure 1 illustrates the algorithm for the program oper-
ation. See the Erase/Program Operations table in “AC
Characteristics” for parameters, and to Figure 12 for
timing diagrams.
14
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
The system can determine the status of the erase oper-
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are
no longer latched. The system can determine the
status of the erase operation by using DQ7, DQ6, or
DQ2. (Refer to “Write Operation Status” for information
on these status bits.)
ation by using DQ7, DQ6, or DQ2. See “Write
Operation Status” for information on these status bits.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are
no longer latched.
Figure 2 illustrates the algorithm for the erase opera-
tion. See the Erase/Program Operations tables in “AC
Characteristics” for parameters, and to Figure 13 for
timing diagrams.
Figure 2 illustrates the algorithm for the erase opera-
tion. Refer to the Erase/Program Operations tables in
the “AC Characteristics” section for parameters, and to
Figure 13 for timing diagrams.
Sector Erase Command Sequence
Erase Suspend/Erase Resume Commands
Sector erase is a six bus cycle operation. The sector
erase command sequence is initiated by writing two
unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the
address of the sector to be erased, and the sector
erase command. Table 4 shows the address and data
requirements for the sector erase command sequence.
The Erase Suspend command allows the system to
interrupt a sector erase operation and then read data
from, or program data to, any sector not selected for
erasure. This command is valid only during the sector
erase operation, including the 50 µs time-out period
during the sector erase command sequence. The
Erase Suspend command is ignored if written during
the chip erase operation or Embedded Program algo-
rithm. Writing the Erase Suspend command during the
Sector Erase time-out immediately terminates the
time-out period and suspends the erase operation.
Addresses are “don’t-cares” when writing the Erase
Suspend command.
The device does not require the system to preprogram
the memory prior to erase. The Embedded Erase algo-
rithm automatically programs and verifies the sector for
an all zero data pattern prior to electrical erase. The
system is not required to provide any controls or
timings during these operations.
When the Erase Suspend command is written during a
sector erase operation, the device requires a maximum
of 20 µs to suspend the erase operation. However,
when the Erase Suspend command is written during
the sector erase time-out, the device immediately ter-
minates the time-out period and suspends the erase
operation.
After the command sequence is written, a sector erase
time-out of 50 µs begins. During the time-out period,
additional sector addresses and sector erase com-
mands may be written. Loading the sector erase buffer
may be done in any sequence, and the number of
sectors may be from one sector to all sectors. The time
between these additional cycles must be less than 50
µs, otherwise the last address and command might not
be accepted, and erasure may begin. It is recom-
mended that processor interrupts be disabled during
this time to ensure all commands are accepted. The
interrupts can be re-enabled after the last Sector Erase
command is written. If the time between additional
sector erase commands can be assumed to be less
than 50 µs, the system need not monitor DQ3. Any
command other than Sector Erase or Erase
Suspend during the time-out period resets the
device to reading array data. The system must
rewrite the command sequence and any additional
sector addresses and commands.
After the erase operation has been suspended, the
system can read array data from or program data to
any sector not selected for erasure. (The device “erase
suspends” all sectors selected for erasure.) Normal
read and write timings and command definitions apply.
Reading at any address within erase-suspended
sectors produces status data on DQ7–DQ0. The
system can use DQ7, or DQ6 and DQ2 together, to
determine if a sector is actively erasing or is erase-sus-
pended. See “Write Operation Status” for information
on these status bits.
After an erase-suspended program operation is com-
plete, the system can once again read array data within
non-suspended sectors. The system can determine
the status of the program operation using the DQ7 or
DQ6 status bits, just as in the standard program oper-
ation. See “Write Operation Status” for more
information.
The system can monitor DQ3 to determine if the sector
erase timer has timed out. (See the “DQ3: Sector Erase
Timer” section.) The time-out begins from the rising
edge of the final WE# pulse in the command sequence.
Once the sector erase operation has begun, only the
Erase Suspend command is valid. All other commands
are ignored. The Sector Erase command sequence
should be reinitiated once the device has returned to
reading array data, to ensure data integrity.
The system may also write the autoselect command
sequence when the device is in the Erase Suspend
mode. The device allows reading autoselect codes
even at addresses within erasing sectors, since the
codes are not stored in the memory array. When the
October 11, 2006 22140D6
Am29LV010B
15
D A T A S H E E T
device exits the autoselect mode, the device reverts to
the Erase Suspend mode, and is ready for another
valid operation. See “Autoselect Command Sequence”
for more information.
START
The system must write the Erase Resume command
(address bits are “don’t care”) to exit the erase suspend
mode and continue the sector erase operation. Further
writes of the Resume command are ignored. Another
Erase Suspend command can be written after the
device has resumed erasing.
Write Erase
Command Sequence
Data Poll
from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
Yes
Erasure Completed
Notes:
1. See Table 4 for erase command sequence.
2. See “DQ3: Sector Erase Timer” for more information.
Figure 2. Erase Operation
16
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
Command Definitions
Table 4. Am29LV010B Command Definitions
Bus Cycles (Notes 2–4)
Command Sequence
(Note 1)
First
Second
Third
Fourth
Fifth
Sixth
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read (Note 5)
Reset (Note 6)
1
1
4
RA
XXX
555
RD
F0
Manufacturer ID
AA
2AA
2AA
55
55
555
555
90
90
X00
X01
01
6E
Device ID,
Am29LV010B
4
555
AA
00
01
Sector Protect
Verify (Note 8)
SA
X02
4
555
AA
2AA
55
555
90
Byte Program
4
3
555
555
AA
AA
2AA
2AA
55
55
555
555
A0
20
PA
PD
Unlock Bypass
Unlock Bypass Program
(Note 9)
2
2
XXX
XXX
A0
90
PA
PD
00
Unlock Bypass Reset
(Note 10)
XXX
Chip Erase
6
6
1
1
555
555
AA
AA
B0
30
2AA
2AA
55
55
555
555
80
80
555
555
AA
AA
2AA
2AA
55
55
555
SA
10
30
Sector Erase
Erase Suspend (Note 11)
Erase Resume (Note 12)
XXX
XXX
Legend:
X = Don’t care
PD = Data to be programmed at location PA. Data is latched
on the rising edge of WE# or CE# pulse.
RA = Address of the memory location to be read.
SA = Address of the sector to be erased or verified. Address
bits A16–A14 uniquely select any sector.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed.
Addresses are latched on the falling edge of the WE# or CE#
pulse.
Notes:
1. See Table 1 for descriptions of bus operations.
8. The data is 00h for an unprotected sector and 01h for a
protected sector. The complete bus address in the fourth
cycle is composed of the sector address (A16–A14), A1 =
1, and A0 = 0.
2. All values are in hexadecimal.
3. Except when reading array or autoselect data, all bus
cycles are write operations.
9. The Unlock Bypass command is required prior to the
Unlock Bypass Program command.
4. Address bits A16–A11 are don’t care for unlock and
command cycles, unless SA or PA required.
10. The Unlock Bypass Reset command is required to return
to reading array data when the device is in the Unlock
Bypass mode.
5. No unlock or command cycles required when device is in
read mode.
6. The Reset command is required to return to the read
mode when the device is in the autoselect mode or if DQ5
goes high.
11. The system may read and program functions in non-
erasing sectors, or enter the autoselect mode, when in the
Erase Suspend mode. The Erase Suspend command is
valid only during a sector erase operation.
7. The fourth cycle of the autoselect command sequence is
a read cycle.
12. The Erase Resume command is valid only during the
Erase Suspend mode.
October 11, 2006 22140D6
Am29LV010B
17
D A T A S H E E T
WRITE OPERATION STATUS
The device provides several bits to determine the
status of a write operation: DQ2, DQ3, DQ5, DQ6, and
DQ7. Table 5 and the following subsections describe
the functions of these bits. DQ7, and DQ6 each offer a
method for determining whether a program or erase
operation is complete or in progress. These three bits
are discussed first.
Table 5 shows the outputs for Data# Polling on DQ7.
Figure 3 shows the Data# Polling algorithm.
START
DQ7: Data# Polling
Read DQ7–DQ0
Addr = VA
The Data# Polling bit, DQ7, indicates to the host
system whether an Embedded Algorithm is in progress
or completed, or whether the device is in Erase Sus-
pend. Data# Polling is valid after the rising edge of the
final WE# pulse in the program or erase command
sequence.
Yes
DQ7 = Data?
During the Embedded Program algorithm, the device
outputs on DQ7 the complement of the datum pro-
grammed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the
Embedded Program algorithm is complete, the device
outputs the datum programmed to DQ7. The system
must provide the program address to read valid status
information on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active for
approximately 1 µs, then the device returns to reading
array data.
No
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Addr = VA
During the Embedded Erase algorithm, Data# Polling
produces a “0” on DQ7. When the Embedded Erase
algorithm is complete, or if the device enters the Erase
Suspend mode, Data# Polling produces a “1” on DQ7.
This is analogous to the complement/true datum output
described for the Embedded Program algorithm: the
erase function changes all the bits in a sector to “1”;
prior to this, the device outputs the “complement,” or
“0.” The system must provide an address within any of
the sectors selected for erasure to read valid status
information on DQ7.
Yes
DQ7 = Data?
No
PASS
FAIL
After an erase command sequence is written, if all
sectors selected for erasing are protected, Data#
Polling on DQ7 is active for approximately 100 µs, then
the device returns to reading array data. If not all
selected sectors are protected, the Embedded Erase
algorithm erases the unprotected sectors, and ignores
the selected sectors that are protected.
Notes:
1. VA = Valid address for programming. During a sector
erase operation, a valid address is an address within any
sector selected for erasure. During chip erase, a valid
address is any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because
DQ7 may change simultaneously with DQ5.
When the system detects DQ7 has changed from the
complement to true data, it can read valid data at DQ7–
DQ0 on the following read cycles. This is because DQ7
may change asynchronously with DQ0–DQ6 while
Output Enable (OE#) is asserted low. Figure 14, Data#
Polling Timings (During Embedded Algorithms), in the
“AC Characteristics” section illustrates this.
Figure 3. Data# Polling Algorithm
18
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
sure. (The system may use either OE# or CE# to
DQ6: Toggle Bit I
control the read cycles.) But DQ2 cannot distinguish
whether the sector is actively erasing or is erase-sus-
pended. DQ6, by comparison, indicates whether the
device is actively erasing, or is in Erase Suspend, but
cannot distinguish which sectors are selected for era-
sure. Thus, both status bits are required for sector and
mode information. Refer to Table 5 to compare outputs
for DQ2 and DQ6.
Toggle Bit I on DQ6 indicates whether an Embedded
Program or Erase algorithm is in progress or complete,
or whether the device has entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is
valid after the rising edge of the final WE# pulse in the
command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm
operation, successive read cycles to any address
cause DQ6 to toggle (The system may use either OE#
or CE# to control the read cycles). When the operation
is complete, DQ6 stops toggling.
Figure 4 shows the toggle bit algorithm in flowchart
form, and the section “Reading Toggle Bits DQ6/DQ2”
explains the algorithm. See also the DQ6: Toggle Bit I
subsection. Figure 15 shows the toggle bit timing dia-
gram. Figure 16 shows the differences between DQ2
and DQ6 in graphical form.
After an erase command sequence is written, if all
sectors selected for erasing are protected, DQ6 toggles
for approximately 100 µs, then returns to reading array
data. If not all selected sectors are protected, the
Embedded Erase algorithm erases the unprotected
sectors, and ignores the selected sectors that are
protected.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 4 for the following discussion. When-
ever the system initially begins reading toggle bit
status, it must read DQ7–DQ0 at least twice in a row to
determine whether a toggle bit is toggling. Typically, the
system would note and store the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the device has com-
pleted the program or erase operation. The system can
read array data on DQ7–DQ0 on the following read
cycle.
The system can use DQ6 and DQ2 together to deter-
mine whether a sector is actively erasing or is erase-
suspended. When the device is actively erasing (that is,
the Embedded Erase algorithm is in progress), DQ6
toggles. When the device enters the Erase Suspend
mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing
or erase-suspended. Alternatively, the system can use
DQ7 (see the subsection on DQ7: Data# Polling).
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the
system also should note whether the value of DQ5 is
high (see the section on DQ5). If it is, the system
should then determine again whether the toggle bit is
toggling, since the toggle bit may have stopped tog-
gling just as DQ5 went high. If the toggle bit is no longer
toggling, the device has successfully completed the
program or erase operation. If it is still toggling, the
device did not completed the operation successfully,
and the system must write the reset command to return
to reading array data.
If a program address falls within a protected sector,
DQ6 toggles for approximately 1 µs after the program
command sequence is written, then returns to reading
array data.
DQ6 also toggles during the erase-suspend-program
mode, and stops toggling once the Embedded
Program algorithm is complete.
Table 5 shows the outputs for Toggle Bit I on DQ6.
Figure 4 shows the toggle bit algorithm in flowchart
form, and the section “Reading Toggle Bits DQ6/DQ2”
explains the algorithm. Figure 15 in the “AC Character-
istics” section shows the toggle bit timing diagrams.
Figure 16 shows the differences between DQ2 and
DQ6 in graphical form. See also the subsection on
DQ2: Toggle Bit II.
The remaining scenario is that the system initially
determines that the toggle bit is toggling and DQ5 has
not gone high. The system may continue to monitor the
toggle bit and DQ5 through successive read cycles,
determining the status as described in the previous
paragraph. Alternatively, it may choose to perform
other system tasks. In this case, the system must start
at the beginning of the algorithm when it returns to
determine the status of the operation (top of Figure 4).
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indi-
cates whether a particular sector is actively erasing
(that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit
II is valid after the rising edge of the final WE# pulse in
the command sequence.
Table 5 shows the outputs for Toggle Bit I on DQ6.
Figure 4 shows the toggle bit algorithm. Figure 15 in the
“AC Characteristics” section shows the toggle bit timing
diagrams. Figure 16 shows the differences between
DQ2 and DQ6 in graphical form. See also the subsec-
tion on DQ2: Toggle Bit II.
DQ2 toggles when the system reads at addresses
within those sectors that have been selected for era-
October 11, 2006 22140D6
Am29LV010B
19
D A T A S H E E T
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has
exceeded a specified internal pulse count limit. Under
these conditions DQ5 produces a “1.” This is a failure
condition that indicates the program or erase cycle was
not successfully completed.
START
Read DQ7–DQ0
The DQ5 failure condition may appear if the system
tries to program a “1” to a location that is previously pro-
grammed to “0.” Only an erase operation can change
a “0” back to a “1.” Under this condition, the device
halts the operation, and when the operation has
exceeded the timing limits, DQ5 produces a “1.”
Read DQ7–DQ0
(Note 1)
No
Under both these conditions, the system must issue the
reset command to return the device to reading array
data.
Toggle Bit
= Toggle?
Yes
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the
system may read DQ3 to determine whether or not an
erase operation has begun. (The sector erase timer
does not apply to the chip erase command.) If addi-
tional sectors are selected for erasure, the entire time-
out also applies after each additional sector erase com-
mand. When the time-out is complete, DQ3 switches
from “0” to “1.” If the time between additional sector
erase commands from the system can be assumed to
be less than 50 µs, the system need not monitor DQ3.
See also the “Sector Erase Command Sequence”
section.
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Twice
(Notes
1, 2)
Toggle Bit
= Toggle?
No
After the sector erase command sequence is written,
the system should read the status on DQ7 (Data#
Polling) or DQ6 (Toggle Bit I) to ensure the device has
accepted the command sequence, and then read DQ3.
If DQ3 is “1”, the internally controlled erase cycle has
begun; all further commands (other than Erase Sus-
pend) are ignored until the erase operation is complete.
If DQ3 is “0”, the device will accept additional sector
erase commands. To ensure the command has been
accepted, the system software should check the status
of DQ3 prior to and following each subsequent sector
erase command. If DQ3 is high on the second status
check, the last command might not have been
accepted. Table 5 shows the outputs for DQ3.
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
Notes:
1. Read toggle bit twice to determine whether or not it is
toggling. See text.
2. Recheck toggle bit because it may stop toggling as DQ5
changes to “1”. See text.
Figure 4. Toggle Bit Algorithm
20
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
Table 5. Write Operation Status
DQ7
DQ5
DQ2
Operation
(Note 2)
DQ7#
0
DQ6
(Note 1)
DQ3
N/A
1
(Note 2)
Embedded Program Algorithm
Embedded Erase Algorithm
Toggle
Toggle
0
0
No toggle
Toggle
Standard
Mode
Reading within Erase
Suspended Sector
1
No toggle
0
N/A
Toggle
Erase
Suspend
Mode
Reading within Non-Erase
Suspended Sector
Data
Data
Data
0
Data
N/A
Data
N/A
Erase-Suspend-Program
DQ7#
Toggle
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.
See “DQ5: Exceeded Timing Limits” for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
October 11, 2006 22140D6
Am29LV010B
21
D A T A S H E E T
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C
20 ns
20 ns
Ambient Temperature
with Power Applied. . . . . . . . . . . . . . –65°C to +125°C
+0.8 V
Voltage with Respect to Ground
All pins except A9 and OE#
(Note 1) . . . . . . . . . . . . . . . . . . . –0.5 V to V +0.5 V
–0.5 V
–2.0 V
CC
V
(Note 1). . . . . . . . . . . . . . . . . . . .–0.5 V to +4.0 V
CC
20 ns
A9 and OE# (Note 2) . . . . . . . . . . . .–0.5 V to +12.5 V
Output Short Circuit Current (Note 3) . . . . . . 200 mA
Figure 5. Maximum Negative
Overshoot Waveform
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During
voltage transitions, input or I/O pins may overshoot VSS to
–2.0 V for periods of up to 20 ns. See Figure 5. Maximum
DC voltage on input or I/O pins is VCC +0.5 V. During
voltage transitions, input or I/O pins may overshoot to VCC
+2.0 V for periods up to 20 ns. See Figure 6.
20 ns
2. Minimum DC input voltage on pins A9 and OE# is –0.5 V.
During voltage transitions, A9 and OE# may overshoot
VSS to –2.0 V for periods of up to 20 ns. See Figure 5.
Maximum DC input voltage on pin A9 is +12.5 V which
may overshoot to 14.0 V for periods up to 20 ns.
VCC
+2.0 V
VCC
+0.5 V
3. No more than one output may be shorted to ground at a
time. Duration of the short circuit should not be greater
than one second.
2.0 V
20 ns
20 ns
4. Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This
is a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the op-
erational sections of this data sheet is not implied. Exposure
of the device to absolute maximum rating conditions for ex-
tended periods may affect device reliability.
Figure 6. Maximum Positive
Overshoot Waveform
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (T ) . . . . . . . . . . . 0°C to +70°C
A
Industrial (I) Devices
Ambient Temperature (T ) . . . . . . . . . –40°C to +85°C
A
Extended (E) Devices
Ambient Temperature (T ) . . . . . . . . –55°C to +125°C
A
V
V
V
Supply Voltages
CC
CC
CC
for regulated voltage range. . . . . .+3.0 V to 3.6 V
for full voltage range . . . . . . . . . . .+2.7 V to 3.6 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
22
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
Test Conditions
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Min
Typ
Max
±1.0
35
Unit
µA
VIN = VSS to VCC
,
ILI
Input Load Current
VCC = VCC max
ILIT
ILO
A9 Input Load Current
Output Leakage Current
VCC = VCC max; A9 = 12.5 V
µA
VOUT = VSS to VCC
,
±1.0
µA
VCC = VCC max
5 MHz
1 MHz
7
2
12
4
VCC Active Read Current
(Notes 1, 2)
ICC1
CE# = VIL, OE# = VIH
mA
VCC Active Write Current
(Notes 2, 3, 5)
ICC2
ICC3
ICC4
CE# = VIL, OE# = VIH
15
0.2
0.2
30
5
mA
µA
µA
VCC Standby Current (Note 2)
CE# = VCC ± 0.3 V
Automatic Sleep Mode Current VIH = VCC 0.3 V;
(Notes 2, 4)
5
VIL = VSS ± 0.3 V
VIL
VIH
Input Low Voltage
Input High Voltage
–0.5
0.8
V
V
0.7 x VCC
VCC + 0.3
Voltage for Autoselect and
Temporary Sector Unprotect
VID
VCC = 3.3 V
11.5
12.5
0.45
V
VOL
VOH1
VOH2
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
V
V
0.85 VCC
VCC – 0.4
Output High Voltage
Low VCC Lock-Out Voltage
(Note 5)
VLKO
2.3
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC currents listed are tested with VCC=VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode
current is 200 nA.
5. Not 100% tested.
October 11, 2006 22140D6
Am29LV010B
23
D A T A S H E E T
DC CHARACTERISTICS (continued)
Zero Power Flash
20
15
10
5
0
0
500
1000
1500
2000
2500
3000
3500
4000
Time in ns
Note:Addresses are switching at 1 MHz
Figure 7.
I
Current vs. Time (Showing Active and Automatic Sleep Currents)
CC1
10
8
3.6 V
2.7 V
6
4
2
0
1
2
3
4
5
Frequency in MHz
Note:T = 25 °C
Figure 8.
I
vs. Frequency
CC1
24
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
TEST CONDITIONS
Table 6. Test Specifications
-70,
3.3 V
Test Condition
-55
-90
Unit
2.7 kΩ
Output Load
1 TTL gate
Device
Under
Test
Output Load Capacitance, CL
(including jig capacitance)
30
100
pF
C
L
6.2 kΩ
Input Rise and Fall Times
Input Pulse Levels
5
0.0–3.0
ns
V
Input timing measurement
reference levels
1.5
1.5
V
V
Note:Diodes are IN3064 or equivalent
Output timing measurement
reference levels
Figure 9. Test Setup
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
1.5 V
1.5 V
Input
Measurement Level
Output
Figure 10. Input Waveforms and Measurement Levels
October 11, 2006 22140D6
Am29LV010B
25
D A T A S H E E T
AC CHARACTERISTICS
Read Operations
Parameter
Speed Options
JEDEC
Std
Description
Test Setup
-55
-70
-90
Unit
tAVAV
tRC
Read Cycle Time (Note 1)
Min
55
55
70
90
90
ns
CE# = VIL
OE# = VIL
tAVQV
tACC Address to Output Delay
Max
70
ns
tELQV
tGLQV
tEHQZ
tGHQZ
tCE
tOE
tDF
tDF
Chip Enable to Output Delay
Output Enable to Output Delay
OE# = VIL
Max
Max
Max
Max
Min
55
30
15
15
70
30
25
25
0
90
35
30
30
ns
ns
ns
ns
ns
Chip Enable to Output High Z (Note 1)
Output Enable to Output High Z (Note 1)
Read
Output Enable
Hold Time (Note 1)
tOEH
Toggle and
Data# Polling
Min
Min
10
0
ns
ns
Output Hold Time From Addresses, CE# or OE#,
Whichever Occurs First (Note 1)
tAXQX
tOH
Notes:
1. Not 100% tested.
2. See Figure 9 and Table 6 for test specifications.
tRC
Addresses Stable
tACC
Addresses
CE#
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
Figure 11. Read Operations Timings
26
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
AC CHARACTERISTICS
Erase/Program Operations
Parameter
Speed Options
JEDEC
tAVAV
Std
tWC
tAS
Description
-55
-70
70
0
-90
Unit
ns
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Data Hold Time
Min
Min
Min
Min
Min
Min
55
90
tAVWL
tWLAX
tDVWH
tWHDX
ns
tAH
45
20
45
35
0
45
45
ns
tDS
ns
tDH
tOES
ns
Output Enable Setup Time (Note 1)
0
ns
Read Recovery Time Before Write
(OE# High to WE# Low)
tGHWL
tGHWL
Min
0
ns
tELWL
tWHEH
tWLWH
tWHWL
tWHWH1
tWHWH2
tCS
tCH
CE# Setup Time
Min
Min
Min
Min
Typ
Typ
Min
0
0
ns
ns
CE# Hold Time
tWP
Write Pulse Width
Write Pulse Width High
30
30
35
30
9
35
30
ns
tWPH
ns
tWHWH1 Programming Operation (Note 2)
tWHWH2 Sector Erase Operation (Note 2)
µs
0.7
50
sec
µs
tVCS
VCC Setup Time (Note 1)
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” Section for more information.
October 11, 2006 22140D6
Am29LV010B
27
D A T A S H E E T
AC CHARACTERISTICS
Program Command Sequence (last two cycles)
Read Status Data (last two cycles)
tAS
PA
tWC
Addresses
555h
PA
PA
tAH
CE#
OE#
tCH
tWHWH1
tWP
WE#
tWPH
tCS
tDS
tDH
PD
DOUT
A0h
Status
Data
VCC
tVCS
Note:
PA = program address, PD = program data, DOUT is the true data at the program address.
Figure 12. Program Operation Timings
28
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
AC CHARACTERISTICS
Erase Command Sequence (last two cycles)
Read Status Data
VA
tAS
SA
tWC
VA
Addresses
CE#
2AAh
555h for chip erase
tAH
tCH
OE#
tWP
WE#
tWPH
tWHWH2
tCS
tDS
tDH
In
Data
VCC
Complete
55h
30h
Progress
10 for Chip Erase
tVCS
Note:
SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”).
Figure 13. Chip/Sector Erase Operation Timings
October 11, 2006 22140D6
Am29LV010B
29
D A T A S H E E T
AC CHARACTERISTICS
tRC
VA
Addresses
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
WE#
tOEH
tDF
tOH
High Z
High Z
DQ7
Valid Data
Complement
Complement
True
DQ0–DQ6
Valid Data
Status Data
True
Status Data
Note:
VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle.
Figure 14. Data# Polling Timings (During Embedded Algorithms)
tRC
Addresses
CE#
VA
tACC
tCE
VA
VA
VA
tCH
tOE
OE#
WE#
tOEH
tDF
tOH
High Z
DQ6/DQ2
Valid Status
(first read)
Valid Status
Valid Status
Valid Data
(second read)
(stops toggling)
Note:
VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle,
and array data read cycle.
Figure 15. Toggle Bit Timings (During Embedded Algorithms)
30
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
AC CHARACTERISTICS
Enter
Embedded
Erasing
Erase
Suspend
Enter Erase
Suspend Program
Erase
Resume
Erase
Erase Suspend
Read
Erase
Suspend
Program
Erase
Complete
WE#
Erase
Erase Suspend
Read
DQ6
DQ2
Note:
The system can use OE# or CE# to toggle DQ2/DQ6. DQ2 toggles only when read at an address within an erase-suspended
sector.
Figure 16. DQ2 vs. DQ6
AC CHARACTERISTICS
Alternate CE# Controlled Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
tWC
tAS
Description
-55
-70
70
0
-90
Unit
ns
tAVAV
tAVEL
tELAX
tDVEH
tEHDX
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Min
Min
Min
Min
Min
Min
55
90
ns
tAH
45
20
45
35
0
45
45
ns
tDS
ns
tDH
tOES
Data Hold Time
ns
Output Enable Setup Time (Note 1)
0
ns
Read Recovery Time Before Write
(OE# High to WE# Low)
tGHEL
tGHEL
Min
0
ns
tWLEL
tEHWH
tELEH
tWS
tWH
WE# Setup Time
Min
Min
Min
Min
Typ
Typ
0
0
ns
ns
WE# Hold Time
tCP
CE# Pulse Width
30
35
30
9
35
ns
tEHEL
tCPH
CE# Pulse Width High
Programming Operation (Note 2)
Sector Erase Operation (Note 2)
ns
tWHWH1
tWHWH2
Notes:
tWHWH1
tWHWH2
µs
0.7
sec
1. Not 100% tested.
2. See the “Erase and Programming Performance” Section for more information.
October 11, 2006 22140D6
Am29LV010B
31
D A T A S H E E T
AC CHARACTERISTICS
555 for program
PA for program
2AA for erase
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tWH
tAS
tAH
WE#
OE#
tGHEL
tWHWH1 or 2
tCP
CE#
Data
tWS
tCPH
tDS
tDH
DQ7#
DOUT
A0 for program
55 for erase
PD for program
30 for sector erase
10 for chip erase
Notes:
1. PA is the address of the memory location to be programmed.
2. PD is the data to be programmed at address PA.
3. DQ7 is the complement of the data written to the device.
4. DOUT is the data written to the device.
5. Figure indicates the last two bus cycles of the command sequence.
Figure 17. Alternate CE# Controlled Write Operation Timings
ERASE AND PROGRAMMING PERFORMANCE
Parameter
Typ (Note 1)
Max (Note 3)
Unit
s
Comments
Sector Erase Time
0.7
6
15
Excludes 00h programming
prior to erasure (Note 4)
Chip Erase Time (Note 2)
Byte Programming Time
Chip Programming Time (Note 2)
s
9
300
3.3
µs
s
Excludes system level
overhead (Note 5)
1.1
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See
Table 4 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles.
32
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
LATCHUP CHARACTERISTICS
Description
Min
Max
Input voltage with respect to VSS on all pins except I/O pins
(including A9 and OE#)
–1.0 V
13.0 V
Input voltage with respect to VSS on all I/O pins
VCC Current
–1.0 V
VCC + 1.0 V
+100 mA
–100 mA
Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time.
TSOP PIN PACKAGE CAPACITANCE
Parameter
Symbol
Parameter Description
Input Capacitance
Test Setup
Typ
6
Max
7.5
12
Unit
pF
CIN
VIN = 0
VOUT = 0
VIN = 0
COUT
CIN2
Output Capacitance
Control Pin Capacitance
8.5
7.5
pF
9
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
PLCC PIN CAPACITANCE
Parameter Symbol
Parameter Description
Test Setup
VIN = 0
Typ
Max
6
Unit
pF
CIN
COUT
CIN2
Input Capacitance
4
8
8
Output Capacitance
Control Pin Capacitance
VOUT = 0
VPP = 0
12
12
pF
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
DATA RETENTION
Parameter
Test Conditions
150°C
Min
Unit
10
20
Years
Years
Minimum Pattern Data Retention Time
125°C
October 11, 2006 22140D6
Am29LV010B
33
D A T A S H E E T
PHYSICAL DIMENSIONS
PL 032—32-Pin Plastic Leaded Chip Carrier
Dwg rev AH; 10/99
34
Am29LV010B
22140D6 October 11, 2006
D A T A S H E E T
PHYSICAL DIMENSIONS*
TS 032—32-Pin Standard Thin Small Outline Package
Dwg rev AA; 10/99
* For reference only. BSC is an ANSI standard for Basic Space Centering
October 11, 2006 22140D6
Am29LV010B
35
D A T A S H E E T
amd corresponding reference in Automatic Sleep Mode
REVISION SUMMARY
Revision A (April 1998)
section.
Requirements for Reading Array Data
Split the Am29LV001B/Am29LV010B data sheet into
separate documents. The Am29LV001B data sheet
retains publication number 21557B and later; the
Am29LV010B data sheet has been reassigned publica-
tion number 22140.
Deleted reference to hardware reset. This device does
not have the RESET# pin.
Revision D (December 2, 1999)
AC Characteristics—Figure 12. Program
Operations Timing and Figure 13. Chip/Sector
Erase Operations
Valid Combinations
Changes since publication number 21557A was
released: deleted the “R” designation from the 55 ns
option. Corrected the part numbers.
Deleted t
high.
and changed OE# waveform to start at
GHWL
Revision B (September 1998)
Physical Dimensions
Expanded data sheet from Advanced Information to
Preliminary version.
Replaced figures with more detailed illustrations.
Revision D+1 (November 13, 2000)
Added table of contents. Deleted burn-in option from
Ordering Information section.
Distinctive Characteristics
Changed “Manufactured on 0.35 µm process technology”
to “Manufactured on 0.32 µm process technology”.
Revision D+2 (June 11, 2004)
Ordering Information
Revision C (January 1999)
Data Retention
Added Pb-free OPNs.
Added new table.
Revision D+3 (June 16, 2005)
Removed -45 ns Speed Option
Revision C+1 (March 22, 1999)
Product Selector Guide
Added Colophon and update Trademark
The parameter t should be 25 ns for the -45R device
CE
and 30 ns for the -70 device.
Revision D+4 (August 19, 2005)
Revision Summary
Added Pb-free for PDIP or PLCC package
Deleted draft revision items.
Revision D+5 (January 4, 2006)
Revision C+2 (October 5, 1999)
Removed 32-pin Reverse Pinout TSOP option.
DC Characteristics
Revision D6 (October 11, 2006)
Global
CMOS Compatible table: Deleted I
rent. This device does not have the RESET# pin.
, V Reset Cur-
CC4 CC
Added notice on product availability to cover page and
first page of data sheet.
Changed I
, Automatic Sleep Mode Current, to I
,
CC5
CC4
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limita-
tion, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as con-
templated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility,
aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for
any use where chance of failure is intolerable ( i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to
you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor de-
vices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design mea-
sures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating
conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign
Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior au-
thorization by the respective government entity will be required for export of those products.
Trademarks
Copyright © 1998-2005 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trade-
marks of Advanced Micro Devices, Inc. ExpressFlash is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are
for identification purposes only and may be trademarks of their respective companies.
Copyright © 2006 Spansion Inc. All Rights Reserved. Spansion, the Spansion logo, MirrorBit, ORNAND, HD-SIM, and combinations thereof are
trademarks of Spansion Inc. Other names are for informational purposes only and may be trademarks of their respective owners.
36
Am29LV010B
22140D6 October 11, 2006
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