AS7C3256-10TC [ALSC]

Standard SRAM, 32KX8, 10ns, CMOS, PDSO28, 8 X 13.40 MM, TSOP1-28;
AS7C3256-10TC
型号: AS7C3256-10TC
厂家: ALLIANCE SEMICONDUCTOR CORPORATION    ALLIANCE SEMICONDUCTOR CORPORATION
描述:

Standard SRAM, 32KX8, 10ns, CMOS, PDSO28, 8 X 13.40 MM, TSOP1-28

静态存储器 光电二极管 内存集成电路
文件: 总9页 (文件大小:125K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2001  
Advance Information  
AS7C256  
AS7C3256  
®
5V/3.3V 32K X 8 CMOS SRAM (Common I/O)  
Features  
• AS7C256 (5V version)  
• AS7C3256 (3.3V version)  
- 7.2 mW (AS7C3256) / max CMOS I/O  
• 2.0V data retention  
• Easy memory expansion with CE and OE inputs  
• TTL-compatible, three-state I/O  
• 28-pin JEDEC standard packages  
- 300 mil PDIP  
- 300 mil SOJ  
- 8 × 13.4 TSOP  
• Industrial and commercial temperature  
• Organization: 262,144 words × 16 bits  
• High speed  
- 12/15/20 ns address access time  
- 5/6/7/9 ns output enable access time  
• Very low power consumption: ACTIVE  
- 660mW (AS7C256) / max @ 12 ns  
- 216mW (AS7C3256) / max @ 12 ns  
• Very low power consumption: STANDBY  
- 22 mW (AS7C256) / max CMOS I/O  
• ESD protection 2000 volts  
• Latch-up current 200 mA  
Logic block diagram  
Pin arrangement  
28-pin TSOP I (8×13.4)  
V
28-pin DIP, SOJ (300 mil)  
CC  
GND  
Input buffer  
A14  
A12  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
1
2
3
4
5
6
7
8
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
V
CC  
WE  
A13  
A8  
A9  
A11  
OE  
A10  
CE  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
OE  
A11  
A9  
1
A10  
CE  
(22)  
(23)  
(24)  
(25)  
(26)  
(27)  
(28)  
(1)  
(21) 28  
(20) 27  
(19) 26  
(18) 25  
(17) 24  
(16) 23  
(15) 22  
(14) 21  
(13) 20  
(12) 19  
(11) 18  
(10) 17  
(9) 16  
(8) 15  
2
3
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
GND  
I/O2  
I/O1  
I/O0  
A0  
A0  
A1  
A8  
4
I/O7  
I/O0  
A13  
WE  
5
6
A2  
A3  
256 X 128 X 8  
Array  
V
7
CC  
AS7C256  
AS7C3256  
8
A14  
A12  
A7  
9
(2)  
A4  
10  
11  
12  
13  
14  
(3)  
9
(4)  
(262,144)  
A6  
A5  
(5)  
A5  
A0  
10  
11  
12  
13  
14  
A6  
(6)  
A4  
A1  
A2  
I/O0  
I/O1  
I/O2  
GND  
(7)  
A3  
A14  
17  
16  
15  
Note: This part is compatible with both pin numbering  
conventions used by various manufacturers.  
WE  
OE  
CE  
Column decoder  
Control  
circuit  
A
7
A
8
A
9
A
A
A
A
10 11 12 13  
Selection guide  
AS7C256-10  
AS7C256-12  
AS7C256-15  
AS7C256-20  
AS7C3256-10  
AS7C3256-12  
AS7C3256-15  
AS7C3256-20  
Unit  
Maximum address access time  
10  
12  
5
15  
6
20  
7
ns  
Maximum output enable access time  
ns  
AS7C256  
AS7C3256  
120  
60  
4
115  
55  
4
110  
50  
4
mA  
mA  
mA  
mA  
Maximum operating current  
AS7C256  
Maximum CMOS standby  
current  
AS7C3256  
2
2
2
1/10/2001  
Alliance Semiconductor  
P. 1 of 9  
Copyright © Alliance Semiconductor. All rights reserved.  
AS7C256  
AS7C3256  
®
Functional description  
The AS7C(3)256 is a 5V/3.3V high-performance CMOS 262,144-bit Static Random-Access Memory (SRAM) device organized  
as 262,144 words × 16 bits. It is designed for memory applications requiring fast data access at low voltage, including  
PentiumTM, PowerPCTM, and portable computing. Alliance’s advanced circuit design and process techniques permit 3.3V  
operation without sacrificing performance or operating margins.  
The device enters standby mode when CE is high. CMOS standby mode consumes 3.6 mW. Normal operation offers 75% power  
reduction after initial access, resulting in significant power savings during CPU idle, suspend, and stretch mode. Both versions  
of the AS7C256 offer 2.0V data retention.  
Equal address access and cycle times (tAA, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 5/6/7/9 ns are  
ideal for high-performance applications. The chip enable (CE) input permits easy memory expansion with multiple-bank  
memory organizations.  
A write cycle is accomplished by asserting chip enable (CE) and write enable (WE) LOW. Data on the input pins I/O0-I/O7 is  
written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive  
I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE).  
A read cycle is accomplished by asserting chip enable (CE) and output enable (OE) LOW, with write enable (WE) high. The  
chip drives I/O pins with the data word referenced by the input address. When chip enable or output enable is high, or write  
enable is low, output drivers stay in high-impedance mode.  
All chip inputs and outputs are TTL-compatible and 5V tolerant. Operation is from a single 3.3 0.3V supply. The  
AS7C(3)256A is packaged in high volume industry standard packages.  
Absolute maximum ratings  
Parameter  
Device  
Symbol  
Vt1  
Min  
–0.5  
–0.5  
–0.5  
Max  
Unit  
V
AS7C256  
AS7C3256  
+7.0  
+5.0  
VCC + 0.5  
1.0  
Voltage on VCC relative to GND  
Vt1  
V
Voltage on any pin relative to GND  
Power dissipation  
Vt2  
V
PD  
W
oC  
oC  
mA  
Storage temperature (plastic)  
Ambient temperature with VCC applied  
DC current into outputs (low)  
Tstg  
–65  
–55  
+150  
+125  
20  
Tbias  
IOUT  
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation  
of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute max-  
imum rating conditions for extended periods may affect reliability.  
Truth table  
CE  
H
L
WE  
X
OE  
X
Data  
Mode  
High Z  
High Z  
DOUT  
DIN  
Standby (ISB, ISB1)  
H
H
L
H
L
Output disable (ICC)  
Read (ICC  
Write (ICC)  
L
)
L
X
Key: X = Don’t care, L = Low, H = High  
1/10/2001  
Alliance Semiconductor  
P. 2 of 9  
AS7C256  
AS7C3256  
®
Recommended operating conditions  
Parameter  
Device  
Symbol  
Min  
4.5  
3.0  
2.2  
2.0  
-0.5*  
0
Typical  
Max  
5.5  
Unit  
V
AS7C256 VCC  
5.0  
3.3  
Supply voltage  
AS7C3256 VCC  
AS7C256 VIH  
3.6  
V
VCC+0.5  
VCC+0.5  
0.8  
V
Input voltage  
AS7C3256 VIH  
V
*
VIL  
V
commercial TA  
industrial TA  
70  
oC  
oC  
Ambient operating temperature  
–40  
85  
*
V
min = –2.0V for pulse width less than t /2.  
RC  
IL  
DC operating characteristics (over the operating range)1  
-10  
-12  
-15  
-20  
Parameter  
Sym Test conditions  
Device  
Min Max Min Max Min Max Min Max Unit  
Input leakage  
current  
V
CC = Max,  
|ILI|  
|ILO  
1
1
1
1
1
1
µA  
µA  
Vin = GND to VCC  
Output leakage  
current  
VCC = Max,  
|
VOUT = GND to VCC  
Operating  
power supply ICC  
current  
AS7C256  
120  
60  
115  
55  
110  
50  
VCC = Max, CE VIL  
f = fMax, IOUT = 0mA  
mA  
mA  
mA  
AS7C3256  
AS7C256  
AS7C3256  
AS7C256  
40  
20  
35  
20  
30  
20  
VCC = Max, CE VIL  
f = fMax, IOUT = 0mA  
ISB  
Standby power  
supply current  
4.0  
4.0  
4.0  
VCC = Max, CE > VCC–0.2V  
ISB1  
V
V
IN < GND + 0.2V or  
IN > VCC–0.2V, f = 0  
AS7C3256  
2.0  
2.0  
2.0  
VOL IOL = 8 mA, VCC = Min  
VOH IOH = –4 mA, VCC = Min  
0.4  
0.4  
0.4  
V
V
Output voltage  
2.4  
2.4  
2.4  
Capacitance (f = 1MHz, T = room temperature, V = NOMINAL)2  
a
CC  
Parameter  
Symbol  
Signals  
Test conditions  
Max  
Unit  
Input capacitance  
I/O capacitance  
CIN  
Vin = 0V  
5
7
pF  
pF  
A, CE  
I/O  
, WE, OE  
CI/O  
Vin = Vout = 0V  
1/10/2001  
Alliance Semiconductor  
P. 3 of 9  
AS7C256  
AS7C3256  
®
Read cycle (over the operating range)3,9  
-10  
-12  
-15  
-20  
Parameter  
Symbol Min Max Min Max Min Max Min Max  
Unit Notes  
ns  
Read cycle time  
tRC  
12  
12  
12  
5
15  
15  
15  
6
20  
20  
20  
7
Address access time  
tAA  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3
3
tACE  
tOE  
Chip enable (CE) access time  
Output enable (OE) access time  
Output hold from address change  
CE LOW to output in low Z  
CE HIGH to output in high Z  
OE LOW to output in low Z  
OE HIGH to output in high Z  
Power up time  
tOH  
tCLZ  
tCHZ  
tOLZ  
tOHZ  
tPU  
3
3
3
3
3
3
5
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
3
4
5
0
0
0
3
4
5
0
0
0
Power down time  
tPD  
12  
15  
20  
Key to switching waveforms  
Rising input  
Falling input  
Undefined output/don’t care  
Read waveform 1 (address controlled)3,6,7,9  
t
RC  
Address  
tAA  
t
OH  
D
Data valid  
out  
Read waveform 2 (CE controlled)3,6,8,9  
1
t
RC  
C E  
O E  
t
OE  
t
t
t
OLZ  
OHZ  
CHZ  
t
ACE  
D
out  
Data valid  
t
CLZ  
t
PD  
I
I
CC  
SB  
t
PU  
Supply  
current  
50%  
50%  
1/10/2001  
Alliance Semiconductor  
P. 4 of 9  
AS7C256  
AS7C3256  
®
Write cycle (over the operating range)11  
-10  
-12  
-15  
-20  
Parameter  
Symbol  
tWC  
tCW  
tAW  
tAS  
Min Max Min Max Min Max  
Unit  
Notes  
Write cycle time  
12  
8
8
0
8
0
6
0
5
15  
10  
10  
0
5
20  
12  
12  
0
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Chip enable to write end  
Address setup to write end  
Address setup time  
Write pulse width  
tWP  
tAH  
tDW  
tDH  
tWZ  
tOW  
9
12  
0
Address hold from end of write  
Data valid to write end  
Data hold time  
0
8
10  
0
0
4, 5  
4, 5  
4, 5  
Write enable to output in high Z  
Output active from write end  
Shaded areas contain advance information.  
3
3
3
Write waveform 1 (WE controlled)10,11  
t
WC  
t
t
t
AW  
AH  
Address  
t
WP  
W E  
t
AS  
t
DW  
DH  
D
Data valid  
in  
t
t
WZ  
OW  
D
out  
Write waveform 2 (CE controlled)10,11  
t
WC  
t
t
AH  
AW  
Address  
t
t
CW  
AS  
C E  
t
WP  
W E  
t
t
t
WZ  
DW  
DH  
D
Data valid  
in  
D
out  
1/10/2001  
Alliance Semiconductor  
P. 5 of 9  
AS7C256  
AS7C3256  
®
Data retention characteristics (over the operating range)13  
Parameter  
Symbol  
Test conditions  
Min  
2.0  
Max  
Unit  
V
VCC for data retention  
VDR  
VCC = 2.0V  
500  
µA  
µA  
ns  
Data retention current  
ICCDR  
CE VCC–0.2V  
VIN VCC–0.2V  
or  
VIN 0.2V  
Chip enable to data retention time tCDR  
0
Operation recovery time  
Input leakage current  
tR  
tRC  
ns  
| ILI |  
1
µA  
Data retention waveform  
Data retention mode  
V
VCC  
VCC  
V
DR 2.0V  
CC  
tCDR  
t
R
V
DR  
V
V
C E  
IH  
IH  
AC test conditions  
- Output load: see Figure B or Figure C.  
Thevenin equivalent  
168  
- Input pulse level: GND to 3.0V. See Figure A.  
- Input rise and fall times: 2 ns. See Figure A.  
- Input and output timing reference levels: 1.5V.  
D
+1.72V (5V and 3.3V)  
out  
+3.3V  
+5V  
320  
480  
D
D
out  
out  
+3.0V  
90%  
10%  
90%  
10%  
350  
C(14)  
GND  
255  
C(14)  
GND  
2 ns  
Figure A: Input pulse  
GND  
Figure C: Output load  
Figure B: Output load  
Notes  
1
2
3
4
5
6
7
8
9
During V power-up, a pull-up resistor to V on CE is required to meet I specification.  
CC CC SB  
This parameter is sampled, but not 100% tested.  
For test conditions, see AC Test Conditions, Figures A, B, C.  
These parameters are specified with CL = 5pF, as in Figures B or C. Transition is measured ±500mV from steady-state voltage.  
This parameter is guaranteed, but not tested.  
WE is High for read cycle.  
CE and OE are Low for read cycle.  
Address valid prior to or coincident with CE transition Low.  
All read cycle timings are referenced from the last valid address to the first transitioning address.  
10 CE or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle.  
11 All write cycle timings are referenced from the last valid address to the first transitioning address.  
12 CE1 and CE2 have identical timing.  
13 2V data retention applies to the commercial operating range only.  
14 C=30pF, except on High Z and Low Z parameters, where C=5pF.  
1/10/2001  
Alliance Semiconductor  
P. 6 of 9  
AS7C256  
AS7C3256  
®
Typical DC and AC characteristics  
Normalized supply current ICC, ISB  
vs. supply voltage VCC  
1.4  
Normalized supply current ICC, ISB  
Normalized supply current ISB1  
vs. ambient temperature T  
vs. ambient temperature Ta  
a
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
1.2  
625  
25  
ICC  
VCC = VCC(NOMINAL)  
ICC  
1.0  
0.8  
0.6  
5
1
ISB  
ISB  
0.4  
0.2  
0.04  
0.2  
0.0  
MIN  
NOMINAL  
–55  
–10  
35  
80  
-55  
-10  
35  
80  
MAX  
125  
125  
Supply voltage (V)  
Ambient temperature (°C)  
Ambient temperature (°C)  
Normalized access time tAA  
vs. supply voltage VCC  
Normalized access time tAA  
vs. ambient temperature Ta  
Normalized supply current ICC  
vs. cycle frequency 1/tRC, 1/tWC  
1.5  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
Ta = 25°C  
VCC = VCC(NOMINAL)  
VCC = VCC(NOMINAL)  
Ta = 25°C  
MIN  
NOMINAL  
–55  
–10  
35  
80  
0
25  
50  
75  
MAX  
125  
100  
Supply voltage (V)  
Ambient temperature (°C)  
Cycle frequency (MHz)  
Output source current IOH  
vs. output voltage VOH  
Output sink current IOL  
vs. output voltage VOL  
Typical access time change tAA  
vs. output capacitive loading  
140  
120  
100  
80  
140  
120  
100  
80  
35  
30  
25  
20  
15  
10  
5
VCC = VCC(NOMINAL)PL  
Ta = 25°C  
VCC = VCC(NOMINAL)  
VCC = VCC(NOMINAL)  
T = 25°C  
a
60  
60  
40  
40  
20  
20  
0
0
0
0
0
0
250  
500  
750  
VCC  
VCC  
1000  
Output voltage (V)  
Output voltage (V)  
Capacitance (pF)  
1/10/2001  
Alliance Semiconductor  
P. 7 of 9  
AS7C256  
AS7C3256  
®
Package diagrams  
28-pin PDIP  
Min  
Max  
0.175  
-
A
A1  
B
-
A
D
0.010  
0.058  
0.016  
0.008  
-
B
S
0.064  
0.022  
0.014  
1.400  
0.320  
0.298  
b
c
E
E1  
α
c
L
D
E
0.295  
0.278  
A1  
eA  
e
b
E1  
e
Seating  
Plane  
0.100 BSC  
Pin 1  
eA  
L
0.330  
0.120  
0°  
0.370  
0.140  
15°  
α
S
-
0.055  
D
e
B
b
28-pin SOJ  
Min  
-
Max  
0.140  
-
A
A
A1  
A2  
B
A1  
E1 E2  
0.025  
0.095  
Seating  
Plane  
0.105  
Pin 1  
0.028 TYP  
c
0.018 TYP  
0.010 TYP  
b
c
A2  
E
-
0.730  
0.285  
0.305  
0.347  
D
E
E1  
E2  
e
0.245  
0.295  
0.327  
b
e
0.050 BSC  
c
A2  
A
A1  
L
28-pin  
8×13.4  
Min  
Max  
1.20  
pin 1(22)  
pin 1(7)  
pin 8(21)  
pin 5(8)  
D
Hd  
A
0.10  
0.95  
0.15  
0.20  
1.05  
0.25  
A1  
A2  
b
c
D
e
α
0.10  
0.20  
11.60  
11.80  
28-pin  
0.55 nominal  
Note: This part is compatible with both pin numbering  
conventions used by various manufacturers.  
E
1/10/2001  
Alliance Semiconductor  
P. 8 of 9  
AS7C256  
AS7C3256  
®
Ordering information  
Package / Access time  
Volt/Temp  
10 ns  
12 ns  
15 ns  
20 ns  
5V commercial  
3.3V commercial  
5V commercial  
3.3V commercial  
5V industrial  
AS7C256-10PC  
AS7C3256-10PC  
AS7C256-10JC  
AS7C3256-10JC  
AS7C256-10JI  
AS7C3256-10JI  
AS7C256-10TC  
AS7C3256-10TC  
AS7C256-10TI  
AS7C3256-10TI  
AS7C256-12PC  
AS7C3256-12PC  
AS7C256-12JC  
AS7C3256-12JC  
AS7C256-12JI  
AS7C256-15PC  
AS7C3256-15PC  
AS7C256-15JC  
AS7C3256-15JC  
AS7C256-15JI  
AS7C3256-15JI  
AS7C256-15TC  
AS7C3256-15TC  
AS7C256-15TI  
AS7C3256-15TI  
AS7C256-20PC  
Plastic DIP, 300 mil  
AS7C3256-20PC  
AS7C256-20JC  
AS7C3256-20JC  
AS7C256-20JI  
AS7C3256-20JI  
AS7C256-20TC  
AS7C3256-20TC  
AS7C256-20TI  
AS7C3256-20TI  
Plastic SOJ, 300 mil  
3.3V industrial  
5V commercial  
3.3V commercial  
5V industrial  
AS7C3256-12JI  
AS7C256-12TC  
AS7C3256-12TC  
AS7C256-12TI  
AS7C3256-12TI  
TSOP 8x13.4  
3.3V industrial  
Part numbering system  
AS7C  
3
256  
–XX  
X
C or I  
Commercial temperature range:  
0 oC to 70 0C  
Package: J = SOJ 300 mil  
SRAM prefix  
3 = 3.3V supply Device number Access time  
T
= TSOP 8x13.4  
Industrial temperature range:  
-40C to 85C  
1/10/2001  
Alliance Semiconductor  
P. 9 of 9  
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