ADG511BRZ-REEL [ADI]

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ADG511BRZ-REEL
型号: ADG511BRZ-REEL
厂家: ADI    ADI
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LC2MOS  
a
Precision 5 V/3 V Quad SPST Switches  
ADG511/ADG512/ADG513  
FUNCTIONAL BLOCK DIAGRAMS  
FEATURES  
+3 V, +5 V or ؎5 V Power Supplies  
Ultralow Power Dissipation (<0.5 W)  
Low Leakage (<100 pA)  
Low On Resistance (<50 )  
Fast Switching Times  
Low Charge Injection  
TTL/CMOS Compatible  
16-Lead DIP or SOIC Package  
S1  
S1  
S1  
IN1  
IN2  
IN3  
IN4  
IN1  
IN2  
IN3  
IN4  
IN1  
IN2  
IN3  
IN4  
D1  
S2  
D1  
S2  
D1  
S2  
D2  
S3  
D2  
S3  
D2  
S3  
ADG511  
ADG512  
ADG513  
D3  
S4  
D3  
S4  
D3  
S4  
APPLICATIONS  
Battery Powered Instruments  
Single Supply Systems  
D4  
D4  
D4  
SWITCHES SHOWN FOR A LOGIC "1" INPUT  
Remote Powered Equipment  
+5 V Supply Systems  
Computer Peripherals such as Disk Drives  
Precision Instrumentation  
Audio and Video Switching  
Automatic Test Equipment  
Precision Data Acquisition  
Sample Hold Systems  
Communication Systems  
Compatible with ؎5 V Supply DACs and ADCs such as  
AD7840/8, AD7870/1/2/4/5/6/8  
The ADG511, ADG512 and ADG513 contain four indepen-  
dent SPST switches. The ADG511 and ADG512 differ only in  
that the digital control logic is inverted. The ADG511 switch is  
turned on with a logic low on the appropriate control input,  
while a logic high is required for the ADG512. The ADG513  
contains two switches whose digital control logic is similar to  
that of the ADG511 while the logic is inverted in the remaining  
two switches.  
PRODUCT HIGHLIGHTS  
1. +5 Volt Single Supply Operation  
GENERAL DESCRIPTION  
The ADG511/ADG512/ADG513 offers high performance,  
including low on resistance and wide signal range, fully  
specified and guaranteed with +3 V, ±5 V as well as +5 V  
supply rails.  
The ADG511, ADG512 and ADG513 are monolithic CMOS  
ICs containing four independently selectable analog switches.  
These switches feature low, well-controlled on resistance and  
wide analog signal range, making them ideal for precision  
analog signal switching.  
2. Ultralow Power Dissipation  
CMOS construction ensures ultralow power dissipation.  
These switch arrays are fabricated using Analog Devices’  
advanced linear compatible CMOS (LC2MOS) process which  
offers the additional benefits of low leakage currents, ultralow  
power dissipation and low capacitance for fast switching speeds  
with minimum charge injection. These features make the  
ADG511, ADG512 and ADG513 the optimum choice for a  
wide variety of signal switching tasks in precision analog signal  
processing and data acquisition systems.  
3. Low RON  
4. Break-Before-Make Switching  
Switches are guaranteed to have break-before-make opera-  
tion. This allows multiple outputs to be tied together for  
multiplexer applications without the possibility of momentary  
shorting between channels.  
The ability to operate from single +3 V, +5 V or ±5 V bipolar  
supplies make the ADG511, ADG512 and ADG513 perfect for  
use in battery-operated instruments, 4–20 mA loop systems and  
with the new generation of DACs and ADCs from Analog  
Devices. The use of 5 V supplies and reduced operating currents  
give much lower power dissipation than devices operating from  
±15 V supplies.  
REV. B  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, nor for any infringements of patents or other rights of third parties  
which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
World Wide Web Site: http://www.analog.com  
© Analog Devices, Inc., 1999  
ADG511/ADG512/ADG513–SPECIFICATIONS1  
Dual Supply(VDD = +5 V ؎ 10%, VSS = –5 V ؎ 10%, GND = 0 V, unless otherwise noted)  
B Versions  
–40؇C to  
T Versions  
–55؇C to  
Parameter  
+25؇C  
+85؇C  
+25؇C  
+125؇C  
Units  
Test Conditions/Comments  
ANALOG SWITCH  
Analog Signal Range  
RON  
VDD to VSS  
50  
VDD to VSS  
50  
V
30  
30  
typ  
max  
VD = ±3.5 V, IS = –10 mA;  
VDD = +4.5 V, VSS = –4.5 V  
LEAKAGE CURRENTS  
VDD = +5.5 V, VSS = –5.5 V  
Source OFF Leakage IS (OFF)  
±0.025  
±0.1  
±0.025  
±0.1  
±0.05  
±0.2  
±0.025  
±0.1  
±0.025  
±0.1  
±0.05  
±0.2  
nA typ  
nA max  
nA typ  
nA max  
nA typ  
nA max  
VD = ±4.5 V, VS = ϯ4.5 V;  
Test Circuit 2  
VD = ±4.5 V, VS = ϯ4.5 V;  
Test Circuit 2  
VD = VS = ±4.5 V;  
Test Circuit 3  
±2.5  
±2.5  
±5  
±2.5  
±2.5  
±5  
Drain OFF Leakage ID (OFF)  
Channel ON Leakage ID, IS (ON)  
DIGITAL INPUTS  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
2.4  
0.8  
V min  
V max  
IINL or IINH  
0.005  
0.005  
µA typ  
VIN = VINL or VINH  
±0.1  
±0.1  
µA max  
DYNAMIC CHARACTERISTICS2  
tON  
200  
120  
100  
11  
200  
120  
100  
11  
ns typ  
ns max  
ns typ  
ns max  
ns typ  
RL = 300 . CL = 35 pF;  
VS = ±3 V; Test Circuit 4  
RL = 300 . CL = 35 pF;  
VS = ±3 V; Test Circuit 4  
RL = 300 , CL = 35 pF;  
VS1 = VS2 = +3 V; Test Circuit 5  
VS = 0 V, RS = 0 , CL = 10 nF;  
Test Circuit 6  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Test Circuit 7  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Test Circuit 8  
375  
150  
375  
150  
tOFF  
Break-Before-Make Time  
Delay, tD (ADG513 Only)  
Charge Injection  
pC typ  
dB typ  
dB typ  
OFF Isolation  
68  
68  
Channel-to-Channel Crosstalk  
85  
85  
CS (OFF)  
CD (OFF)  
CD, CS (ON)  
9
9
35  
9
9
35  
pF typ  
pF typ  
pF typ  
f = 1 MHz  
f = 1 MHz  
f = 1 MHz  
POWER REQUIREMENTS  
VDD  
VSS  
IDD  
+4.5/5.5  
–4.5/–5.5  
+4.5/5.5  
–4.5/–5.5  
V min/max  
V min/max  
µA typ  
µA max  
µA typ  
0.0001  
0.0001  
0.0001  
0.0001  
VDD = +5.5 V, VSS = –5.5 V  
Digital Inputs = 0 V or 5 V  
1
1
1
1
ISS  
µA max  
NOTES  
1Temperature ranges are as follows: B Versions –40°C to +85°C; T Versions –55°C to +125°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
–2–  
REV. B  
ADG511/ADG512/ADG513  
(VDD = +5 V ؎ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)  
Single Supply  
B Versions  
–40؇C to  
T Versions  
–55؇C to  
Parameter  
+25؇C  
+85؇C  
+25؇C  
+125؇C  
Units  
Test Conditions/Comments  
ANALOG SWITCH  
Analog Signal Range  
RON  
0 V to VDD  
75  
0 V to VDD  
75  
V
typ  
max  
45  
45  
VD = +3.5 V, IS = –10 mA;  
VDD = +4.5 V  
LEAKAGE CURRENTS  
VDD = +5.5 V  
Source OFF Leakage IS (OFF)  
±0.025  
±0.1  
±0.025  
±0.1  
±0.05  
±0.2  
±0.025  
±0.1  
±0.025  
±0.1  
±0.05  
±0.2  
nA typ  
VD = 4.5/1 V, VS = 1ր4.5 V;  
Test Circuit 2  
VD = 4.5/1 V, VS = 1ր4.5 V;  
Test Circuit 2  
VD = VS = +4.5 V/+1 V;  
Test Circuit 3  
±2.5  
±2.5  
±5  
±2.5  
±2.5  
±5  
nA max  
nA typ  
nA max  
nA typ  
nA max  
Drain OFF Leakage ID (OFF)  
Channel ON Leakage ID, IS (ON)  
DIGITAL INPUTS  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
2.4  
0.8  
V min  
V max  
IINL or IINH  
0.005  
0.005  
µA typ  
VIN = VINL or VINH  
±0.1  
±0.1  
µA max  
DYNAMIC CHARACTERISTICS2  
tON  
250  
50  
250  
50  
ns typ  
ns max  
ns typ  
ns max  
ns typ  
RL = 300 , CL = 35 pF;  
VS = +2 V; Test Circuit 4  
RL = 300 , CL = 35 pF;  
VS = +2 V; Test Circuit 4  
RL = 300 , CL = 35 pF;  
VS1 = VS2 = +2 V; Test Circuit 5  
VS = 0 V, RS = 0 , CL = 10 nF;  
Test Circuit 6  
500  
100  
500  
100  
tOFF  
Break-Before-Make Time  
Delay, tD (ADG513 Only)  
Charge Injection  
200  
16  
200  
16  
pC typ  
dB typ  
dB typ  
OFF Isolation  
68  
68  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Test Circuit 7  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Channel-to-Channel Crosstalk  
85  
85  
Test Circuit 8  
CS (OFF)  
CD (OFF)  
CD, CS (ON)  
9
9
35  
9
9
35  
pF typ  
pF typ  
pF typ  
f = 1 MHz  
f = 1 MHz  
f = 1 MHz  
POWER REQUIREMENTS  
VDD  
IDD  
+4.5/5.5  
1
+4.5/5.5  
1
V min/max  
µA typ  
µA max  
0.0001  
0.0001  
VDD = +5.5 V  
Digital Inputs = 0 V or 5 V  
NOTES  
1Temperature ranges are as follows: B Versions –40°C to +85°C; T Versions –55°C to +125°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
REV. B  
–3–  
ADG511/ADG512/ADG513–SPECIFICATIONS1  
(VDD = +3.3 V ؎ 10%, VSS = 0 V, GND = 0 V, unless otherwise noted)  
Single Supply  
B Versions  
0؇C to  
+70؇C  
Parameter  
+25؇C  
Units  
Test Conditions/Comments  
ANALOG SWITCH  
Analog Signal Range  
RON  
0 V to VDD  
500  
V
200  
typ  
max  
VD = +1.5 V, IS = –1 mA;  
VDD = +3 V  
LEAKAGE CURRENTS  
VDD = +3.6 V  
Source OFF Leakage IS (OFF)  
±0.025  
±0.1  
±0.025  
±0.1  
±0.05  
±0.2  
nA typ  
nA max  
nA typ  
nA max  
nA typ  
nA max  
VD = 2.6/1 V, VS = 1ր2.6 V;  
Test Circuit 2  
VD = 2.6/1 V, VS = 1ր2.6 V;  
Test Circuit 2  
VD = VS = +2.6 V/+1 V;  
Test Circuit 3  
±2.5  
±2.5  
±5  
Drain OFF Leakage ID (OFF)  
Channel ON Leakage ID, IS (ON)  
DIGITAL INPUTS  
Input High Voltage, VINH  
Input Low Voltage, VINL  
Input Current  
2.4  
0.8  
V min  
V max  
IINL or IINH  
0.005  
µA typ  
VIN = VINL or VINH  
±0.1  
µA max  
DYNAMIC CHARACTERISTICS2  
tON  
600  
100  
500  
11  
ns typ  
ns max  
ns typ  
ns max  
ns typ  
RL = 300 , CL = 35 pF;  
VS = +1 V; Test Circuit 4  
RL = 300 , CL = 35 pF;  
VS = +1 V; Test Circuit 4  
RL = 300 , CL = 35 pF;  
VS1 = VS2 = +1 V; Test Circuit 5  
VS = 0 V, RS = 0 , CL = 10 nF;  
Test Circuit 6  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Test Circuit 7  
RL = 50 , CL = 5 pF, f = 1 MHz;  
Test Circuit 8  
1200  
160  
tOFF  
Break-Before-Make Time  
Delay, tD (ADG513 Only)  
Charge Injection  
pC typ  
dB typ  
dB typ  
OFF Isolation  
68  
Channel-to-Channel Crosstalk  
85  
CS (OFF)  
CD (OFF)  
CD, CS (ON)  
9
9
35  
pF typ  
pF typ  
pF typ  
f = 1 MHz  
f = 1 MHz  
f = 1 MHz  
POWER REQUIREMENTS  
VDD  
IDD  
3/3.6  
1
V min/max  
µA typ  
µA max  
0.0001  
VDD = +3.6 V  
Digital Inputs = 0 V or 3 V  
NOTES  
1Temperature ranges are as follows: B Versions –40°C to +85°C.  
2Guaranteed by design, not subject to production test.  
Specifications subject to change without notice.  
–4–  
REV. B  
ADG511/ADG512/ADG513  
ABSOLUTE MAXIMUM RATINGS1  
(TA = +25°C unless otherwise noted)  
Plastic Package, Power Dissipation . . . . . . . . . . . . . . . 470 mW  
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 117°C/W  
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . +260°C  
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . . 600 mW  
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 77°C/W  
Lead Temperature, Soldering  
V
DD to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44 V  
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +25 V  
VSS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –25 V  
Analog, Digital Inputs2 . . . . . . . . . . . VSS –2 V to VDD + 2 V or  
30 mA, Whichever Occurs First  
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . . 30 mA  
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA  
(Pulsed at 1 ms, 10% Duty Cycle max)  
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C  
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C  
NOTES  
1Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those listed in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device reliability. Only one absolute  
maximum rating may be applied at any one time.  
Operating Temperature Range  
Industrial (B Version) . . . . . . . . . . . . . . . . . –40°C to +85°C  
Extended (T Version) . . . . . . . . . . . . . . . . –55°C to +125°C  
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C  
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . +150°C  
Cerdip Package, Power Dissipation . . . . . . . . . . . . . . . 900 mW  
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . 76°C/W  
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . +300°C  
2Overvoltages at IN, S or D will be clamped by internal diodes. Current should be  
limited to the maximum ratings given.  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the ADG511/ADG512/ADG513 features proprietary ESD protection circuitry,  
permanent damage may occur on devices subjected to high energy electrostatic discharges.  
Therefore, proper ESD precautions are recommended to avoid performance degradation or loss  
of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
ORDERING GUIDE  
Model1  
Temperature Range2  
Package Option3  
ADG511BN  
ADG511BR  
ADG511ABR4  
ADG511TQ4  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–55°C to +125°C  
N-16  
R-16A  
R-16A  
Q-16  
ADG512BN  
ADG512BR  
ADG512ABR4  
ADG512TQ4  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–55°C to +125°C  
N-16  
R-16A  
R-16A  
Q-16  
ADG513BN  
ADG513BR  
ADG513ABR4  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
N-16  
R-16A  
R-16A  
NOTES  
1For availability of MIL-STD-883, Class B processed parts, contact factory.  
23.3 V specifications apply over 0°C to +70°C temperature range.  
3N = Plastic DIP; R = 0.15" Small Outline IC (SOIC); Q = Cerdip.  
4Trench isolated latch-up proof parts. See Trench Isolation section.  
REV. B  
–5–  
ADG511/ADG512/ADG513  
TERMINOLOGY  
PIN CONFIGURATION  
(DIP/SOIC)  
VDD  
VSS  
Most positive power supply potential.  
Most negative power supply potential in  
dual supplies. In single supply applications,  
it may be connected to GND.  
IN1  
D1  
S1  
IN2  
D2  
S2  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
ADG511  
ADG512  
ADG513  
GND  
S
D
IN  
RON  
IS (OFF)  
Ground (0 V) reference.  
Source terminal. May be an input or output.  
Drain terminal. May be an input or output.  
Logic control input.  
Ohmic resistance between D and S.  
Source leakage current with the switch  
“OFF.”  
V
V
DD  
SS  
TOP VIEW  
(Not to Scale)  
GND  
NC  
S3  
S4  
D4  
D3  
IN3  
IN4  
NC = NO CONNECT  
ID (OFF)  
Drain leakage current with the switch  
“OFF.”  
Truth Table (ADG511/ADG512)  
ID, IS (ON)  
Channel leakage current with the switch  
“ON.”  
Analog voltage on terminals D, S.  
“OFF” switch source capacitance.  
“OFF” switch drain capacitance.  
“ON” switch capacitance.  
ADG511  
In  
ADG512  
In  
Switch  
Condition  
VD (VS)  
CS (OFF)  
0
1
1
0
ON  
OFF  
C
D (OFF)  
CD, CS (ON)  
tON  
Delay between applying the digital control  
input and the output switching on.  
Truth Table (ADG513)  
Switch  
1, 4  
Switch  
2, 3  
tOFF  
tD  
Delay between applying the digital control  
input and the output switching off.  
“OFF” or “ON” time measured between the  
90% points of both switches when switching  
from one address state to another.  
Logic  
0
1
OFF  
ON  
ON  
OFF  
Crosstalk  
A measure of unwanted signal which is  
coupled through from one channel to an-  
other as a result of parasitic capacitance.  
Off Isolation  
A measure of unwanted signal coupling  
through an “OFF” switch.  
Charge Injection A measure of the glitch impulse transferred  
from the digital input to the analog output  
during switching.  
–6–  
REV. B  
Typical Performance Graphs–ADG511/ADG512/ADG513  
50  
40  
30  
20  
10mA  
V
V
= +5V  
= –5V  
DD  
SS  
T
= +25؇C  
A
1mA  
100A  
10A  
V
V
= +3V  
= –3V  
DD  
SS  
I–, I+  
1A  
100nA  
10nA  
V
V
= +5V  
= –5V  
1 SW  
4 SW  
DD  
SS  
10  
0
0
–5  
–4  
–3  
–2  
–1  
1
2
3
4
5
10  
100  
1k  
10k  
100k  
1M  
10M  
FREQUENCY – Hz  
V
OR V – DRAIN OR SOURCE VOLTAGE – V  
S
D
Figure 4. Supply Current vs. Input Switching Frequency  
Figure 1. On Resistance as a Function of VD (VS) Dual  
Supplies  
10  
50  
V
V
V
V
= +5V  
= –5V  
= ؎5V  
= ؎5V  
DD  
SS  
V
V
= +5V  
= –5V  
DD  
SS  
S
D
I
(OFF)  
D
40  
30  
20  
1
0.1  
+125؇C  
+85؇C  
+25؇C  
I
(ON)  
D
0.01  
0.001  
10  
0
I
(OFF)  
45  
S
25  
35  
55  
65  
75  
85  
95  
105 115 125  
0
–5  
–4  
–3  
–2  
–1  
1
2
3
4
5
TEMPERATURE – ؇C  
V
OR V – DRAIN OR SOURCE VOLTAGE – V  
S
D
Figure 5. Leakage Currents as a Function of Temperature  
Figure 2. On Resistance as a Function of VD (VS) for  
Different Temperatures  
120  
90  
T
= +25؇C  
A
V
V
= +5V  
= –5V  
DD  
SS  
80  
70  
60  
50  
40  
30  
20  
V
V
= +3V  
= 0V  
DD  
SS  
100  
80  
V
V
= +5V  
= 0V  
DD  
SS  
60  
40  
100  
1k  
10k  
100k  
1M  
10M  
0
1
2
3
4
5
FREQUENCY – Hz  
V
OR V – DRAIN OR SOURCE VOLTAGE – V  
S
D
Figure 6. Off Isolation vs. Frequency  
Figure 3. On Resistance as a Function of VD (VS)  
Single Supply  
REV. B  
–7–  
ADG511/ADG512/ADG513  
network RC and CC. This compensation network also reduces  
the hold time glitch while optimizing the acquisition time. Using  
the illustrated op amps and component values, the pedestal  
error has a maximum value of 5 mV over the ±3 V input range.  
The acquisition time is 2.5 µs while the settling time is 1.85 µs.  
0.008  
V
V
= +5V  
= –5V  
= +25؇C  
DD  
SS  
I
(ON)  
0.004  
0.002  
D
T
A
I
(OFF)  
(OFF)  
D
+5V  
0.000  
I
2200pF  
S
+5V  
SW2  
–0.002  
–0.004  
–0.006  
+5V  
AD845  
–5V  
S
S
D
D
C
C
1000pF  
R
V
OUT  
C
OP07  
–5V  
V
IN  
SW1  
75⍀  
C
H
2200pF  
–5  
–4  
–3  
–2  
–1  
0
1
2
3
4
5
ADG511  
ADG512  
ADG513  
V
OR V – DRAIN OR SOURCE VOLTAGE – V  
S
D
Figure 7. Leakage Currents as a Function of VD (VS)  
–5V  
Figure 9. Accurate Sample-and-Hold  
110  
V
V
= +5V  
= –5V  
DD  
SS  
TRENCH ISOLATION  
100  
90  
80  
70  
60  
The MOS devices that make up the ADG511A/ADG512A/  
ADG513A are isolated from each other by an oxide layer  
(trench) (see Figure 10). When the NMOS and PMOS devices  
are not electrically isolated from each other, there exists the  
possibility of “latch-up” caused by parasitic junctions between  
CMOS transistors. Latch-up is caused when P-N junctions that  
are normally reverse biased, become forward biased, causing  
large currents to flow. This can be destructive.  
CMOS devices are normally isolated from each other by  
Junction Isolation. In Junction Isolation the N and P wells of the  
CMOS transistors form a diode that is reverse biased under  
normal operation. However, during overvoltage conditions, this  
diode becomes forward biased. A Silicon-Controlled Rectifier  
(SCR)-type circuit is formed by the two transistors, causing a  
significant amplification of the current that, in turn, leads to  
latch-up. With Trench Isolation, this diode is removed; the  
result is a latch-up-proof circuit.  
100  
1k  
10k  
100k  
1M  
10M  
FREQUENCY – Hz  
Figure 8. Crosstalk vs. Frequency  
APPLICATION  
Figure 9 illustrates a precise sample-and-hold circuit. An AD845  
is used as the input buffer while the output operational amplifier  
is an OP07. During the track mode, SW1 is closed and the  
output VOUT follows the input signal VIN. In the hold mode,  
SW1 is opened and the signal is held by the hold capacitor CH.  
V
V
G
G
V
V
V
V
D
S
D
S
T
P-CHANNEL  
T
N-CHANNEL  
T
+
+
+
+
Due to switch and capacitor leakage, the voltage on the hold  
capacitor will decrease with time. The ADG511/ADG512/  
ADG513 minimizes this droop due to its low leakage specifica-  
tions. The droop rate is further minimized by the use of a poly-  
styrene hold capacitor. The droop rate for the circuit shown is  
typically 15 µV/µs.  
P
N
P
N
N
R
E
N
C
H
R
E
N
C
H
R
E
N
C
H
P
BURIED OXIDE LAYER  
SUBSTRATE (BACKGATE)  
A second switch, SW2, which operates in parallel with SW1, is  
included in this circuit to reduce pedestal error. Since both  
switches will be at the same potential, they will have a differen-  
tial effect on the op amp OP07, which will minimize charge  
injection effects. Pedestal error is also reduced by the compensation  
Figure 10. Trench Isolation  
–8–  
REV. B  
ADG511/ADG512/ADG513  
Test Circuits  
I
DS  
V1  
I
(ON)  
A
I
(OFF)  
A
I
(OFF)  
A
D
D
S
S
D
S
D
S
D
V
V
V
V
D
S
D
S
V
S
R
= V1/I  
DS  
ON  
1. On Resistance  
2. Off Leakage  
3. On Leakage  
V
V
DD  
0.1F  
3V  
ADG511  
DD  
V
50%  
50%  
50%  
50%  
IN  
S
D
V
OUT  
3V  
ADG512  
V
R
C
L
IN  
L
V
S
35pF  
300⍀  
IN  
90%  
90%  
V
V
OUT  
GND  
SS  
0.1F  
tON  
tOFF  
V
SS  
4. Switching Times  
V
V
DD  
0.1F  
3V  
V
IN  
50%  
50%  
DD  
0V  
0V  
S1  
D1  
D2  
V
V
S1  
OUT1  
90%  
90%  
V
V
OUT1  
R
C
L1  
35pF  
L1  
V
OUT2  
S2  
300⍀  
V
S2  
R
C
L2  
35pF  
IN1, IN2  
L2  
300⍀  
90%  
V
90%  
GND  
SS  
V
OUT2  
IN  
0V  
tD  
tD  
0.1F  
V
SS  
5. Break-Before-Make Time Delay  
V
V
DD  
3V  
DD  
V
R
IN  
S
S
D
V
OUT  
C
10nF  
L
V
S
IN  
V
OUT  
V  
OUT  
V
V
GND  
SS  
Q
= C 
؋
 V  
L OUT  
INJ  
SS  
6. Charge Injection  
–9–  
REV. B  
ADG511/ADG512/ADG513  
Test Circuits (continued)  
V
V
DD  
DD  
V
V
DD  
DD  
0.1F  
0.1F  
50⍀  
S
D
S
D
V
OUT  
V
IN1  
R
50⍀  
L
V
S
V
IN2  
IN  
V
V
S
IN  
D
S
V
OUT  
NC  
V
V
GND  
SS  
GND  
SS  
R
L
50⍀  
CHANNEL TO CHANNEL  
CROSSTALK = 20 
؋
 LOG V /V  
0.1F  
0.1F  
S
OUT  
V
V
SS  
SS  
7. Off Isolation  
8. Channel-to-Channel Crosstalk  
–10–  
REV. B  
ADG511/ADG512/ADG513  
OUTLINE DIMENSIONS  
Dimensions are shown in inches and (mm).  
16-Lead Plastic DIP  
(N-16)  
0.840 (21.34)  
0.745 (18.92)  
16  
1
9
0.280 (7.11)  
0.240 (6.10)  
8
0.325 (8.26)  
0.195 (4.95)  
0.115 (2.93)  
0.300 (7.62)  
PIN 1  
0.060 (1.52)  
0.015 (0.38)  
0.210 (5.33)  
MAX  
0.130  
(3.30)  
MIN  
0.160 (4.06)  
0.115 (2.93)  
0.015 (0.381)  
0.008 (0.204)  
0.070 (1.77) SEATING  
0.100  
(2.54)  
BSC  
0.022 (0.558)  
0.014 (0.356)  
PLANE  
0.045 (1.15)  
16-Lead Cerdip  
(Q-16)  
0.005 (0.13) MIN  
16  
0.080 (2.03) MAX  
9
0.310 (7.87)  
0.220 (5.59)  
8
1
0.320 (8.13)  
0.290 (7.37)  
PIN 1  
0.840 (21.34) MAX  
0.060 (1.52)  
0.015 (0.38)  
0.200 (5.08)  
MAX  
0.150  
(3.81)  
MIN  
SEATING  
PLANE  
0.200 (5.08)  
0.125 (3.18)  
0.015 (0.38)  
0.008 (0.20)  
0.023 (0.58)  
0.014 (0.36)  
0.100  
(2.54)  
BSC  
0.070 (1.78)  
15°  
0°  
0.030 (0.76)  
16-Lead SOIC  
(R-16A)  
0.3937 (10.00)  
0.3859 (9.80)  
16  
9
8
0.1574 (4.00)  
0.2440 (6.20)  
0.2284 (5.80)  
1
0.1497 (3.80)  
0.0688 (1.75)  
0.0532 (1.35)  
PIN 1  
0.0196 (0.50)  
0.0099 (0.25)  
x 45؇  
0.0098 (0.25)  
0.0040 (0.10)  
8؇  
0؇  
0.0500  
(1.27)  
BSC  
0.0192 (0.49)  
0.0138 (0.35)  
SEATING  
PLANE  
0.0500 (1.27)  
0.0160 (0.41)  
0.0099 (0.25)  
0.0075 (0.19)  
REV. B  
–11–  

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