REF02R000C_技术文档

REVISIONS

LTR

A

DESCRIPTION

DATE (YR-MO-DA)

88-03-17

APPROVED

M. A. FRYE

Change to military drawing format. Changes to output adjustment range. Add

conditions for load regulation test at -55°C and +125°C. Change group A

subgroups for load regulation and line regulation tests, and output voltage

temperature coefficient. Add vendor CAGE 64155. Editorial changes

throughout.

B

C

D

Add vendor CAGE 07933. Add vendor CAGE 54186. Add case outline 2.

Change output voltage temperature coefficient test limits.

89-04-12

92-11-25

97-06-10

M. A. FRYE

R. MONNIN

Add device type 02. Editorial changes throughout. Delete vendors CAGEs

54186 and 07933. Add vendor CAGE 1ES66.

Add class V devices. Replace CAGE 06665 with 24355. Add case outline H

and TABLE IIB. Make changes to 1.2.2 and TABLE II.

E

F

Add radiation hardness assurance requirements. - ro

98-08-07

00-01-21

R. MONNIN

Make changes to 1.5, table IIA, 4.4.1b, and output voltage temperature

coefficient test as specified in table I. - ro

G

Add device types 03 and 04. Make changes 1.2.2 and to the output voltage

noise test as specified under TABLE I. - ro

01-02-07

R. MONNIN

H

J

Drawing updated to reflect current requirements. -rrp

05-12-07

11-11-29

R. MONNIN

C. SAFFLE

Removed “RADIATION HARDENED” from title block. Add device type 05

tested at low dose rate. Make change to paragraphs 1.2.2, 1.5, and 3.2.3.

Make changes to footnotes 2/ and 3/ as specified under Table I. Removed

figure 2. Make change to paragraph 4.4.4.1. Delete paragraphs 4.4.4.1.1 and

4.4.4.2. -rrp

CURRENT CAGE CODE 67268

THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

J

SHEET

1

2

3

4

5

6

7

8

9

10

PREPARED BY

DONALD OSBORNE

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

http://www.landandmaritime.dla.mil

STANDARD

MICROCIRCUIT

DRAWING

CHECKED BY

DANIEL A. DiCENZO

APPROVED BY

N. A. HAUCK

MICROCIRCUIT, LINEAR, +5 VOLT ADJUSTABLE

PRECISION VOLTAGE REFERENCE,

MONOLITHIC SILICON

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

86-03-08

REVISION LEVEL

J

SIZE

A

CAGE CODE

AMSC N/A

85514

14933

SHEET

1 OF 10

DSCC FORM 2233

APR 97

5962-E020-12

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and

M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part

or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

1.2 PIN. The PIN is as shown in the following examples.

For device classes M and Q:

85514

01

G

A

Drawing number

Device type

(see 1.2.1)

Case outline

(see 1.2.2)

Lead finish

(see 1.2.3)

For device class V:

5962

R

85514

01

V

G

A

Federal

stock class

designator

\

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

(see 1.2.3)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

/

\/

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are

marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type

Generic number

REF02A

REF02

Circuit function

Output voltage noise

01

02

03

04

05

Precision reference +5-volt

adjustable output

18 µV

P-P

Precision reference +5-volt

adjustable output

REF02A

REF02

Precision reference +5-volt

adjustable output

100 µV

18 µV

Precision reference +5-volt

adjustable output

REF02A

Radiation hardened,

Precision reference +5-volt

adjustable output

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

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SHEET

COLUMBUS, OHIO 43218-3990

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DSCC FORM 2234

APR 97

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed

below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q

designators will not be included in the PIN and will not be marked on the device.

Device class

M

Device requirements documentation

Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V

Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter

Descriptive designator

Terminals

Package style

G

H

P

2

MACY1-X8

8

10

8

Can

Flat pack

Dual-in-line

Square leadless chip carrier

GDFP1-F10 or CDFP2-F10

GDIP1-T8 or CDIP2-T8

CQCC1-N20

20

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

1.3 Absolute maximum ratings. 1/

Input voltage (V )........................................................................................ 40 V dc

IN

Power dissipation (P ) ................................................................................. 500 mW 2/

D

Output short circuit duration.......................................................................... Indefinite

Storage temperature..................................................................................... -65°C to +150°C

Lead temperature (soldering, 10 seconds)................................................... +300°C

Junction temperature (T )............................................................................. +150°C

J

Thermal resistance, junction-to-case (θ )................................................... See MIL-STD-1835

JC

1.4 Recommended operating conditions.

Ambient operating temperature range (T ) .................................................. -55°C to +125°C

A

1.5 Radiation features:

Device type 01:

Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ................. 100 krads (Si) 3/

Device type 05:

Maximum total dose available (dose rate ≤ 10 mrads(Si)/s) ........................ 50 krads (Si) 4/

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ Derate 7.1 mW/°C above +80°C for the "G" and "H" packages, 6.6 mW/°C above +75°C for the "P" package, and

7.8 mW/°C above +72°C for the "2" package.

3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,

method 1019, condition A for device type 01.

4/ For device type 05, radiation end point limits for the noted parameters are guaranteed for the conditions specified in

MIL-STD-883, method 1019, condition D.

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

J

SHEET

COLUMBUS, OHIO 43218-3990

3

DSCC FORM 2234

APR 97

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

-

Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or from the Standardization

Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text

of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified

in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document

revision level control and shall be made available to the preparing and acquiring activity upon request.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

in accordance with MIL-PRF-38535, appendix A.

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

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TABLE I. Electrical performance characteristics.

Conditions 1/

-55°C ≤ T ≤ +125°C

unless otherwise specified

Test

Symbol

SY

Group A

subgroups

Device

type

Limits

Max

Unit

A

Min

Quiescent supply current

No load

1

All

1.4

mA

I

2,3

1

2.0

1.4

M,D,P,L,R 2/ 3/

M,D,P,L 2/ 3/

01

05

All

1

Output adjustment 4/

range

Output voltage

1

%

V

±3.0

∆V

R = 10 kΩ, T = +25°C

P A

TRIM

1

01,03,

05

4.985

5.015

V

O

I = 0 mA

L

02,04

4.975

4.978

5.025

5.022

2,3

01,03,

05

02,04

01

4.953

4.975

+15

5.047

5.025

+60

M,D,P,L,R 2/ 3/

M,D,P,L 2/ 3/

1

05

Short circuit current 4/

Sink current 4/

All

mA

I

V = 0 V, T = +25°C

O A

OS

S

1

All

-0.3

mA

T = +25°C

A

Load regulation

LD reg

0.01

%/mA

I = 0 mA to 10 mA 5/

L

M,D,P,L,R 2/ 3/

M,D,P,L 2/ 3/

1

01

05

0.015

0.012

2,3

01,03,

05

I = 0 mA to 8 mA 5/

L

02,04

0.015

0.010

Line regulation

LN reg

1

01,03,

05

%/V

mA

V

= 8 V to 33 V 5/

IN

02,04

All

0.012

0.015

0.030

2,3

1

M,D,P,L,R 2/ 3/

M,D,P,L 2/ 3/

01

1

05

Load current

1

All

10

I

T = +25°C 4/ 6/

A

L

Output voltage noise

enp-p

0.1 Hz to 10 Hz 4/

4

8

01,02,

05

18

µV

P-P

03,04

100

Output voltage

4/ 7/

01,03,

05

±8.5

ppm/°C

TCV

O

temperature coefficient

See footnotes at end of table.

02,04

±25

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

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SHEET

COLUMBUS, OHIO 43218-3990

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DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics – continued.

1/

V

IN

= 15 V.

2/ Device type 01 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device type

05 supplied to this drawing has been characterized through all levels P and L of irradiation. However,

device type 01 is only tested at the “R” level and device type 05 is only tested at the “L” level. Pre and Post irradiation

values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any

RHA level, T = +25°C.

A

3/ For device type 01, this part may be dose rate sensitive in a space environment and may demonstrate enhanced low

dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified

in MIL-STD-883, method 1019, condition A for device type 01 and condition D for device type 05. Device type 05, has been

tested at low dose rate.

4/ This parameter is not tested to post irradiation.

5/ Line and load regulation specifications include the effect of self heating.

6/ Minimum of 10 mA load current guaranteed by load regulation test.

6

7/ TCV = (V

MAX

- V

) / 5 V x ((-55°C to +125°C) x (1 x 10 )) / 180°C.

MIN

O

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of

supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-

PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of

product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime's agent,

and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore

documentation shall be made available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 59 (see MIL-PRF-38535, appendix A).

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

J

SHEET

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DSCC FORM 2234

APR 97

Device types

Case outlines

01,02,03,04

G and P

01,05

H

01,02,03,04

2

Terminal number

Terminal symbol

NC

1

2

NC

V

IN

V

IN

3

4

5

TEMP

GND

TEMP

GND

NC

TRIM

V

IN

6

NC

V

OUT

V

OUT

7

NC

---

NC

---

TEMP

NC

8

9

NC

10

11

12

13

14

15

GND

NC

---

TRIM

NC

---

NC

---

V

OUT

16

17

18

19

20

---

NC

NC = No connection

FIGURE 1. Terminal connections.

SIZE

STANDARD

85514

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MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

SHEET

COLUMBUS, OHIO 43218-3990

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DSCC FORM 2234

APR 97

4. VERIFICATION

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in

accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015.

(2) T_A= +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device

class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for

device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

4.4.1 Group A inspection.

a. Tests shall be as specified in table IIA herein.

b. Subgroups 5, 6, 7, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

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TABLE IIA. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

MIL-PRF-38535, table III)

method 5005, table I)

Device

class M

---

Device

class Q

---

Device

class V

---

Interim electrical

parameters (see 4.2)

Final electrical

1,2,3,4 1/

1,2,3,8

1,2,3

1,2,3,4 1/

1,2,3,8

1,2,3

1,2,3,4 1/ 2/

1,2,3,8

1,2,3 2/

1,2,3

parameters (see 4.2)

Group A test

requirements (see 4.4)

Group C end-point electrical

parameters (see 4.4)

Group D end-point electrical

parameters (see 4.4)

Group E end-point electrical

parameters (see 4.4)

1,2,3

---

1

1/ PDA applies to subgroup 1.

2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits

shall be computed with reference to the previous interim electrical parameters.

TABLE IIB. 240 hour and 1000 hour life test deltas.

Test

Symbol

End point

Delta

Units

mV

Min

4.985

Max

Output voltage

5.015

±3

V

O

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,

outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

b. T_A= +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

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APR 97

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein).

a. End-point electrical parameters shall be as specified in table IIA herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device

classes must meet the postirradiation end-point electrical parameter limits as defined in table I at

T_A= +25°C ±5°C, after exposure, to the subgroups specified in table IIA herein.

4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883

method 1019, condition A for device type 01, condition D for device type 05 and as specified herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes

Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-

prepared specification or drawing.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires

configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and

this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic

devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,

or telephone (614) 692-0540.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and

have agreed to this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DLA Land and Maritime-VA.

SIZE

STANDARD

85514

A

MICROCIRCUIT DRAWING

DLA LAND AND MARITIME

REVISION LEVEL

J

SHEET

COLUMBUS, OHIO 43218-3990

10

DSCC FORM 2234

APR 97

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 11-11-29

Approved sources of supply for SMD 85514 are listed below for immediate acquisition information only and shall be

added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to

include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of

compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is

superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime maintains an

online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

8551401GA

3/

REF02AJ/883

REF-02AH/883

REF02AJ/883B

REF-02AZ/883

REF-02AJ8/883

3/

8551401GC

8551401PA

3/

24355 (2)

3/

REF02AZ/883B

REF-02ARC/883

REF02J/883B

85514012A

8551402GC

24355 (2)

3/

8551402PA

3/

REF02Z/883B

85514022C

3/

REF02RC/883B

REF02AJ/QMLV

REF02AL/QMLV

REF02AZ/QMLV

REF02ARC/QMLV

REF02AJ/QMLR

REF02AL/QMLR

REF02AZ/QMLR

REF02ARC/QMLR

REF02AJ/883B

REF02AZ/883B

5962-8551401VGA

5962-8551401VHA

5962-8551401VPA

5962-8551401V2A

5962R8551401VGA

5962R8551401VHA

5962R8551401VPA

5962R8551401V2A

8551403GC

24355 (4)

3/

8551403PA

3/

1 of 2

STANDARD MICROCIRCUIT DRAWING BULLETIN - Continued

DATE: 11-11-29

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

8551404GC

8551404PA

3/

REF02J/883B

REF02Z/883B

REF02RC/883B

REF02AL/QMLL

3/

85514042C

5962L8551405VHA

24355 (4)

1/ The lead finish shown for each PIN representing a hermetic

package is the most readily available from the manufacturer

listed for that part. If the desired lead finish is not listed

contact the vendor to determine its availability.

2/ Caution. Do not use this number for item acquisition. Items

acquired to this number may not satisfy the performance

requirements of this drawing.

3/ Not available from an approved source of supply.

Vendor CAGE

number

Vendor name

and address

24355

Analog Devices (2)

RT 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact:

804 Woburn Street

Wilmington, MA 01887-3462

24355

Analog Devices (4)

RT 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact: 7910 Triad Center Drive

Greensboro, NC 27409-9605

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.

2 of 2


型号：	REF02R000C
厂家：	ADI
描述：	Aerospace +5V Precision Voltage Ref./Temp. Transducer
文件：	总12页 (文件大小：122K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

REF02R000C [ADI]

相关型号：

REF02RC/883

REF02RC/883B

REF02RC/883C

REF02RC883

REF02RE/883

REF02RM

REF02S

REF02Z

REF02Z

REF02Z

REF02Z/883

REF02Z/883B