MAT03BIFH [ADI]

TRANSISTOR 20 mA, 36 V, 2 CHANNEL, PNP, Si, SMALL SIGNAL TRANSISTOR, TO-78, BIP General Purpose Small Signal;
MAT03BIFH
型号: MAT03BIFH
厂家: ADI    ADI
描述:

TRANSISTOR 20 mA, 36 V, 2 CHANNEL, PNP, Si, SMALL SIGNAL TRANSISTOR, TO-78, BIP General Purpose Small Signal

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Low Noise, Matched  
Dual PNP Transistor  
a
MAT03  
FEATURES  
PIN CONNECTION  
Dual Matched PNP Transistor  
Low Offset Voltage: 100 V Max  
Low Noise: 1 nV/Hz @ 1 kHz Max  
High Gain: 100 Min  
TO-78  
(H Suffix)  
High Gain Bandwidth: 190 MHz Typ  
Tight Gain Matching: 3% Max  
Excellent Logarithmic Conformance: rBE Ӎ 0.3 typ  
GENERAL DESCRIPTION  
The MAT03 dual monolithic PNP transistor offers excellent  
parametric matching and high frequency performance. Low  
Each transistor is individually tested to data sheet specifications.  
Device performance is guaranteed at 25°C and over the extended  
industrial and military temperature ranges. To ensure the long-  
term stability of the matching parameters, internal protection  
diodes across the base-emitter junction clamp any reverse base-  
emitter junction potential. This prevents a base-emitter breakdown  
condition that can result in degradation of gain and matching  
performance due to excessive breakdown current.  
noise characteristics (1 nV/Hz max @ 1 kHz), high bandwidth  
(190 MHz typical), and low offset voltage (100 µV max), makes  
the MAT03 an excellent choice for demanding preamplifier appli-  
cations. Tight current gain matching (3% max mismatch) and  
high current gain (100 min), over a wide range of collector cur-  
rent, makes the MAT03 an excellent choice for current mirrors.  
A low value of bulk resistance (typically 0.3 ) also makes the  
MAT03 an ideal component for applications requiring accurate  
logarithmic conformance.  
REV. C  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, norforanyinfringementsofpatentsorotherrightsofthirdpartiesthat  
may result from its use. No license is granted by implication or otherwise  
under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
www.analog.com  
© Analog Devices, Inc., 2002  
MAT03–SPECIFICATIONS  
ELECTRICAL CHARACTERISTICS  
(@ TA = 25؇C, unless otherwise noted.)  
MAT03E  
MAT03F  
Typ  
Parameter  
Symbol  
Conditions  
Min  
Typ  
Max  
Min  
Max  
Unit  
Current Gain1  
hFE  
VCB = 0 V, –36 V  
IC = 1 mA  
IC = 100 µA  
IC = 10 µA  
IC = 100 µA,VCB = 0 V  
VCB = 0 V, IC = 100 µA  
IC = 100 µA  
VCB1 = 0 V  
VCB2 = –36 V  
VCB = 0 V  
IC1 = 10 µA, IC2 = 1 mA  
VCB = 0 V  
10 µA IC 1 mA  
IC = 100 µA, VCB = 0 V  
100  
90  
80  
165  
150  
120  
0.5  
40  
80  
70  
60  
165  
150  
120  
0.5  
40  
Current Gain Matching2 DhFE  
3
100  
6
200  
%
µV  
Offset Voltage3  
VOS  
VOS/VCB  
Offset Voltage Change  
vs. Collector Voltage  
11  
11  
12  
12  
0.3  
0.3  
6
150  
150  
50  
11  
11  
12  
12  
0.3  
0.3  
6
200  
200  
75  
µV  
µV  
µV  
µV  
Offset Voltage Change  
vs. Collector Current  
Bulk Resistance  
VOS/IC  
rBE  
50  
75  
0.75  
0.75  
35  
0.75  
0.75  
45  
Offset Current  
Collector-Base  
IOS  
nA  
Leakage Current  
ICB0  
eN  
VCB = –36 V = VMAX  
IC = 1 mA, VCB = 0  
50  
200  
50  
400  
pA  
Noise Voltage Density4  
f
f
f
f
O = 10 Hz  
O = 100 Hz  
O = 1 kHz  
O = 10 kHz  
0.8  
0.7  
0.7  
0.7  
0.8  
0.7  
0.7  
0.7  
nV/÷Hz  
nV/÷Hz  
nV/÷Hz  
nV/÷Hz  
Collector Saturation  
Voltage  
VCE(SAT)  
IC = 1 mA, IB = 100 µA  
0.025 0.1  
0.025 0.1  
V
(@ –40؇C T 85؇C, unless otherwise noted.)  
ELECTRICAL CHARACTERISTICS  
A
MAT03E  
Min Typ Max  
MAT03F  
Min Typ Max  
Parameter  
Symbol  
Conditions  
Unit  
Current Gain  
hFE  
VCB = 0 V, –36 V  
IC = 1 mA  
IC = 100 µA  
IC = 10 µA  
IC = 100 µA, VCB = 0 V  
IC = 100 µA, VCB = 0 V  
IC = 100 µA, VCB = 0 V  
70  
60  
50  
120  
105  
90  
30  
0.3 0.5  
10 85  
60  
50  
40  
120  
105  
90  
30  
0.3 1.0  
10 200  
Offset Voltage  
VOS  
TCVOS  
IOS  
135  
265  
µV  
µV/°C  
nA  
Offset Voltage Drift5  
Offset Current  
Breakdown Voltage  
BVCEO  
36  
36  
V
NOTES  
1Current gain is measured at collector-base voltages (VCB) swept from 0 to VMAX at indicated collector current. Typicals are measured at VCB = 0 V.  
100 (IB ) hFE (min)  
2
Current gain matching (hFE) is defined as: hFE =  
.
IC  
IIC1.  
In  
KT  
q
3Offset voltage is defined as: VOS = VBE1 VBE2, where VOS is the differential voltage for IC1 = IC2: VOS = VBE1 VBE2  
=
C2  
4Sample tested. Noise tested and specified as equivalent input voltage for each transistor.  
5Guaranteed by VOS test (TCVOS = VOS/T for VOS VBE) where T = 298°K for TA = 25°C.  
Specifications subject to change without notice.  
REV. C  
–2–  
MAT03  
ORDERING GUIDE  
ABSOLUTE MAXIMUM RATINGS1  
Collector-Base Voltage (BVCBO . . . . . . . . . . . . . . . . . . . 36 V  
Collector-Emitter Voltage (BVCEO) . . . . . . . . . . . . . . . . . 36 V  
)
VOS max  
Temperature  
Package  
Option  
Model  
(TA = +25؇C) Range  
Collector-Collector Voltage (BVCC) . . . . . . . . . . . . . . . . . 36 V  
Emitter-Emitter Voltage (BVEE  
) . . . . . . . . . . . . . . . . . . . 36 V  
MAT03EH 100 µV  
40°C to +85°C  
40°C to +85°C  
TO-78  
TO-78  
Collector Current (IC) . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA  
Emitter Current (IE) . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA  
Total Power Dissipation  
MAT03FH  
200 µV  
Ambient Temperature 70°C2 . . . . . . . . . . . . . . . 500 mW  
Operating Temperature Range  
MAT03E/F . . . . . . . . . . . . . . . . . . . . . . . . 40°C to +85°C  
Operating Junction Temperature . . . . . . . . . 55°C to +150°C  
Storage Temperature . . . . . . . . . . . . . . . . . . 65°C to +150°C  
Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . . 300°C  
Junction Temperature . . . . . . . . . . . . . . . . . 65°C to +150°C  
NOTES  
1Absolute maximum ratings apply to both DICE and packaged devices.  
2Rating applies to TO-78 not using a heat sink and LCC; devices in free air only. For  
TO-78, derate linearly at 6.3 mW/°C above 70°C ambient temperature; for LCC,  
derate at 7.8 mW/°C.  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the MAT03 features propriety ESD protection circuitry, permanent damage may occur  
on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions  
are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. C  
–3–  
–Typical Performance Characteristics  
MAT03  
TPC 2. Current Gain  
vs. Temperature  
TPC 3. Gain Bandwidth vs.  
Collector Current  
TPC 1. Current Gain vs.  
Collector Current  
TPC 5. Small-Signal Input Resistance  
(hie) vs. Collector Current  
TPC 6. Small Signal Output Con-  
ductance (hoe) vs. Collector Current  
TPC 4. Base-Emitter Voltage  
vs. Collector Current  
REV. C  
–4–  
MAT03  
TPC 8. Noise Voltage Density  
vs. Frequency  
TPC 9. Noise Voltage Density  
TPC 7. Saturation Voltage  
vs. Collector Current  
TPC 11. Collector-Base Capacitance vs. VCB  
TPC 10. Total Noise vs. Collector Current  
REV. C  
–5–  
MAT03  
Figure 1. SPICE or SABER Model  
APPLICATIONS INFORMATION  
MAT03 MODELS  
The MAT03 model (Figure 1) includes parasitic diodes D3  
through D6. D1 and D2 are internal protection diodes that prevent  
zenering of the base-emitter junctions.  
MAT03 NOISE MEASUREMENT  
2
All resistive components (Johnson noise, en = 4kTBR, or  
en = 0.13R nV/Hz, where R is in k) and semiconductor  
junctions (shot noise, caused by current flowing through a  
junction, produces voltage noise in series impedances such as  
transistor-collector load resistors, In = 0.566 I pA/Hz where  
I is in µA) contribute to the system input noise.  
The analysis programs, SPICE and SABER, are primarily used  
in evaluating the functional performance of systems. The models  
are provided only as an aid in using these simulation programs.  
Figure 2 illustrates a technique for measuring the equivalent in-  
put noise voltage of the MAT03. 1 mA of stage current is used  
Figure 2. MAT03 Voltage Noise Measurement Circuit  
REV. C  
–6–  
MAT03  
surement circuit must be thermally isolated. Effects of extraneous  
noise sources must also be eliminated by totally shielding the circuit.  
to bias each side of the differential pair. The 5 kcollector  
resistors noise contribution is insignificant compared to the volt-  
age noise of the MAT03. Since noise in the signal path is referred  
back to the input, this voltage noise is attenuated by the gain of  
the circuit. Consequently, the noise contribution of the col-  
lector load resistors is only 0.048 nV/Hz. This is considerably  
less than the typical 0.8 nV/Hz input noise voltage of the  
MAT03 transistor.  
SUPER LOW NOISE AMPLIFIER  
The circuit in Figure 3a is a super low noise amplifier with  
equivalent input voltage noise of 0.32 nV/Hz. By paralleling  
three MAT03 matched pairs, a further reduction of amplifier  
noise is attained by a reduction of the base spreading resistance  
by a factor of 3, and consequently the noise by 3. Additionally,  
the shot noise contribution is reduced by maintaining a high  
collector current (2 mA/device) which reduces the dynamic  
emitter resistance and decreases voltage noise. The voltage noise  
is inversely proportional to the square root of the stage current,  
and current noise increases proportionally to the square root of  
the stage current. Accordingly, this amplifier capitalizes on  
voltage noise reduction techniques at the expense of increasing  
the current noise. However, high current noise is not usually  
important when dealing with low impedance sources.  
The noise contribution of the OP27 gain stages is also negli-  
gible due to the gain in the signal path. The op amp stages  
amplify the input referred noise of the transistors to increase the  
signal strength to allow the noise spectral density (ein × 10000)  
to be measured with a spectrum analyzer. Since we assume  
equal noise contributions from each transistor in the MAT03,  
the output is divided by 2 to determine a single transistors  
input noise.  
Air currents cause small temperature changes that can appear  
as low frequency noise. To eliminate this noise source, the mea-  
Figure 3a. Super Low Noise Amplifier  
REV. C  
–7–  
MAT03  
This amplifier exhibits excellent full power ac performance,  
0.08% THD into a 600 load, making it suitable for exacting  
audio applications (see Figure 3b).  
and the VBE of a silicon transistor is predictable and constant (to  
a few percent) over a wide temperature range. The voltage differ-  
ence, approximately 1 V, is dropped across the 250 resistor  
which produces a temperature stabilized emitter current.  
CURRENT SOURCES  
A fundamental requirement for accurate current mirrors and  
active load stages is matched transistor components. Due to the  
excellent VBE matching (the voltage difference between VBE  
s
required to equalize collector current) and gain matching, the  
MAT03 can be used to implement a variety of standard current  
mirrors that can source current into a load such as an amplifier  
stage. The advantages of current loads in amplifiers versus  
resistors is an increase of voltage gain due to higher imped-  
ances, larger signal range, and in many applications a wider  
signal bandwidth.  
Figure 5 illustrates a cascode current mirror consisting of two  
MAT03 transistor pairs.  
The cascode current source has a common base transistor in se-  
ries with the output which causes an increase in output imped-  
ance of the current source since VCE stays relatively constant.  
High frequency characteristics are improved due to a reduction  
of Miller capacitance. The small-signal output impedance can  
be determined by consulting hOF vs. Collector Currenttypical  
graph. Typical output impedance levels approach the perfor-  
mance of a perfect current source.  
Figure 3b. Super Low Noise Amplifier—Total  
Harmonic Distortion  
LOW NOISE MICROPHONE PREAMPLIFIER  
Figure 4 shows a microphone preamplifier that consists of a  
MAT03 and a low noise op amp. The input stage operates at a  
relatively high quiescent current of 2 mA per side, which reduces  
the MAT03 transistors voltage noise. The 1/ƒ corner is less than  
1 Hz. Total harmonic distortion is under 0.005% for a 10 V p-p  
signal from 20 Hz to 20 kHz. The preamp gain is 100, but can be  
modified by varying R5 or R6 (VOUT/VIN = R5/R6 + 1).  
Considering a typical collector current of 100 µA, we have:  
1
roQ3  
=
= 1 MΩ  
1. 0 µMHOS  
A total input stage emitter current of 4 mA is provided by Q2.  
The constant current in Q2 is set by using the forward voltage of  
a GaAsP LED as a reference. The difference between this voltage  
Figure 4. Low Noise Microphone Preamplifier  
REV. C  
–8–  
MAT03  
Since Q2 buffers Q3, both transistors in the MAT03, Q1 and Q3,  
maintain the same collector current. D2 and D3 form a Baker  
clamp which prevents Q2 from turning off, thereby improving  
the switching speed of the current mirror. The feedback serves  
to increase the output impedance and improves accuracy by re-  
ducing the base-width modulation which occurs with varying  
collector-emitter voltages. Accuracy and linearity performance  
of the current pump is summarized in Figure 8.  
Q2 and Q3 are in series and operate at the same current levels so  
the total output impedance is:  
RO = hFE roQ3 @ (160)(1 M) = 160 M.  
Figure 5. Cascode Current Source  
Figure 6a. Current Matching Circuit  
CURRENT MATCHING  
The objective of current source or mirror design is generation of  
currents that are either matched or must maintain a constant ra-  
tio. However, mismatch of base emitter voltages cause output  
current errors. Consider the example of Figure 5. If the resistors  
and transistors are equal and the collector voltages are the same,  
the collector currents will match precisely. Investigating the cur-  
rent matching errors resulting from a nonzero VOS, we define  
IC as the current error between the two transistors.  
Graph 6b describes the relationship of current matching errors  
versus offset voltage for a specified average current IC. Note that  
since the relative error between the currents is exponentially  
proportional to the offset voltage, tight matching is required to  
design high accuracy current sources. For example, if the offset  
voltage is 5 mV at 100 µA collector current, the current match-  
ing error would be 20%. Additionally, temperature effects such  
as offset drift (3 µV/°C per mV of VOS) will degrade performance  
if Q1 and Q2 are not well matched.  
Figure 6b. Current Matching Accuracy %  
vs. Offset Voltage  
DIGITALLY PROGRAMMABLE BIPOLAR CURRENT  
PUMP  
The circuit of Figure 7 is a digitally programmable current  
pump. The current pump incorporates a DAC08, and a fast  
Wilson current source using the MAT03. Examining Figure 7,  
the DAC08 is set for 2 mA full-scale range so that bipolar cur-  
rent operation of 2 mA is achieved. The Wilson current mirror  
maintains linearity within the LSB range of the 8-bit DAC08  
( 2 mA/256 = 15.6 µA resolution) as seen in Figure 8. A nega-  
tive feedback path established by Q2 regulates the collector cur-  
rent so that it matches the reference current programmed by the  
DAC08.  
Collector-emitter voltages across both Q1 and Q3 are matched  
by D1, with Q3s collector-emitter voltage remaining constant,  
independent of the voltage across the current source output.  
Figure 7. Digitally Programmable Bipolar Current Pump  
REV. C  
–9–  
MAT03  
The full-scale output of the DAC08, IOUT, is a linear function  
of IREF  
256  
256  
256  
256  
IFR  
=
× IREF, and IOUT  
+
= IREF  
IOUT  
The current mirror output is IOUT  
= 1, so that if  
IOUT  
IREF = 2 mA:  
I = 2 IOUT 1.992 mA  
Input Code  
(2 mA) 1.992 mA.  
= 2  
256  
DIGITAL CURRENT PUMP CODING  
Digital Input  
Figure 8. Digitally Programmable Current  
Pump—INL Error as Digital Code  
B1 . . . B8  
Output Current  
FULL RANGE  
HALF RANGE  
ZERO SCALE  
1111 1111  
1000 0000  
0000 0000  
I = 1.992 mA  
I = 0.008 mA  
I = 1.992 mA  
REV. C  
–10–  
MAT03  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
TO-78 Metal Can  
REFERENCE PLANE  
0.750 (19.05)  
0.500 (12.70)  
0.185 (4.70)  
0.165 (4.19)  
0.250 (6.35) MIN  
0.050 (1.27) MAX  
0.100 (2.54) BSC  
4
0.160 (4.06)  
0.110 (2.79)  
5
0.045 (1.14)  
0.027 (0.69)  
0.200  
(5.08)  
BSC  
3
6
2
1
0.100  
(2.54)  
BSC  
0.019 (0.48)  
0.016 (0.41)  
0.034 (0.86)  
0.027 (0.69)  
0.040 (1.02) MAX  
0.021 (0.53)  
0.016 (0.41)  
0.045 (1.14)  
0.010 (0.25)  
45° BSC  
BASE & SEATING PLANE  
Revision History  
Location  
Page  
Data Sheet changed from REV. B to REV. C.  
Edits to ELECTRICAL CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Deleted WAFER TEST LIMITS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Deleted DICE CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Edits to ORDERING GUIDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Edits to ABSOLUTE MAXIMUM RATINGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
REV. C  
–11–  
–12–  

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