5962L8856504VDA [ADI]
Aerospace High Speed Low Noise Quad Op Amp;
| 型号： | 5962L8856504VDA |
| 厂家： | 
ADI |
| 描述： | Aerospace High Speed Low Noise Quad Op Amp 放大器 |
| 文件： | 总13页 (文件大小：75K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
89-11-07
APPROVED
M. A. Frye
Add case outline 2 for device types 01 and 02. Update format. Editorial
changes throughout.
Changes to large-signal voltage gain test and to the output voltage swing test.
Changes IAW NOR 5962-R193-93.
B
C
93-08-26
96-11-25
M. A. Frye
R. Monnin
Add case outline K. Change boilerplate to add one-part part numbers.
Add delta test limits. Redrawn.
D
E
Add radiation hardness requirements. Update boilerplate. -rrp
98-06-19
00-10-04
R. Monnin
R. Monnin
Change to the slew rate test condition A
in table I. -rrp
VCL
Add case outline D. Remove radiation exposure circuit. Changes made to
1.2.4, 1.3, 3.2.3, figure 1, and table IIA. Update boilerplate to reflect current
requirements. -rrp
F
03-03-19
R. Monnin
Update drawing to current requirements. Deleted unused group E boilerplate
paragraphs. –rrp
G
H
11-04-06
11-11-16
C. Saffle
C. Saffle
Add device types 03 and 04 tested at low dose rate. Make changes to 1.2.2,
1.5, Table I, figure 1, Table IIB, 4.4.4.1. - ro
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
H
1
H
2
H
3
H
4
H
5
H
6
H
7
H
8
H
9
H
H
SHEET
10
11
PREPARED BY
Gary Zahn
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
Ray Monnin
APPROVED BY
Michael A. Frye
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
MICROCIRCUIT, LINEAR, RADIATION
HARDENED, LOW NOISE, QUAD OPERATIONAL
AMPLIFIER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
88-08-18
REVISION LEVEL
H
SIZE
A
CAGE CODE
AMSC N/A
5962-88565
67268
SHEET
1 OF 11
DSCC FORM 2233
APR 97
5962-E524-11
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following examples.
For device classes M and Q:
5962
-
88565
01
C
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
For device class V:
5962
R
88565
01
V
C
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
Circuit function
01
02
OP-470A
OP-471A
Very low noise, quad, operational amplifier
High speed, low noise, quad, operational
amplifier
03
04
OP-470A
OP-471A
Very low noise, quad, operational amplifier
High speed, low noise, quad, operational
amplifier
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed
below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q
designators will not be included in the PIN and will not be marked on the device.
Device class
M
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V
Certification and qualification to MIL-PRF-38535
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
2
DSCC FORM 2234
APR 97
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
C
D
2
3
K
GDIP1-T14 or CDIP2-T14
GDFP1-F14 or CDFP2-F14
CQCC1-N20
CQCC1-N28
GDFP2-F24 or CDFP3-F24
14
14
20
28
24
Dual-in-line
Flat pack
Square leadless chip carrier
Square leadless chip carrier
Flat pack
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
1.3 Absolute maximum ratings. 1/
Supply voltage (V ) ................................................................................... 18 V dc
CC
Differential input voltage .............................................................................. 1 V dc 2/
Differential input current .............................................................................. 25 mA 2/
Input voltage ................................................................................................ Supply voltage
Output short circuit duration ......................................................................... Continuous
Storage temperature range ......................................................................... -65C to +150C
Lead temperature (soldering, 60 seconds) .................................................. +300C
Power dissipation (P ):
D
Cases C and 2 ......................................................................................... 800 mW
Case D ..................................................................................................... 550 mW
Case 3 ...................................................................................................... 500 mW
Case K ..................................................................................................... 440 mW
Maximum junction temperature (T ) ............................................................ +150C
J
Thermal resistance, junction-to-case ( ) .................................................. See MIL-STD-1835
JC
Thermal resistance, junction-to-ambient ( ):
JA
Cases C and 2 ......................................................................................... 100C/W
Case D ..................................................................................................... 140C/W
Case 3 ...................................................................................................... 110C/W
Case K ..................................................................................................... 69C/W
1.4 Recommended operating conditions.
Ambient operating temperature range (T ) ................................................. -55C to +125C
A
Supply voltage (V ) ................................................................................... 15 V
CC
1.5 Radiation features.
Device types 01 and 02:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) .............. 100 krads(Si) 3/
Device types 03 and 04:
Maximum total dose available (dose rate 10 mrads(Si)/s) .................... 50 krads (Si) 4/
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ The inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise
performance. If the differential input voltage exceeds 1 V, the input current should be limited to 25 mA.
3/ Device types 01 and 02 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate
effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in
MIL-STD-883, method 1019, condition A.
4/ For device type 03 and 04, radiation end point limits for the noted parameters are guaranteed for the conditions specified
in MIL-STD-883, method 1019, condition D.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein .
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions 1/ 2/
-55C T +125C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits
Max
Unit
A
Min
1
2, 3
1
01, 03
mV
0.4
0.6
0.6
0.6
0.8
1.2
1.0
1.0
10
20
50
V
Input offset voltage
IO
M,D,P,L,R
M,D,P,L
01
03
1
1
02, 04
2, 3
1
M,D,P,L,R
M,D,P,L
02
04
All
1
1
nA
nA
I
V
= 0 V
Input offset current
Input bias current
IO
CM
2, 3
1
M,D,P,L,R
M,D,P,L
01, 02
03, 04
All
1
50
1
25
50
500
500
110
265
I
V
CM
= 0 V
IB
2, 3
1
M,D,P,L,R
M,D,P,L
01, 02
03, 04
01, 03
02, 04
01, 03
1
fO = 1 Hz to 100 Hz, 3/
7
nV
E
n
Input noise voltage
RMS
V/mV
T
= +25C
V = 10 V,
O
A
4
5, 6
4
1000
750
100
100
500
400
500
375
50
A
VS
Large-signal voltage gain
R = 10 k
L
M,D,P,L,R
M,D,P,L
01
03
4
4
01, 03
V
O
= 10 V, 3/
5, 6
4
R = 2 k
L
02, 04
V
O
= 10 V,
5, 6
4
R = 10 k
L
M,D,P,L,R
M,D,P,L
02
04
4
50
See footnotes at end of table.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Conditions 1/ 2/
-55C T +125C
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Limits
Max
Unit
A
Min
350
4
5, 6
4, 5, 6
1, 2, 3
1
02, 04
V/mV
A
VS
V = 10 V, 3/
O
Large-signal voltage gain
250
R = 2 k
L
All
V
RL = 2 k 3/
12
V
OP
Output voltage swing
Supply current 4/
No load
All
11
11
11
mA
I
S
M,D,P,L,R
M,D,P,L
01, 02
03, 04
01, 03
02, 04
01, 03
1
SR
7
1.4
6.5
V/s
A
= +21, R = 10 k,
L
Slew rate
VCL
T
= +25C 3/
A
CMR
1
2, 3
1
110
100
105
100
dB
V
= IVR = 11 V 3/ 5/
Common-mode rejection
CM
02, 04
01, 03
02, 04
2, 3
1
PSRR
1.8
5.6
5.6
10
V/V
V
= 4.5 V to 18 V 3/
Power supply rejection ratio
CC
2, 3
1
2, 3
1/ Device types 01 and 02 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation.
Device types 03 and 04 supplied to this drawing has been characterized through all levels M, D, P, L of irradiation.
However, device types 01 and 02 is only tested at the “R” level and device types 03 and 04 is only tested at the “L” level.
Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation
electrical measurements for any RHA level, T = +25C. V
= 15 V, R = 50 .
S
A
CC
2/ For device types 01 and 02, these parts may be dose rate sensitive in a space environment and may demonstrate
enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions
specified in MIL-STD-883, method 1019, condition A for device types 01 and 02 and condition D for device types 03 and 04.
Device types 03 and 04, have been tested at low dose rate.
3/ This parameter is not tested post-irradiation.
4/
I limit equals the total of all amplifiers.
S
5/ IVR is defined as the V
range used for the CMR test.
CM
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
6
DSCC FORM 2234
APR 97
Device types
Case outlines
01, 02, and 03, 04
C and D
K
2
3
Terminal
number
Terminal symbol
1
OUT A
-IN A
OUT A
NC
OUT A
-IN A
+IN A
NC
NC
OUT A
-IN A
NC
2
-IN A
NC
3
+IN A
4
NC
+V
CC
5
+IN B
-IN B
+IN A
NC
6
+IN A
NC
+V
+V
CC
CC
7
OUT B
OUT C
-IN C
+IN B
NC
NC
8
+IN B
-IN B
OUT B
NC
+V
CC
9
NC
NC
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
+IN C
NC
+IN B
NC
-IN B
OUT B
OUT C
-IN C
NC
-V
CC
+IN D
-IN D
OUT D
---
OUT C
-IN C
+IN C
NC
NC
-IN B
OUT B
NC
---
NC
OUT C
-IN C
NC
-V
CC
---
NC
NC
---
+IN C
+IN D
-IN D
OUT D
---
---
NC
-V
CC
---
+IN D
NC
+IN C
NC
---
---
NC
---
-V
CC
---
-IN D
OUT D
---
---
NC
---
---
+IN D
NC
---
---
---
---
---
NC
---
---
---
-IN D
OUT D
---
---
---
NC = No connection.
FIGURE 1. Terminal connections.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
7
DSCC FORM 2234
APR 97
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime 's agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 49 (see MIL-PRF-38535, appendix A).
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015.
(2) T = +125C, minimum.
A
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
8
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Subgroups
(in accordance with
MIL-STD-883,
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Test requirements
method 5005, table I)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
1
1
1
1,2,3,4, 1/ 2/
5,6
Final electrical
parameters (see 4.2)
1,2,3,4,5,6 1/
1,2,3,4,5,6 1/
Group A test
requirements (see 4.4)
1,2,3,4,5,6,7
1,2,3,4,5,6,7
1,2,3,4,5,6,7
Group C end-point electrical
parameters (see 4.4)
1
1
1 2/
1
Group D end-point electrical
parameters (see 4.4)
1
1
Group E end-point electrical
parameters (see 4.4)
---
---
1, 4
1/ PDA applies to subgroup 1.
2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits
shall be computed with reference to the previous interim electrical parameters.
TABLE IIB. Burn-in and operating life test delta parameters. T = +25C. 1/ 2/
A
Limit
Delta
Parameter
Device types
Min
Max
Min
Max
100 V
250 V
5 nA
01, 03
02, 04
01, 03
02, 04
01, 03
02, 04
0.4 mV
0.8 mV
10 nA
10 nA
25 nA
25 nA
V
OS
I
I
OS
5 nA
5 nA
B
5 nA
1/ Deltas are performed at room temperature.
2/ 240 hour burn-in and 1,000 hour operating group C life test.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
9
DSCC FORM 2234
APR 97
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device
class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for
device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
T = +125C, minimum.
A
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
= +25C 5C, after exposure, to the subgroups specified in table IIA herein.
A
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883
method 1019, condition A for device types 01 and 02, condition D for device types 03 and 04 and as specified herein.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
10
DSCC FORM 2234
APR 97
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-
prepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0544.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime-VA and
have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime-VA.
SIZE
STANDARD
5962-88565
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
H
11
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 11-11-16
Approved sources of supply for SMD 5962-88565 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8856501CA
5962-88565012A
5962-88565013A
5962-8856502CA
5962-88565022A
5962-88565023A
5962-8856501VCA
5962-8856501V2A
5962-8856501VKA
5962-8856502VCA
5962-8856502VDA
5962-8856502V2A
5962-8856502VKA
5962R8856501VCA
5962R8856501V2A
5962R8856501VKA
24355 (2)
24355 (2)
3/
OP-470AY/883C
OP-470ARC/883C
OP-470ATC/883C
OP-471AY/883C
OP-471ARC/883C
OP-471ATC/883C
OP470AY/QMLV
OP470ARC/QMLV
OP470AN/QMLV
OP471AY/QMLV
OP471AM/QMLV
OP471ARC/QMLV
OP471AN/QMLV
OP470AY/QMLR
OP470ARC/QMLR
OP470AN/QMLR
24355 (2)
24355 (2)
24355 (2)
24355 (4)
24355 (4)
24355 4/
24355 4/
24355 4/
3/
24355 (4)
24355 (4)
24355 (4)
24355(4)
See footnotes at end of table.
1 of 2
STANDARD MICROCIRCUIT DRAWING BULLETIN - CONTINUED
DATE: 11-11-16
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962R8856502VCA
5962R8856502VDA
5962R8856502V2A
5962R8856502VKA
24355 (4)
24355 (4)
3/
OP471AY/QMLR
OP471AM/QMLR
OP471ARC/QMLR
OP471AN/QMLR
24355 (4)
5962L8856503VCA
5962L8856504VDA
24355 (4)
24355 (4)
OP470AY/QMLL
OP471AM/QMLL
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
4/ This device has an end of life date of August 31, 2011.
Vendor CAGE
number
Vendor name
and address
24355
24355
Analog Devices (2)
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact:
804 Woburn Street
Wilmington, MA 01887-3462
Analog Devices (4)
Route 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 7910 Triad Center Drive
Greensboro, NC 27409-9605
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
2 of 2
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